US 11,815,547 B2
Test circuit
Francois Tailliet, Fuveau (FR)
Assigned to STMICROELECTRONICS (ROUSSET) SAS, Rousset (FR)
Filed by STMICROELECTRONICS (ROUSSET) SAS, Rousset (FR)
Filed on Sep. 7, 2021, as Appl. No. 17/468,377.
Claims priority of application No. 2010070 (FR), filed on Oct. 1, 2020.
Prior Publication US 2022/0107356 A1, Apr. 7, 2022
Int. Cl. G01R 31/28 (2006.01); G01R 1/067 (2006.01)
CPC G01R 31/2884 (2013.01) [G01R 1/06766 (2013.01); G01R 31/2889 (2013.01)] 20 Claims
OG exemplary drawing
 
1. An integrated circuit, comprising:
a conductive track extending over at least a portion of a periphery of the integrated circuit;
at least one component; and
a test circuit including:
an activation circuit configured to:
divert an input data signal, that carries data for the at least one component, to the conductive track during a test mode; and
send the input data signal to the at least one component during an operating mode.