LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 10th DAY OF November, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
E. I. du Pont de Nemours and Company: See--
Farneth, William E.; Damore, Michael B.; and Harmer, Mark Andrew
07615293 Cl. 429-12.
Lee, I-Hwa; McKenna, James Michael; and Narumanchi, Raghuram
07615270 Cl. 428-35.2.
E. J. Brooks Company: See--
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George
07616116 Cl. 340-571.
E.I. du Pont de Nemours and Company: See--
Caimi, Perry G.; Chen, Mario W.; Nagarajan, Vasantha; Tomb, Jean-Francois; Wang, Siqun; and Zhang, Yuying
07615365 Cl. 435-200.
Mehdizadeh, Mehrdad
07616076 Cl. 333-24R.
E.T.C. Epitaxial Technology Center SRL: See--
Maccalli, Giacomo Nicolao; Valente, Gianluca; Kordina, Olle; Preti, Franco; and Crippa, Danilo
07615121 Cl. 118-728.
E2V Semiconductors: See--
Fritsch, Lionel; and Cambou, Pierre
07615414 Cl. 438-113.
Eagan, Shaun: See--
Beish, Phillip; Eagan, Shaun; and Levenkov, Alexei
07617074 Cl. 702-187.
Eager, Terrin: See--
Li, Yalun; Wang, Chen; and Eager, Terrin
07616586 Cl. 370-252.
Easom, Bruce H.: See--
Burlatsky, Sergei F.; Gottung, Eric J.; Vedula, Venkata R.; Sloan, Michael A.; Nardone, Vincent C.; Easom, Bruce H.; Smolensky, Leo A.; and Berry, Mark S.
07615107 Cl. 96-57.
Eastman Chemical Company: See--
Lin, Robert; and O'Meadhra, Ruairi Seosamh
07615663 Cl. 562-485.
Puckette, Thomas Allen; and Hampton, Jr., Kenneth Wayne
07615671 Cl. 568-864.
Eastman Kodak Company: See--
Border, John N.; Bietry, Joseph R.; and Compton, John T.
07616393 Cl. 359-834.
Liang, Rongguang; Mi, Xiang-Dong; and Kessler, David
07616881 Cl. 396-175.
Nakajima, Yukio; Ogawa, Satoru; and Toyoda, Kenji
07616883 Cl. 396-263.
Parulski, Kenneth A.; and Malloy Desormeaux, Stephen G.
07616248 Cl. 348-333.11.
Suchy, Donna P.; and Herrick, Diane M.
07616917 Cl. 399-223.
Eaton Corporation: See--
Dell'Eva, Mark Louis; Green, Timothy John; and Herbert, David Edward
07614307 Cl. 73-714.
Jur, Arthur J.; Oneufer, Stephen W.; Miller, Phillip D.; and Taylor, Douglas V.
07614895 Cl. 439-213.
Lathrop, Todd M.; and Wehrli, Jonathan A.
07615888 Cl. 307-64.
Luebke, Charles J.; and Juds, Mark A.
07616432 Cl. 361-631.
Moore, Stanley E.; Rowell, Amy W.; and Abrahamsen, Michael H.
07616431 Cl. 361-611.
Seff, Paul D.; Brooks, Alston G.; and Nailler, Gregory S.
07614143 Cl. 29-832.
Ebata, Jun; to Ricoh Company, Ltd. Information providing device, method, program and recording medium, and user authentication device, method, program and recording medium
07617399 Cl. 713-185.
eBay, Inc.: See--
Sharma, Anoop; Korlipara, Ramu; and Nguyen, Binh
07617486 Cl. 717-125.
Ebbenga, Mark Rope tensioner for winch
07614608 Cl. 254-278.
Ebbinghaus, Karlheinz: See--
Ebeling, Welf; Ebbinghaus, Karlheinz; Mercker, Edzard; and Meyer, Oliver
07614291 Cl. 73-116.07.
Ebeling, Welf; Ebbinghaus, Karlheinz; Mercker, Edzard; and Meyer, Oliver, to Bayerische Motoren Werke Aktiengesellschaft Test bed and method for aerodynamic measurements on an object
07614291 Cl. 73-116.07.
Eberhardy, Peter: See--
Baumgartner, Patrick; Sol, Alisson A. S.; Eberhardy, Peter; Wang, Luming; Yang, Mark; and Shahnawaz, Amer
07617221 Cl. 707-10.
Ebied, Amer: See--
Puskas, Judit E.; Ebied, Amer; Lamperd, Barry; and Kumar, Bhuwneesh
07614349 Cl. 102-517.
Ebisawa, Yoshimitsu; to Kabushiki Kaisha Toshiba Telephone exchange apparatus and control method for telephone exchange apparatus
07616626 Cl. 370-357.
ECEBS Limited: See--
Hochfield, Barry Sim; and Breslin, Anthony
07617528 Cl. 726-20.
Ecker, Friedrich: See--
Zikeli, Stefan; and Ecker, Friedrich
07614864 Cl. 425-71.
Eckert, Günther Oskar; to Koenig & Bauer Aktiengesellschaft Methods for the compensation of a transverse elongation and/or longitudinal elongation of a printing material and printing press with several printing couples generating at least one printed image on a printing material
07614343 Cl. 101-486.
Eckert, Helmut: See--
Loibner, Hans; and Eckert, Helmut
07615226 Cl. 424-184.1.
Eckstein, Wolfgang; to Atmel Automotive GmbH Power supply circuit for producing a reference current with a prescribable temperature dependence
07616050 Cl. 327-538.
Ecolab Inc.: See--
Mehus, Richard J.; and Hodge, Charles A.
07615122 Cl. 134-36.
Ecole Polytechnique: See--
Dine, Sébastien; Jolly, Jacques; and Larour, Jean Bernard Pierre
07615985 Cl. 324-72.5.
Ecole Polytechnique Federale de Lausanne: See--
Faupel, Michel D.; Girault, Hubert H.; Reymond, Frederic; Ros, Alexandra; and Rossier, Joel Stephane
07615354 Cl. 435-7.1.
Ecole Polytechnique Fédérale de Lausanne (EPFL) CM - Ecublens: See--
Flierl, Markus; and Vandergheynst, Pierre
07616824 Cl. 382-240.
Edelman, Bradley; Gay, Jonathan; Lozben, Slavik; Cheng, Stephen; and Shetty, Pritham, to Adobe Systems Incorporated Client controllable server-side playlists
07617278 Cl. 709-204.
Edelstein, Daniel C.; Demos, Alexandros; Gates, Stephen M.; Grill, Alfred; Molis, Steven E.; Nguyen, Vu Ngoc Tran; Reiter, Steven; Restaino, Darryl D.; and Yim, Kang Sub, to International Business Machines Corporation Structure and method for porous SiCOH dielectric layers and adhesion promoting or etch stop layers having increased interfacial and mechanical strength
07615482 Cl. 438-627.
Eden, J. Gary; Park, Sung-Jin; Tchertchian, Paul A.; and Sung, Seung Hoon, to Board of Trustees of the University of Illinois, The Low voltage microcavity plasma device and addressable arrays
07615926 Cl. 313-582.
Eder, Jörg: See--
Bollbuck, Birgit; DenholmMritain, Alastair; Eder, Jörg; Hersperger, René; Janser, Philipp; Révész, Lászlo; Schlapbach, Achim; and Wálchi, Rudolf
07615562 Cl. 514-275.
Edsall, Thomas J.: See--
Lee, Scott S.; Dutt, Dinesh G.; and Edsall, Thomas J.
07616637 Cl. 370-394.
Edwards, Jayme; to Rockwell Automation Technologies, Inc. Internet object based remote operation of an industrial controller
07617277 Cl. 709-203.
Edwards Limited: See--
Schofield, Nigel Paul
07614844 Cl. 415-90.
Edwards, Matthew; to Carolina Stair Supply, Inc. Adjustable baluster system
07614612 Cl. 256-67.
Egami, Tsuneyuki; and Kawakami, Keiichi, to DENSO Corporation Control apparatus and method for electric vehicles
07615943 Cl. 318-139.
Egger, Andreas: See--
Hainzl, Josef; Stiegler, Christian; Spiesberger, Franz; Egger, Andreas; Diermaier, Franz; and Dullinger, Walter
07614353 Cl. 111-199.
Egger, Christoph: See--
Francesconi, Christian; Egger, Christoph; Klausner, Johann; and Gruber, Friedrich
07615914 Cl. 313-140.
Eggert, Uwe; Heim, Heiko; Kollmann, Martin; and Schneier, Jochen, to FTE automotive GmbH End section of a fluid line with molded-on push-in fitting
07614666 Cl. 285-321.
Eglauer, Heribert: See--
Streit, Wolfgang; Wenczel, Gyoergy; Lamprecht, Waltraud; and Eglauer, Heribert
07615370 Cl. 435-287.2.
Eglin, Paul: See--
Astruc, Joel; and Eglin, Paul
07616130 Cl. 340-946.
Egolf, Stephen R.; to BFS Diversified Products, LLC Directional stabilizer ring and fluid spring assembly including same
07614615 Cl. 267-64.19.
Eguchi, Hiroyuki: See--
Shimizu, Motohiro; Takaishi, Toshimitsu; and Eguchi, Hiroyuki
07615878 Cl. 290-10.
Eguchi, Ken: See--
Nakakubo, Toru; Eguchi, Ken; and Watanabe, Mitsuhiro
07615301 Cl. 429-34.
Ehnebuske, David L.: See--
Stern, Edith H.; and Ehnebuske, David L.
07617422 Cl. 714-54.
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George, to E. J. Brooks Company Electronic tamper evident seal
07616116 Cl. 340-571.
Ehrfeld, Wolfgang; and Weber, Lutz, to Institut fur Mikrotechnik Mainz GmbH Storage magazine for microstructured molded parts and fabrication procedure
07615274 Cl. 428-172.
Ehrnsperger, Eric C.: See--
Deshmukh, Subodh S.; Ali, Kadum; Diorio, Christopher R.; Dulin, Wendy; Ehrnsperger, Eric C.; Fawzi, Mahdi B.; and Shah, Syed Muzafar
07615551 Cl. 514-230.5.
Eichenberger Gewinde AG: See--
Eigler, Neal L.: See--
Mann, Brian; Whiting, James S.; and Eigler, Neal L.
07616991 Cl. 607-9.
Eiko Epson Corporation: See--
Kinoshita, Shuzo; Tokunaga, Yukio; Horai, Masako; Onishi, Hiroyuki; and Shibatani, Masaya
07615266 Cl. 428-32.33.
Einberg, Fredrik: See--
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George
07616116 Cl. 340-571.
Eiriksson, Asgeir Thor; and Noureddine, Wael, to Chelsio Communications, Inc. Method to implement an L4-L7 switch using split connections and an offloading NIC
07616563 Cl. 370-230.
Eisner, Edward C.: See--
Vanderberg, Bo H.; Rathmell, Robert D.; and Eisner, Edward C.
07615763 Cl. 250-492.21.
Ekl, Randy L.: See--
Pandey, Aparna; Ekl, Randy L.; and Ware, Christopher G.
07616617 Cl. 370-338.
El-Kareh, Badih: See--
Trogolo, Joe R.; Yasuda, Hiroshi; El-Kareh, Badih; and Steinmann, Philipp
07615425 Cl. 438-186.
El-Malki, EL-Mekki: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M.
07615509 Cl. 502-185.
Elcomax Membranes GmbH: See--
Haufe, Stefan; Reiche, Annette; Kiel, Suzana; Maehr, Ulrich; and Melzner, Dieter
07615306 Cl. 429-35.
Elder, Danny S.; and Sekunda, Janusz, to Alcan International, Ltd. Process of producing overhead transmission conductor
07615127 Cl. 148-688.
Eldridge, Benjamin N.; Khandros, Igor Y.; and Sporck, A. Nicholas, to FormFactor, Inc. Probe card assembly and kit
07616016 Cl. 324-754.
Electro Industries/Gauge Tech: See--
Kagan, Erran; Banhegyesi, Tibor; and Cohen, Avi
07616433 Cl. 361-664.
Electro Scientific Industries, Inc.: See--
Grant, Keith; Stone, Steve; and Nilsen, Brady
07616669 Cl. 372-10.
Electrolux Home Care Products, Inc.: See--
Sepke, Arnold; Bolkan, Steven A.; and Ashley, Raymond F.
07615109 Cl. 96-222.
Electron Industries / Gauge Tech: See--
Wang, Wei; and Slota, Fred
07616656 Cl. 370-463.
Electronics and Telecommunications Research Institute: See--
Ahn, Joon Tae; Seo, Hong-Seok; and Park, Bong Je
07616668 Cl. 372-6.
Kim, Pan-Soo; Song, Yun-Jeoug; Kim, Byoung-Hak; Oh, Deock-Gil; and Lee, Ho-Jin
07616710 Cl. 375-334.
Koo, Ki Jong; and Hwang, Dae Hwan
07616612 Cl. 370-336.
Moon, Hwa Shin; Yi, Sungwon; Oh, Jintae; Jang, Jong Soo; and Kim, Changhoon
07617231 Cl. 707-101.
Park, Jung Woo; and Kim, Cheon Soo
07616056 Cl. 330-69.
Element CXI, LLC: See--
Kelem, Steven Hennick; Cummins, Jaime C.; Watson, John L.; Plunkett, Robert; Wasson, Stephen L.; Box, Brian A.; Wein, Enno; and Furciniti, Charles A.
07616024 Cl. 326-9.
Elhardt, Paul M.; and Lewis, Franklin P., to Deere & Company Mower deck lift system with transport lock
07614207 Cl. 56-17.1.
Eli Lilly and Company: See--
Franciskovich, Jeffry Bernard; Herron, David Kent; Linebarger, Jared Harris; Marquart, Angela Lynn; Masters, John Joseph; Mendel, David; Merritt, Leander; Ratz, Andrew Michael; Smith, Gerald Floyd; Weigel, Leland Otto; Wiley, Michael Robert; and Yee, Ying Kwong
07615568 Cl. 514-352.
Harris, John Richard; Clark, Barry Peter; Gallagher, Peter Thaddeus; and Whatton, Maria Ann
07615648 Cl. 548-566.
Elias, Hans; to IGT Gaming device having multiple interacting rotators and translating indicator
07614952 Cl. 463-20.
Eliasson, Matts; to Inspection Machinery (No 2) Pty Ltd. Apparatus and method for testing flexible packages for defects
07614282 Cl. 73-49.3.
Elisseeff, André: See--
Ben-Hur, Asa; Elisseeff, André; Chapelle, Olivier; and Weston, Jason Aaron Edward
07617163 Cl. 706-12.
Elkhatib, Hecham K.: See--
Mendenhall, David W.; Elkhatib, Hecham K.; and Miklinski, Jr., Richard
07614883 Cl. 439-66.
Elks, Jeff: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M.
07615509 Cl. 502-185.
Ellefson, Shawn; and Schatz, Warren, to Clark Equipment Company Lift arm assembly with integrated cylinder stop
07614842 Cl. 414-680.
Ellerbrock, Philip J.; Konz, Daniel W.; and Watts, Marshall, to Boeing Company, The System and method for preloading a bus controller with command schedule
07617330 Cl. 709-253.
Ellingsen, Reinold: See--
Hjelme, Dag Roar; Aune, Oddvar; Falch, Berit; Ostling, Dan; and Ellingsen, Reinold
07616844 Cl. 385-12.
Elliott, Brig Barnum; to Verizon Corporate Services Group, Inc. Method and apparatus for information dissemination
07616663 Cl. 370-474.
Elliott, Roger James: See--
Schwabe, Nikolai Franz Gregor; Heide, Carsten; and Elliott, Roger James
07616478 Cl. 365-173.
Ellis, Duane: See--
Knowles, C. Harry; Zhu, Xiaoxun; Good, Timothy; Xian, Tao; Kotlarsky, Anatoly; Veksland, Michael; Hernandez, Mark; Gardner, John; Essinger, Steven; Giordano, Patrick; Kearney, Sean; Schmidt, Mark; Furlong, John; Ciarlante, Nicholas; Liu, Yong; Ren, Jie; Tao, Xi; Liu, JiBin; Zhuo, Ming; and Ellis, Duane
07614560 Cl. 235-462.42.
Elmasry, George F.; and McCann, C. John, to General Dynamics C4 Systems Call admission control/session management based on N source to destination severity levels for IP networks
07616572 Cl. 370-235.
Elpelt, Rudolf; Mitlehner, Heinz; and Schörner, Reinhold, to SiCED Electronics Development GmbH & Co. KG Semiconductor structure comprising a highly doped conductive channel region and method for producing a semiconductor structure
07615802 Cl. 257-135.
Elpida Memory, Inc.: See--
Shibamoto, Masanori; Yamaguchi, Masahiro; and Kanda, Naoya
07615870 Cl. 257-777.
Elsenhans, Olivier: See--
Dual, Jürg; Elsenhans, Olivier; and May, Frank
07615378 Cl. 436-180.
Elushik, Richard D.: See--
Johnson, Ross S.; Wilson, Harold R.; Borgman, Randy; Elushik, Richard D.; Crow, Derek D.; and Emery, Dave
07614896 Cl. 439-215.
Elward Systems Corporation: See--
Mitchell, Everett Lee
07614191 Cl. 52-235.
EMC Corporation: See--
Bjornsson, Magnus E.; Yu, Rong; Kopylovitz, Haim; and Meiri, David
07617372 Cl. 711-167.
Fridella, Stephen A.; Jiang, Xiaoye; Faibish, Sorin; and Forecast, John
07617216 Cl. 707-10.
Zhang, Chao; and Frey, Robert Tower
07617365 Cl. 711-141.
Emcore Corporation: See--
Lau, Edmond Warming; Wang, Xiaozhong; and Mosebar, Robert Lewis
07614800 Cl. 385-92.
Emerson Electronic Co.: See--
Fei, Renyan W.; and Xu, Yanguang
07615907 Cl. 310-218.
Emery, Dave: See--
Johnson, Ross S.; Wilson, Harold R.; Borgman, Randy; Elushik, Richard D.; Crow, Derek D.; and Emery, Dave
07614896 Cl. 439-215.
Emma, Philip George; to International Business Machines Corporation Method for achieving very high bandwidth between the levels of a cache hierarchy in 3-dimensional structures, and a 3-dimensional structure resulting therefrom
07616470 Cl. 365-129.
Emmitte, Kyle Allen: See--
Kuntz, Kevin; Emmitte, Kyle Allen; Rheault, Tara Renae; Smith, Stephon; Hornberger, Keith; Dickson, Hamilton; and Cheung, Mui
07615643 Cl. 548-304.7.
Emmons, David James: See--
Tanner, John D.; Emmons, David James; and Riedel, Richard P.
07615152 Cl. 210-257.1.
EMS Technologies, Inc.: See--
Sorenson, Jr., Richard W.; Son, Ernest Lee; Wiesner, Paul Edward; Roeder, William H.; and Clott, Michael Sayre
07616127 Cl. 340-693.9.
Enablence USA FTTX Networks Inc.: See--
Farmer, James O.; Brown, Alan M.; Kenny, John J.; and Thomas, Stephen
07616901 Cl. 398-159.
Enami, Takashi: See--
Kato, Shinji; Hasegawa, Shin; Ishibashi, Hitoshi; Fujimori, Kohta; Takeuchi, Nobutaka; Ariizumi, Osamu; Watanabe, Naoto; Tanaka, Kayoko; Hirayama, Yushi; Kobayashi, Kazumi; Kobayashi, Shinji; Uchida, Fukutoshi; Enami, Takashi; and Morimoto, Ryohta
07616909 Cl. 399-49.
Endeca Technologies, Inc.: See--
Ferrari, Adam; Gourley, David; Johnson, Keith; Knabe, Frederick; Lau, Andrew; Mohta, Vinay; Tunkelang, Daniel; and Walter, John
07617184 Cl. 707-3.
Endo, Hiroshi; to Fujifilm Corporation Image-taking apparatus
07616874 Cl. 396-61.
Endo, Hiroyuki: See--
Nomura, Takumi; Ueda, Hiromi; Makino, Kunitetsu; Kasai, Hiroyuki; Tsuboi, Toshinori; Kurokawa, Hiroaki; Kobayashi, Hirokazu; and Endo, Hiroyuki
07616899 Cl. 398-154.
Endo, Kimitaka: See--
Nakayama, Jouji; Yamamoto, Tetsuya; Shimokura, Ken-ichiro; Yabuuchi, Tsutomu; Endo, Kimitaka; and Imaeda, Takashi
07617238 Cl. 707-103.
Endo, Michio; to Hoya Corporation Optical glass, press-molding glass gob and optical element
07615507 Cl. 501-50.
Endo, Seiichiro: See--
Hirau, Tsutomu; Endo, Seiichiro; and Kamino, Kazuya
07614966 Cl. 473-376.
Endo, Shigeru; and Sato, Kenji, to TS Tech Co., Ltd. Passenger's weight measurement device for vehicle seat
07614680 Cl. 296-68.1.
Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KG: See--
Pechstein, Torsten; and Kirsten, Lars
07615140 Cl. 204-416.
Endress & Hauser Flowtec AG: See--
Rieder, Alfred; Wiest, Achim; Strunz, Torsten; and Bezdek, Michal
07614309 Cl. 73-861.27.
Energy & Environmental Research Foundation: See--
Holmes, Michael J.; Pavlish, John H; Olson, Edwin S.; and Zhuang, Ye
07615101 Cl. 95-107.
Enermax Technology Corporation: See--
Engel, Klaus; to Siemens Medical Solutions USA, Inc. System and method for interleaved slice volume rendering
07616199 Cl. 345-419.
Engel, Thomas: See--
Baumann, Heinz; Engel, Thomas; Friedrich, Gerhard; Hecht, Martin; and Nögel, Peter
07614786 Cl. 378-195.
Engels, Frank Peter: See--
Sickert, Dirk; Engels, Frank Peter; and Odenthal, Frank
07614317 Cl. 74-422.
Enkemann, Steven Alan: See--
Riker, Adam I.; and Enkemann, Steven Alan
07615349 Cl. 435-6.
Enplas Corporation: See--
Enthone Inc.: See--
Chen, Qingyun; Valverde, Charles; Paneccasio, Vincent; Petrov, Nicolai; Stritch, Daniel; Witt, Christian; and Hurtubise, Richard
07615491 Cl. 438-678.
Entorian Technologies, LP: See--
Wehrly, Jr., James Douglas; Goodwin, Paul; and Rapport, Russell
07616452 Cl. 361-803.
EPCOS AG: See--
Tikka, Pasi; Stömmer, Ralph; Schmidhammer, Edgar; and Unterberger, Michael
07616079 Cl. 333-189.
Epistar Corporation: See--
Lu, Chih-Chiang; Huang, Ling-Chin; Wang, Jen-Shul; Liu, Wen-Huang; and Hsieh, Min-Hsun
07615796 Cl. 257-98.
Yen, Shih-Nan; Chiu, Jung-Tu; Shen, Yu-Jiun; and Tsai, Ching-Fu
07615773 Cl. 257-14.
Equistar Chemicals, LP: See--
Devakottai, Bala S.; Kiballa, Anthony R.; Swanson, John A.; and Mistry, Pinakin B.
07615144 Cl. 208-132.
Equitz, William H.: See--
Nunnink, Laurens; Equitz, William H.; and Gerst, Carl W.
07614563 Cl. 235-473.
Erb, Andreas: See--
Forgatsch, Oliver; and Erb, Andreas
07614694 Cl. 297-284.2.
Erb, Christina: See--
Hendrix, Martin; Bärfacker, Lars; Erb, Christina; Hafner, Frank-Thorsten; Heckroth, Heike; Karthaus, Dagmar; Tersteegen, Adrian; van der Staay, Franz-Josef; and van Kampen, Marja
07615558 Cl. 514-262.1.
Erdman, Joseph L. Scalable call center telecommunications system
07616757 Cl. 379-266.07.
Ergun, Arif Sanli: See--
Khuri-Yakub, Burtis; Ergun, Arif Sanli; Yaralioglu, G. Göksenin; Huang, Yongli; and Hansen, Sean
07615834 Cl. 257-416.
Ericsson Inc.: See--
Erignac, Charles A: See--
Wan, Ming; Murray, Paul; and Erignac, Charles A
07616590 Cl. 370-256.
Eriguchi, Takuya: See--
Kudo, Yasuyuki; Akai, Akihito; Eriguchi, Takuya; Okado, Kazuo; and Aizawa, Hiroki
07616221 Cl. 345-690.
Eriksson, Ann-Christine; Collins, Sandra; and Backlund, Ingemar, to Telefonaktiebolaget L M Ericsson (PUBL) Data preservation
07616607 Cl. 370-331.
Erker, Brad: See--
Veldboom, Lance; and Erker, Brad
07615693 Cl. 800-320.1.
Erlandsson, Eva: See--
Forsberg, Goran; Erlandsson, Eva; Antonsson, Per; and Walse, Bjorn
07615225 Cl. 424-183.1.
Erol, Berna; Hull, Jonathan J.; and Lee, Dar-Shyang, to Ricoh Company, Ltd. Techniques for using an image for the retrieval of television program information
07616840 Cl. 382-305.
Eromäki, Marko; to Nokia Corporation Single motor/actuator for adjusting two assemblies
07616255 Cl. 348-360.
Eronen, Pasi: See--
Haverinen, Henry; and Eronen, Pasi
07617524 Cl. 726-6.
Ersheid, Ali: See--
Light, Elliott D.; and Ersheid, Ali
07617125 Cl. 705-26.
Esche, Jr., Carl K.; Dudding, Christopher J.; Growcott, Peter; Fagan, Anthony; and Robertson, Andrew, to Afton Chemical Corporation Additives and lubricant formulations for improved antiwear properties
07615519 Cl. 508-165.
Esche, Jr., Carl K.; to Afton Chemical Corporation Additives and lubricant formulations for improved antioxidant properties
07615520 Cl. 508-165.
Eshbaugh, Jonathan P.: See--
Gardner, Paul D.; and Eshbaugh, Jonathan P.
07614280 Cl. 73-40.
Esmaili, Gholamreza: See--
Chakrabarti, Sibaprasad; Hiti, Silva; John, George; Smith, Gregory S.; Perisic, Milun; and Esmaili, Gholamreza
07616466 Cl. 363-132.
Espinasse, Philippe: See--
Dupoiron, Francois; and Espinasse, Philippe
07615124 Cl. 148-529.
Espy, Mark J: See--
Smith, Thomas F.; and Espy, Mark J
07615352 Cl. 435-6.
Essilor International (Compagnie Generale d'Optique): See--
Freson, David; and Cailloux, Jean-François
07614527 Cl. 222-380.
Essinger, Steven: See--
Knowles, C. Harry; Zhu, Xiaoxun; Good, Timothy; Xian, Tao; Kotlarsky, Anatoly; Veksland, Michael; Hernandez, Mark; Gardner, John; Essinger, Steven; Giordano, Patrick; Kearney, Sean; Schmidt, Mark; Furlong, John; Ciarlante, Nicholas; Liu, Yong; Ren, Jie; Tao, Xi; Liu, JiBin; Zhuo, Ming; and Ellis, Duane
07614560 Cl. 235-462.42.
Estenfelder, Marvin: See--
Guckel, Christian; Dialer, Harald; Estenfelder, Marvin; and Pitschi, Werner
07615513 Cl. 502-350.
Esveld, Erik; Hamoen, Remco; and Hoogland, Hans, to CONOPCO, Inc. Apparatus and method for mixing components
07614781 Cl. 366-275.
ETHERTRONICS, Inc.: See--
Krier, Mark; Thornwall, Shane; Rowson, Sebastian; and Desclos, Laurent
07616164 Cl. 343-783.
Ethicon Endo-Surgery, Inc: See--
Sixto, Jr., Robert; Kortenbach, Juergen A.; and Smith, Kevin W.
07615058 Cl. 606-142.
Ethicon Endo-Surgery, Inc.: See--
Jambor, Kristin L.; and Wiley, Jeffrey P.
07615001 Cl. 600-37.
Stefanchik, David; and Applegate, Rick D.
07615003 Cl. 600-104.
Stefanchik, David; Linenkugel, Duane A.; Bakos, Gregory J.; Vakharia, Omar J.; Craft, James A.; and Bally, Kurt R.
07615005 Cl. 600-106.
Stokes, Michael J.; and Ortiz, Mark S.
07615060 Cl. 606-145.
Stokes, Michael J.; Ortiz, Mark S.; and Shelton, IV, Frederick E.
07615004 Cl. 600-104.
Ethicon Inc.: See--
Priewe, Jörg; Hartkop, Birgit; Schuldt-Hempe, Barbara; Walther, Christoph; and Holste, Jörg
07615065 Cl. 606-154.
Ethington, Jon: See--
Liu, Xinbing; and Ethington, Jon
07614831 Cl. 407-113.
Eto, Keita; to Nintendo Co., Ltd. Storage medium having game program stored thereon and game apparatus
07614945 Cl. 463-9.
Eudyna Devices Inc.: See--
Ono, Haruyoshi; and Sugawara, Hidemitsu
07614801 Cl. 385-93.
Eun, Hyung-Lae; to Samsung Electronics Co., Ltd. Stacked-type semiconductor device package
07615858 Cl. 257-686.
Eurocopter: See--
Astruc, Joel; and Eglin, Paul
07616130 Cl. 340-946.
Evans, Daniel D. Conduit retainer apparatus
07614828 Cl. 405-184.4.
Evans, Scott: See--
Ayton, Ian; Evans, Scott; and Nguyen, Tuan
07615056 Cl. 606-107.
Evarts, Jeffrey D.: See--
Antony, Felix F.; Kaufman, Donald; Yang, Weiling; and Evarts, Jeffrey D.
07617133 Cl. 705-27.
Eveland, Renee A.; Koch, Frederick W.; Wilby, Robert Ian; Carrick, Virginia A.; Abraham, William D.; Lamb, Gordon D.; and Pudelski, John K., to Lubrizol Corporation, The Mixed dispersants for lubricants
07615521 Cl. 508-228.
Even-Zur, Ronen: See--
Cohen, Yossef; Galperin, Noam; and Even-Zur, Ronen
07616684 Cl. 375-232.
Everitt, Cass W.: See--
Molnar, Steven E.; French, Mark J.; Everitt, Cass W.; Weitkemper, Adam Clark; Keslin, Phillip; Anderson, David L.; and Lynch, George R.
07616209 Cl. 345-545.
Everlight Electronics Co., Ltd.: See--
Wen, Chung-Han; and Liu, Pang-Yen
07616184 Cl. 345-102.
Evers, Holger: See--
Gerlach, Till; Evers, Holger; and Melder, Johann-Peter
07615665 Cl. 564-463.
Evers Smith, Linda; Cabell, David William; Mackey, Larry Neil; Gordon, Gregory Charles; Trokhan, Paul Dennis; and DeBruler, Tedi-Lea Anne, to Proctor & Gamble Company, The Fibrous structures comprising a polymer structure
07615278 Cl. 428-221.
Everson, John Michael: See--
Bertz, Lyle Thomas; Rogers, Frederick Carl; Everson, John Michael; Pinney, Keith; and Cerda, Jr., Salvador
07617336 Cl. 710-8.
Eves, David A.; and Cole, Richard S., to Koninklijke Philips Electronics N.V. Controlling ambient light as a function of a video signal
07616262 Cl. 348-553.
Evonik Degussa GmbH: See--
Lortz, Wolfgang; Lach, Heinz; and Von Seyerl, Joachim
07615577 Cl. 516-90.
Evonik Stockhausen, Inc.: See--
Joy, Mark C.; and Hsu, Whei-Neen
07615579 Cl. 521-72.
Excedra Technology, LLC: See--
Exica, Inc.: See--
Sabadicci, Rio; and Nelson, Larry D.
07614614 Cl. 261-76.
ExxonMobil Chemical Patents Inc.: See--
Chen, Tan-Jen; Keusenkothen, Paul F.; Wu, J. Jason; Buchanan, John Scott; Cao, Guang; Iaccino, Larry L.; Stern, David L.; and Vincent, Matthew J.
07615143 Cl. 208-120.01.
Westwood, Alistair D.; Devorest, Yann; Jourdain, Eric P.; Georjon, Olivier; Chapman, Bryan R.; Bulawa, Michael C.; and Lundmark, Bruce R.
07615589 Cl. 524-474.
ExxonMobil Research and Engineering Company: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M.
07615509 Cl. 502-185.
EZM, Inc.: See--
O'Connor, Charles S.
07614628 Cl. 280-37.