LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 10th DAY OF November, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

E. I. du Pont de Nemours and Company: See--
Farneth, William E.; Damore, Michael B.; and Harmer, Mark Andrew 07615293 Cl. 429-12.
Lee, I-Hwa; McKenna, James Michael; and Narumanchi, Raghuram 07615270 Cl. 428-35.2.
E. J. Brooks Company: See--
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George 07616116 Cl. 340-571.
E.I. du Pont de Nemours and Company: See--
Caimi, Perry G.; Chen, Mario W.; Nagarajan, Vasantha; Tomb, Jean-Francois; Wang, Siqun; and Zhang, Yuying 07615365 Cl. 435-200.
Mehdizadeh, Mehrdad 07616076 Cl. 333-24R.
E.T.C. Epitaxial Technology Center SRL: See--
Maccalli, Giacomo Nicolao; Valente, Gianluca; Kordina, Olle; Preti, Franco; and Crippa, Danilo 07615121 Cl. 118-728.
E2V Semiconductors: See--
Fritsch, Lionel; and Cambou, Pierre 07615414 Cl. 438-113.
Eagan, Shaun: See--
Beish, Phillip; Eagan, Shaun; and Levenkov, Alexei 07617074 Cl. 702-187.
Eager, Terrin: See--
Li, Yalun; Wang, Chen; and Eager, Terrin 07616586 Cl. 370-252.
Easom, Bruce H.: See--
Burlatsky, Sergei F.; Gottung, Eric J.; Vedula, Venkata R.; Sloan, Michael A.; Nardone, Vincent C.; Easom, Bruce H.; Smolensky, Leo A.; and Berry, Mark S. 07615107 Cl. 96-57.
Eastman Chemical Company: See--
Lin, Robert; and O'Meadhra, Ruairi Seosamh 07615663 Cl. 562-485.
Puckette, Thomas Allen; and Hampton, Jr., Kenneth Wayne 07615671 Cl. 568-864.
Eastman Kodak Company: See--
Border, John N.; Bietry, Joseph R.; and Compton, John T. 07616393 Cl. 359-834.
Kahen, Keith B. 07615800 Cl. 257-103.
Liang, Rongguang; Mi, Xiang-Dong; and Kessler, David 07616881 Cl. 396-175.
Nakajima, Yukio; Ogawa, Satoru; and Toyoda, Kenji 07616883 Cl. 396-263.
Parulski, Kenneth A.; and Malloy Desormeaux, Stephen G. 07616248 Cl. 348-333.11.
Suchy, Donna P.; and Herrick, Diane M. 07616917 Cl. 399-223.
Yuen, William 07614619 Cl. 271-11.
Eaton Corporation: See--
Dell'Eva, Mark Louis; Green, Timothy John; and Herbert, David Edward 07614307 Cl. 73-714.
Jur, Arthur J.; Oneufer, Stephen W.; Miller, Phillip D.; and Taylor, Douglas V. 07614895 Cl. 439-213.
Lathrop, Todd M.; and Wehrli, Jonathan A. 07615888 Cl. 307-64.
Luebke, Charles J.; and Juds, Mark A. 07616432 Cl. 361-631.
Moore, Stanley E.; Rowell, Amy W.; and Abrahamsen, Michael H. 07616431 Cl. 361-611.
Seff, Paul D.; Brooks, Alston G.; and Nailler, Gregory S. 07614143 Cl. 29-832.
Yan, Jiyang 07614214 Cl. 60-286.
Ebata, Jun; to Ricoh Company, Ltd. Information providing device, method, program and recording medium, and user authentication device, method, program and recording medium 07617399 Cl. 713-185.
eBay, Inc.: See--
Sharma, Anoop; Korlipara, Ramu; and Nguyen, Binh 07617486 Cl. 717-125.
Ebbenga, Mark Rope tensioner for winch 07614608 Cl. 254-278.
Ebbinghaus, Karlheinz: See--
Ebeling, Welf; Ebbinghaus, Karlheinz; Mercker, Edzard; and Meyer, Oliver 07614291 Cl. 73-116.07.
Ebeling, Welf; Ebbinghaus, Karlheinz; Mercker, Edzard; and Meyer, Oliver, to Bayerische Motoren Werke Aktiengesellschaft Test bed and method for aerodynamic measurements on an object 07614291 Cl. 73-116.07.
Eberhardy, Peter: See--
Baumgartner, Patrick; Sol, Alisson A. S.; Eberhardy, Peter; Wang, Luming; Yang, Mark; and Shahnawaz, Amer 07617221 Cl. 707-10.
Ebied, Amer: See--
Puskas, Judit E.; Ebied, Amer; Lamperd, Barry; and Kumar, Bhuwneesh 07614349 Cl. 102-517.
Ebisawa, Yoshimitsu; to Kabushiki Kaisha Toshiba Telephone exchange apparatus and control method for telephone exchange apparatus 07616626 Cl. 370-357.
ECEBS Limited: See--
Hochfield, Barry Sim; and Breslin, Anthony 07617528 Cl. 726-20.
Ecker, Friedrich: See--
Zikeli, Stefan; and Ecker, Friedrich 07614864 Cl. 425-71.
Eckert, Günther Oskar; to Koenig & Bauer Aktiengesellschaft Methods for the compensation of a transverse elongation and/or longitudinal elongation of a printing material and printing press with several printing couples generating at least one printed image on a printing material 07614343 Cl. 101-486.
Eckert, Helmut: See--
Loibner, Hans; and Eckert, Helmut 07615226 Cl. 424-184.1.
Eckstein, Wolfgang; to Atmel Automotive GmbH Power supply circuit for producing a reference current with a prescribable temperature dependence 07616050 Cl. 327-538.
Ecolab Inc.: See--
Mehus, Richard J.; and Hodge, Charles A. 07615122 Cl. 134-36.
Ecole Polytechnique: See--
Dine, Sébastien; Jolly, Jacques; and Larour, Jean Bernard Pierre 07615985 Cl. 324-72.5.
Ecole Polytechnique Federale de Lausanne: See--
Faupel, Michel D.; Girault, Hubert H.; Reymond, Frederic; Ros, Alexandra; and Rossier, Joel Stephane 07615354 Cl. 435-7.1.
Ecole Polytechnique Fédérale de Lausanne (EPFL) CM - Ecublens: See--
Flierl, Markus; and Vandergheynst, Pierre 07616824 Cl. 382-240.
Edelman, Bradley; Gay, Jonathan; Lozben, Slavik; Cheng, Stephen; and Shetty, Pritham, to Adobe Systems Incorporated Client controllable server-side playlists 07617278 Cl. 709-204.
Edelstein, Daniel C.; Demos, Alexandros; Gates, Stephen M.; Grill, Alfred; Molis, Steven E.; Nguyen, Vu Ngoc Tran; Reiter, Steven; Restaino, Darryl D.; and Yim, Kang Sub, to International Business Machines Corporation Structure and method for porous SiCOH dielectric layers and adhesion promoting or etch stop layers having increased interfacial and mechanical strength 07615482 Cl. 438-627.
Eden, J. Gary; Park, Sung-Jin; Tchertchian, Paul A.; and Sung, Seung Hoon, to Board of Trustees of the University of Illinois, The Low voltage microcavity plasma device and addressable arrays 07615926 Cl. 313-582.
Eder, Jörg: See--
Bollbuck, Birgit; DenholmMritain, Alastair; Eder, Jörg; Hersperger, René; Janser, Philipp; Révész, Lászlo; Schlapbach, Achim; and Wálchi, Rudolf 07615562 Cl. 514-275.
Edsall, Thomas J.: See--
Lee, Scott S.; Dutt, Dinesh G.; and Edsall, Thomas J. 07616637 Cl. 370-394.
Edwards, Jayme; to Rockwell Automation Technologies, Inc. Internet object based remote operation of an industrial controller 07617277 Cl. 709-203.
Edwards Limited: See--
Schofield, Nigel Paul 07614844 Cl. 415-90.
Edwards, Matthew; to Carolina Stair Supply, Inc. Adjustable baluster system 07614612 Cl. 256-67.
Egami, Tsuneyuki; and Kawakami, Keiichi, to DENSO Corporation Control apparatus and method for electric vehicles 07615943 Cl. 318-139.
Egger, Andreas: See--
Hainzl, Josef; Stiegler, Christian; Spiesberger, Franz; Egger, Andreas; Diermaier, Franz; and Dullinger, Walter 07614353 Cl. 111-199.
Egger, Christoph: See--
Francesconi, Christian; Egger, Christoph; Klausner, Johann; and Gruber, Friedrich 07615914 Cl. 313-140.
Eggert, Uwe; Heim, Heiko; Kollmann, Martin; and Schneier, Jochen, to FTE automotive GmbH End section of a fluid line with molded-on push-in fitting 07614666 Cl. 285-321.
Eglauer, Heribert: See--
Streit, Wolfgang; Wenczel, Gyoergy; Lamprecht, Waltraud; and Eglauer, Heribert 07615370 Cl. 435-287.2.
Eglin, Paul: See--
Astruc, Joel; and Eglin, Paul 07616130 Cl. 340-946.
Egolf, Stephen R.; to BFS Diversified Products, LLC Directional stabilizer ring and fluid spring assembly including same 07614615 Cl. 267-64.19.
Eguchi, Hiroyuki: See--
Shimizu, Motohiro; Takaishi, Toshimitsu; and Eguchi, Hiroyuki 07615878 Cl. 290-10.
Eguchi, Ken: See--
Nakakubo, Toru; Eguchi, Ken; and Watanabe, Mitsuhiro 07615301 Cl. 429-34.
Ehnebuske, David L.: See--
Stern, Edith H.; and Ehnebuske, David L. 07617422 Cl. 714-54.
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George, to E. J. Brooks Company Electronic tamper evident seal 07616116 Cl. 340-571.
Ehrfeld, Wolfgang; and Weber, Lutz, to Institut fur Mikrotechnik Mainz GmbH Storage magazine for microstructured molded parts and fabrication procedure 07615274 Cl. 428-172.
Ehrnsperger, Eric C.: See--
Deshmukh, Subodh S.; Ali, Kadum; Diorio, Christopher R.; Dulin, Wendy; Ehrnsperger, Eric C.; Fawzi, Mahdi B.; and Shah, Syed Muzafar 07615551 Cl. 514-230.5.
Eichenberger Gewinde AG: See--
Husistein, Kurt 07614318 Cl. 74-424.87.
Eigler, Neal L.: See--
Mann, Brian; Whiting, James S.; and Eigler, Neal L. 07616991 Cl. 607-9.
Eiko Epson Corporation: See--
Kinoshita, Shuzo; Tokunaga, Yukio; Horai, Masako; Onishi, Hiroyuki; and Shibatani, Masaya 07615266 Cl. 428-32.33.
Einberg, Fredrik: See--
Ehrensvard, Jakob; Einberg, Fredrik; Debrody, Robert; Dreisbach, Richard; and Lundberg, George 07616116 Cl. 340-571.
Eiriksson, Asgeir Thor; and Noureddine, Wael, to Chelsio Communications, Inc. Method to implement an L4-L7 switch using split connections and an offloading NIC 07616563 Cl. 370-230.
Eisner, Edward C.: See--
Vanderberg, Bo H.; Rathmell, Robert D.; and Eisner, Edward C. 07615763 Cl. 250-492.21.
Ekl, Randy L.: See--
Pandey, Aparna; Ekl, Randy L.; and Ware, Christopher G. 07616617 Cl. 370-338.
El-Kareh, Badih: See--
Trogolo, Joe R.; Yasuda, Hiroshi; El-Kareh, Badih; and Steinmann, Philipp 07615425 Cl. 438-186.
El-Malki, EL-Mekki: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M. 07615509 Cl. 502-185.
Elcomax Membranes GmbH: See--
Haufe, Stefan; Reiche, Annette; Kiel, Suzana; Maehr, Ulrich; and Melzner, Dieter 07615306 Cl. 429-35.
Elder, Danny S.; and Sekunda, Janusz, to Alcan International, Ltd. Process of producing overhead transmission conductor 07615127 Cl. 148-688.
Eldridge, Benjamin N.; Khandros, Igor Y.; and Sporck, A. Nicholas, to FormFactor, Inc. Probe card assembly and kit 07616016 Cl. 324-754.
Electro Industries/Gauge Tech: See--
Kagan, Erran; Banhegyesi, Tibor; and Cohen, Avi 07616433 Cl. 361-664.
Electro Scientific Industries, Inc.: See--
Grant, Keith; Stone, Steve; and Nilsen, Brady 07616669 Cl. 372-10.
Electrolux Home Care Products, Inc.: See--
Sepke, Arnold; Bolkan, Steven A.; and Ashley, Raymond F. 07615109 Cl. 96-222.
Electron Industries / Gauge Tech: See--
Wang, Wei; and Slota, Fred 07616656 Cl. 370-463.
Electronics and Telecommunications Research Institute: See--
Ahn, Joon Tae; Seo, Hong-Seok; and Park, Bong Je 07616668 Cl. 372-6.
Kim, Pan-Soo; Song, Yun-Jeoug; Kim, Byoung-Hak; Oh, Deock-Gil; and Lee, Ho-Jin 07616710 Cl. 375-334.
Koo, Ki Jong; and Hwang, Dae Hwan 07616612 Cl. 370-336.
Moon, Hwa Shin; Yi, Sungwon; Oh, Jintae; Jang, Jong Soo; and Kim, Changhoon 07617231 Cl. 707-101.
Park, Jung Woo; and Kim, Cheon Soo 07616056 Cl. 330-69.
Element CXI, LLC: See--
Kelem, Steven Hennick; Cummins, Jaime C.; Watson, John L.; Plunkett, Robert; Wasson, Stephen L.; Box, Brian A.; Wein, Enno; and Furciniti, Charles A. 07616024 Cl. 326-9.
Elhardt, Paul M.; and Lewis, Franklin P., to Deere & Company Mower deck lift system with transport lock 07614207 Cl. 56-17.1.
Eli Lilly and Company: See--
Franciskovich, Jeffry Bernard; Herron, David Kent; Linebarger, Jared Harris; Marquart, Angela Lynn; Masters, John Joseph; Mendel, David; Merritt, Leander; Ratz, Andrew Michael; Smith, Gerald Floyd; Weigel, Leland Otto; Wiley, Michael Robert; and Yee, Ying Kwong 07615568 Cl. 514-352.
Harris, John Richard; Clark, Barry Peter; Gallagher, Peter Thaddeus; and Whatton, Maria Ann 07615648 Cl. 548-566.
Elias, Hans; to IGT Gaming device having multiple interacting rotators and translating indicator 07614952 Cl. 463-20.
Eliasson, Matts; to Inspection Machinery (No 2) Pty Ltd. Apparatus and method for testing flexible packages for defects 07614282 Cl. 73-49.3.
Elisseeff, André: See--
Ben-Hur, Asa; Elisseeff, André; Chapelle, Olivier; and Weston, Jason Aaron Edward 07617163 Cl. 706-12.
Elkhatib, Hecham K.: See--
Mendenhall, David W.; Elkhatib, Hecham K.; and Miklinski, Jr., Richard 07614883 Cl. 439-66.
Elks, Jeff: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M. 07615509 Cl. 502-185.
Ellefson, Shawn; and Schatz, Warren, to Clark Equipment Company Lift arm assembly with integrated cylinder stop 07614842 Cl. 414-680.
Ellerbrock, Philip J.; Konz, Daniel W.; and Watts, Marshall, to Boeing Company, The System and method for preloading a bus controller with command schedule 07617330 Cl. 709-253.
Ellingsen, Reinold: See--
Hjelme, Dag Roar; Aune, Oddvar; Falch, Berit; Ostling, Dan; and Ellingsen, Reinold 07616844 Cl. 385-12.
Elliott, Brig Barnum; to Verizon Corporate Services Group, Inc. Method and apparatus for information dissemination 07616663 Cl. 370-474.
Elliott, Roger James: See--
Schwabe, Nikolai Franz Gregor; Heide, Carsten; and Elliott, Roger James 07616478 Cl. 365-173.
Ellis, Duane: See--
Knowles, C. Harry; Zhu, Xiaoxun; Good, Timothy; Xian, Tao; Kotlarsky, Anatoly; Veksland, Michael; Hernandez, Mark; Gardner, John; Essinger, Steven; Giordano, Patrick; Kearney, Sean; Schmidt, Mark; Furlong, John; Ciarlante, Nicholas; Liu, Yong; Ren, Jie; Tao, Xi; Liu, JiBin; Zhuo, Ming; and Ellis, Duane 07614560 Cl. 235-462.42.
Elmasry, George F.; and McCann, C. John, to General Dynamics C4 Systems Call admission control/session management based on N source to destination severity levels for IP networks 07616572 Cl. 370-235.
Elpelt, Rudolf; Mitlehner, Heinz; and Schörner, Reinhold, to SiCED Electronics Development GmbH & Co. KG Semiconductor structure comprising a highly doped conductive channel region and method for producing a semiconductor structure 07615802 Cl. 257-135.
Elpida Memory, Inc.: See--
Shibamoto, Masanori; Yamaguchi, Masahiro; and Kanda, Naoya 07615870 Cl. 257-777.
Ueda, Yasuhiko 07615460 Cl. 438-387.
Elsenhans, Olivier: See--
Dual, Jürg; Elsenhans, Olivier; and May, Frank 07615378 Cl. 436-180.
Elushik, Richard D.: See--
Johnson, Ross S.; Wilson, Harold R.; Borgman, Randy; Elushik, Richard D.; Crow, Derek D.; and Emery, Dave 07614896 Cl. 439-215.
Elward Systems Corporation: See--
Mitchell, Everett Lee 07614191 Cl. 52-235.
EMC Corporation: See--
Bjornsson, Magnus E.; Yu, Rong; Kopylovitz, Haim; and Meiri, David 07617372 Cl. 711-167.
Fridella, Stephen A.; Jiang, Xiaoye; Faibish, Sorin; and Forecast, John 07617216 Cl. 707-10.
Zhang, Chao; and Frey, Robert Tower 07617365 Cl. 711-141.
Emcore Corporation: See--
Lau, Edmond Warming; Wang, Xiaozhong; and Mosebar, Robert Lewis 07614800 Cl. 385-92.
Emerson Electronic Co.: See--
Fei, Renyan W.; and Xu, Yanguang 07615907 Cl. 310-218.
Emery, Dave: See--
Johnson, Ross S.; Wilson, Harold R.; Borgman, Randy; Elushik, Richard D.; Crow, Derek D.; and Emery, Dave 07614896 Cl. 439-215.
Emma, Philip George; to International Business Machines Corporation Method for achieving very high bandwidth between the levels of a cache hierarchy in 3-dimensional structures, and a 3-dimensional structure resulting therefrom 07616470 Cl. 365-129.
Emmitte, Kyle Allen: See--
Kuntz, Kevin; Emmitte, Kyle Allen; Rheault, Tara Renae; Smith, Stephon; Hornberger, Keith; Dickson, Hamilton; and Cheung, Mui 07615643 Cl. 548-304.7.
Emmons, David James: See--
Tanner, John D.; Emmons, David James; and Riedel, Richard P. 07615152 Cl. 210-257.1.
EMS Technologies, Inc.: See--
Sorenson, Jr., Richard W.; Son, Ernest Lee; Wiesner, Paul Edward; Roeder, William H.; and Clott, Michael Sayre 07616127 Cl. 340-693.9.
Enablence USA FTTX Networks Inc.: See--
Farmer, James O.; Brown, Alan M.; Kenny, John J.; and Thomas, Stephen 07616901 Cl. 398-159.
Enami, Takashi: See--
Kato, Shinji; Hasegawa, Shin; Ishibashi, Hitoshi; Fujimori, Kohta; Takeuchi, Nobutaka; Ariizumi, Osamu; Watanabe, Naoto; Tanaka, Kayoko; Hirayama, Yushi; Kobayashi, Kazumi; Kobayashi, Shinji; Uchida, Fukutoshi; Enami, Takashi; and Morimoto, Ryohta 07616909 Cl. 399-49.
Endeca Technologies, Inc.: See--
Ferrari, Adam; Gourley, David; Johnson, Keith; Knabe, Frederick; Lau, Andrew; Mohta, Vinay; Tunkelang, Daniel; and Walter, John 07617184 Cl. 707-3.
Endo, Hiroshi; to Fujifilm Corporation Image-taking apparatus 07616874 Cl. 396-61.
Endo, Hiroyuki: See--
Nomura, Takumi; Ueda, Hiromi; Makino, Kunitetsu; Kasai, Hiroyuki; Tsuboi, Toshinori; Kurokawa, Hiroaki; Kobayashi, Hirokazu; and Endo, Hiroyuki 07616899 Cl. 398-154.
Endo, Kimitaka: See--
Nakayama, Jouji; Yamamoto, Tetsuya; Shimokura, Ken-ichiro; Yabuuchi, Tsutomu; Endo, Kimitaka; and Imaeda, Takashi 07617238 Cl. 707-103.
Endo, Michio; to Hoya Corporation Optical glass, press-molding glass gob and optical element 07615507 Cl. 501-50.
Endo, Seiichiro: See--
Hirau, Tsutomu; Endo, Seiichiro; and Kamino, Kazuya 07614966 Cl. 473-376.
Endo, Shigeru; and Sato, Kenji, to TS Tech Co., Ltd. Passenger's weight measurement device for vehicle seat 07614680 Cl. 296-68.1.
Endress + Hauser Conducta Gesellschaft fur Mess- und Regeltechnik mbH + Co. KG: See--
Pechstein, Torsten; and Kirsten, Lars 07615140 Cl. 204-416.
Endress & Hauser Flowtec AG: See--
Rieder, Alfred; Wiest, Achim; Strunz, Torsten; and Bezdek, Michal 07614309 Cl. 73-861.27.
Energy & Environmental Research Foundation: See--
Holmes, Michael J.; Pavlish, John H; Olson, Edwin S.; and Zhuang, Ye 07615101 Cl. 95-107.
Enermax Technology Corporation: See--
Chu, Chin-Chen 07615949 Cl. 318-400.22.
Engel, Klaus; to Siemens Medical Solutions USA, Inc. System and method for interleaved slice volume rendering 07616199 Cl. 345-419.
Engel, Thomas: See--
Baumann, Heinz; Engel, Thomas; Friedrich, Gerhard; Hecht, Martin; and Nögel, Peter 07614786 Cl. 378-195.
Engels, Frank Peter: See--
Sickert, Dirk; Engels, Frank Peter; and Odenthal, Frank 07614317 Cl. 74-422.
Enkemann, Steven Alan: See--
Riker, Adam I.; and Enkemann, Steven Alan 07615349 Cl. 435-6.
Enplas Corporation: See--
Morioka, Shimpei 07614802 Cl. 385-93.
Enthone Inc.: See--
Chen, Qingyun; Valverde, Charles; Paneccasio, Vincent; Petrov, Nicolai; Stritch, Daniel; Witt, Christian; and Hurtubise, Richard 07615491 Cl. 438-678.
Entorian Technologies, LP: See--
Wehrly, Jr., James Douglas; Goodwin, Paul; and Rapport, Russell 07616452 Cl. 361-803.
EPCOS AG: See--
Tikka, Pasi; Stömmer, Ralph; Schmidhammer, Edgar; and Unterberger, Michael 07616079 Cl. 333-189.
Epistar Corporation: See--
Lu, Chih-Chiang; Huang, Ling-Chin; Wang, Jen-Shul; Liu, Wen-Huang; and Hsieh, Min-Hsun 07615796 Cl. 257-98.
Yang, Kuang-Neng 07615392 Cl. 438-47.
Yen, Shih-Nan; Chiu, Jung-Tu; Shen, Yu-Jiun; and Tsai, Ching-Fu 07615773 Cl. 257-14.
Equistar Chemicals, LP: See--
Devakottai, Bala S.; Kiballa, Anthony R.; Swanson, John A.; and Mistry, Pinakin B. 07615144 Cl. 208-132.
Shield, David B. 07614613 Cl. 261-26.
Equitz, William H.: See--
Nunnink, Laurens; Equitz, William H.; and Gerst, Carl W. 07614563 Cl. 235-473.
Erb, Andreas: See--
Forgatsch, Oliver; and Erb, Andreas 07614694 Cl. 297-284.2.
Erb, Christina: See--
Hendrix, Martin; Bärfacker, Lars; Erb, Christina; Hafner, Frank-Thorsten; Heckroth, Heike; Karthaus, Dagmar; Tersteegen, Adrian; van der Staay, Franz-Josef; and van Kampen, Marja 07615558 Cl. 514-262.1.
Erdman, Joseph L. Scalable call center telecommunications system 07616757 Cl. 379-266.07.
Ergun, Arif Sanli: See--
Khuri-Yakub, Burtis; Ergun, Arif Sanli; Yaralioglu, G. Göksenin; Huang, Yongli; and Hansen, Sean 07615834 Cl. 257-416.
Ericsson Inc.: See--
Chen, Dayong 07616712 Cl. 375-340.
Erignac, Charles A: See--
Wan, Ming; Murray, Paul; and Erignac, Charles A 07616590 Cl. 370-256.
Eriguchi, Takuya: See--
Kudo, Yasuyuki; Akai, Akihito; Eriguchi, Takuya; Okado, Kazuo; and Aizawa, Hiroki 07616221 Cl. 345-690.
Eriksson, Ann-Christine; Collins, Sandra; and Backlund, Ingemar, to Telefonaktiebolaget L M Ericsson (PUBL) Data preservation 07616607 Cl. 370-331.
Erker, Brad: See--
Veldboom, Lance; and Erker, Brad 07615693 Cl. 800-320.1.
Erlandsson, Eva: See--
Forsberg, Goran; Erlandsson, Eva; Antonsson, Per; and Walse, Bjorn 07615225 Cl. 424-183.1.
Erol, Berna; Hull, Jonathan J.; and Lee, Dar-Shyang, to Ricoh Company, Ltd. Techniques for using an image for the retrieval of television program information 07616840 Cl. 382-305.
Eromäki, Marko; to Nokia Corporation Single motor/actuator for adjusting two assemblies 07616255 Cl. 348-360.
Eronen, Pasi: See--
Haverinen, Henry; and Eronen, Pasi 07617524 Cl. 726-6.
Ersheid, Ali: See--
Light, Elliott D.; and Ersheid, Ali 07617125 Cl. 705-26.
Esche, Jr., Carl K.; Dudding, Christopher J.; Growcott, Peter; Fagan, Anthony; and Robertson, Andrew, to Afton Chemical Corporation Additives and lubricant formulations for improved antiwear properties 07615519 Cl. 508-165.
Esche, Jr., Carl K.; to Afton Chemical Corporation Additives and lubricant formulations for improved antioxidant properties 07615520 Cl. 508-165.
Eshbaugh, Jonathan P.: See--
Gardner, Paul D.; and Eshbaugh, Jonathan P. 07614280 Cl. 73-40.
Esmaili, Gholamreza: See--
Chakrabarti, Sibaprasad; Hiti, Silva; John, George; Smith, Gregory S.; Perisic, Milun; and Esmaili, Gholamreza 07616466 Cl. 363-132.
Espinasse, Philippe: See--
Dupoiron, Francois; and Espinasse, Philippe 07615124 Cl. 148-529.
Espy, Mark J: See--
Smith, Thomas F.; and Espy, Mark J 07615352 Cl. 435-6.
Essilor International (Compagnie Generale d'Optique): See--
Freson, David; and Cailloux, Jean-François 07614527 Cl. 222-380.
Essinger, Steven: See--
Knowles, C. Harry; Zhu, Xiaoxun; Good, Timothy; Xian, Tao; Kotlarsky, Anatoly; Veksland, Michael; Hernandez, Mark; Gardner, John; Essinger, Steven; Giordano, Patrick; Kearney, Sean; Schmidt, Mark; Furlong, John; Ciarlante, Nicholas; Liu, Yong; Ren, Jie; Tao, Xi; Liu, JiBin; Zhuo, Ming; and Ellis, Duane 07614560 Cl. 235-462.42.
Estenfelder, Marvin: See--
Guckel, Christian; Dialer, Harald; Estenfelder, Marvin; and Pitschi, Werner 07615513 Cl. 502-350.
Esveld, Erik; Hamoen, Remco; and Hoogland, Hans, to CONOPCO, Inc. Apparatus and method for mixing components 07614781 Cl. 366-275.
ETHERTRONICS, Inc.: See--
Krier, Mark; Thornwall, Shane; Rowson, Sebastian; and Desclos, Laurent 07616164 Cl. 343-783.
Ethicon Endo-Surgery, Inc: See--
Sixto, Jr., Robert; Kortenbach, Juergen A.; and Smith, Kevin W. 07615058 Cl. 606-142.
Ethicon Endo-Surgery, Inc.: See--
Jambor, Kristin L.; and Wiley, Jeffrey P. 07615001 Cl. 600-37.
Stefanchik, David; and Applegate, Rick D. 07615003 Cl. 600-104.
Stefanchik, David; Linenkugel, Duane A.; Bakos, Gregory J.; Vakharia, Omar J.; Craft, James A.; and Bally, Kurt R. 07615005 Cl. 600-106.
Stokes, Michael J.; and Ortiz, Mark S. 07615060 Cl. 606-145.
Stokes, Michael J.; Ortiz, Mark S.; and Shelton, IV, Frederick E. 07615004 Cl. 600-104.
Ethicon Inc.: See--
Priewe, Jörg; Hartkop, Birgit; Schuldt-Hempe, Barbara; Walther, Christoph; and Holste, Jörg 07615065 Cl. 606-154.
Ethington, Jon: See--
Liu, Xinbing; and Ethington, Jon 07614831 Cl. 407-113.
Eto, Keita; to Nintendo Co., Ltd. Storage medium having game program stored thereon and game apparatus 07614945 Cl. 463-9.
Eudyna Devices Inc.: See--
Ono, Haruyoshi; and Sugawara, Hidemitsu 07614801 Cl. 385-93.
Eun, Hyung-Lae; to Samsung Electronics Co., Ltd. Stacked-type semiconductor device package 07615858 Cl. 257-686.
Eurocopter: See--
Astruc, Joel; and Eglin, Paul 07616130 Cl. 340-946.
Evans, Daniel D. Conduit retainer apparatus 07614828 Cl. 405-184.4.
Evans, Scott: See--
Ayton, Ian; Evans, Scott; and Nguyen, Tuan 07615056 Cl. 606-107.
Evarts, Jeffrey D.: See--
Antony, Felix F.; Kaufman, Donald; Yang, Weiling; and Evarts, Jeffrey D. 07617133 Cl. 705-27.
Eveland, Renee A.; Koch, Frederick W.; Wilby, Robert Ian; Carrick, Virginia A.; Abraham, William D.; Lamb, Gordon D.; and Pudelski, John K., to Lubrizol Corporation, The Mixed dispersants for lubricants 07615521 Cl. 508-228.
Even-Zur, Ronen: See--
Cohen, Yossef; Galperin, Noam; and Even-Zur, Ronen 07616684 Cl. 375-232.
Everitt, Cass W.: See--
Molnar, Steven E.; French, Mark J.; Everitt, Cass W.; Weitkemper, Adam Clark; Keslin, Phillip; Anderson, David L.; and Lynch, George R. 07616209 Cl. 345-545.
Everlight Electronics Co., Ltd.: See--
Wen, Chung-Han; and Liu, Pang-Yen 07616184 Cl. 345-102.
Evers, Holger: See--
Gerlach, Till; Evers, Holger; and Melder, Johann-Peter 07615665 Cl. 564-463.
Evers Smith, Linda; Cabell, David William; Mackey, Larry Neil; Gordon, Gregory Charles; Trokhan, Paul Dennis; and DeBruler, Tedi-Lea Anne, to Proctor & Gamble Company, The Fibrous structures comprising a polymer structure 07615278 Cl. 428-221.
Everson, John Michael: See--
Bertz, Lyle Thomas; Rogers, Frederick Carl; Everson, John Michael; Pinney, Keith; and Cerda, Jr., Salvador 07617336 Cl. 710-8.
Eves, David A.; and Cole, Richard S., to Koninklijke Philips Electronics N.V. Controlling ambient light as a function of a video signal 07616262 Cl. 348-553.
Evonik Degussa GmbH: See--
Lortz, Wolfgang; Lach, Heinz; and Von Seyerl, Joachim 07615577 Cl. 516-90.
Evonik Stockhausen, Inc.: See--
Joy, Mark C.; and Hsu, Whei-Neen 07615579 Cl. 521-72.
Excedra Technology, LLC: See--
Yang, Chih-Lung 07616591 Cl. 370-259.
Exica, Inc.: See--
Sabadicci, Rio; and Nelson, Larry D. 07614614 Cl. 261-76.
ExxonMobil Chemical Patents Inc.: See--
Chen, Tan-Jen; Keusenkothen, Paul F.; Wu, J. Jason; Buchanan, John Scott; Cao, Guang; Iaccino, Larry L.; Stern, David L.; and Vincent, Matthew J. 07615143 Cl. 208-120.01.
Lattner, James R. 07615578 Cl. 518-713.
Westwood, Alistair D.; Devorest, Yann; Jourdain, Eric P.; Georjon, Olivier; Chapman, Bryan R.; Bulawa, Michael C.; and Lundmark, Bruce R. 07615589 Cl. 524-474.
ExxonMobil Research and Engineering Company: See--
Bai, Chuansheng; El-Malki, EL-Mekki; Elks, Jeff; Hou, Zhiguo; McConnachie, Jon M.; Venkataraman, Pallassana S.; Wu, Jason; Jacobs, Peter W.; Han, Jun; Giaquinta, Daniel M.; Hagemeyer, Alfred; Sokolovskii, Valery; Volpe, Jr., Anthony F.; and Lowe, David M. 07615509 Cl. 502-185.
EZM, Inc.: See--
O'Connor, Charles S. 07614628 Cl. 280-37.