LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 8th DAY OF November, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
E Ink Corporation: See--
E. I. du Pont de Nemours and Company: See--
Bailey, Richard Kevin; Blanchet, Graciela Beatriz; Catron, Jr., John W.; Chesterfield, Reid John; Goldfinger, Marc B.; Jaycox, Gary Delmar; Johnson, Lynda Kaye; Malajovich, Irina; Meng, Hong; Meth, Jeffrey Scott; Sharp, Kenneth George; Schiffino, Rinaldo Soria; Gao, Feng; and Andrews, Gerald Donald
08053840 Cl. 257-352.
Burch, Heidi Elizabeth; Venkataraman, Sundar Kilnagar; and Aten, Ralph Munson
08053527 Cl. 525-199.
Nikiforov, Gregory A.; and Gridnev, Alexei A.
08053541 Cl. 526-319.
Rao, Velliyur Nott Mallikarjuna; Rosenfeld, H. David; Sievert, Allen Capron; and Subramoney, Shekhar
08053611 Cl. 570-156.
Rymer, Donald L.; and Read, III, Nolan K.
08053504 Cl. 524-297.
Wilczek, Lech; Getty, Ross; and Lynch, Phil
08053258 Cl. 438-20.
E.I. du Pont de Nemours and Company: See--
Ionkin, Alex Sergey; Fish, Brian M.; and Marshall, William J.
08053545 Cl. 528-51.
Jagota, Anand; Lustig, Steven Raymond; Wang, Siqun; and Wang, Hong
08053555 Cl. 530-327.
Sievert, Allen Capron
08053613 Cl. 570-170.
Sweetman, Karl Jeffrey; and Backer, Scott Andrew
08053606 Cl. 568-615.
E.S. Originals, Inc.: See--
Robson, Susan; and Genberg, Paul
08051584 Cl. 36-35B.
E2V Technologies (UK) Limited: See--
Robbins, Mark Stanford
08054363 Cl. 348-311.
EADS North America, Inc.: See--
Carlson, Gary; Landon, Frank; and Talbert, Joseph
08051675 Cl. 62-512.
Eagle Industry Co., Ltd.: See--
Ebihara, Hiroshi; Arita, Yasuhisa; and Ikeda, Yasuhiro
08052153 Cl. 277-572.
EaglePicher Technologies, LLC: See--
Dixon, Graham; Hart, Mark; Pettersson, Ola; and Sneath, Chad
08052764 Cl. 29-623.1.
Eastern Company, The: See--
Weinerman, Lee S.; and Hollingsworth, Michael J.
08052182 Cl. 292-336.3.
Eastham, Paul Christopher: See--
Lango, Jason Ansel; English, Robert M.; Eastham, Paul Christopher; Zheng, Qinghua; Quirion, Brian Mederic; Griess, Peter; Amdur, Matthew Benjamin; Ayyar, Kartik; Tsai, Robert Lieh-Yuan; Grunwald, David; Wagner, J. Chris; Ackaouy, Emmanuel; and Prakash, Ashish
08055702 Cl. 709-203.
Eastman Kodak Company: See--
Luo, Jiebo; and Yuan, Junsong
08055081 Cl. 382-224.
Tao, Ting; Saraiya, Shashikant; Clark, Eric E.; and Mikell, Frederic E.
08053162 Cl. 430-270.1.
Trafton, R. Winfield; Moore, Steven L.; Petruchik, Dwight J.; Petranek, Diana C.; and Perkins, Mark D.
08052263 Cl. 347-86.
Eaton Corporation: See--
Bawks, James Robert
08051744 Cl. 74-650.
Morris, Robert A.; Yee, Edgar; Bryll, Jared A.; Leeman, Daniel J.; and Kroushl, Daniel B.
08054606 Cl. 361-115.
Spitsberg, Yuri C.; and Whitaker, Thomas A.
08053694 Cl. 200-308.
Eaton, deceased, James Howard; and Eaton, legal representative, Glynda Williams, to International Business Machines Corporation Tape roller guide with integral recording head
08054577 Cl. 360-83.
Eaton, legal representative, Glynda Williams: See--
Eaton, deceased, James Howard
08054577 Cl. 360-83.
Ebara Corporation: See--
Nakasuji, Mamoru; Noji, Nobuharu; Satake, Tohru; Hatakeyama, Masahiro; Kimba, Toshifumi; Sobukawa, Hirosi; Yoshikawa, Shoji; Murakami, Takeshi; Watanabe, Kenji; Karimata, Tsutomu; Oowada, Shin; Saito, Mutsumi; Yamazaki, Yuichiro; Nagai, Takamitsu; and Nagahama, Ichirota
08053726 Cl. 250-310.
Ebara, Yukinori: See--
Hiejima, Katsuhiro; and Ebara, Yukinori
08052641 Cl. 604-110.
Ebashi, Hiromichi: See--
Demachi, Koji; Ebashi, Hiromichi; Akabane, Kuniharu; Nakajima, Takeshi; Hongo, Takeshi; Yokoi, Toyoaki; Habaguchi, Kenji; and Murakami, Masayuki
08054850 Cl. 370-438.
eBay Inc.: See--
Shah, Seema; Nash, Adam; Gupta, Raghav; Arora, Aditya; Foster, Benjamin David; Subramaniam, Srikanth; Ansari, Suhail; Stonestreet, Xavier; Raman, Vijay; and Leon, Jean-Michel
08055641 Cl. 707-706.
Ebdrup, Soren: See--
Kilburn, John Paul; Andersen, Henrik Sune; Kampen, Gita Camilla Tejlgaard; and Ebdrup, Soren
08053431 Cl. 514-228.2.
Ebdrup, Soren; and Andersen, Henrik Sune, to High Point Pharmaceuticals, LLC 11β-hydroxysteroid dehydrogenase type 1 active compounds
08053447 Cl. 514-315.
Ebe, Takaaki; to Oki Data Corporation Developing device with image supporting member and developer supporting member disposed in specific arrangement, and image forming apparatus
08055169 Cl. 399-279.
Ebensen, Thomas; Morr, Michael; and Guzman, Carlos, to Helmholtz-Zentrum fuer Infektionsforschung GmbH Hexosylceramides as adjuvants and their uses in pharmaceutical compositions
08053417 Cl. 514-25.
Eberhard, Timothy L.; to Sprint Communications Company L.P. Firewall doctor
08055760 Cl. 709-224.
Eberler, Ludwig; and Renz, Wolfgang, to Siemens Aktiengesellschaft Antenna structure for a magnetic resonance device
08054228 Cl. 343-701.
Ebihara, Hiroshi; Arita, Yasuhisa; and Ikeda, Yasuhiro, to Eagle Industry Co., Ltd. Seal device
08052153 Cl. 277-572.
EBM-Papst St. Georgen GmbH & Co. KG: See--
Karwath, Arno; and Nocita, Elvis
08054020 Cl. 318-400.26.
Ebner, Bruce W.: See--
Galdonik, Jason A.; Ogle, Matthew F.; and Ebner, Bruce W.
08052714 Cl. 606-200.
EBS Group Limited: See--
Schoen, John Edward; Zubairi, Nasir Ahmed; Howorka, Edward R.; and Jain, Neena
08055572 Cl. 705-37.
Echevarria, Louis Daniel: See--
Compton, Matthew Charles; Echevarria, Louis Daniel; Taku, Alain Asong; and Welp, Richard Albert
08055945 Cl. 714-26.
EchoStar Technologies LLC: See--
Taylor, Thomas Steven; Yakemovich, John; Friedrich, Alisson; Hansen, Tom; and Selvamani, Kiruthika
08055795 Cl. 709-245.
Eck, Brian T.; Ervolina, Thomas R.; Ferreri, Anthony V.; and Reiche, George W., to International Business Machines Corporation Method, system, and storage medium for facilitating excess inventory utilization in a manufacturing environment
08055522 Cl. 705-7.12.
Eco Lean Research & Development A/S: See--
Edbauer, Franz: See--
Boeger, Christian; and Edbauer, Franz
08051974 Cl. 198-766.
Edel, Stephen F.; and Shackelford, David M., to International Business Machines Corporation Synchronous and asynchronous continuous data protection
08055943 Cl. 714-20.
Edelman, Howard; and Liu, Daqing, to VitalWear, Inc. Spinal column brace for a contrast therapy system
08052628 Cl. 602-2.
Edelmann, Volker: See--
Vetter, Christoph; Müller, Eric; Stehr, Reinhard; Nissen, Hanjo; and Edelmann, Volker
08051650 Cl. 60-420.
Edmison, Kelvin Ross: See--
Spicer, John William; Edmison, Kelvin Ross; and Marchand, Clarey Roland Christopher
08055746 Cl. 709-223.
Edmiston, Daryl R.: See--
Linder, Richard J.; Edmiston, Daryl R.; and Johnson, Steven W.
08052712 Cl. 606-200.
Edmunds, Cyril G.; and Gaudioso, Stephen L., to Xerox Corporation Amorphous metal components for a reproduction machine
08052590 Cl. 492-54.
Edwards, James Ian; and Diver, Peter Thomas, to ITI Scotland Limited Wind and wave power generation
08053916 Cl. 290-44.
Edwards, James R.: See--
Tanguay, Kevin B.; Edwards, James R.; Frodin, David W.; Dawson, Marshall A.; and Hoot, Scott B.
08054676 Cl. 365-149.
Edwards, Jeremy Paul Lawrence; to Vetco Gray Controls Limited Pipeline protection system
08051875 Cl. 137-461.
Edwards, Judith: See--
Doland, Anne E.; McGinley, Joseph A.; Konecny, Robert J.; Crallie, Charles E.; Edwards, Judith; and Crews, Tim
08052047 Cl. 235-379.
Doland, Anne E.; McGinley, Joseph A.; Konecny, Robert J.; Crallie, Charles E.; Edwards, Judith; and Crews, Tim
08052048 Cl. 235-379.
Doland, Anne E.; McGinley, Joseph A.; Konecny, Robert J.; Crallie, Charles E.; Edwards, Judith; and Crews, Tim
08052049 Cl. 235-379.
Edwards, Mark Stephen: See--
Peck, Steve D.; and Edwards, Mark Stephen
08051614 Cl. 52-220.8.
Edwards, Nigel: See--
Rolia, Jerome; Gaisbauer, Sebastian; Schneider, Sebastian Phillipp; Edwards, Nigel; and Kirschnick, Johannes
08055493 Cl. 703-13.
Edwards, Robert D.: See--
Chanda, Kaushik; Rathore, Hazara S.; McLaughlin, Paul S.; Edwards, Robert D.; Clevenger, Lawrence A.; Cowley, Andrew P.; Yang, Chih-Chao; and Barile, Conrad A.
08053257 Cl. 438-17.
Edwards, Scott: See--
Lang, Michael T. K.; Buan, Angeles Lillian; White, Teresa L.; Kalyankar, Varsha; Nebgen, Gregg; Edwards, Scott; and Hong, Kuo Zong
08053048 Cl. 428-35.2.
Eftekhar, Ali Ashgar: See--
Mohammadi, Saeed; Eftekhar, Ali Ashgar; and Adibi, Ali
08054145 Cl. 333-186.
Egashira, Yoshinori; and Takehana, Eiji, to Bridgestone Sports Co., Ltd. Golf ball material, golf ball and method for preparing golf ball material
08053524 Cl. 525-154.
Eggert, Justin M.: See--
Wick, Thomas H.; Hedeen, Mark S.; Stroschein, Jeremy J.; Schumann, John L.; and Eggert, Justin M.
08051553 Cl. 29-737.
Egi, Yuji; Nishida, Jiro; and Nishi, Takeshi, to Semiconductor Energy Laboratory Co., Ltd. Plasma display panel and field emission display
08053987 Cl. 313-582.
Egilsson, Egill Sevinbjorn; and Asgeirsson, Sigurdur, to Ossur HF Suspension liner system with seal
08052760 Cl. 623-36.
Egli, Thomas: See--
Zylber, Emmanuel; Egli, Thomas; Meier, Nimrod; and Filippi, Michael
08052727 Cl. 606-279.
Egorov, Vladimir; and Sarvazyan, Armen P., to Artann Laboratories Inc Methods for characterizing vaginal tissue elasticity
08052622 Cl. 600-591.
Egozi, Noam Sensing gas bubbles in a living body
08055330 Cl. 600-473.
Eguchi, Junichi; Kimata, Ryuichi; and Tamura, Minoru, to Honda Motor Co., Ltd. Connection apparatus for parallel running generators
08053932 Cl. 307-84.
Eguchi, Shingo: See--
Akimoto, Kengo; Miyagi, Noriko; and Eguchi, Shingo
08054397 Cl. 349-46.
Ehm, Dirk Heinrich: See--
Kraus, Dieter; Ehm, Dirk Heinrich; and Schmidt, Stefan-Wolfgang
08054446 Cl. 355-30.
Ehrat, Markus: See--
Schürmann-Mader, Eveline; Abel, Andreas Peter; Bopp, Martin Andreas; Duveneck, Gert Ludwig; Ehrat, Markus; Kresbach, Gerhard Matthias; Pawlak, Michael; Schärer-Hernández, Nania Graciela; and Schick, Eginhard
08053225 Cl. 435-287.1.
Ehrmann, Elmar Eugen; to Multivac Sepp Haggenmueller GmbH & Co. KG Device for shrinking packagings
08051630 Cl. 53-557.
Eich, Juergen; Reibold, Ekkehard; Nguyen, Minh Nam; and Panzer, Matthias, to Schaeffler Technologies GmbH & Co. KG Method for checking the plausibility of the position of the clutch actuator of a clutch, method for determining the touch point of a clutch, and device for carrying out the method
08052579 Cl. 477-175.
Eichenberger, Alexandre E.; O'Brien, John K. P.; O'Brien, Kathryn M.; and Vasilache, Nicolas T., to International Business Machines Corporation Stable transitions in the presence of conditionals for an advanced dual-representation polyhedral loop transformation framework
08056065 Cl. 717-151.
Eichenberger, Alexandre E.; Wang, Kai-Ting Amy; and Wu, Peng, to International Business Machines Corporation Framework for integrated intra- and inter-loop aggregation of contiguous memory accesses for SIMD vectorization
08056069 Cl. 717-160.
Eichholz, Stefan: See--
Kasperowski, Bernd; Ramin, Wolfgang; Larson, Grant; and Eichholz, Stefan
08052197 Cl. 296-107.17.
Eichler, Uzi: See--
Strommer, Gera; Eichler, Uzi; and Sobe, Lior
08055327 Cl. 600-424.
Eickholt, David W.: See--
Jeff, Oberlin; and Eickholt, David W.
08051530 Cl. 15-320.
Eicon Networks Corporation: See--
Startsev, Vladimir; and Mielich, Rainer
08054947 Cl. 379-26.02.
Eiermann, Michael: See--
Algüera, José Manuel; Eiermann, Michael; and Richter, Martin
08052163 Cl. 280-420.
Algüera, José Manuel; and Eiermann, Michael
08052164 Cl. 280-422.
Eilers, Jacobus; De Jong, Johannes Cornelis; and Martens, Franciscus Johanna Arnoldus, to Shell Oil Company Process to prepare a sweet crude
08052864 Cl. 208-86.
Eisal R&D Management Co., Ltd.: See--
Yokoi, Hiroyuki; Mizuno, Masanori; and Haga, Toyokazu
08053580 Cl. 546-273.7.
Eisengruber, Gregory M.; to Means Industries, Inc. Controllable or selectable bi-directional overrunning coupling assembly
08051959 Cl. 188-82.3.
Eisenhauer, Daniel G.; Kovacs, Robert G.; Pafumi, James A.; and Srikrishnan, Jaya, to International Business Machines Corporation Maintaining storage area network (‘SAN’) access rights during migration of operating systems
08055736 Cl. 709-220.
Eisgruber, Max: See--
Schall, Norbert; Nuspl, Gerhard; Vogler, Christian; Wimmer, Lucia; and Eisgruber, Max
08053075 Cl. 428-402.
Eiynk, Benedict: See--
McCoy, Sean M.; Richards, David M.; Eiynk, Benedict; and Mairs, Susan M.
08055386 Cl. 700-276.
McCoy, Sean M.; Richards, David M.; Eiynk, Benedict; and Mairs, Susan M.
08055387 Cl. 700-276.
Eklund, Karin: See--
Ahnesjo, Anders; Eklund, Karin; Rikner, Goran; Ronnqvist, Camilla; and Grusell, Erik
08053736 Cl. 250-370.07.
Eklund, Klas-Hakan Lateral semiconductor device comprising two layers of mutually opposite conductivity-type materials between source and drain
08053835 Cl. 257-343.
El-Azzi, Karen: See--
Abraham, Cherian; Boland, Simon; El-Azzi, Karen; McNamara, Paul; and Saoumi, Ted
08054954 Cl. 379-88.22.
El-Mahdy, Ahmed Hazem Mohamed Rashid; and ElShishiny, Hisham, to International Business Machines Corporation Load balancing for image processing using multiple processors
08056086 Cl. 718-105.
El-Shishiny, Hisham; and Volkov, Pavel, to International Business Machines Corporation Systems and methods for building an electronic dictionary of multi-word names and for performing fuzzy searches in the dictionary
08055498 Cl. 704-10.
Elam, Thomas G.: See--
Gallagher, Michael D.; Mohammed, Jahangir; Baranowski, Joseph G.; Shi, Jianxiong; Markovic, Milan; Elam, Thomas G.; Kolderup, Kenneth M.; Shekhar, Madhu C.; and Powell, Mark
08054165 Cl. 340-286.02.
Elbit Systems Ltd.: See--
Elce, Edmund; Bell, Andrew; Knapp, Brian; Ng, Hendra; Rhodes, Larry F.; Shick, Robert; Zhang, Wei; DiMenna, William; Jayaraman, Saikumar; Jin, Jianyong; Puthenkovilakom, Rajesh Raja; Ravikiran, Ramakrishna; Wu, Xiaoming; and Takeuchi, Etsu, to Promerus LLC Directly photodefinable polymer compositions and methods thereof
08053515 Cl. 524-599.
Eldelstein, William: See--
Atalar, Ergin; Allen, Justin; Bottomley, Paul; Eldelstein, William; and Karmarkar, Parag V.
08055351 Cl. 607-63.
Eldering, Charles Anthony: See--
Kenedy, Andrew Alexander; and Eldering, Charles Anthony
08055643 Cl. 707-706.
Eldridge, Keith; Meskonis, Paul; Hall, Robert; Burke, Kenneth A.; Volk, Scott; Johnson, Mark; MacKay, Brian; and Dardinski, Steven, to Invensys Systems, Inc. Methods and apparatus for configuring a process control system with a configuration editor executing on a digital data processing device
08056056 Cl. 717-121.
Electro Scientific Industries, Inc.: See--
Johansen, Brian; and McCurry, Brandon John
08054085 Cl. 324-548.
Electrolux Home Porducts, Inc.: See--
Fisher, Gary W.
08053708 Cl. 219-448.12.
Electrolux Home Products, Inc.: See--
Kelly, Paul H.; Arvia, Aaron W.; Richardson, Edmund Scott; Pope, Kenneth L.; Moulder, Richard B.; and Simoni, David A.
08052235 Cl. 312-404.
Electronics and Telecommunications Research Institute: See--
Ahn, Hokyun; Lim, Jong-Won; Yoon, Hyung Sup; Chang, Woojin; Kim, Hae Cheon; and Nam, Eun Soo
08053345 Cl. 438-585.
Cho, Seong Mok; Ryu, Ho Jun; Yang, Woo Seok; Cheon, Sang Hoon; Yu, Byoung Gon; and Choi, Chang Auk
08053730 Cl. 250-338.1.
Choi, Sang Kuk; Kang, Kwang Yong; Paek, Mun Cheol; Kwak, Min Hwan; and Kang, Seung Beom
08053732 Cl. 250-341.1.
Han, Young-Tak; Shin, Jang Uk; Han, Sang-Pil; Park, Sang Ho; and Baek, Yongsoon
08055106 Cl. 385-22.
Hyoung, Chang-Hee; Sung, Jin-Bong; Kang, Sung-Weon; Hwang, Jung-Hwan; Park, Duck-Gun; and Kim, Jin-Kyung
08054159 Cl. 340-5.64.
Jun, Sun-Mi; Kim, Kyung-Soo; Ahn, Jee-Hwan; Choi, Song-In; Jung, Dong-Soo; and Jeon, Byoung-Chun
08054814 Cl. 370-338.
Jung, Eui Suk; Kim, Tae Yeon; Lee, Kang Bok; Yu, Jea Hoon; and Kim, Byoung Whi
08054172 Cl. 340-506.
Lee, Changki; Wang, Jihyun; Choi, Miran; and Jang, Myunggil
08055661 Cl. 707-737.
Lee, Dong Soo; Yoon, Bin Yeong; and Kim, Bong Tae
08055133 Cl. 398-75.
Lee, Donghan; Bae, Ji-Hoon; Quan, Cheng-Hao; Cho, Kwang-Soo; Choi, Gil Young; Chae, Jong-Suk; and Kang, Sang-Gi
08054161 Cl. 340-10.1.
Lee, Jae Sung; and Kim, Seong Woon
08055823 Cl. 710-68.
Lee, Nam-Suk; and Kim, Kyung-Soo
08055268 Cl. 455-452.2.
Lim, Changgyu; Bae, Suyoung; Cho, Changsik; Lim, Dongsun; and Ham, Hosang
08054844 Cl. 370-401.
Park, Sun-Ok; Huh, Mi Young; Kang, Shin Gak; and Han, Jae Cheon
08055277 Cl. 455-456.5.
Song, Yoon Ho; Kim, Dae Jun; Jeong, Jin Woo; Lee, Jin Ho; and Kang, Kwang Yong
08054249 Cl. 345-75.2.
Sung, Ho-Sang; Hwang, Dae-Hwan; Youn, Dae-Hee; Kang, Hong-Goo; Park, Young-Cheol; Lee, Ki-Seung; Jung, Sung-Kyo; and Kim, Kyung-Tae
08055499 Cl. 704-220.
Yoo, Jae-Jun; Kim, Do-Hyun; Kim, Mi-Jeong; Jang, Byung-Tae; Park, Jong-Hyun; Choi, Jeong-Dan; Son, Myung-Hee; Kim, Jung-Sook; Sung, Kyung-Bok; and Lim, Jae-Han
08055763 Cl. 709-224.
Electrostar Schöttle GmbH & Co. KG: See--
Eleftheriou, Evangelos S.: See--
Cherubini, Giovanni; Eleftheriou, Evangelos S.; and Loeliger, Theodor W.
08054736 Cl. 369-126.
Element Six Limited: See--
Amaratunga, Gehan Anil Joseph; Brezeanu, Mihai; Rashid, Jeremy Suhail; Rupesinghe, Nalin Lalith; Tajani, Antonella; Twitchen, Daniel James; Udrea, Florin; and Wort, Christopher John Howard
08053783 Cl. 257-77.
Elie-Dit-Cosaque, David; Sridhar, Kamakshi; Vissers, Maarten Petrus Joseph; and Van Kerckhove, Tony, to Alcatel Lucent Remote access link fault indication mechanism
08054751 Cl. 370-241.1.
Elkem AS: See--
Ellendson, Alexander D.: See--
Ferraro, Brandon R.; Ellendson, Alexander D.; and Magner, Timothy M.
08052103 Cl. 248-174.
Ellingson, Eric E.; to Digimarc Corporation Bi-directional image capture methods and apparatuses
08055014 Cl. 382-100.
Elliott, Rachel: See--
Purcell, Matthew; Elliott, Rachel; and Storm, Graeme
08054210 Cl. 341-169.
Ellis, Edric; and Martin, Jocelyn Luke, to MathWorks, Inc., The Recoverable error detection for concurrent computing programs
08055940 Cl. 714-12.
Ellis, Jason L.; Weber, Darren J.; and Long, Charles F., to GM Global Technology Operations LLC Electro-hydraulic control system for transmission with dual-area piston for torque-transmitting mechanism
08052563 Cl. 475-128.
Ellis, Jeffrey: See--
Cox, Daniel L.; Ellis, Jeffrey; and Limon, Timothy A.
08052701 Cl. 606-159.
Ellmann, Siegfried: See--
Preukschat, Alfred; Brendecke, Thomas; Miller, Luitpold; and Ellmann, Siegfried
08052161 Cl. 280-124.167.
Ellsworth, Jr., Michael J.: See--
Campbell, Levi A.; Chu, Richard C.; Ellsworth, Jr., Michael J.; Iyengar, Madhusudan K.; Schmidt, Roger R.; and Simons, Robert E.
08051897 Cl. 165-80.4.
Elpida Memory, Inc.: See--
Harashima, Shiro; and Tsukada, Wataru
08054664 Cl. 365-51.
Miyata, Kyoko; and Aiso, Fumiki
08053286 Cl. 438-142.
Morishige, Kazuyuki
08053813 Cl. 257-210.
Nakai, Kiyoshi; Tsukada, Shuichi; and Jono, Yusuke
08054679 Cl. 365-163.
Takahashi, Susumu; and Oishi, Kanji
08054699 Cl. 365-189.18.
ElShishiny, Hisham: See--
El-Mahdy, Ahmed Hazem Mohamed Rashid; and ElShishiny, Hisham
08056086 Cl. 718-105.
Elsholz, John F.; to Koninklijke Philips Electronics N.V. User-centric methodology for navigating through and accessing databases of medical information management system
08055514 Cl. 705-3.
Eltek S.p.A.: See--
Bigliati, Marco; Colombo, Paolo; Martinengo, Giorgio; Mueller, Daniel Verner; and Zorzetto, Mauro
08051719 Cl. 73-756.
Elzur, Uri: See--
Buer, Mark; McDaniel, Scott S.; Elzur, Uri; Tardo, Joseph J.; and Fan, Kan
08055895 Cl. 713-153.
EM Microelectronic-Marin S.A.: See--
Grosjean, Sylvain; Willemin, Michel; and Pfefferli, Beat
08051711 Cl. 73-489.
EMC Corporation: See--
Amegadzie, Augustine; Compton, James T.; Gross, Jerald W.; Rago, Stephen A; Stacey, Christopher H.; and Zimran, Eyal
08055724 Cl. 709-217.
Fachan, Neal T.; Godman, Peter J.; and Passey, Aaron J.
08055711 Cl. 709-205.
Passey, Aaron J.; and Fachan, Neal T.
08054765 Cl. 370-256.
Todd, Stephen; Fisher, Michel; Bober, Paul; and Blumenau, Steven M.
08055555 Cl. 705-29.
Todd, Stephen J.; Kilian, Michael; Teugels, Tom; Matthys, Frank; and Marivoet, Kim
08055861 Cl. 711-161.
EMCON Technologies Germany (Augsburg) GmbH: See--
Henke, Martin; and Zahn, Albert
08051949 Cl. 181-251.
Emerson Climate Technologies, Inc.: See--
Li, Feng E.; Zhang, Jin; Busching, Samuel P.; Angle, Shane J.; and Tobe, William P.
08052406 Cl. 418-55.1.
Emerson Retail Services, Inc.: See--
Singh, Abtar; Mathews, Thomas J.; Brown, III, Frank C.; and Gurkan, Ozgur Y.
08051668 Cl. 62-181.
Emerson, Sarah Jane: See--
Chang, Shujun; Connett, Marie B.; Emerson, Sarah Jane; Forster, Richard L.; Gause, Katrina; Havukkala, Ilkka; Higgins, Colleen; and Kodrzycki, Robert
08053237 Cl. 435-419.
Emery, III, George B. Poker billiard table and game
08052538 Cl. 473-23.
Emma, Philip George: See--
Bernstein, Kerry; Coteus, Paul W.; Emma, Philip George; Hartstein, Allan Mark; Kosonocky, Stephen V.; Puri, Ruchir; and Ritter, Mark B.
08053819 Cl. 257-278.
Emmett, Andrew Anthony: See--
Hickson, Andrew; Akehurst, Andrew David; Goddard, Nigel; and Emmett, Andrew Anthony
08055782 Cl. 709-230.
Emori, Akihiko: See--
Kawahara, Youhei; Emori, Akihiko; Yamauchi, Shuko; Takahashi, Hirotaka; Shida, Masami; and Kudo, Akihiko
08054045 Cl. 320-127.
Empire Technology Development LLC: See--
Koushanfar, Farinaz; and Potkonjak, Miodrag
08054098 Cl. 326-8.
Enami, Takashi: See--
Kaneko, Masaru; Miyajima, Masami; Aizawa, Hiroshi; Yonenaga, Kohtaroh; Umezawa, Hiroaki; Shimizu, Kiichirou; Kawase, Natsuko; Hasegawa, Ryu; and Enami, Takashi
08052144 Cl. 271-258.02.
ENANEF Limited: See--
Encelle, Inc.: See--
Lamberti, Francis V.; Klann, Richard Chris; and Hill, Ronald Stewart
08053423 Cl. 514-80.
Endo, Daisuke; Inamasu, Tokuo; Nukuda, Toshiyuki; and Katayama, Yoshihiro, to GS Yuasa International Ltd. Active material for lithium ion battery having Mg-containing lithium titanate and lithium ion battery
08053115 Cl. 429-231.6.
Endo, Shigeru: See--
Takayasu, Wataru; Ishima, Shinya; Endo, Shigeru; and Sato, Kenji
08051941 Cl. 180-273.
Endo, Takeshi; Kojima, Takahiro; and Takahashi, Kazutoshi, to Kabushiki Kaisha Toshiba Laser exposure device and optical axis adjustment method in laser exposure device
08054326 Cl. 347-242.
Endovascular Technologies, Inc.: See--
Pulnev, Sergei Appolonovich; Karev, Andrei Vladimirovich; and Schukin, Sergei Vladimirovich
08052739 Cl. 623-1.22.
Endress+ Hauser Flowtec AG: See--
Voigt, Frank; and Bähr, Günther
08051722 Cl. 73-861.12.
Endt, Axel vom: See--
Hebrank, Franz; Speckner, Thorsten; and Endt, Axel vom
08054079 Cl. 324-309.
Endustra Filter Manufacturers: See--
Geyer, III, Robert E.
08051948 Cl. 181-243.
Enerco Group, Inc.: See--
Vandrak, Brian S.; and Haney, Donald C.
08053709 Cl. 219-533.
Enercon Services, Inc.: See--
Smith, James Aaron; Patel, Atul Harihar; and Carr, Jr., Louis Thomas
08054932 Cl. 376-282.
EnerDel, Inc.: See--
Gorshkov, Vadim; and Volkov, Oleg
08052955 Cl. 423-598.
Energy Efficiency Solutions, LLC: See--
Engdegard, Jonas: See--
Röden, Jonas; Engdegard, Jonas; Purnhagen, Heiko; Breebaart, Jeroen; Schuijers, Erik; van de Par, Steven; Hilpert, Johannes; and Herre, Jürgen
08054981 Cl. 381-23.
Engel, Bernd: See--
Cramer, Guenther; Engel, Bernd; Greizer, Frank; and Laschinski, Joachim
08053930 Cl. 307-82.
Engel, Sharon Rae: See--
Shao, Liming; Wang, Fengjiang; Malcolm, Scott Christopher; Hewitt, Michael Charles; Bush, Larry R.; Varney, Mark A.; Campbell, Una; Engel, Sharon Rae; Hardy, Larry Wendell; Koch, Patrick; and Ma, Jianguo
08053603 Cl. 564-308.
Engelhaupt, Darell E.; Gubarev, Mikhail V.; Jones, William David; Ramsey, Brian D.; and Benson, Carl M., to United States of America as represented by the Administrator of the National Aeronautics and Space Administration, The Electrochemical and mechanical polishing and shaping method and system
08052860 Cl. 205-641.
Engenes, Finn: See--
Dekker, Cees Jan; Stouten, John H. W. M.; Zachariasen, Erik; and Engenes, Finn
08052370 Cl. 414-22.66.
Englberger, Werner: See--
Hinze, Claudia; Aulenbacher, Otto; Sundermann, Bernd; Oberboersch, Stefan; Friderichs, Elmar; Englberger, Werner; Koegel, Babette-Yvonne; Linz, Klaus; Schick, Hans; Sonnenschein, Helmut; Henkel, Birgitta; Rose, Valerie Sarah; and Lipkin, Michael Jonathan
08053576 Cl. 546-18.
Engle, William N.: See--
Cunningham, David W.; Harden, John M.; Engle, William N.; and Reuben, Charles W.
08055542 Cl. 705-17.
Englisch, Andreas: See--
Müller, Eric; Stehr, Reinhard; Homm, Manfred; Reuschel, Michael; Indlekofer, Norbert; Englisch, Andreas; Vornehm, Martin; and Lauinger, Christian
08051652 Cl. 60-430.
English, Robert M.: See--
Lango, Jason Ansel; English, Robert M.; Eastham, Paul Christopher; Zheng, Qinghua; Quirion, Brian Mederic; Griess, Peter; Amdur, Matthew Benjamin; Ayyar, Kartik; Tsai, Robert Lieh-Yuan; Grunwald, David; Wagner, J. Chris; Ackaouy, Emmanuel; and Prakash, Ashish
08055702 Cl. 709-203.
Enlisted Design, LLC: See--
Enman, Josefine: See--
Berglund, Kris Arvid; Rova, Ulrika; and Enman, Josefine
08053217 Cl. 435-119.
Ennis, G. Thomas Double wrap around brush set car wash apparatus
08051521 Cl. 15-53.3.
Enplas Corporation: See--
Enpulz, LLC: See--
Enquist, Paul M.: See--
Tong, Qin-Yi; Fountain, Jr., Gaius Gillman; and Enquist, Paul M.
08053329 Cl. 438-455.
Enreach Technology, Inc.: See--
Ensor, David S.: See--
Andrady, Anthony L.; and Ensor, David S.
08052407 Cl. 425-72.2.
Han, Li; Andrady, Anthony L.; and Ensor, David S.
08052932 Cl. 422-90.
Entanglement Technologies, LLC: See--
Environmental Business Specialists, LLC: See--
Foster, Michael Harvey; Smith, Kenneth Wayne; Duos, Bronwyn; and Guidotti, Elizabeth Claire
08052873 Cl. 210-610.
Envirosight LLC: See--
Lindner, Richard
08054459 Cl. 356-241.1.
EnviroVest LLC: See--
Selby, E. Field; Hardee, John R.; and Henry, Joe D.
08052986 Cl. 424-406.
Enya, Yohei: See--
Kyono, Takashi; Yoshizumi, Yusuke; Enya, Yohei; Akita, Katsushi; Ueno, Masaki; Sumitomo, Takamichi; and Nakamura, Takao
08053806 Cl. 257-102.
Enzymotec Ltd.: See--
Ben Dror, Gai; Plat, Dorit; Farkash, Orly; Zuabi, Rassan; Bar-On, Zohar; Shulman, Avidor; and Pelled, Dori
08052992 Cl. 424-439.
Eoff, Larry S.: See--
Reddy, B. Raghava; Eoff, Larry S.; Zhang, Danhua Leslie; Dalrymple, Eldon D.; and Brown, Paul S.
08053395 Cl. 507-234.
Eom, Su-Hyung: See--
Lee, Seung-Yeob; and Eom, Su-Hyung
08055221 Cl. 455-180.1.
Eom, Sung-Shik: See--
Choi, Jae-Hui; Ko, Dong-Hyun; Eom, Sung-Shik; Lee, Sang-Gi; Hong, Moo-Ho; and Kwon, O-Hark
08053605 Cl. 568-454.
Eow, Yeong Taur: See--
Azad, Vikas; Eow, Yeong Taur; and Chen, Ping
08052481 Cl. 439-676.
Epifani, Francesco: See--
Calochira, Giorgio; Epifani, Francesco; Ludovico, Michele; Minerva, Giuseppe; Mirra, Daniela; Panico, Massimiliano; Petra, Massimiliano; Silio, Emanuele; and Stola, Loris
08055265 Cl. 455-446.
Minerva, Giuseppe; Silio, Emanuele; and Epifani, Francesco
08054824 Cl. 370-351.
Epistar Corporation: See--
Hsieh, Min-Hsun; and Wang, Chien-Yuan
08054409 Cl. 349-68.
Epivalley Co., Ltd.: See--
Park, Eun Hyun; and Yoo, Tae-Kyung
08053793 Cl. 257-95.
Epler, John E.; Krames, Michael R.; Neff, James G.; and Schiaffino, Stefano, to Koninklijke Philips Electronics N.V. Compliant bonding structures for semiconductor devices
08053905 Cl. 257-778.
Epp, Joachim: See--
Yair, Ben-Shaul; Harel, Orit; Holzman, Ziv; Epp, Joachim; and Hadari, Malkiel
08055377 Cl. 700-216.
Eppard, Erin F.; to Robert Bosch GmbH Injury mitigation system for power tools
08051758 Cl. 83-62.1.
Epstein, Jonathan A.: See--
Cappola, Thomas; and Epstein, Jonathan A.
08053182 Cl. 435-6.
Equistar Chemicals, LP: See--
Shelley, Christopher; and Sonnycalb, Matthew A.
08053085 Cl. 428-515.
Erger, Robert: See--
Reid, Paul A.; and Erger, Robert
08054593 Cl. 361-42.
Erhardt, James C. Head covering apparatus
08051497 Cl. 2-175.6.
Ericsson AB: See--
Magri, Roberto; and Furst, Cornelius
08055127 Cl. 398-18.
Erturk, Hakan: See--
Li, Zhihua; Hsieh, Cheng-Chieh; Hu, Xuejiao; Erturk, Hakan; and Chen, George
08054629 Cl. 361-703.
Ervin, Jeffery: See--
Gabrielson, Cory; and Ervin, Jeffery
08051864 Cl. 135-16.
Ervolina, Thomas R.: See--
Eck, Brian T.; Ervolina, Thomas R.; Ferreri, Anthony V.; and Reiche, George W.
08055522 Cl. 705-7.12.
Erwin, Anthony Wayne; Mossing, Timothy Charles; Robbins, Christopher A.; and Wood, Brian Owen, to International Business Machines Corporation Implementing registration and conflict resolution of web application keyboard shortcuts
08056018 Cl. 715-847.
Esbeck, Thomas David: See--
Park, Sang joon; Choo, Shaulaine; Andreacchi, Anthony S.; Chen, Yung-Ming; Currlin, Arnoldo M.; Garcia, Antonio; Van Sciver, Jason; Esbeck, Thomas David; and Glenn, Bryan D.
08055360 Cl. 700-57.
Eshel, Noam; and Golan, Zeituni, to Advasense Technologies Ltd. Device and method for providing a reference signal
08054360 Cl. 348-308.
Eshwar, Bhavani Kumar; to International Business Machines Corporation Transmitting critical table information in databases
08054764 Cl. 370-254.
Eskelinen, Ilkka; to Exel Oyj Blade, structural components of a blade, and method for manufacturing a blade and the structural components of a blade
08052844 Cl. 162-281.
Essen, Kevin Von; to FUJIFILM Corporation Manifold for a printhead
08052254 Cl. 347-84.
Essence Security International Ltd. (E.S.I.): See--
Essilor International (compagnie Generale d'optique: See--
Bovet, Christian; Cano, Jean-Paul; and Mathieu, Gilles
08052278 Cl. 351-159.
Estermann, Beat: See--
Celoudoux, Jean Paul; Daugy, Bruno; Soriano, Louis; and Estermann, Beat
08052079 Cl. 242-362.
Estubier, Pierre: See--
Brothier, Meryl; Estubier, Pierre; Comte, Julien; Baussand, Patrick; and Soyez, Johann
08054082 Cl. 324-468.
Etemad, Kamran; and Olfat, Masoud, to Nextel Communications Inc. System and method for dividing subchannels in a OFDMA network
08054783 Cl. 370-329.
Eternal Chemical Co., Ltd.: See--
Hsu, Lung-Lin; and Liu, Sue-Hong
08053486 Cl. 522-42.
Etherwan Systems, Inc.: See--
Ethicon Endo-Surgery, Inc.: See--
Etling, Keith A.; to Boeing Company, The Anti-icing apparatus for honeycomb structures
08052089 Cl. 244-134B.
Etoh, Norio: See--
Okamura, Toshifumi; and Etoh, Norio
08054998 Cl. 381-307.
Eu, Seung-Hun; and Lee, Jang-Hoon, to LG Chem, Ltd. Catalyst precursor composition for electroless plating, and preparation method of transparent electromagnetic interference shielding material using the same
08053540 Cl. 526-317.1.
Eun, Yeong-Chan: See--
Roh, Gill-Tae; Eun, Yeong-Chan; Sauk, Jun-Ho; An, Seong-Jin; and Chang, Seok-Rak
08053132 Cl. 429-456.
Euro-Pro Operating LLC: See--
Rosenzweig, Maximilian; and Vrdoljak, Ognjen
08052342 Cl. 401-140.
Eurocopter: See--
Eurofilters N.V.: See--
Schultink, Jan; and Sauer, Ralf
08052769 Cl. 55-382.
Eurosets S.r.l.: See--
Ghelli, Nicola; Maianti, Edgardo Costa; Balanzoni, Roberto; and Petralia, Antonio
08052632 Cl. 604-6.15.
Evalve, Inc.: See--
Goldfarb, Eric A.; Thornton, Troy L.; Raschdorf, Alfred H.; Sarabia, Jaime E.; Maddan, John P.; Powell, Ferolyn; Martin, Brian B.; Wen-Chin Fan, Sylvia; Komtebedde, Jan; and Liao, Yen C.
08052592 Cl. 600-37.
Evans, Gregory Morgan: See--
Olaiya, Oladipupo; Evans, Gregory Morgan; and Roberts, Thomas
08055536 Cl. 705-14.1.
Evans, Gregory Morgan; to Qurio Holdings, Inc. System and method for bypassing an access point in a local area network for P2P data transfers
08054815 Cl. 370-338.
Evans, James: See--
Issa, Alfredo C.; Walsh, Richard J.; and Evans, James
08055803 Cl. 709-253.
Evans, James D.: See--
Smith, Barry S.; Pham, Xuan M.; Longest, Cary; Miller, Carl G.; and Evans, James D.
08051979 Cl. 206-256.
Evans, Kent J: See--
Wu, Jin; Prosser, Dennis J; Carmichael, Kathleen M; Toates, Sherri A; Evans, Kent J; and Grabowski, Edward F
08053152 Cl. 430-64.
Everland, Hanne: See--
Nielsen, Peter Sylvest; Nielsen, Brian; Jespersen, Lene Karin; Everland, Hanne; and Nielsen, Lene Feldskov
08053559 Cl. 530-350.
Evers, Marc Francois Theophile: See--
Bianchetti, Giulia Ottavia; Evers, Marc Francois Theophile; Smets, Johan; and Grande, Giovanni
08053402 Cl. 510-286.
EVM Systems LLC: See--
Sachdeva, Rohit C. L.; and Besselink, Petrus A.
08052670 Cl. 604-531.
Evonik Degussa GmbH: See--
Hennige, Volker; Hying, Christian; and Hoerpel, Gerhard
08053102 Cl. 429-129.
Evonik Roehm GmbH: See--
Loehden, Gerd; Balk, Sven; Brand, Thorsten; Brenner, Gabriele; Arnold, Thomas; and Baumann, Cornelia
08053522 Cl. 525-63.
Exaflop LLC: See--
Sadler, Chris; Fan, Xiaobo; and Corhodzic, Selver
08054598 Cl. 361-63.
Excellerate Enterprise Co., Ltd.: See--
Yu, Fu-Sian; Mo, Xiao-Long; and Wang, Chih-Wei
08051508 Cl. 5-98.1.
Exel Industries: See--
Exel Oyj: See--
Exelixis, Inc.: See--
Kearney, Patrick; Brown, S. David; and Koltun, Elena S.
08053454 Cl. 514-381.
Expanse Networks, Inc.: See--
Kenedy, Andrew Alexander; and Eldering, Charles Anthony
08055643 Cl. 707-706.
Expedite International: See--
EXPORTech Company, Inc.: See--
Oder, Robin R.; and Jamison, Russell E.
08052875 Cl. 210-695.
Extreme Networks, Inc.: See--
Bardzil, Timothy J.; and Hubbard, Scott M.
08055800 Cl. 709-248.
ExxonMobil Chemical Patents Inc.: See--
Datta, Sudhin; Tse, Mun Fu; Sahnoune, Abdelhadi; Sims, Charles L.; and Coffey, James N.
08052822 Cl. 156-242.
ExxonMobil Research and Engineering Company: See--
Sengupta, Bhaskar; Kumaran, Krishnan; Weissman, Walter; Partridge, Randall D.; Sugiyama, Kouseki; Yoeda, Keiji; Oda, Tomihisa; and Iwashita, Yoshihiro
08051828 Cl. 123-304.
Eyers, William: See--
Ayshford, Gordon; and Eyers, William
08052770 Cl. 55-483.
Ezzat, Tony; and Gouvea, Evandro, to Mitsubishi Electric Research Laboratories, Inc. Method for retrieving items represented by particles from an information database
08055693 Cl. 707-899.