US 11,810,829 B2
Apparatus for inspecting light emitting elements, method of inspecting light emitting elements using the apparatus, and method of manufacturing display device using the apparatus
Seung Cheol Ko, Hwaseong-si (KR)
Assigned to Samsung Display Co., Ltd., Yongin-si (KR)
Filed by Samsung Display Co., Ltd., Yongin-si (KR)
Filed on Apr. 5, 2021, as Appl. No. 17/301,503.
Claims priority of application No. 10-2020-0069189 (KR), filed on Jun. 8, 2020.
Prior Publication US 2021/0384084 A1, Dec. 9, 2021
Int. Cl. H01L 21/66 (2006.01); H01L 33/00 (2010.01)
CPC H01L 22/10 (2013.01) [H01L 22/24 (2013.01); H01L 33/0095 (2013.01)] 19 Claims
OG exemplary drawing
 
1. An apparatus for inspecting light emitting elements, the apparatus comprising:
a flow path unit extending in one direction and comprising a flow path along which a solution in which light emitting elements are mixed moves;
at least one alignment unit to which the flow path extends from at least a portion of the flow path unit;
a packaging unit at an end of the flow path unit and in which the light emitting elements are stacked; and
a plurality of alignment electrodes on an outer surface of the alignment unit,
wherein the alignment unit comprises a first alignment area and a second alignment area, and the first alignment area and the second alignment area are spaced apart from each other with the flow path unit in between,
wherein the plurality of alignment electrodes is disposed to extend the flow path unit, the first alignment area and the second alignment area in one body.