US 11,810,631 B2
Data integrity checks based on voltage distribution metrics
Vamsi Pavan Rayaprolu, San Jose, CA (US); Michael Sheperek, Longmont, CO (US); and Christopher M. Smitchger, Garden City, ID (US)
Assigned to Micron Technology, Inc., Boise, ID (US)
Filed by Micron Technology, Inc., Boise, ID (US)
Filed on Dec. 16, 2020, as Appl. No. 17/123,993.
Prior Publication US 2022/0189572 A1, Jun. 16, 2022
Int. Cl. G11C 29/02 (2006.01); G11C 29/12 (2006.01); G11C 29/50 (2006.01); G11C 29/44 (2006.01)
CPC G11C 29/021 (2013.01) [G11C 29/12005 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01); G11C 2207/2254 (2013.01)] 15 Claims
OG exemplary drawing
 
1. A system comprising:
a memory device; and
a processing device, operatively coupled to the memory device, to perform operations comprising:
determining a value of a data state metric of a memory page, wherein the data state metric value is reflective of a number of bit errors associated with the memory page;
upon determining that the data state metric value satisfies a first threshold criterion, determining a first value of a first voltage distribution metric and a second value of a second voltage distribution metric associated with the page, wherein each of the first value and the second value reflects at least one of: a voltage distribution margin, a voltage distribution floor, or a voltage distribution center;
determining whether the first voltage distribution metric value satisfies a second threshold criterion;
upon determining that the first voltage distribution metric value satisfies a second threshold criterion, determining whether the second voltage distribution metric value satisfies a third threshold criterion; and
upon determining that the second voltage distribution metric value satisfies the third threshold criterion, performing a media management operation with respect to a block associated with the page, wherein the media management operation comprises writing data stored at the block to a new block.