US 11,809,947 B2
Methods and systems for reading machine-readable labels on sample receptacles
Norbert D. Hagen, Carlsbad, CA (US); David Opalsky, San Diego, CA (US); and Rolf Silbert, Del Mar, CA (US)
Assigned to GEN-PROBE INCORPORATED, San Diego, CA (US)
Filed by GEN-PROBE INCORPORATED, San Diego, CA (US)
Filed on Mar. 14, 2022, as Appl. No. 17/694,436.
Application 17/694,436 is a continuation of application No. 16/905,816, filed on Jun. 18, 2020, granted, now 11,275,914.
Application 16/905,816 is a continuation of application No. 16/208,186, filed on Dec. 3, 2018, granted, now 10,719,677, issued on Jul. 21, 2020.
Application 16/208,186 is a continuation of application No. 15/092,150, filed on Apr. 6, 2016, granted, now 10,146,973, issued on Dec. 4, 2018.
Claims priority of provisional application 62/143,963, filed on Apr. 7, 2015.
Prior Publication US 2022/0207254 A1, Jun. 30, 2022
This patent is subject to a terminal disclaimer.
Int. Cl. G06K 7/10 (2006.01); G01N 35/00 (2006.01); G01N 35/02 (2006.01); G06K 7/14 (2006.01); G06K 19/06 (2006.01); G01N 35/04 (2006.01)
CPC G06K 7/10732 (2013.01) [G01N 35/00732 (2013.01); G01N 35/026 (2013.01); G06K 7/10811 (2013.01); G06K 7/10861 (2013.01); G06K 7/1413 (2013.01); G06K 7/1417 (2013.01); G06K 7/1447 (2013.01); G06K 19/06028 (2013.01); G06K 19/06037 (2013.01); G01N 2035/00752 (2013.01); G01N 2035/00801 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/0413 (2013.01); G01N 2035/0493 (2013.01)] 16 Claims
OG exemplary drawing
 
1. A method for reading machine-readable labels on sample receptacles, comprising:
with a first label reader at a first location, reading a machine-readable label associated with each sample receptacle of a plurality of sample receptacles held by a rack;
moving the sample rack from the first location to a second location;
with a sensor at the second location, sensing a rack identifier on the sample rack, wherein the sensor is not the first label reader; and
associating the rack identifier with the machine-readable label of each sample receptacle of the plurality of sample receptacles.