US 11,808,901 B2
Nuclear reaction detection device, method and program with high detection position resolution
Hidenori Iwashita, Musashino (JP); Gentaro Funatsu, Musashino (JP); Michihiro Furusaka, Sapporo (JP); Takashi Kamiyama, Sapporo (JP); Hirotaka Sato, Sapporo (JP); and Yoshiaki Kiyanagi, Nagoya (JP)
Assigned to Nippon Telegraph and Telephone Corporation, Tokyo (JP); National University Corporation Hokkaido University, Hokkaido (JP); and National University Corporation Tokai National Higher Education and Research System, Aichi (JP)
Appl. No. 17/623,752
Filed by Nippon Telegraph and Telephone Corporation, Tokyo (JP); National University Corporation Hokkaido University, Sapporo (JP); and National University Corporation Tokai National Higher Education and Research System, Nagoya (JP)
PCT Filed Jul. 3, 2020, PCT No. PCT/JP2020/026279
§ 371(c)(1), (2) Date Dec. 29, 2021,
PCT Pub. No. WO2021/002470, PCT Pub. Date Jan. 7, 2021.
Claims priority of application No. 2019-125190 (JP), filed on Jul. 4, 2019.
Prior Publication US 2022/0252743 A1, Aug. 11, 2022
Int. Cl. G01T 1/16 (2006.01); G01T 1/24 (2006.01); G01T 1/29 (2006.01); G01T 3/08 (2006.01)
CPC G01T 1/245 (2013.01) [G01T 1/246 (2013.01)] 7 Claims
OG exemplary drawing
 
1. A nuclear reaction detection device comprising:
a semiconductor memory that integrates therein a semiconductor element that electrically stores one-bit data, and is arranged in an environment in which a particle radiation is incident;
a position information storage unit, comprising one or more memory devices, configured to store spatial position information of the semiconductor element in the semiconductor memory;
a semiconductor element specifying unit, comprising one or more hardware processors, configured to detect that an SEU (Single Event Upset) has occurred in the semiconductor element included in the semiconductor memory, and specifies the semiconductor element in which the SEU has occurred; and
a position calculating unit, comprising the one or more hardware processors, configured to calculate a spatial position in which the SEU has occurred, based on the specified semiconductor element and the spatial position information.