US 11,808,795 B2
Prognostic method and apparatus for improving circuit health
Tae Yeob Kang, Daejeon (KR); and Donghwan Seo, Daejeon (KR)
Assigned to AGENCY FOR DEFENSE DEVELOPMENT, Daejeon (KR)
Filed by AGENCY FOR DEFENSE DEVELOPMENT, Daejeon (KR)
Filed on Jan. 10, 2022, as Appl. No. 17/572,133.
Claims priority of application No. 10-2021-0003562 (KR), filed on Jan. 11, 2021.
Prior Publication US 2022/0221497 A1, Jul. 14, 2022
Int. Cl. G01R 23/02 (2006.01)
CPC G01R 23/02 (2013.01) 10 Claims
OG exemplary drawing
 
1. A method of estimating health of a circuit by using an S-parameter plot analysis of an apparatus comprising a memory, an S-parameter measurer, and at least one processor, the method comprising:
obtaining, by the S-parameter measurer, an S-parameter plot of a circuit having an input port and an output port;
determining, by the at least one processor, a resonance frequency of the circuit based on the S-parameter plot, wherein the resonance frequency has a maximum or a minimum in a pre-set frequency band; and
estimating, by the at least one processor, a remaining lifespan of the circuit based on a ratio of a difference between the resonance frequency and a second resonance frequency to a difference between a first resonance frequency and the second resonance frequency, wherein the S-parameter measurer obtains and saves in the memory the first resonance frequency of the circuit when the circuit is in a fresh state, and obtains and saves in the memory the second resonance frequency of the circuit when the circuit is in an old state.