US 11,807,925 B2
Probe pin material including Ag—Pd—Cu-based alloy
Takeshi Fuse, Isehara (JP); Kunihiro Shima, Isehara (JP); Takeyuki Sagae, Isehara (JP); and Shinji Kouno, Isehara (JP)
Assigned to TANAKA KIKINZOKU KOGYO K.K., Tokyo (JP)
Filed by TANAKA KIKINZOKU KOGYO K.K., Tokyo (JP)
Filed on Nov. 7, 2022, as Appl. No. 17/982,092.
Claims priority of application No. 2022-019142 (JP), filed on Feb. 10, 2022.
Prior Publication US 2023/0250513 A1, Aug. 10, 2023
Int. Cl. C22C 5/04 (2006.01); C22C 30/02 (2006.01); C22F 1/14 (2006.01); C22C 30/06 (2006.01); C22C 30/04 (2006.01)
CPC C22C 5/04 (2013.01) [C22C 30/02 (2013.01); C22C 30/04 (2013.01); C22C 30/06 (2013.01); C22F 1/14 (2013.01)] 19 Claims
 
1. A probe pin material comprising a Ag—Pd—Cu-based alloy comprising: Ag, Pd and Cu; B as a first additive element; at least any element of Zn, Bi and Sn as a second additive element, and unavoidable impurities,
wherein the alloy contains no In; wherein SAg is a ratio of a concentration of Ag in the alloy to a combined concentration of Ag, Pd and Cu in the alloy as mass %, SPd is a ratio of a concentration of Pd in the alloy to the combined concentration of Ag, Pd and Cu in the alloy as mass %, SCu is a ratio of a concentration of Cu in the alloy to the combined concentration of Ag, Pd and Cu in the alloy as mass %,
wherein all values of the SAg, the SPd and the SCu fall within a range of a polygon (A1-A2-A3-A4) surrounded with straight lines connecting respective points of a point A1 (Ag: 5.5 mass %, Pd:47.5 mass %, Cu:47 mass %), a point A2 (Ag: 5.5 mass %, Pd:58.5 mass %, Cu:36 mass % ), a point A3 (Ag: 18 mass %, Pd:49 mass %, Cu:33 mass %) and a point A4 (Ag: 18 mass %, Pd:45 mass %, Cu:37 mass %) in a Ag—Pd—Cu ternary system phase diagram,
a concentration of the first additive element is 0.1 mass % or more and 1.5 mass % or less, and
a concentration of the second additive element is 0.1 mass % or more and 1.0 mass % or less.