US 11,806,124 B2
Method and apparatus for measuring signal
JongPal Kim, Seoul (KR)
Assigned to Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed by Samsung Electronics Co., Ltd., Suwon-si (KR)
Filed on Oct. 17, 2019, as Appl. No. 16/655,817.
Claims priority of application No. 10-2019-0053093 (KR), filed on May 7, 2019.
Prior Publication US 2020/0352471 A1, Nov. 12, 2020
Int. Cl. A61B 5/053 (2021.01); H03F 3/45 (2006.01); H03M 1/12 (2006.01); A61B 5/00 (2006.01)
CPC A61B 5/053 (2013.01) [A61B 5/7225 (2013.01); H03F 3/45071 (2013.01); H03M 1/124 (2013.01); H03F 2200/129 (2013.01); H03F 2200/228 (2013.01); H03F 2203/45116 (2013.01)] 17 Claims
OG exemplary drawing
 
1. An apparatus for measuring a signal, the apparatus comprising:
a power source configured to supply a current signal having a carrier frequency to a target object;
a reset circuit configured to change, at least once during a reset interval using a switch, a first input connection of an amplifier, connected to an input voltage signal, to a second input connection of the amplifier, connected to a reference voltage,
wherein the switch is configured to switch between the first input connection of the amplifier and the second input connection of the amplifier, and
wherein the input voltage signal is changed according to a change in an object voltage signal generated from the target object receiving the current signal; and
the amplifier configured to generate an amplified signal by amplifying the input voltage signal being reset,
wherein the reset circuit comprises:
a capacitor configured to connect the target object and the amplifier; and
for the switching between the first input connection of the amplifier and the second input connection of the amplifier, the switch configured to connect one end of the capacitor and a common mode node that supplies the reference voltage in case of being switched to the second input connection of the amplifier.