US 7,615,483 B2
Printed metal mask for UV, e-beam, ion-beam and X-ray patterning
Jurgen H. Daniel, San Francisco, Calif. (US); and Ana C. Arias, San Carlos, Calif. (US)
Assigned to Palo Alto Research Center Incorporated, Palo Alto, Calif. (US)
Filed on Dec. 22, 2006, as Appl. No. 11/644,250.
Prior Publication US 2008/0153242 A1, Jun. 26, 2008
Int. Cl. H01L 21/4763 (2006.01)
U.S. Cl. 438—637  [977/775; 977/776] 22 Claims
OG exemplary drawing
 
1. A method of forming a via opening comprising:
forming a dielectric layer;
using a printer to deposit at least one individual droplet including suspended metal nanoparticles over a first portion of the dielectric layer to form a mask pattern;
exposing the dielectric layer to radiation such that regions which are not masked by the mask pattern of metal nanoparticles become chemically altered;
removing areas of the dielectric layer that have not been exposed to radiation to create a via in the dielectric.