| US 7,613,537 B2 | ||
| Method and system of recognizing ID marks appended on base materials, and method of manufacturing products by base materials with the ID marks | ||
| Masao Iwase, Yokohama (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan) | ||
| Filed on Jan. 19, 2005, as Appl. No. 11/37,301. | ||
| Claims priority of application No. P2004-011812 (JP), filed on Jan. 20, 2004. | ||
| Prior Publication US 2005/0213458 A1, Sep. 29, 2005 | ||
| Int. Cl. G06F 19/00 (2006.01) | ||
| U.S. Cl. 700—115 [235/462.1; 714/784] | 20 Claims |
| 1. A method of recognizing different ID marks formed of two-dimensional codes appended respectively on a plurality of base
materials so as to identify each of the base materials, where a number of base materials is the same as the number of original
bit sequence data to be compared with the base materials such that every ID mark appended to the plurality of base materials
are assigned to all of the original bit sequence data, implementing one-to-one correspondences, the method comprising:
reading all of the ID marks appended on all of the base materials, and converting all of the ID marks, base material by base
material, into corresponding different bit sequence data, respectively;
sorting all of the base materials into normal and damaged groups, the normal group consisting of base materials to which normal
ID marks are appended, identifying each of the converted bit sequence data of the normal ID mark with one of the original
bit sequence data, as deterioration of the ID mark is within an error correction ability, the damaged group consisting of
base materials to which damaged ID marks are appended, specifying the converted bit sequence data of the damaged ID marks
as damaged data, as the deterioration of the damaged ID mark is beyond the error correction ability;
when the damaged group include a plurality of base materials, identifying, base material by base material, each of the base
materials of the damaged group, by comparing bit by bit each of the damaged data of the damaged ID marks with a plurality
of candidate original data, each of the candidate original data being remnant original bit data that are not identified by
the converted bit data of the normal group, a number of candidate original data is the same as the number of damaged ID marks;
calculating successively concordance ratios between a subject damaged data and the plurality of candidate original data, mark
by mark, for all of the damaged ID marks under a paramount-criterion, which conjectures successively candidate original data
having the highest concordance ratio to the subject damaged data as the conjectured bit sequence data of the subject damaged
data so as to implement one-to-one correspondences between the plurality of damaged ID marks and the plurality of candidate
original data; and
judging whether each of the conjectured bit sequence data can be assigned as true bit sequence data of the damaged ID marks
under a subsidiary-criterion, which is different from the paramount-criterion.
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