| US 7,612,698 B2 | ||
| Test apparatus, manufacturing method, and test method | ||
| Hiroki Kimura, Tokyo (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Filed on Jun. 25, 2008, as Appl. No. 12/145,510. | ||
| Claims priority of application No. 2007-203519 (JP), filed on Aug. 03, 2007. | ||
| Prior Publication US 2009/0033528 A1, Feb. 05, 2009 | ||
| Int. Cl. H03M 1/10 (2006.01) | ||
| U.S. Cl. 341—120 [714/736; 714/724] | 11 Claims |
| 1. A test apparatus for testing a device under test, the test apparatus comprising:
a test signal supplying section that supplies a digital input signal for testing purposes, to the device under test;
a reference signal output section that outputs an analogue reference signal in accordance with the digital input signal;
a difference obtaining section that outputs an analogue difference signal representing a difference between the analogue reference
signal and an analogue output signal outputted by the device under test in accordance with the digital input signal; and
a determining section that determines whether the analogue output signal shows a defect or not based on the analogue difference
signal.
|