	US 7,612,575 B2
	Electronic device test apparatus for successively testing electronic devices
Akihiko Ito, Tokyo (Japan); Kazuyuki Yamashita, Tokyo (Japan); and Yoshihito Kobayashi, Tokyo (Japan)
Assigned to Advantest Corporation, Tokyo (Japan)
Appl. No. 11/571,428 PCT Filed Jul. 25, 2005, PCT No. PCT/JP2005/013590 § 371(c)(1), (2), (4) Date Mar. 13, 2007, PCT Pub. No. WO2006/009282, PCT Pub. Date Jan. 26, 2006.
Claims priority of application No. 2004-215802 (JP), filed on Jul. 23, 2004.
Prior Publication US 2008/0038098 A1, Feb. 14, 2008
Int. Cl. G01R 31/26 (2006.01); G01R 31/28 (2006.01)

U.S. Cl. 324—765 [324/158.1; 714/738]

13 Claims

1. An electronic device test apparatus comprising:

a test tray for carrying and transporting a plurality of electronic devices;

a plurality of test units each including a test head side transporting said test tray inside the test unit and bringing said electronic devices into electrical contact with sockets on the test head side for an electrical test;

said plurality of test units transporting said electronic devices between the test units using said test tray as a medium;

a loading transport unit for receiving another conveyance medium different from said test tray or a test tray of the same structure and transporting and loading electronic devices to said test tray;

said loading transport unit connected to a frontmost stage test unit and supplying a test tray to said frontmost stage test unit;

an unloading transport unit receiving electronic devices from said test tray and transporting and unloading electronic devices to said other conveyance medium or a test tray of the same structure;

each test unit is provided inside it with a loader unit receiving a test tray loaded into it and conducting an electrical test and an unloader unit unloading a test tray electrically tested at said test unit and is provided with an electronic device transporter for receiving said test tray with said loader unit and transferring said test tray with said unloader unit; and

said electronic device transporter is provided with a temporary buffer device for temporarily storing electronic devices from pockets of said test tray carrying electronic devices or placing stored electronic devices in said pockets.