| US 7,609,803 B2 | ||
| Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatus | ||
| Yosuke Okamoto, Kanagawa-ken (Japan); and Naruomi Akino, Tochigi-ken (Japan) | ||
| Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan); and Toshiba Medical Systems Corporation, Otawara-shi (Japan) | ||
| Filed on Oct. 02, 2008, as Appl. No. 12/244,259. | ||
| Claims priority of application No. 2007-258987 (JP), filed on Oct. 02, 2007. | ||
| Prior Publication US 2009/0092222 A1, Apr. 09, 2009 | ||
| Int. Cl. A61B 6/00 (2006.01) | ||
| U.S. Cl. 378—7 [382/131] | 20 Claims |
| 1. A method for estimating a scattered ray intensity distribution in an X-ray CT apparatus, the method comprising:
irradiating a subject with X-rays; and
configuring a cross-sectional image of the subject by detecting the X-rays passing through the subject,
on the basis of a path length of a scattered ray passing through the subject, an X-ray absorption coefficient of the subject
and an X-ray scattering probability of the subject, intensity of the scattered ray being calculated.
|