| US 7,609,366 B2 | ||
| Material measurement system for obtaining coincident properties and related method | ||
| Ross MacHattie, Mississauga (Canada); Frank M. Haran, Vancouver (Canada); Graham I. Duck, Vancouver (Canada); David R. Jez, Vancouver (Canada); and Dan Gordon, Vancouver (Canada) | ||
| Assigned to Honeywell International Inc., Morristown, N.J. (US) | ||
| Filed on Nov. 16, 2007, as Appl. No. 11/941,574. | ||
| Prior Publication US 2009/0128799 A1, May 21, 2009 | ||
| Int. Cl. G01C 3/08 (2006.01) | ||
| U.S. Cl. 356—5.05 [356/5.01; 356/4.01; 162/49; 162/198; 162/263] | 20 Claims |

| 1. A sheet material measurement system, comprising:
a THz generator including at least one laser source for emitting optical pulses, said optical pulses coupled to a THz emitter
operable for emitting pulsed THz radiation at a first sample location on said sheet material while being processed by a manufacturing
system;
a receiver operable to receive said optical pulses and to detect reflected or transmitted THz radiation from said first sample
location synchronously with said optical pulses and provide electrical detection signals;
synchronizing optics operable to receive said optical pulses from said laser and provide said optical pulses to both said
receiver and said THz emitter, and
a controller comprising at least one processor for receiving said electrical detection signals and providing a processed electrical
detection signal and an analyzer operable to determine a plurality of different sheet material properties selected from the
group consisting of basis weight, moisture content, thickness, composition and fiber orientation at said first sample location
from said processed electrical detection signal.
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