| US 7,603,638 B2 | ||
| Method and system for modeling statistical leakage-current distribution | ||
| Robert Haeussler, Augsburg (Germany); and Harald Kinzelbach, Munich (Germany) | ||
| Assigned to Infineon Technologies AG, Munich (Germany) | ||
| Filed on Jul. 28, 2006, as Appl. No. 11/495,859. | ||
| Prior Publication US 2008/0026489 A1, Jan. 31, 2008 | ||
| Int. Cl. G06F 17/50 (2006.01) | ||
| U.S. Cl. 716—4 [716/1] | 17 Claims |
| 1. A method of modeling statistical variations of a leakage-current of semiconductor chips, the method comprising the steps
of:
generating statistical data with a statistical analysis method using an analysis tool based on Monte-Carlo simulations or
based on a pre characterization response-modeling step for a plurality of representative chip-unit-models;
deriving a plurality of distribution parameters from said statistical data based on a specific class of skew-normal distribution;
deriving values for said distribution parameters representative for realistic chip level leakage-current variations; and
generating leakage-current variation estimates based on said distribution parameters.
|