| US 7,602,996 B2 | ||
| Microscope system and method | ||
| John R. Maddison, Nottingham (United Kingdom) | ||
| Assigned to Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka (Japan) | ||
| Filed on Feb. 04, 2004, as Appl. No. 10/772,591. | ||
| Claims priority of application No. 0302664.8 (GB), filed on Feb. 05, 2003. | ||
| Prior Publication US 2004/0184678 A1, Sep. 23, 2004 | ||
| Int. Cl. G06K 9/46 (2006.01); G06K 9/00 (2006.01); B05D 3/00 (2006.01); G01N 1/28 (2006.01) | ||
| U.S. Cl. 382—291 [382/128; 382/278; 382/144; 427/2.11] | 12 Claims |
| 1. A method for determining a position of an area of an object within said object, wherein an image of said area of said object
is contained within a field of view of a microscope, and wherein image data representing a low magnification image of the
complete object is available, the method comprising the steps of:
acquiring high magnification image data representing an image of the field of view of the microscope;
using one or more processors to perform the steps of:
processing the high magnification image data to reduce the resolution thereof;
comparing the processed high magnification image data with portions of the low magnification image data; and,
determining said position based on the results of said comparison.
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