| US 7,602,923 B2 | ||
| Electro acoustic system built-in test and calibration method | ||
| Yi-Bing Lee, Taipei (Taiwan); and Bo-Ren Bai, Chia-Yi Hsien (Taiwan) | ||
| Assigned to Fortemedia, Inc., Cupertino, Calif. (US) | ||
| Filed on Jan. 06, 2005, as Appl. No. 11/29,367. | ||
| Claims priority of application No. 93125070 A (TW), filed on Aug. 20, 2004. | ||
| Prior Publication US 2006/0039568 A1, Feb. 23, 2006 | ||
| Int. Cl. H04R 29/00 (2006.01) | ||
| U.S. Cl. 381—59 [381/96; 381/108; 381/58; 702/103] | 9 Claims |

| 1. An electro acoustic system built-in test and calibration, replaying and warning method, said electro acoustic system including
an audio receiver with at least one microphone for generating an audio signal and an audio device with a speaker for playing
a voice or warning sound, comprising the steps of:
(a) sending a test signal through a first circuit device to said audio device to produce a test audio signal; said test signal
generated by a self test module for a calibration between said speaker and said at least one microphone;
(b) receiving the test audio signal by a plurality of audio receivers, for enabling the received test audio signal to be sent
by the plurality of respective audio receivers to a plurality of respective second circuit devices for converting said test
audio signal into a plurality of feedback digital signals for comparing a linearity difference between the test audio signal
and the feedback digital signals by the self-test module; and
(c) adjusting at least one parameter value of the first circuit device simultaneously relative to at least one parameter values
of each of the plurality of second circuit devices being respectively connected to the audio receivers, and comparing the
at least one parameter values of each of the plurality of second circuit devices with the corresponding received feedback
digital signals and then determining an optimizing parameter of each of the plurality of second circuit devices such that
the optimized parameters are within a predetermined range of each other;
(d) adjusting the at least one parameter value of the first circuit device when the linearity difference between the test
signal and the feedback digital signal surpasses a predetermined value;
(e) driving the self-test module to send out a warning signal when the self-test module is unable to optimize the at least
one parameter value of one of the first circuit device and at least one of the plurality of second circuit devices.
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