LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 4th DAY OF October, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
Ubahara, Nobuhiro; to Nichia Corporation Nitride semiconductor light emitting element
08030673 Cl. 257-96.
Ube Industries, Ltd.: See--
Nishino, Shigeyoshi; Shima, Hidetaka; Oda, Hiroyuki; and Omata, Yoji
08030512 Cl. 560-102.
Umemoto, Teruo; and Saito, Norimichi
08030516 Cl. 562-829.
Ubiquisys Limited: See--
Carter, Alan; Whittaker, Stephen; and Maida, Aminu Wada
08032142 Cl. 455-444.
Ubiquity Holdings, Inc: See--
Bailey, Kenneth S.; and Carmichael, Christopher
08032113 Cl. 455-406.
Uchida, Hiroyuki: See--
Katoh, Takayuki; Miyashita, Atsushu; Yamazaki, Mitsuhiro; Uchida, Hiroyuki; Shimotono, Susumu; and Tadokoro, Mizuho
08031466 Cl. 361-679.55.
Uchida, Kenko: See--
Noda, Hideyuki; Kohara, Yoshinobu; and Uchida, Kenko
08029744 Cl. 422-504.
Uchida, Mamoru: See--
Takeuchi, Tetsuya; Uchida, Mamoru; Miyamoto, Tomoyuki; and Koyama, Fumio
08031753 Cl. 372-50.11.
Uchida, Satoshi: See--
Hyakutake, Yoshinori; Tsukuda, Yoshiaki; Hashimoto, Takao; Uchida, Satoshi; Ota, Katsuhiro; and Sonoda, Takashi
08028511 Cl. 60-39.12.
Uchida, Tomoyuki: See--
Hisanaga, Toru; Kawamata, Akihiro; Uchida, Tomoyuki; and Oshimizu, Shingo
08028795 Cl. 181-205.
Uchikawa, Hironori: See--
Ishikawa, Tatsuyuki; Honma, Mitsuaki; and Uchikawa, Hironori
08032810 Cl. 714-754.
Uchikawa, Osamu; Koike, Tatsuki; Hoashi, Yasutaka; and Takai, Takafumi, to Takeda Pharmaceutical Company Limited Tricyclic compound and pharmaceutical use thereof
08030337 Cl. 514-375.
Uchino, Keiichi: See--
Goda, Naoki; and Uchino, Keiichi
08028782 Cl. 180-69.2.
Uchino, Satoshi; Obara, Shinya; and Matsuya, So, to Konica Minolta Business Technologies, Inc. Developing roller and image forming method employing the same
08029965 Cl. 430-123.3.
Uchinokura, Osamu: See--
Nagatomo, Tsuneyasu; Watanabe, Naohiro; Uchinokura, Osamu; and Kojima, Satoshi
08029960 Cl. 430-108.6.
Uchitel, Ilan: See--
Better, Hadar; Fostick, Gideon; Uchitel, Ilan; and Gross, Yossi
08029284 Cl. 433-173.
Uchiyama, Akihiko; and Kobayashi, Tatsuya, to Canon Kabushiki Kaisha Image forming apparatus
08029084 Cl. 347-19.
Uchiyama, Akio: See--
Sato, Ryoji; Uchiyama, Akio; and Kimura, Atsushi
08032320 Cl. 702-94.
Uchiyama, Hiroaki; and Nagao, Seiji, to Ricoh Company, Limited Image-capturing apparatus, image-capturing method, and computer program product
08031238 Cl. 348-231.3.
Udo, Motonari: See--
Aoki, Takayasu; Udo, Motonari; Ikuta, Masahiro; Itou, Tsuyoshi; Urabe, Takashi; Hara, Takafumi; Araki, Satoshi; and Noda, Yasuhito
08029962 Cl. 430-110.2.
Uecker, Christopher James: See--
Bradley, Elizabeth Oriel; Runge, Troy Michael; Hurley, Steven Michael; Uecker, Christopher James; Cunningham, Corey Thomas; Vogel, Nathan John; Van Himbergen, Timothy James; Bunyard, William Clayton; and Soerens, Dave Allen
08030226 Cl. 442-97.
Ueda, Naoki: See--
Takashima, Reiko; Nishigaki, Makoto; Sakamoto, Toshinobu; Ueda, Naoki; and Yamamoto, Kenichi
08028636 Cl. 114-57.
Ueda, Satoshi: See--
Mi, Xiaoyu; Shimanouchi, Takeaki; Imai, Masahiko; and Ueda, Satoshi
08031459 Cl. 361-278.
Ueda, Takafumi: See--
Ogihara, Tsutomu; Ueda, Takafumi; and Yano, Toshiharu
08029974 Cl. 430-270.1.
Ueda, Takanori: See--
Niimi, Kuniaki; Tsujimoto, Kenichi; Oda, Tomihisa; Hirota, Shinya; and Ueda, Takanori
08028514 Cl. 60-286.
Ueda, Takashi: See--
Miyazaki, Taichi; Yoshida, Tatsuo; Ueda, Takashi; and Takayama, Terufumi
08029884 Cl. 428-212.
Ueda, Takuji: See--
Van Dien, Stephen; Iwatani, Shintaro; Usuda, Yoshihiro; Matsui, Kazuhiko; Nakai, Yuta; Suzuki, Tomoko; Moriya, Mika; Tsuji, Yuichiro; and Ueda, Takuji
08030036 Cl. 435-115.
Ueda, Toru: See--
Hirata, Masafumi; and Ueda, Toru
08032136 Cl. 455-432.3.
Ueda, Toshikatsu: See--
Tang, Huaipeng; Seta, Akihiro; Anai, Toshihiro; Ueda, Toshikatsu; Okuda, Minoru; Hashigucci, Kazuhiro; and Okubo, Kimihiro
08029729 Cl. 422-50.
Ueffing, Marius: See--
Meitinger, Thomas; Strom, Tim Matthias; Biskup, Saskia; Ueffing, Marius; Kremmer, Elisabeth; Gloeckner, Christian Johannes; Gasser, Thomas; Herzig, Petra; Asmus, Friedrich; Patenge, Nadja; Zimprich, Alexander; Farrer, Matthew J.; Kachergus, Jennifer M.; Lincoln, Sara J.; Hulihan, Mary M.; Wszolek, Zibigniew; and Uitti, Ryan
08029986 Cl. 435-6.
Uehara, Kozo: See--
Hata, Hidenori; Uehara, Kozo; Kimura, Kazuhiro; Kuribayashi, Noriyuki; and Shimomura, Koji
08028747 Cl. 165-182.
Uehara, Susumu; to Ohara Inc. Optical glass
08030233 Cl. 501-73.
Uehara, Yusuke: See--
Liu, Rujie; Baba, Takayuki; Endo, Susumu; Shiitani, Shuchi; Uehara, Yusuke; and Masumoto, Daiki
08031948 Cl. 382-203.
Uehori, Yukiyo: See--
Fuse, Tohru; and Uehori, Yukiyo
08032590 Cl. 709-204.
Uematsu, Yoshio: See--
Suzuki, Hiroyuki; and Uematsu, Yoshio
08031437 Cl. 360-234.5.
Uemura, Katsuhiko: See--
Imanishi, Ryouzou; Morikawa, Tomoyuki; Uemura, Katsuhiko; Yamashita, Nobuyuki; Kurohara, Kazuaki; and Oshima, Hiroshi
08028508 Cl. 56-320.1.
Uemura, Minoru: See--
Narasaki, Masahiko; Akutagawa, Tomoya; Maki, Takamasa; and Uemura, Minoru
08029261 Cl. 425-78.
Ueno, Hideo: See--
Taki, Kazunari; Suzuki, Masashi; Koie, Hiroshi; Ueno, Hideo; Ikeno, Takahiro; and Hosokawa, Takahiro
08031361 Cl. 358-1.16.
Ueno, Hidetoshi: See--
Fukazawa, Yusuke; Hara, Mirai; Ueno, Hidetoshi; Onogi, Masashi; Naganuma, Takefumi; Onogi, Midori; and Kurakake, Shoji
08032526 Cl. 707-722.
Ueno, Kazuhiko: See--
Sakai, Takaaki; and Ueno, Kazuhiko
08030678 Cl. 257-99.
Ueno, Masaji: See--
Ando, Tomohiro; and Ueno, Masaji
08031157 Cl. 345-98.
Ueno, Takahisa; Yonemoto, Kazuya; Suzuki, Ryoji; and Shiono, Koichi, to Sony Corporation Solid state imaging element having horizontal scanning circuit for providing reset signals
08031248 Cl. 348-308.
Uenoyama, Kazuyuki: See--
Aruga, Hiroyasu; Uenoyama, Kazuyuki; and Hashimoto, Toshiya
D0646299 Cl. D15-1.
Ueyanagi, Katsumichi: See--
Soyano, Shin; and Ueyanagi, Katsumichi
08030749 Cl. 257-688.
Ufert, Klaus-Dieter; to Qimonda AG Memory element using reversible switching between SP2 and SP3 hybridized carbon
08030637 Cl. 257-5.
Ugaji, Masaya; Hasegawa, Masaki; Yamamoto, Taisuke; and Ohara, Keisuke, to Panasonic Corporation Negative electrode for non-aqueous electrolyte secondary battery, method for manufacturing the same, and non-aqueous electrolyte secondary battery using the same
08029933 Cl. 429-238.
Ugajin, Atsushi; Hisamura, Toshio; Matsubara, Yoshitake; Tsubota, Hirokazu; Kurashima, Satoshi; Yasui, Osamu; Arai, Yasuhiro; and Fujise, Masaki, to Fuji Xerox Co., Ltd. Encrypting image data based on paper fiber properties, printing encrypted image, and decrypting encrypted image
08031377 Cl. 358-3.28.
Ugajin, Toru: See--
Kumamoto, Yoshiaki; Mukai, Kenta; Ugajin, Toru; Maezawa, Takahiro; Honbo, Naoki; and Isogai, Akira
08029896 Cl. 428-393.
Ugolick, Ronald: See--
Utz, Martin; Lengfeller, Karl; Wilkes, Michael; Chu, Chia-Hsi; Heydarpour, Ramin; Venkatasanthanam, Sriram; Ugolick, Ronald; and Mehrabi, Ali R.
RE042798 Cl. 428-43.
Uh, Kee-Han: See--
Park, Young-Gi; Uh, Kee-Han; Lim, Ji-Suk; and Kwon, Sun-Ja
08031301 Cl. 349-110.
Uhov, Andrei; to Electrolux Home Products Corporation N.V. Method and device for measuring the capacitance of a capacitive component
08030950 Cl. 324-676.
Uhr, Manfred; Holsboer, Florian; Binder, Elisabeth; and Mueller-Myhsok, Bertram, to Max-Planck-Gesellschaft zur Forderung der Wissenshaften e.V. Polymorphisms in ABCB1 associated with a lack of clinical response to medicaments
08030033 Cl. 435-91.2.
Uitti, Ryan: See--
Meitinger, Thomas; Strom, Tim Matthias; Biskup, Saskia; Ueffing, Marius; Kremmer, Elisabeth; Gloeckner, Christian Johannes; Gasser, Thomas; Herzig, Petra; Asmus, Friedrich; Patenge, Nadja; Zimprich, Alexander; Farrer, Matthew J.; Kachergus, Jennifer M.; Lincoln, Sara J.; Hulihan, Mary M.; Wszolek, Zibigniew; and Uitti, Ryan
08029986 Cl. 435-6.
Ukanwa, Maria: See--
Svendsen, Kjeld; and Ukanwa, Maria
08032734 Cl. 712-34.
Ukishima, Sadayuki: See--
Takahashi, Hirohisa; Ishibashi, Satoru; Tani, Noriaki; Ukishima, Sadayuki; Takasawa, Satoru; Nakamura, Kyuzo; and Yamamoto, Haruhiko
08031183 Cl. 345-173.
Ukyo, Shigeo: See--
Maruyama, Gaku; Susuki, Kenta; Kuze, Katsuaki; Ukyo, Shigeo; and Koketsu, Shoji
08030417 Cl. 525-439.
Ulbrich, Jens: See--
Krayer, Elmar; Göhring, Alfred; Jeltsch, Thomas; Ulbrich, Jens; and Welte, Christoph
D0646352 Cl. D23-226.
Uldahl, Mark: See--
Eskildsen, Simon Fristed; Uldahl, Mark; Østergaard, Lasse Riis; and Prisak, Anders
08031919 Cl. 382-128.
Ulges, Adrian: See--
Vincent, Luc; and Ulges, Adrian
08031940 Cl. 382-176.
Ulke, Markus: See--
Schemer, Eric; Wingerter, Tanja B.; and Ulke, Markus
08032567 Cl. 707-811.
Ullmann, Lorin Evan: See--
Benfield, Jason; Hsu, Oliver Yehung; Ullmann, Lorin Evan; and Yarsa, Julianne
08032625 Cl. 709-224.
Ulrich, Karl Thatcher: See--
Cook, Alan J.; Grube, Kristin William; Devlin, Thomas Edward; Greason, Jeff Reed; Ulrich, Karl Thatcher; Ulrich, Nathan Thatcher; and Yau, Chi Lam
08028659 Cl. 119-166.
Ulrich, Nathan Thatcher: See--
Cook, Alan J.; Grube, Kristin William; Devlin, Thomas Edward; Greason, Jeff Reed; Ulrich, Karl Thatcher; Ulrich, Nathan Thatcher; and Yau, Chi Lam
08028659 Cl. 119-166.
Ulvac, Inc: See--
Ulvac, Inc.: See--
Takahashi, Hirohisa; Ishibashi, Satoru; Tani, Noriaki; Ukishima, Sadayuki; Takasawa, Satoru; Nakamura, Kyuzo; and Yamamoto, Haruhiko
08031183 Cl. 345-173.
Um, Pyung-yong; to Eugene Technology Co., Ltd. Partition-type heating apparatus
08030597 Cl. 219-267.
Um, Ye Ji: See--
Jeon, Ho Il; Um, Ye Ji; Lee, Jung Hwan; and Kwon, Hui Jae
D0646141 Cl. D8-316.
Um, Yoon-Sung; Kim, Hoon; Yoo, Hye-Ran; Lyu, Jae-Jin; and Park, Seung-Beom, to Samsung Electronics Co., Ltd. Display panel and liquid crystal display including the same
08031287 Cl. 349-48.
Umehara, Naoto: See--
Kozuka, Shinichi; and Umehara, Naoto
08030216 Cl. 438-711.
Umemoto, Azusa: See--
Kashito, Kiyotaka; Umemoto, Azusa; Nitta, Soichi; Hirata, Masafumi; Enatsu, Aya; Sudo, Tatsuo; Kinoshita, Takuya; and Takahashi, Masafumi
08031171 Cl. 345-156.
Umemoto, Takeshi: See--
Kobayashi, Tatsuya; Suzuki, Masato; Yasutake, Masatoshi; and Umemoto, Takeshi
08028567 Cl. 73-105.
Umemoto, Teruo; and Saito, Norimichi, to UBE Industries, Ltd. Methods for producing perfluoroalkanedi(sulfonyl chloride)
08030516 Cl. 562-829.
Umeo, Tatsuya: See--
Kageyama, Takahisa; Umeo, Tatsuya; and Fukada, Atsushi
08031886 Cl. 381-119.
Kageyama, Takahisa; Umeo, Tatsuya; and Fukada, Atsushi
08031887 Cl. 381-119.
Umesh, Anil: See--
Usuda, Masafumi; and Umesh, Anil
08032171 Cl. 455-522.
Une, Kiyoshi: See--
Kawashima, Hidetoshi; Kishimoto, Yasunari; Higashikata, Ryosuke; Yamauchi, Yasuki; Ito, Akihiro; Hasegawa, Noriko; Tashiro, Yousuke; and Une, Kiyoshi
08031203 Cl. 345-604.
Uni-Charm Corporation: See--
Nakajima, Kaiyo; and Mishima, Yoshitaka
08029486 Cl. 604-385.19.
Unico, Inc.: See--
Messmer, Craig S.; and Riley, Josh J.
08029345 Cl. 454-284.
Unilever Home & Personal Care USA, division of Conopco, Inc.: See--
Bosley, John Anthony; Harding, Clive Roderick; Rawlins, Christopher; Rogers, Julia Sarah; and Scott, Ian Richard
08030352 Cl. 514-559.
Uniloc (Singapore) Private Limited: See--
Richardson, Frederic B.
05490216 Cl. 705-59.
Unipoint Electric Mfg. Co., Ltd.: See--
Chien, Ching-Chuan
08028368 Cl. 15-250.201.
Unisys Corporation: See--
Bergerson, Robert L.; Heit, James R.; and Schultz, Jason C.
08032742 Cl. 713-155.
Meinhardt, Mark M.
08032412 Cl. 705-14.4.
United Microelectronics Corp.: See--
United Services Automobile Association: See--
Fastenau, Lee; Noriega, Anthony R.; and Reed, James
08032424 Cl. 705-26.61.
United States Gypsum Company: See--
Dubey, Ashish; Chan, Cesar; Natesaiyer, Kumar; Durst, Bartley P.; Kinnebrew, Pamela G.; Cummins, Toney K.; Boone, Nicholas; Heard, William F.; Roth, Michael J.; and Slawson, Thomas
08030377 Cl. 524-5.
United States of America as represented by the Administrator of the Environmental Protection Agency, The: See--
Lytle, Darren Alan
08029674 Cl. 210-617.
Varma, Rajender S.; Ju, Yuhong; and Sikdar, Subhas
08029662 Cl. 208-250.
United States of America as represented by the Administrator of the National Aeronautics and Space Administration: See--
Wilson, Andrew; Punnoose, Andrew; Strausser, Katherine; and Parikh, Neil
08030873 Cl. 318-568.12.
United States of America as represented by the Administrator of the National Aeronautics and Space Administration, The: See--
Burns, Bradley M.; and Blalock, Norman N.
08031449 Cl. 361-90.
United States of America as represented by the Department of Health and Human Services, The: See--
Klinman, Dennis; Ishii, Ken; Verthelyi, Daniela; and Mond, James J.
08030285 Cl. 514-44R.
United States of America as represented by the Secretary, Department of Health and Human Services, The: See--
Kawakami, Yutaka; and Rosenberg, Steven A.
08030280 Cl. 514-19.3.
United States of America, as represented by the Secretary of Agriculture, The: See--
Stern, Norman J; Svetoch, Edward A; Eruslanov, Boris V; Perelygin, Vladimir V; Levchuk, Vladimir P; Volodina, Larisa I; Kovalev, Yuri N.; Kudryavtseva, Tamara Y.; Pokhilenko, Victor D.; Borzenkov, Valery N.; Svetoch, Olga E.; Mitsevich, Eugeni V.; and Mitsevich, Irina P.
08029809 Cl. 424-282.1.
United States of America as represented by the Secretary of the Army, The: See--
Bruno, Ferdinando F.; and Favreau, Nicole
08030432 Cl. 528-219.
Emmenegger, Eveline J.; and Kurath, Gael
08030287 Cl. 514-44R.
Woo, Timothy; Moy, Leon; Cohen, Alan N.; Prillaman, Daniel Lee; and Morales, Christina
08028826 Cl. 206-3.
United States of America as represented by the Secretary of the Department of Health and Human Services, The: See--
Kashmiri, Syed V S; Padlan, Eduardo A.; and Schlom, Jeffrey
08029788 Cl. 424-130.1.
Lazarus, Lawrence H.; Okada, Yoshio; and Li, Tingyou
08030341 Cl. 514-408.
United States of America as represented by the Secretary of the Navy, The: See--
Barron, Charlie N.; and Helber, Robert W.
08032314 Cl. 702-50.
Ching, Wei-Mei; and Chao, Chien-Chung
08029804 Cl. 424-234.1.
Harris, Vincent G; and Chen, Zhaohui
08029921 Cl. 428-693.1.
Howarth, Thomas R.
08030825 Cl. 310-339.
Nematollahi, Khosrow; and Ream, Brian
08028830 Cl. 206-317.
Stenger, David A; and Thornton, Jennifer
08032310 Cl. 702-20.
United Technologies Corp.: See--
McCaffrey, Michael G.
08029234 Cl. 415-142.
United Technologies Corporation: See--
Burd, Steven W.; Sowa, William; Cheung, Albert K.; Kramer, Stephen Karl; Smith, Reid Dyer Curtis; and Hoke, James
08028528 Cl. 60-752.
Gratton, Andrew R.
08028414 Cl. 29-898.045.
Norris, James W.; Nordeen, Craig A.; and Raver, Bernard J.
08028513 Cl. 60-226.1.
United Test and Assembly Center Ltd.: See--
Kolan, Ravi Kanth; Liu, Hao; and Toh, Chin Hock
08030761 Cl. 257-713.
Robles, Roel; Retuta, Danny; Cheong, Mary Annie; Tan, Hien Boon; Sun, Anthony Yi Sheng; and Gan, Richard
08030768 Cl. 257-737.
Unity Semiconductor Corporation: See--
Rinerson, Darrell; Chevallier, Christophe; and Siau, Chang Hua
08031545 Cl. 365-203.
Schloss, Lawrence; Brewer, Julie Casperson; Kinney, Wayne; and Meyer, Rene
08031509 Cl. 365-148.
Schloss, Lawrence; Meyer, Rene; Kinney, Wayne; Lambertson, Roy; and Brewer, Julie Casperson
08031510 Cl. 365-148.
Universal Entertainment Corporation: See--
Kosaka, Toshihiko; Kogo, Junichi; Yoshizawa, Kazumasa; and Kato, Yoichi
08029351 Cl. 463-17.
Universal Lighting Technologies, Inc.: See--
Folker, Donald; and LeBlanc, Mike
08031040 Cl. 336-198.
Université Laval: See--
Galstian, Tigran; Presniakov, Vladimir; Asatryan, Karen; and Tork, Amir
08031323 Cl. 349-200.
University of British Columbia, The: See--
Reiner, Neil E.; Tcherkassov, Artem; and Nandan, Devki
08032347 Cl. 703-12.
Wen, Xu; Salcudean, Septimiu E.; Lawrence, Peter D.; and Zahiri-Azar, Reza
08029445 Cl. 600-443.
University of Central Florida Research Foundation, Inc.: See--
Gilson, Richard D; and Razack, Nizam
08032231 Cl. 607-139.
University of Cincinnati: See--
van Ooij, William J.; Sorenson, Max; and Stacy, Matthew B.
08029906 Cl. 428-450.
University of Cincinnati, The: See--
Wu, Dan; Scott, Charles; Co, Carlos; and Ho, Chia-Chi
08029709 Cl. 264-4.1.
University of Connecticut: See--
Srivastava, Pramod K.
08029808 Cl. 424-277.1.
University of Georgia Research Foundation, Inc, The: See--
University of Georgia Research Foundation, Inc.: See--
Armitage, Allan M.; and Knauft, David A.
PP022186 Cl. PLT-431.
Armitage, Allan M.; and Knauft, David A.
PP022187 Cl. PLT-431.
University of Houston: See--
Donnelly, Vincent M.; Economou, Demetre J.; Ruchhoeft, Paul; Xu, Lin; Vemula, Sri Charan; and Jain, Manish Kumar
08030620 Cl. 250-396R.
University of Kentucky Research Foundation: See--
Jay, Michael; and Mumper, Russell J.
08030358 Cl. 514-663.
University of Louisville Research Foundation, Inc.: See--
Bates, Paula J.; Miller, Donald M.; Trent, John O.; and Xu, Xiaohua
08029784 Cl. 424-130.1.
University of Maryland, Baltimore: See--
Shekhar, Raj; and Walimbe, Vivek
08031211 Cl. 345-648.
University of Medicine and Dentistry of New Jersey: See--
Lobel, Peter; and Sleat, David
08029781 Cl. 424-94.1.
Ryazanov, Alexey G.; and Chu, Hsueh-Ping
08030286 Cl. 514-44A.
University of Nottingham, The: See--
Garvey, Seamus Dominic
08030793 Cl. 290-54.
University of Pittsburgh: See--
Beckman, Eric J.; Badylak, Stephen F.; Wells, Alan H.; Zhang, Jianying; and Freytes, Donald
08029774 Cl. 424-78.08.
University of Rochester: See--
University of South Carolina, The: See--
Márton, László; and Czako, Mihaly
08030073 Cl. 435-410.
University of Southern California: See--
Khoshnevis, Behrokh
08029258 Cl. 425-64.
Khoshnevis, Behrokh
08029710 Cl. 264-34.
Narayanan, Shrikanth; and Georgiou, Panayiotis
08032355 Cl. 704-2.
Narayanan, Shrikanth; Georgiou, Panayiotis; Bulut, Murtaza; and Wang, Dagen
08032356 Cl. 704-2.
University of Tennessee Research Foundation: See--
University of Texas at San Antonio, The: See--
Boppana, Rajendra V.; and Winsborough, William H.
08032746 Cl. 713-168.
University of Toledo, The: See--
Deng, Xunming; Liao, Xianbo; and Du, Wenhui
08030120 Cl. 438-96.
Varanasi, Sasidhar; Schall, Constance Ann; Dadi, Anantharam Prasad; Anderson, Jared; Rao, Kripa; Kumar, Guneet; and Paripati, Praveen
08030030 Cl. 435-72.
University of Utah Research Foundation: See--
University of Washington: See--
Hochberg, Michael J.; and Baehr-Jones, Tom
08031985 Cl. 385-2.
University of Yamanashi: See--
Hiraoka, Kenzo; Akashi, Satoko; Takamizawa, Atsushi; and Sunner, Jan Arne
08030090 Cl. 436-173.
Uno, Takanori: See--
Kawamura, Masateru; Ikami, Jun; Uno, Takanori; and Hattori, Tomoaki
08029967 Cl. 430-137.14.
Uno, Toshiyuki: See--
Hayashi, Kazuyuki; Uno, Toshiyuki; and Ebihara, Ken
08029950 Cl. 430-5.
UOP LLC: See--
Liu, Chunqing; Wilson, Stephen T.; and Kulprathipanja, Santi
08030399 Cl. 525-54.3.
Tertel, Jonathan Andrew; Maglente, July S.; and Bahr, David Alden
08028975 Cl. 261-75.
Upalekar, Sunil Ramchandra; Luhadiya, Ravi; Yehuda, Hanna; Marokhovsky, Serge G.; and Doyle, Serena M., to EMC Corporation Methods and apparatus providing root cause analysis on alerts
08032621 Cl. 709-223.
Updike, Stuart J.: See--
Shults, Mark C.; Rhodes, Rathburn K.; Updike, Stuart J.; and Brauker, James H.
07771352 Cl. 600-365.
UPI Semiconductor Corporation: See--
Upreti, Mani: See--
Prakash, Indra; and Upreti, Mani
08030481 Cl. 536-128.
Upsite Technologies, Inc.: See--
Sempliner, Arthur T.; and Pettingill, Jonathan
D0646150 Cl. D8-356.
Urabe, Takashi: See--
Aoki, Takayasu; Udo, Motonari; Ikuta, Masahiro; Itou, Tsuyoshi; Urabe, Takashi; Hara, Takafumi; Araki, Satoshi; and Noda, Yasuhito
08029962 Cl. 430-110.2.
Urairi, Masakatsu: See--
Mochizuki, Amane; Nakamura, Toshitaka; Urairi, Masakatsu; and Pan, Guang
08030127 Cl. 438-99.
Uralwong, Pongsthorn: See--
Rose, Douglas H.; Uralwong, Pongsthorn; and Smith, David D.
08029683 Cl. 216-24.
Uramichi, Hideki: See--
Endo, Takayuki; and Uramichi, Hideki
08029064 Cl. 297-367R.
Uramoto, Yasutaka: See--
Takagi, Nobuhiro; Murao, Yukiteru; Yui, Tomohiro; Uramoto, Yasutaka; Taguchi, Atsushi; Suzuki, Koji; and Kawai, Yoshinao
08031811 Cl. 375-319.
Urano, Junji: See--
Morishita, Naohisa; Yumoto, Toshiyuki; Iwata, Kazuyuki; Honda, Kenji; and Urano, Junji
08028779 Cl. 180-65.265.
Urban, Marcel: See--
Perske, Frank; Steele, Colin; and Urban, Marcel
08030916 Cl. 324-207.25.
Urlberger, Hermann H.: See--
Kurze, Peter; Urlberger, Hermann H.; and Koch, Jürgen
08029907 Cl. 428-469.
Urnes, Sr., James M.; to Boeing Company, The System for shipboard launch and recovery of unmanned aerial vehicle (UAV) aircraft and method therefor
08028952 Cl. 244-63.
Urquijo, Antonio De Miguel: See--
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Uruburu, Philip: See--
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Childers, Darrell R.; Howard, Joseph; Kent, Eric; and Hart, Lisa
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Usa, Toshihiro: See--
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USG Interiors, Inc.: See--
Ushiku, Toru: See--
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Usuda, Masafumi: See--
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Uth, Joshua: See--
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08029477 Cl. 604-175.
Utschick, Wolfgang: See--
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08031584 Cl. 370-208.
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Uwahodo, Yasufumi: See--
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