| US 7,598,762 B2 | ||
| Semiconductor driver circuit with signal swing balance and enhanced testing | ||
| Gyung-Su Byun, Seoul (Korea, Republic of); Kyu-Hyoun Kim, Suwon-si (Korea, Republic of); and Woo-Seop Kim, Seoul (Korea, Republic of) | ||
| Assigned to Samsung Electronics Co., Ltd., Suwon-si (Korea, Republic of) | ||
| Filed on Oct. 04, 2005, as Appl. No. 11/243,369. | ||
| Claims priority of application No. 10-2004-0105326 (KR), filed on Dec. 14, 2004. | ||
| Prior Publication US 2006/0126403 A1, Jun. 15, 2006 | ||
| Int. Cl. G01R 31/26 (2006.01); G01R 31/02 (2006.01) | ||
| U.S. Cl. 324—765 [324/537; 324/158.1; 327/334] | 17 Claims |
| 1. A semiconductor driver circuit comprising:
a first impedance unit for generating a first impedance at a first data pad in response to a first control signal;
a second impedance unit for generating a second impedance at a second data pad in response to a second control signal independent
of the first control signal;
wherein the first data pad outputs a first data signal, and wherein the second data pad outputs a second data signal that
is complementary of the first data signal;
wherein the first and second data signals have respective voltage swings; and
means for adjusting the first and second control signals until the respective voltage swings of the first and second data
signals are substantially equal.
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