US 7,596,051 B2
Semiconductor memory integrated circuit
Tatsuya Sakamoto, Tokyo (Japan)
Assigned to Elpida Memory, Inc., Tokyo (Japan)
Filed on Feb. 05, 2008, as Appl. No. 12/68,289.
Claims priority of application No. 2007-034766 (JP), filed on Feb. 15, 2007.
Prior Publication US 2008/0198684 A1, Aug. 21, 2008
Int. Cl. G11C 8/00 (2006.01)
U.S. Cl. 365—230.08  [365/230.03] 5 Claims
OG exemplary drawing
 
1. A semiconductor memory integrated circuit comprising:
an X-row controller for reading an X address from an X-address signal line in the semiconductor memory integrated circuit, holding the X address in a latch circuit, and outputting the X address stored by the latch circuit to a predecoder selected by an bank active signal, wherein the X-row controller includes:
a high-speed-operation control circuit for generating and outputting a latch-circuit control signal, by which:
when the bank active signal is input into the high-speed-operation control circuit, an X-address reading stop period for stopping the latch circuit from receiving the X address is produced after a predetermined amount of delay time has elapsed from the input of the bank active signal, and
in the periods other than the X-address reading stop period, the latch circuit receives and holds the X address;
a low-current-operation control circuit for generating and outputting a latch-circuit control signal, by which:
when no bank active signal is input into the low-current-operation control circuit, the latch circuit stops receiving the X address, and
when the bank active signal is input into the low-current-operation control circuit, the latch circuit receives and holds the X address after a predetermined amount of delay time has elapsed from the input of the bank active signal;
an input switching circuit for selecting whether the bank active signal is output to the high-speed-operation control circuit or the low-current-operation control circuit in accordance with a switching signal input into the X-row controller; and
an output switching circuit for selecting whether the latch-circuit control signal output from the high-speed-operation control circuit or the latch-circuit control signal output from the low-current-operation control circuit is output to the latch circuit in accordance with the switching signal.