| US 7,594,444 B1 | ||
| Test apparatus and method therewith | ||
| Lei Li, Shenzhen (China); Ping Chen, Shenzhen (China); Chun-Ying Wang, Shenzhen (China); Shu-Zhen Zhang, Shenzhen (China); Xiao-Hong Huang, Shenzhen (China); and Chen-Jing Cao, Shenzhen (China) | ||
| Assigned to Shenzhen Futaihong Precision Industry Co., Ltd., ShenZhen, Guangdong Province (China); and FIH (Hong Kong) Limited, Kowloon (Hong Kong Special Administrative Region of the People's Republic of China, The) | ||
| Filed on Oct. 27, 2008, as Appl. No. 12/258,548. | ||
| Claims priority of application No. 2008 1 0301202 (CN), filed on Apr. 18, 2008. | ||
| Int. Cl. G01L 5/00 (2006.01) | ||
| U.S. Cl. 73—862.01 [73/150 A] | 10 Claims |
| 1. A test apparatus for testing a separation force between a housing and a subsidiary element of a portable electronic device,
the housing defining a plurality of through holes, the subsidiary element is attached to the housing, and covers the through
holes, the test apparatus comprising:
a positioning apparatus for positioning the housing with the subsidiary element therein;
a push mechanism including a support board and a plurality of rods, the rods mounted in the support board, the rods passing
through the through holes and resisting the subsidiary element;
a test machine providing a driven force to press the support board to separate the subsidiary element from the housing.
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