Grima Poveda, Pedro Manuel; Karstens, Willem Frederik Johan; and Timmers, Cornelis Marius 08022218 Cl. 546-173.

Heeres, Gerhardus Johannes 08022228 Cl. 548-426.

Tabuchi, Mitsuharu; Nabeshima, Yoko; Ado, Kazuaki; Tatsumi, Kuniaki; and Takeuchi, Tomonari 08021783 Cl. 429-224.

Nohara, Osamu; Yokoyama, Katsuhiko; and Tanabe, Sadayuki 08022564 Cl. 290-44.

Bergman, Ruth; Nachlieli, Hila; and Ruckenstein, Gitit 08023766 Cl. 382-275.

Verhaegen, Staf; and Nackaerts, Axel 08021989 Cl. 438-773.

Nadehara, Kouhei; to NEC Corporation Debugger and debugging method for debugging a system-on-chip device including a microprocessor core 08024614 Cl. 714-34.

Li, Dun Alex; and Nafis, Christopher Allen 08022990 Cl. 348-187.

Engler, Heidrun; Nagabhushan, Tattanahalli L.; and Youngster, Stephen Kenneth 08022044 Cl. 514-26.

Morinaga, Kazuyuki; Nagahara, Hideaki; Suzuki, Yoshiaki; Iwata, Naohiro; Terashima, Hideyuki; and Tomoda, Akihiro 08023163 Cl. 358-498.

Nagahara, Mikio: See--

Imafuku, Shigeru; Nagahara, Mikio; Mizuochi, Shunichi; Hayashi, Akifumi; and Kurata, Tomoyuki 08022865 Cl. 342-357.25.

Nagai, Atsushi; and Nakayama, Kazutaka, to Noritake Co., Limited Photosensitive conductive paste for transferring and photosensitive transfer sheet 08021821 Cl. 430-270.1.

Nagai, Hideo; to Panasonic Corporation Semiconductor light emitting device, illumination module, illumination apparatus, method for manufacturing semiconductor light emitting device, and method for manufacturing semiconductor light emitting element 08022420 Cl. 257-88.

Nagai, Hiromi: See--

Fukuda, Yuichi; Kojima, Noriaki; Sakanobe, Makoto; Nagai, Hiromi; Akamatsu, Hiroaki; and Katahira, Masahiro 08023878 Cl. 399-350.

Nagai, Takuya: See--

Ohashi, Tsuyoshi; Yamaguchi, Koshiro; Moriyama, Satoru; Nagai, Takuya; and Maeda, Yoshinori 08020774 Cl. 235-492.

Nagai, Youichi; to Sumitomo Electric Industries, Ltd. Photodiode array, method of manufacturing the same, and detecting device 08022449 Cl. 257-290.

Nagamatsu, Takayuki; to Sharp Kabushiki Kaisha Content processing device, content processing method, control program, and storage medium 08024754 Cl. 725-39.

Echigoya, Kenichi; and Nagamine, Hisayuki 08023303 Cl. 365-51.

Kawakubo, Takashi; Nagano, Toshihiko; and Nishigaki, Michihiko 08022599 Cl. 310-330.

Tsuchiya, Tadao; Shouji, Manabu; Naganuma, Tsukasa; Hourai, Yasuharu; Omori, Kenichi; Kakimoto, Kazuhito; and Ozawa, Hidetaka 08020533 Cl. 123-478.

Tadaki, Toshihiro; Shibata, Masahiro; Nagaoka, Tamotsu; and Sone, Takuo 08022129 Cl. 524-492.

Nagaraj, Krishnasawamy; Nayak, Neeraj; Madhavapeddi, Srinadh; and Haroun, Baher, to Texas Instruments Incorporated Low phase noise frequency synthesizer 08022778 Cl. 331-117FE.

Nagarajan, Ramesh; Tse, Francis Kapo; Lee, Chia-Hao; Cassidy, John Christopher; and Wu, John W., to Xerox Corporation Method and system for improved copy quality by generating contone value based on pixel pattern and image context type around pixel of interest 08023150 Cl. 358-2.1.

Nagasawa, Hideharu; and Shimizu, Yuki, to Fujifilm Corporation Organic pigment fine particles and method of producing the same 08021475 Cl. 106-493.

Nagasawa, Koichi: See--

Koubuchi, Yasushi; Nagasawa, Koichi; Moniwa, Masahiro; Yamada, Youhei; and Takeda, Toshifumi 08022550 Cl. 257-766.

Ohmi, Tadahiro; Ikeda, Nobukazu; Nishino, Kouji; Nagase, Masaaki; Dohi, Kyousuke; and Nishimura, Ryutaro 08020574 Cl. 137-12.

Nagase, Takeshi; to Mitsubishi Jidosha Kogyo Kabushiki Kaisha Spare tire cover supporting structure 08020736 Cl. 224-42.2.

Nagase, Tomoki: See--

Fuji, Masaru; Okura, Seiji; and Nagase, Tomoki 08024175 Cl. 704-7.

Nagashima, Fumio; to Fujitsu Limited Information equipment for detecting fall 08024150 Cl. 702-141.

Nagashima, Shigeki: See--

Doi, Yasuhiro; Ito, Yasushi; and Nagashima, Shigeki 08022131 Cl. 524-501.

Nagatomi, Kenji; and Hibino, Katsutoshi, to Sanyo Electric Co., Ltd. Optical pickup device 08023387 Cl. 369-112.01.

Toyozumi, Morihiko; Tsuji, Isao; Nagayasu, Daiki; Sakata, Tsutomu; Fujita, Tetsuya; and Kim, Sung-Jin 08020920 Cl. 296-146.7.

Cao, Chi-Thuan; Baumann, Dietmar; Hofmann, Dirk; Vollert, Herbert; Nagel, Willi; Henke, Andreas; Foitzik, Bertram; Goetzelmann, Bernd; and Frick, Hans 08020675 Cl. 188-157.

Guenther, Joachim; Nagelschmicd, Klaus; Moeller, Friedemann; Mcuer, Roland; and Blatz, Thomas 08021214 Cl. 451-359.

Zuniga, Steven M.; Nagengast, Andrew J.; and Oh, Jeonghoon 08021215 Cl. 451-398.

Sano, Akihito; Fujimoto, Hideo; and Ikemata, Yoshito 08024070 Cl. 700-254.

Kezys, Vytautas Robertas; Nagy, Thomas Charles; Robertson, Ian; and Dunk, Craig A. 08023994 Cl. 455-552.1.

Armstrong, Ralph; and Nahill, Thomas E. 08021587 Cl. 264-255.

Nahm, Kitae; Zheng, Esther Xing; and Kashyap, Praveen, to Samsung Electronics Co., Ltd. System and method for peer-to-peer datacasting in a broadcasting network 08024723 Cl. 717-172.

Naidu, A. Satyanarayan; Naidu, A. G. Tezus; and Naidu, A. G. Sreus 08021659 Cl. 424-94.1.

Naidu, A. G. Tezus: See--

Naidu, A. Satyanarayan; Naidu, A. G. Tezus; and Naidu, A. G. Sreus 08021659 Cl. 424-94.1.

Naidu, A. Satyanarayan; Naidu, A. G. Tezus; and Naidu, A. G. Sreus, to Naidu LP Coenzyme Q10, lactoferrin and angiogenin compositions and uses thereof 08021659 Cl. 424-94.1.

Naidu LP: See--

Naidu, A. Satyanarayan; Naidu, A. G. Tezus; and Naidu, A. G. Sreus 08021659 Cl. 424-94.1.

Tokita, Koji; Watanabe, Takeo; Naijo, Shuichi; and Gomi, Shuji 08021033 Cl. 362-615.

Russo, Neil; Naik, Shailesh I.; and Silverstein, Steven M. 08021013 Cl. 362-150.

Nair, Rahul; Davis, Marc Eliot; Higgins, Christopher William; and King, Simon P., to Yahoo! Inc. System and method for deriving income from URL based context queries 08024317 Cl. 707-709.

Naito, Manami; Tanaka, Atsushi; Hagiwara, Toshiyuki; and Tsubaki, Yasunori, to Mitsubishi Electric Corporation Screen synchronous control apparatus 08022894 Cl. 345-2.2.

Naito, Takashi: See--

Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Akata, Hiroyuki; Naito, Takashi; Kanazawa, Keiichi; Kijima, Yuuichi; Hirasawa, Shigemi; Asakura, Shunichi; and Hayashibara, Mitsuo 08022000 Cl. 501-21.

Naito, Tomonari; Umeda, Michio; and Takahashi, Akiko, to Nitto Denko Corporation Pressure-sensitive adhesive sheet 08022125 Cl. 524-187.

Naitoh, Yasuhisa; Morita, Yukinori; Horikawa, Masayo; and Shimizu, Tetsuo, to National Institute of Advanced Industrial Science and Technology Two-terminal resistance switching element with silicon, and semiconductor device 08022383 Cl. 257-4.

Najmabadi, Kioumars; Shivitz, William F.; Coleman, Edward Ernest; Ho, John Koon-hung; Johnson, Richard D.; Carver, William F.; Grubb, David W.; and McIntosh, Robert James, to Boeing Company, The Wing-body load alleviation for aircraft 08024079 Cl. 701-3.

Nishimura, Kazumasa; Nakabayashi, Ryo; Hasegawa, Naoya; Saito, Masamichi; Ide, Yosuke; and Ishizone, Masahiko 08023233 Cl. 360-324.2.

Kurata, Masakazu; Hisazumi, Takumi; Nakakuki, Yasuhito; and Nakada, Mitsuaki 08020660 Cl. 180-417.

Sugimoto, Keiichi; and Nakagawa, Mitsuru 08020289 Cl. 29-841.

Nakagawa, Shigeyuki: See--

Kobayashi, Kojiro; Hirose, Akio; Nakagawa, Shigeyuki; Miyamoto, Kenji; Kasukawa, Minoru; Inoue, Masayuki; and Morita, Tetsuji 08020749 Cl. 228-178.

Nakagawa, Takashi; to Kowa Co., Ltd. Therapeutic agent for glomerular disease 08022086 Cl. 514-311.

Nakagawa, Takashi; to Renesas Electronics Corporation Address detection circuit and address detection method 08023372 Cl. 369-47.28.

Nakagawa, Takuma: See--

Higuchi, Hiroshi; Umezawa, Junji; Sato, Katsunori; and Nakagawa, Takuma 08021249 Cl. 473-384.

Nakagawa, Terry Y.: See--

Siegel, Robert W.; Tyner, Joan D.; and Nakagawa, Terry Y. 08022188 Cl. 530-387.1.

Nakagawa, Yoichi: See--

Murakami, Yutaka; Orihashi, Masayuki; Matsuoka, Akihiko; and Nakagawa, Yoichi 08023488 Cl. 370-343.

Honda, Shiro; Sawaoka, Ryuji; and Nakahara, Koyomi 08021752 Cl. 428-413.

Nakahara, Masanori: See--

Takakuwa, Nobuyuki; Fukuda, Yasuko; Sawabe, Takao; Kanegae, Tohru; Nakahara, Masanori; Koda, Takeshi; and Imamura, Akira 08023797 Cl. 386-248.

Nakai, Daisaburou; and Hashimoto, Yoshiharu, to Renesas Electronics Corporation Apparatus for driving a plurality of display units using common driving circuits 08022892 Cl. 345-1.1.

Nakai, Tohru: See--

En, Honchin; Hayashi, Masayuki; Wang, Dongdong; Shimada, Kenichi; Asai, Motoo; Sekine, Koji; Nakai, Tohru; Ichikawa, Shinichiro; and Toyoda, Yukihiko 08020291 Cl. 29-846.

Nakai, Toshihiro; Kashino, Hiroshi; Miki, Takeshi; and Saibara, Shoji, to Hitachi Maxell Energy, Ltd. Hydrogen producing apparatus and fuel cell system using the same 08021793 Cl. 429-416.

Sando, Yasuhiro; Nakajima, Akihisa; and Higashino, Kusunoki 08021629 Cl. 422-505.

Nakajima, Hirokazu: See--

Soga, Tasao; Shimokawa, Hanae; Nakatsuka, Tetsuya; Miura, Kazuma; Negishi, Mikio; Nakajima, Hirokazu; and Endoh, Tsuneo 08022551 Cl. 257-772.

Nakajima, Kaori; to Fujitsu Limited Voice input support program, voice input support device, and voice input support method 08023666 Cl. 381-110.

Nakajima, Ken: See--

Kato, Fumiaki; and Nakajima, Ken 08023748 Cl. 382-232.

Nakajima, Noriko: See--

Taguchi, Yuichi; Yamamoto, Masayuki; Nasu, Hiroshi; and Nakajima, Noriko 08024532 Cl. 711-154.

Nakajima, Setsuo; and Arai, Yasuyuki, to Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of manufacturing the semiconductor device 08023055 Cl. 349-43.

Nakajima, Shigeru: See--

Sugawara, Takuya; Tada, Yoshihide; Nakamura, Genji; Ozaki, Shigenori; Nakanishi, Toshio; Sasaki, Masaru; Matsuyama, Seiji; Hasebe, Kazuhide; Nakajima, Shigeru; and Fujiwara, Tomonori 08021987 Cl. 438-758.

Nakajima, Shinichi; to Olympus Corporation Solid-state imaging apparatus for overcoming effects of power fluctuations 08023026 Cl. 348-308.

Nakajima, Shinichiro; to JTEKT Corporation Differential limiting apparatus 08021261 Cl. 475-249.

Nakajima, Tomohiro: See--

Nakamura, Tadashi; Nakajima, Tomohiro; and Imai, Shigeaki 08023166 Cl. 359-224.1.

Nakakita, Osamu; Okazaki, Yoshimi; and Yamazaki, Hiroyuki, to Mitsubishi Heavy Industries, Ltd. Inverter apparatus suitable for battery vehicle 08023281 Cl. 361-775.

Nakakubo, Toru; to Canon Kabushiki Kaisha Heat transfer controlling mechanism and fuel cell system having the heat transfer controlling mechanism 08020613 Cl. 165-272.

Kurata, Masakazu; Hisazumi, Takumi; Nakakuki, Yasuhito; and Nakada, Mitsuaki 08020660 Cl. 180-417.

Furuichi, Kazuteru; Miyata, Masamitsu; and Nakamoto, Hiroshi 08023069 Cl. 349-65.

Shoji, Mamoru; Koishi, Kenji; Nakamura, Atsushi; Ishida, Takashi; and Tasaka, Shuichi 08023380 Cl. 369-59.11.

Nakamura, Daisaku: See--

Tanifuji, Shigeyuki; Nakamura, Daisaku; and Takasaki, Shinya 08022207 Cl. 544-179.

Nakamura, Fumihiko: See--

Iwazaki, Yasushi; Kidokoro, Toru; Sawada, Hiroshi; Imamura, Keiji; and Nakamura, Fumihiko 08024105 Cl. 701-107.

Nakamura, Genji: See--

Sugawara, Takuya; Tada, Yoshihide; Nakamura, Genji; Ozaki, Shigenori; Nakanishi, Toshio; Sasaki, Masaru; Matsuyama, Seiji; Hasebe, Kazuhide; Nakajima, Shigeru; and Fujiwara, Tomonori 08021987 Cl. 438-758.

Nakamura, Hiroaki: See--

Saito, Masatoshi; Nakano, Yuki; and Nakamura, Hiroaki 08022401 Cl. 257-40.

Nakamura, Hiroshi; to Kabushiki Kaisha Toshiba Boost circuit 08022750 Cl. 327-536.

Nakamura, Keiichi: See--

Minoguchi, Kazumi; and Nakamura, Keiichi 08021391 Cl. 606-235.

Tanida, Mutsumi; Mori, Nobuyuki; and Nakamura, Keiichi 08021502 Cl. 148-593.

Nakamura, Kentarou; to Konica Minolta Opto, Inc. Objective lens, optical pickup apparatus, and optical information recording reproducing apparatus 08023388 Cl. 369-112.08.

Nakamura, Kentarou; to Konica Minolta Opto, Inc. Objective lens, optical pickup apparatus, and optical information recording reproducing apparatus 08023389 Cl. 369-112.08.

Nakamura, Kimiaki: See--

Sasaki, Takahiro; Takeda, Arihiro; Ohmuro, Katsufumi; Chida, Hideo; Koike, Yoshio; Nakamura, Kimiaki; and Tashiro, Kunihiro 08023085 Cl. 349-129.

Nakamura, Masahide: See--

Suzuki, Tatsuya; Matsumoto, Shinji; Nakamura, Masahide; and Jimbo, Tomohiro 08024099 Cl. 701-70.

Nakamura, Masato: See--

Nakatsuka, Tetsuya; and Nakamura, Masato 08020747 Cl. 228-110.1.

Nakamura, Mitsuaki: See--

Shimma, Nobuo; Ebiike, Hirosato; Ohwada, Jun; Kawada, Hatsuo; Morikami, Kenji; Nakamura, Mitsuaki; Yoshida, Miyuki; Ishii, Nobuya; Hasegawa, Masami; Yamamoto, Shun; and Koyama, Kohei 08022205 Cl. 544-114.

Nakamura, Reki: See--

Sudo, Kazuhisa; Ishibashi, Mikio; Iwasaki, Yukiko; Ohtoshi, Megumi; Nakamura, Reki; Yamada, Masafumi; Koinuma, Nobuyuki; and Sakamaki, Takashi 08023877 Cl. 399-341.

Nakamura, Sadatoshi: See--

Goto, Yukio; Ikawa, Masahiko; Kumazawa, Hiroyuki; and Nakamura, Sadatoshi 08023894 Cl. 455-41.2.

Nakamura, Satoshi; and Watanabe, Mikio, to Fujifilm Corporation Image recording apparatus and image recording method 08023005 Cl. 348-231.2.

Nakamura, Shigeru; to Fujifilm Corporation Radiation detector 08022451 Cl. 257-293.

Nakamura, Shuji; and DenBaars, Steven P., to Regents of the University of California, The Standing transparent mirrorless light emitting diode 08022423 Cl. 257-95.

Nakamura, Tadashi; Nakajima, Tomohiro; and Imai, Shigeaki, to Ricoh Company, Limited Optical scanning device and image forming apparatus 08023166 Cl. 359-224.1.

Nakamura, Takeaki: See--

Miyamoto, Shinichi; Kameya, Takayuki; Watanabe, Katsushi; Matsumoto, Kazutaka; and Nakamura, Takeaki 08022979 Cl. 348-65.

Nakamura, Takehiro: See--

Motegi, Masayuki; Kato, Yasuhiro; Ishii, Minami; and Nakamura, Takehiro 08023460 Cl. 370-329.

Nakamura, Teruo; Sekimori, Yasuo; Machida, Minoru; Kawata, Hiromitsu; and Miyamoto, Hajime, to Chugai Seiyaku Kabushiki Kaisha PEG-conjugated erythropoietin 08022191 Cl. 530-399.

Nakamura, Tsuyoshi: See--

Shimizu, Hiroaki; Nakamura, Tsuyoshi; Dazai, Takahiro; Shiono, Daiju; and Hirano, Tomoyuki 08021823 Cl. 430-270.1.

Nakamura, Tsuyoshi; and Saji, Nobuhito, to NSK Ltd. Positioning apparatus 08021485 Cl. 118-719.

Nakamura, Yukio: See--

Toyama, Hiroshi; and Nakamura, Yukio 08023070 Cl. 349-69.

Ishihara, Toshiharu; Tokumoto, Yoshitomo; Hakamata, Sinji; Joushita, Kaname; Horiuchi, Tomoharu; Yahata, Noriyuki; and Nakane, Naoki 08020454 Cl. 73-862.331.

Mizunuma, Masanori; and Kimura, Takao 08021152 Cl. 433-126.

Nakanishi, Toshio: See--

Sugawara, Takuya; Tada, Yoshihide; Nakamura, Genji; Ozaki, Shigenori; Nakanishi, Toshio; Sasaki, Masaru; Matsuyama, Seiji; Hasebe, Kazuhide; Nakajima, Shigeru; and Fujiwara, Tomonori 08021987 Cl. 438-758.

Hiraoka, Nobuyasu; Okumura, Tsuyoshi; and Nakano, Akiyoshi 08020240 Cl. 15-77.

Nakano, Kenichi; and Yoshida, Yoshihiro, to Honda Motor Co., Ltd. Shaft member coupling structure 08021073 Cl. 403-379.5.

Nakano, Rieko; Takemoto, Masaki; and Shima, Yoshikazu, to Mitsubishi Gas Chemical Company, Inc. Process for producing glycidyl 2-hydroxyisobutyrate and composition containing the product 08022233 Cl. 549-531.

Nakano, Shusaku: See--

Iwakawa, Yasuko; Nakano, Shusaku; and Matsuda, Shoichi 08021572 Cl. 252-299.61.

Nakano, Takashi: See--

Akagi, Nozomu; Takahashi, Shigeki; Nakano, Takashi; Higuchi, Yasushi; Fujii, Tetsuo; Hattori, Yoshiyuki; and Kuwahara, Makoto 08022477 Cl. 257-343.

Nakano, Tsuyoshi; and Hata, Masahiko, to Sumitomo Chemical Company, Limited Compound semiconductor epitaxial substrate and manufacturing method thereof 08022440 Cl. 257-194.

Nakano, Yoshio: See--

Katayama, Toshiyuki; Nakano, Yoshio; Yagi, Takashi; and Matsui, Masamichi 08020897 Cl. 285-256.

Nakano, Yuki: See--

Saito, Masatoshi; Nakano, Yuki; and Nakamura, Hiroaki 08022401 Cl. 257-40.

Nakao, Hajime; to Sony Corporation Liquid crystal display device and manufacturing method of the liquid crystal display device 08023088 Cl. 349-143.

Nakashima, Masami; Kato, Yoshiharu; and Komura, Kazufumi, to Fujitsu Semiconductor Limited Semiconductor memory device, refresh control method thereof, and test method thereof 08023353 Cl. 365-222.

Nakashima, Mikio: See--

Nishimura, Hideki; and Nakashima, Mikio 08020315 Cl. 34-350.

Kageyama, Yuichi; Honda, Yasuaki; Kikkawa, Norifumi; Kusakabe, Toshiaki; Hara, Masahiro; Nakata, Junichi; and Hamada, Gen 08024340 Cl. 707-736.

Nakata, Tetsuyoshi: See--

Yamashiro, Toshihiro; Yoshigai, Shigeru; Ogura, Yoshimitsu; and Nakata, Tetsuyoshi 08020959 Cl. 347-16.

Nakatani, Takanobu; to Kyocera Mita Corporation Image forming apparatus 08021041 Cl. 374-162.

Nakatsu, Haruhiko; to Canon Kabushiki Kaisha Image forming apparatus 08023873 Cl. 399-302.

Nakatsuka, Hiroshi; Yamakawa, Takehiko; and Onishi, Keiji, to Panasonic Corporation Micromachine switch, filter circuit, duplexer circuit, and communication device 08022794 Cl. 333-262.

Nakatsuka, Tetsuya: See--

Soga, Tasao; Shimokawa, Hanae; Nakatsuka, Tetsuya; Miura, Kazuma; Negishi, Mikio; Nakajima, Hirokazu; and Endoh, Tsuneo 08022551 Cl. 257-772.

Nakatsuka, Tetsuya; and Nakamura, Masato, to Hitachi, Ltd. Soldering method and soldering apparatus 08020747 Cl. 228-110.1.

Akashi, Ryojiro; and Nakayama, Daisuke 08023176 Cl. 359-296.

Nakayama, Hideaki: See--

Itou, Ken; and Nakayama, Hideaki 08022650 Cl. 318-432.

Nakayama, Hideo: See--

Ueno, Osamu; Sakamoto, Akira; Sakai, Kazuhiro; Nakayama, Hideo; and Murakami, Akemi 08023539 Cl. 372-26.

Nakayama, Kazutaka: See--

Inoue, Toshihiko; Nakayama, Kazutaka; and Iwayama, Takatoshi 08020466 Cl. 74-490.02.

Nagai, Atsushi; and Nakayama, Kazutaka 08021821 Cl. 430-270.1.

Nakayama, Masahiko; and Akiyama, Hiroshi, to Ricoh Company, Ltd. Optical pickup apparatus and optical disk drive apparatus 08023386 Cl. 369-112.01.

Nakayama, Masahiro; and Irikura, Masato, to Sumitomo Electric Industries, Ltd. Chamfered freestanding nitride semiconductor wafer and method of chamfering nitride semiconductor wafer 08022438 Cl. 257-171.

Nakayama, Shinsaku: See--

Inagawa, Toshinori; Nakayama, Shinsaku; and Masubuchi, Yoshinori 08022562 Cl. 290-40A.

Nakayama, Tadayoshi; to Nissan Motor Co., Ltd. Engaging and fixing structure and engaging and fixing method 08020905 Cl. 293-115.

Nakayama, Tatsuki; and Shindo, Hideki, to Mitutoyo Corporation Circularity measuring apparatus 08020309 Cl. 33-550.

Nakayama, Tomonari: See--

Miura, Daisuke; Nakayama, Tomonari; Ohnishi, Toshinobu; Kubota, Makoto; Masumoto, Akane; Tsuzuki, Hidetoshi; and Miyachi, Makiko 08021915 Cl. 438-99.

Nakayama, Toshitaka: See--

Shima, Shinji; Nakayama, Toshitaka; and Shibata, Tomoaki 08021602 Cl. 266-177.

Nakayama, Yuri; to Sharp Kabushiki Kaisha Image compressing apparatus and image reading apparatus including the same, image processing apparatus including image compressing apparatus and image forming apparatus including the same, image compression processing method, computer program thereof, and recording medium 08023749 Cl. 382-232.

Yamamoto, Tsunenori; Ohara, Ken; Nakayoshi, Yoshiaki; Edo, Susumu; and Saito, Hiroshi 08023087 Cl. 349-143.

Berry, Norman Micheal; Nakazawa, Akira; and Silverbrook, Kia 08020962 Cl. 347-29.

Brown, Brian Robert; Berry, Norman Micheal; Jackson, Garry Raymond; Sharp, Paul Timothy; Morgan, John Douglas Peter; Silverbrook, Kia; Nakazawa, Akira; Hudson, Michael John; Mallinson, Samuel George; Reichl, Paul Justin; and Hibbard, Christopher 08020965 Cl. 347-40.

Kinoshita, Yoshiki; Furihata, Hideki; Takami, Toru; and Nakazawa, Akira 08020771 Cl. 235-475.

Sato, Jin; Nakazawa, Akira; and Momose, Katsumi 08023105 Cl. 355-72.

Silverbrook, Kia; Berry, Norman Micheal; Jackson, Garry Raymond; and Nakazawa, Akira 08020969 Cl. 347-49.

Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 08020976 Cl. 347-85.

Nakazawa, Hiroshi: See--

Sato, Shuji; Iwazaki, Eisuke; Sugawara, Atsushi; Ninomiya, Masanobu; and Nakazawa, Hiroshi 08021813 Cl. 430-108.1.

Nakazawa, Osamu; Hachisuka, Nozomu; and Hiraki, Tetsuya, to TDK Corporation Wafer and manufacturing method of electronic component 08021712 Cl. 427-97.6.

Kitada, Kazuo; Nakazono, Takuya; Koshio, Satoru; and Yura, Tomokazu 08021510 Cl. 156-259.

Tao, Satoru; and Nakura, Makoto 08023872 Cl. 399-302.

Furman, Gary S.; Bonday, Laurence S.; and John, Shiby 08021518 Cl. 162-184.

Nalco Mobotec, Inc.: See--

Higgins, Brian S.; and Moberg, Goran 08021635 Cl. 423-235.

Nalesso, Federico; Fisher, Mark S.; and Wall, William Shaun, to Medical Components, Inc. Syringe for sequential expression of different liquids 08021343 Cl. 604-191.

Nalesso, Federico; Fisher, Mark S.; and Wall, W. Shaun, to Medical Components, Inc. Method of using a syringe 08021349 Cl. 604-508.

Nalla, Amar; Avadhanam, Srikanth R.; and Plancarte, Gustavo, to Microsoft Corporation Server session management application program interface and schema 08024439 Cl. 709-223.

Oh, Sung Hyun; and Nam, Byung Ho 08021805 Cl. 430-5.

Nam, Joong Jin: See--

Kim, Youn Suk; Bae, Hyo Gun; Nam, Joong Jin; Won, Jun Goo; and Kim, Ki Joong 08022762 Cl. 330-165.

Nam, Kyung-Tae: See--

Kim, Hyun-Jo; Nam, Kyung-Tae; Baek, In-Gyu; Oh, Se-Chung; Lee, Jang-Eun; and Jeong, Jun-Ho 08023311 Cl. 365-148.

Nam, Sang-June; Chung, So-Young; Han, Jeong-Jun; Choi, Wang-Keun; Park, Chang-Seo; Kim, Yun-Sik; Cho, Sang-Woo; Lee, Young-Ho; Kim, Jin-Wook; and Koh, Ui-Chan, to Doosan Corporation Composition for protection and improvement of skin, or reinforcing skin barrier function comprising phosphatidylserine 08022051 Cl. 514-114.

Nam, Seok Hyun: See--

Kim, Young Sic; Im, Seoung Jae; Shunichi, Kubota; Lee, Jae Ho; Kim, Tae Gon; Nam, Seok Hyun; and Lee, Dong Chin 08021575 Cl. 252-301.4R.

Nam, Seung Hee: See--

Kwon, Oh Nam; and Nam, Seung Hee 08021818 Cl. 430-270.1.

Namba, Shu; Yamashita, Naoko; and Yaeo, Daisuke, to Panasonic Corporation Projection type display apparatus having a controlling unit for controlling a rotation rate of the fan of a cooling unit with reference to information regarding lighting state of light sources 08022348 Cl. 250-205.

Nambu, Hidetaka; to Renesas Electronics Corporation Method of manufacturing a semiconductor device including optical test pattern above a light shielding film 08021899 Cl. 438-18.

Sawai, Yuichi; Shiono, Osamu; Namekawa, Takashi; Akata, Hiroyuki; Naito, Takashi; Kanazawa, Keiichi; Kijima, Yuuichi; Hirasawa, Shigemi; Asakura, Shunichi; and Hayashibara, Mitsuo 08022000 Cl. 501-21.

Namgoong, Jong; to Jiris Co., Ltd. Iris recognition system, a method thereof, and an encryption system using the same 08023699 Cl. 382-115.

Ueda, Minoru; Kaneda, Shoichi; and Ueno, Kenji 08022799 Cl. 335-222.

Ivan, William T.; and Namuduri, Chandra S. 08022710 Cl. 324-522.

Van Maanen, Keith D.; Gleason, Sean E.; Namuduri, Chandra S.; and Wybo, Steven V. 08020650 Cl. 180-65.265.

Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Yu, Frank I-Kang; Ma, Abraham C.; and Shen, Ming-Shiang 08021166 Cl. 439-76.1.

Nanda, Arun K.; Rossi, Nace; and Singh, Ranbir, to Agere Systems Inc. Robust shallow trench isolation structures and a method for forming shallow trench isolation structures 08022481 Cl. 257-374.

Nanda, Sanjiv: See--

Jayaram, Ranjith; Meylan, Arnaud; Gupta, Kirti; Deshpande, Manoj M.; and Nanda, Sanjiv 08023497 Cl. 370-352.

Reis, Andre Inacio; Rasmussen, Anders Bo; Correia, Vinicius Pazutti; and Andersen, Ole Christian 08024695 Cl. 716-132.

Weber, Mark A. 08023184 Cl. 359-385.

Farning, Abigail R.; Sarkas, Harry W.; and Murray, Patrick G. 08022025 Cl. 510-180.

Chen, Jen-Chun; and Yang, Wu-Der 08022523 Cl. 257-686.

Ogawa, Yuichi; Naoe, Masamu; and Yoshizawa, Yoshihito 08021498 Cl. 148-304.

Hoiness, Stuart E.; Napiorkowski, John J.; Blake, Kathleen E.; Brower, Boyd G.; and Nguyen, Tuy T. 08023997 Cl. 455-557.

Nara, Kaoru; and Suzuki, Makoto, to Sony Corporation Digital broadcast receiver and backup method 08024757 Cl. 725-58.

Nara, Kazutaka; Urabe, Haruki; Saitoh, Tsunetoshi; and Morimoto, Masahito, to Furukawa Electric Co., Ltd., The Broadband wavelength multiplexing and demultiplexing filter and optical splitter with optical signal multiplexing and demultiplexing function 08023781 Cl. 385-14.

Nara, Nobuyoshi: See--

Murakami, Tetsuya; Nara, Nobuyoshi; and Imamiya, Kenichi 08023355 Cl. 365-226.

Narahara, Kazuhiro; Kato, Hirotaka; and Hayashida, Koichiro, to Sumco Techxiv Corporation Method of manufacturing epitaxial silicon wafer and apparatus therefor 08021484 Cl. 118-716.

Gowdru, Savitha Somashekharappa; Hedaoo, Atul Kisanrao; Narasimhan, Santhosh; Patrimath, Mahantesh; and Singh, Ravi Kumar 08024801 Cl. 726-22.

Chatterjee, Paresh; Narayanan, Ajit; Ranganathan, Loganathan; and Enoch, Sharon 08024542 Cl. 711-170.

Narayanan, Kumaran; and Kwok, Peter, to Juniper Networks, Inc. No split virtual chassis based on pass through mode 08023404 Cl. 370-216.

Malaney, Robert Anderson 08022870 Cl. 342-357.74.

Narui, Yoichi; Nishida, Ikuo; Tanaka, Yoshiyuki; and Miki, Hisahiro, to Hitachi-LG Data Storage, Inc. Optical disc apparatus 08024747 Cl. 720-623.

Maki, Yoichiro; and Narusawa, Hideyuki 08023158 Cl. 358-3.26.

Maki, Yoichiro; Narusawa, Hideyuki; Ishida, Goro; Kojima, Shoji; Oyanagi, Makoto; and Kobayashi, Masaya 08023145 Cl. 358-1.18.

Narusawa, Keiji: See--

Sonoyama, Takashi; and Narusawa, Keiji 08023391 Cl. 369-116.

Narushima, Kazuhiko; Yamagishi, Shigekazu; Hashimoto, Makoto; Ikeda, Ken; Ono, Masafumi; Ryu, Hinki; and Kuroishi, Kenji, to Fuji Xerox Co., Ltd. Abnormality detection frequency set when it is indicated that abnormality will occur 08024622 Cl. 714-47.3.

Sinclair, John W.; Pettener, Ian James; and Nash, Alistair H. 08024471 Cl. 709-229.

Nash, Philip John; Tyler, David John; and Middleton, Nicholas, to Qinetiq Limited Demodulation of phase modulated fibre-optic sensor system signals 08023829 Cl. 398-155.

Nass, Geoffrey D; and Glaser, William, to Siemens Industry, Inc. Binding wireless devices in a building automation system 08023440 Cl. 370-310.

Taguchi, Yuichi; Yamamoto, Masayuki; Nasu, Hiroshi; and Nakajima, Noriko 08024532 Cl. 711-154.

Aronowich, Michael; Mariamova, Sofia; Natan, Ofra; and Harel, Henry 08024216 Cl. 705-7.31.

Nath, Prem; Basava, Venugopala R.; Kalla, Ajay Kumar; Shevchuk, Peter Alex; and Misra, Mohan S., to Ascent Solar Technologies, Inc. Machine and process for sequential multi-sublayer deposition of copper indium gallium diselenide compound semiconductors 08021905 Cl. 438-46.

Lee, Gwo-Bin; and Chen, Cheng-Tso 08021582 Cl. 264-9.

National Chung-Hsien University: See--

Wuu, Dong-Sing; Horng, Ray-Hua; Chen, Shih-Ting; Tsai, Tshung-Han; and Wu, Hsueh-Wei 08022412 Cl. 257-76.

National Health Research Institutes: See--

Jiaang, Weir-Torn; Chao, Yu-Sheng; Tsai, Ting-Yueh; and Hsu, Tsu 08022096 Cl. 514-422.

National Institute of Advanced Industrial Science and Technology: See--

Naitoh, Yasuhisa; Morita, Yukinori; Horikawa, Masayo; and Shimizu, Tetsuo 08022383 Cl. 257-4.

Okamoto, Masaya; Sugiyama, Jun-ichi; and Ueda, Mitsuru 08022241 Cl. 558-275.

Tabuchi, Mitsuharu; Nabeshima, Yoko; Ado, Kazuaki; Tatsumi, Kuniaki; and Takeuchi, Tomonari 08021783 Cl. 429-224.

National Institute of Information and Communications Technology: See--

Sakamoto, Takahide; Kawanishi, Tetsuya; Tsuchiya, Masahiro; and Izutsu, Masayuki 08023775 Cl. 385-3.

National Material, L.P.: See--

Ge, Molly Mo Hui 08021768 Cl. 428-698.

National Semiconductor Corporation: See--

Aslan, Mehmet; and Branch, John W. 08021042 Cl. 374-178.

Evans, Jr., Joseph T.; Miller, William D.; and Womack, Richard H. 08023308 Cl. 365-145.

Signoretti, Barry; Anderson, David I.; and Zhang, Jianhui 08022746 Cl. 327-423.

National Taiwan University: See--

Chen, Jyh-Horng; Chiueh, Tzi-Dar; Wu, Edzer L.; and Kuo, Li-Wei 08022701 Cl. 324-309.

Huang, Polly; and Lin, Tsung-Han 08022876 Cl. 342-451.

Huang, Polly; Lin, Tsung-Han; and Ng, I-Hei 08022875 Cl. 342-451.

Hung, Kuo-Fong; and Lin, Yi-Cheng 08022880 Cl. 343-700MS.

Tsai, Meng-Tsan; Lee, Hsiang-Chieh; Lee, Cheng-Kuang; Wang, Yih-Ming; Chiang, Chun-Pin; Chen, Hsin-Ming; and Yang, Chih-Chung 08023119 Cl. 356-497.

National University Corporation Tokyo University of Marine Science and Technology: See--

Hu, Fuxiang; Tokai, Tadashi; Ozeki, Yoshioki; Kubota, Hiroshi; Tomatsu, Chiaki; and Ino, Tetsuro 08020336 Cl. 43-9.1.

König, Klaus; Nattermann, Meinhard; and Zimmermann, Armin 08020863 Cl. 271-265.04.

Järvinen, Aimo; Judin, Kai; Natunen, Harri; Oinonen, Yrjö; and Talonen, Panu 08021459 Cl. 75-375.

Naumann, Hans; to Niles-Simmons Industrieanlagen GmbH Method for machining the bearing seats of the main and rod bearings of crankshafts 08020293 Cl. 29-888.08.

Rizzo, Pierre; Moreaux, Christophe; Naura, David; and Kari, Ahmed 08022889 Cl. 343-876.

Navarrette, Jr., Felipe E. Combination chin protector and mouth guard 08020562 Cl. 128-861.

Navratil, Jiri; Pelecanos, Jagon; and Ramaswamy, Ganesh N., to International Business Machines Corporation System and method for addressing channel mismatch through class specific transforms 08024183 Cl. 704-225.

Nawrot, Thomas; Stahn, Hans-Werner; Stolze, Andreas; and Ziemann, Andreas, to BSH Bosch und Siemens Hausgeraete GmbH Washing household device, in particular a clothes dryer 08020316 Cl. 34-603.

Naya, Masayuki; and Tani, Takeharu, to FUJIFILM Corporation Sensor, sensing system and sensing method 08023115 Cl. 356-445.

Bilac, Mario; Restrepo, Carlos; Kinsel, Hugh T.; and Nayak, Amit 08023235 Cl. 361-42.

Nayak, Neeraj: See--

Nagaraj, Krishnasawamy; Nayak, Neeraj; Madhavapeddi, Srinadh; and Haroun, Baher 08022778 Cl. 331-117FE.

Armstrong, William Joseph; Francois, Christopher; and Nayar, Naresh 08024726 Cl. 718-1.

Even-Zohar, Yair; and Nayfeh, Basem 08024341 Cl. 707-736.

Nayfeh, Basem; to AudienceScience Inc. Natural language search for audience 08024323 Cl. 707-715.

Nazri, Gholam-Abbas; Aymard, Luc M. A.; Oumellal, Yassine; Rougier, Aline Dominique; and Tarascon, Jean-Marie, to GM Global Technology Operations LLC Preparation of hydrogen storage materials 08021533 Cl. 205-59.

North, Greg; Haban, Scott; and Stein, Kyle 08024392 Cl. 708-491.

White, David; Murray, Kevin A.; Darshan, Ezra; Shlissel, Moshe; Fink, David; Whittaker, David; Geyzel, Zeev; and Wachtfogel, Reuven 08023805 Cl. 386-353.

Sedukhin, Igor; Eshner, Daniel; Swartz, Steve; Bhaskara, Udaya Kumar; Sripathi Panditharadhya, Nagalinga Durga Prasad; Kulkarni, Amol Sudhakar; Wu, Haoran Andy; Borsa, Mariusz Gerard; and Neary, Michael Oliver 08024396 Cl. 709-201.

Pompe, Anthony Lawrence Alfred; and Haralambous, Kallis 08021145 Cl. 431-354.

Momozu, Masateru; Shibui, Naoto; Nebuya, Hideto; Masuda, Satoru; Akutsu, Yukiyoshi; and Sugiyama, Tomoya 08020469 Cl. 74-523.

Liu, Yongqiang; Zhang, Yanfeng; and Xia, Yong 08023468 Cl. 370-331.

NEC Corporation: See--

Ageishi, Daisuke 08024619 Cl. 714-43.

Fukami, Shunsuke 08023315 Cl. 365-158.

Kawato, Masahiro 08024740 Cl. 718-106.

Kikuchi, Shingo 08023573 Cl. 375-259.

Mizuno, Masayuki; Ohashi, Keishi; Nose, Koichi; and Nishi, Kenichi 08023832 Cl. 398-202.

Nadehara, Kouhei 08024614 Cl. 714-34.

Nishiyama, Junko; and Kanbe, Chika 08022673 Cl. 320-129.

Ohkubo, Shuichi 08023394 Cl. 369-275.3.

Suzuki, Daisuke; Uchikawa, Tatsuya; Kiuchi, Hiroyuki; Shiraishi, Mitsutaka; Ito, Takao; and Matsuo, Ryuji 08022944 Cl. 345-184.

Takeda, Kenji 08023494 Cl. 370-350.

Tsukada, Masato 08023736 Cl. 382-173.

Westhoff, Dirk; and Girao, Joao 08024573 Cl. 713-179.

NEC Laboratories America, Inc.: See--

Prasad, Narayan; Wang, Xiaodong; and Madihian, Mohammad 08023581 Cl. 375-262.

Wang, Shuangquan; Wang, Xiaodong; and Madihian, Mohammad 08023578 Cl. 375-261.

Yu, Jianjun; Luo, Yuanqiu; Hu, Junqiang; and Wang, Ting 08023824 Cl. 398-72.

Zhang, Honghai; and Rangarajan, Sampath 08023455 Cl. 370-328.

NEC LCD Technologies, Ltd.: See--

Motomatsu, Toshihiko 08023096 Cl. 349-189.

Ono, Shin-ichirou 08023064 Cl. 349-60.

NEC Lighting, Ltd.: See--

Ueji, Yoshinori; and Okimura, Katsuyuki 08022429 Cl. 257-98.

Nedelec, Yann P M; to Corning Incorporated Sintered glass and glass-ceramic structures and methods for producing 08021739 Cl. 428-166.

Forsell, Justin; and Pysden, David 08021281 Cl. 482-84.

Allen, James P.; Ham, Nicholas S.; Neemidge, John L.; and Tee, Stephen M. 08024498 Cl. 710-39.

Neenan, Michael A.; Szymanski, Christopher G.; and Crawford, Eric E., to Parsec Technologies, Inc. Linearized trans-impedance amplifiers 08022771 Cl. 330-308.

Camwell, Paul L.; and Neff, James M. 08022840 Cl. 340-854.4.

Oba, Takahiro; Takimoto, Katsushi; and Negami, Akihiko 08020375 Cl. 60-286.

Niitsuma, Kenichi; Negishi, Hirooki; Tanabe, Jinichi; Sano, Koji; Uno, Koji; Terauchi, Tatsuya; and Matsumoto, Tomoki 08020930 Cl. 297-216.12.

Negishi, Mikio: See--

Soga, Tasao; Shimokawa, Hanae; Nakatsuka, Tetsuya; Miura, Kazuma; Negishi, Mikio; Nakajima, Hirokazu; and Endoh, Tsuneo 08022551 Cl. 257-772.

Hirayama, Fukushi; Fujiyasu, Jiro; Kaga, Daisuke; Negoro, Kenji; Sasuga, Daisuke; Seki, Norio; and Suzuki, Ken-ichi 08022208 Cl. 544-194.

Davis, James W.; McGoldrick, Kevin J.; Fitzsimmons, Alan H.; Neil, Robert M.; and Rowley, John 08022663 Cl. 320-104.

Nelander, Christopher Paul; Stockbridge, John N.; and Kuzmanov, Todar, to GM Global Technology Operations LLC Positive crankcase ventilation system 08020541 Cl. 123-572.

Sanborn, Warren G.; and Doyle, Peter R. 08021310 Cl. 600-538.

Nelle, Peter; and Stecher, Matthias, to Infineon Technologies AG Apparatus and method configured to lower thermal stresses 08021929 Cl. 438-123.

Tinnin, Melvin L.; Nellett, Arthur W.; Cymbal, William D.; and Riefe, Richard K. 08021235 Cl. 464-167.

Cocotis, Thomas A.; Curtis, Alan D.; Emmett, David M.; Fan, Shengkuo; Henderson, Kristofer P.; Luepke, Jack W.; Nellor, Howard J.; Treptow, Jay A.; and Wong, Gregory H. 08024398 Cl. 709-203.

Nelson, Craig H.; to Tektronix, Inc. Apparatus and method of reducing color smearing artifacts in a low resolution picture 08023729 Cl. 382-166.

Nelson, Eric Lewis: See--

Donahue, Brett; and Nelson, Eric Lewis 08024423 Cl. 709-217.

Nelson, Kenneth D.; and Chiverton, Edward A., to Chevron Oronite Company LLC Lubricating oil additive and lubricating oil composition containing same 08022022 Cl. 508-230.

Nelson, Kenneth D.; and Chiverton, Edward A., to Chevron Oronite Company LLC Lubricating oil additive and lubricating oil composition containing same 08022023 Cl. 508-230.

Nelson, Kevin Larry; to Panduit Corp. Cable bracket and strap assembly 08020811 Cl. 248-68.1.

Nelson, Lance Engraving tool with a very strong cutter tip to reduce breakage 08021085 Cl. 407-54.

Nelson, Lionel M.: See--

Paraschac, Joe; Boucher, Ryan P.; Gillis, Edward M.; Iancea, Octavian; Kramer, Andrew W.; McCollum, Brian K.; McGill, Scott A.; Nelson, Lionel M.; and Tomas, Andres D. 08020560 Cl. 128-848.

Nelson, Steve J.: See--

Olson, David P.; Schmeling, Andrew L.; and Nelson, Steve J. 08024047 Cl. 607-61.

Gross, Wibke; Fuhr, Denise; Nemitz, Ralph; and Kleen, Astrid 08021438 Cl. 8-405.

Beausoleil, Raymond G.; Munro, William J.; Spiller, Timothy P.; and Nemoto, Kae 08023828 Cl. 398-140.

Teo, Chun Woei; Neo, Sua Hong; Yoshida, Koji; and Goto, Michiyo 08024187 Cl. 704-239.

Neo, Weng Chuen Edmund: See--

Gajadharsing, Radjindrepersad; Neo, Weng Chuen Edmund; Pelk, Marco Johannes; De Vreede, Leonardus Cornelis Nicolaas; and Zhao, Ji 08022760 Cl. 330-124R.

Baig, Aamer Ali; Cowell, James E.; Karas, Peter M.; Neofytides, Cheryl L.; Golub, Matthew F.; Yoder, James R.; Milberger, Susan M.; Sherrard, Jeff D.; Dunker, Amy M.; Macfarlane, Jackie M.; Platte, Eric L.; and Abrahams, Susan F. 08024229 Cl. 705-26.

Neogi, Raja; to Intel Corporation Fingerprinting digital video for rights management in networks 08023757 Cl. 382-245.

Cheung, Man; Rutherford, David; Richgels, Jerry; and Neos, Perry 08023216 Cl. 360-51.

Sampalis, Tina 08021691 Cl. 424-522.

Delnevo, Annalisa; and Neri, Roberto 08021319 Cl. 604-6.16.

Do, Lydia M.; Nesbitt, Pamela A.; and Seacat, Lisa A. 08024185 Cl. 704-235.

Myllyoja, Jukka; Aalto, Pekka; Savolainen, Pekka; Purola, Veli-Matti; Alopaeus, Ville; and Grönqvist, Johan 08022258 Cl. 585-240.

Bruessow, Harald; Chennoufi, Sandra; Sidoti, Josette; and Bruttin, Anne 08021657 Cl. 424-93.6.

Corthesy-Theulaz, Irène; de Bercik, Elena Verdu; Bercik, Premysl; and Collins, Stephen Michael 08021656 Cl. 424-93.45.

Deshmukh, Vijay; Swartzlander, Benjamin; and Thompson, Timothy J. 08024309 Cl. 707-705.

Jibbe, Mahmoud K. 08024440 Cl. 709-223.

Malaiyandi, Prasanna; Khurana, Varun; and Federwisch, Michael 08024518 Cl. 711-114.

Trimmer, Don Alvin; Stager, Roger Keith; Johnston, Craig Anthony; Chang, Yafen Peggy; Cohen, Gavin David; and Blaser, Rico 08024172 Cl. 703-26.

Gharia, Nilesh A. 08023299 Cl. 365-49.1.

Park, Kee 08023298 Cl. 365-49.1.

Srinivasan, Varadarajan; Deshpande, Chetan; Srinivasan, Maheshwaran; Khanna, Sandeep; and Gaddam, Venkat Rajendher Reddy 08023300 Cl. 365-49.18.

Srinivasan, Varadarajan; Srinivasan, Maheshwaran; Deshpande, Chetan; Khanna, Sandeep; and Gaddam, Venkat Rajendher Reddy 08023301 Cl. 365-49.18.

Bissantz, Caterina; Jablonski, Philippe; Knust, Henner; Nettekoven, Matthias; Ratni, Hasane; and Riemer, Claus 08022099 Cl. 514-426.

Lin, Lin; Xiong, Ziyou; Finn, Alan Matthew; Peng, Pei-Yuan; Kang, Pengju; Atalla, Mauro J.; Misra, Meghna; and Netter, Christian Maria 08020672 Cl. 187-392.

Roussos, Konstantinos; Thillai, Kumaravel; Kirpekar, Anupama; Bhalodia, Atul; and Bappanadu, Vani 08024442 Cl. 709-223.

Neubäcker, Peter Sound-object oriented analysis and note-object oriented processing of polyphonic sound recordings 08022286 Cl. 84-609.

Snyder, Shawn W.; and Neudecker, Bernd J. 08021778 Cl. 429-162.

Schaaf, Ulrich; Kugler, Andreas; Becker, Karl-Friederich; Neumann, Alexander; and Kostelnik, Jan 08020288 Cl. 29-834.

Neumann, Gerhard: See--

Chlumsky, Lubomir; Hellinger, Leopold; Kocevar, Anton; and Neumann, Gerhard 08023273 Cl. 361-752.

Neumann, Michael; to BSH Bosch und Siemens Hausgeraete GmbH Refrigeration device 08020400 Cl. 62-298.

Peters, Dan; Olsen, Gunnar; and Nielsen, Elsebet Østergaard 08022081 Cl. 514-286.

Laufenberg, Xaver; Eynius, Dominique; Suelzle, Helmut; Usbeck, Stephan; Spaeth, Matthias; Neuser-Hoffmann, Miriam; Myrzik, Christian; Schmid, Manfred; Nietfeld, Franz; Thiel, Alexander; Braun, Harald; and Ebner, Norbert 08022677 Cl. 322-28.

Votaw, Gregory A.; Buckner, Charles A.; Hartmann, Daniel M.; Karsh, William; Montefusco, Frank Anthony; Nevill, Joshua T.; Patel, Mehul; Wyrick, David W.; and Crenshaw, Hugh C. 08021130 Cl. 417-415.

Bar-Ness, Yesheskel; and Liu, Pan 08023583 Cl. 375-285.

Shi, Yun-Qing; and Chen, Chunhua 08023747 Cl. 382-232.

New South Innovations Pty. Limited: See--

Sahajwalla, Veena 08021458 Cl. 75-10.61.

New York Stock Exchange: See--

Burkhardt, Roger; Allen, Anne E.; McSweeney, Robert J.; and Pastina, Louis G. 08024247 Cl. 705-36R.

New York University: See--

Rapoport, David M. 08020555 Cl. 128-204.21.

Shener, Cemal; Newell, Christopher R.; Hedstrom, Petter; and Krause, Kenneth W. 08021294 Cl. 600-159.

Newell Operating Company: See--

Flory, Edward C.; Annes, Jason L.; and Pettit, Dean 08020904 Cl. 292-241.

Kovac, Zdravko 08020278 Cl. 29-525.01.

Matsuno, Hiroto; and Ibaraki, Masato 08020812 Cl. 248-71.

Newman, Bruce M.; to Freescale Semiconductor, Inc. Multiple-bit, digital-to-analog converters and conversion methods 08022850 Cl. 341-144.

Newman, Kenneth: See--

Karles, Georgios D.; Braunshteyn, Michael; and Newman, Kenneth 08020566 Cl. 131-331.

Newman, Timothy J.; and Parker, Richard D., to Delphi Technologies, Inc. Automatic fault detection and laser shut-down method for a laser-generated windshield display 08022346 Cl. 250-205.

Seal, Thomas Joseph 08021461 Cl. 75-743.

Newton, Chris; to Q1 Labs, Inc. Network intelligence system 08024795 Cl. 726-22.

Sebastian, Reeny T.; Boswell, Karen A.; and Lemanski, Brian D. 08024088 Cl. 701-41.

Tinnin, Melvin L.; Nellett, Arthur W.; Cymbal, William D.; and Riefe, Richard K. 08021235 Cl. 464-167.

Mangiaracina, Anthony 08022639 Cl. 315-291.

Chu, Shao-fu Sanford; Zhang, Shaoqing; Chew, Johnny Kok Wai; and Ng, Chit Hwei 08021954 Cl. 438-396.

Ng, Choon Yong; Takagi, Kazutaka; and Tomita, Naotaka, to Kabushiki Kaisha Toshiba Semiconductor device 08022769 Cl. 330-295.

Ng, I-Hei: See--

Huang, Polly; Lin, Tsung-Han; and Ng, I-Hei 08022875 Cl. 342-451.

Ng, James L.: See--

Yang, Yi; Savage, Donnie Van; Gage, Timothy M.; Tran, Thuan Van; and Ng, James L. 08023517 Cl. 370-401.

Ng, Spencer W.: See--

Auerbach, Daniel J.; and Ng, Spencer W. 08024515 Cl. 711-113.

Ng, Willie W.: See--

Hayes, Robert R.; and Ng, Willie W. 08023831 Cl. 398-198.

Ngai, Samuel; and Levy, Ady, to KLA-Tencor Corporation Priori crack detection in solar photovoltaic wafers by detecting bending at edges of wafers 08023110 Cl. 356-237.1.

Ozawa, Shuichi; and Yamaguchi, Hirofumi 08022604 Cl. 310-358.

Teratani, Naomi; Hayase, Toru; and Katsuda, Yuji 08022001 Cl. 501-98.4.

NGK Spark Plug Co., Ltd.: See--

Miyata, Daisuke; Hirasawa, Makoto; and Matsubara, Yoshiaki 08021616 Cl. 422-83.

Shao, Huai-Rong; and Ngo, Chiu 08023976 Cl. 455-502.

Ngo, Minh Van; Li, Wenmei; Shields, Jeffrey A.; Cheng, Ning; Hui, Angela; and Chen, Cinti Xiaohua, to Spansion LLC Ultraviolet radiation blocking interlayer dielectric 08022468 Cl. 257-325.

Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Yu, Frank I-Kang; Ma, Abraham C.; and Shen, Ming-Shiang, to Super Talent Electronics, Inc. Extended USB plug, USB PCBA, and USB flash drive with dual-personality for embedded application with mother boards 08021166 Cl. 439-76.1.

Nguyen, Hanh Nho: See--

Cee, Victor J.; Deak, Holly L.; Du, Bingfan; Geuns-Meyer, Stephanie D.; Hodous, Brian L.; Nguyen, Hanh Nho; Olivieri, Philip R.; Patel, Vinod F.; Romero, Karina; and Schenkel, Laurie 08022221 Cl. 546-268.1.

Nguyen, Joanne T.: See--

Dile, James Michael; Nguyen, Joanne T.; Piletski, Vadzim Ivanovich; and Smith, James Patrick 08024298 Cl. 707-650.

Nguyen, Khai Q.: See--

Wang, Xiaobao; Wang, Bonnie I.; Sung, Chiakang; and Nguyen, Khai Q. 08022723 Cl. 326-30.

Nguyen, Khanhlinh: See--

Parhami, Farhad; Kim, Woo-Kyun; Jung, Michael E.; and Nguyen, Khanhlinh 08022052 Cl. 514-170.

Nguyen, Loi N.: See--

Mohanakrishnaswamy, Venkatesh; and Nguyen, Loi N. 08022491 Cl. 257-415.

Nguyen, Luy B.: See--

Hur, Inhong; and Nguyen, Luy B. 08023286 Cl. 361-822.

Nguyen, My T.; and Locas, Marc-Andre, to American Dye Source, Inc. Materials for lithographic plates coatings, lithographic plates and coatings containing same, methods of preparation and use 08021827 Cl. 430-302.

Nguyen, Peter N.; Manderfield, Cary E.; and Tasz, Maciej K., to S.C. Johnson & Son, Inc. Odor elimination composition comprising triethylene glycol for use on soft surfaces 08022026 Cl. 510-287.

Nguyen, Quang; to QUALCOMM Incorporated Communication circuit for driving a plurality of devices 08023280 Cl. 361-775.

Nguyen, Thong N: See--

Baan, Robert L; Cox, Harry D; Gauci, John P; Lankard, Jr., John R; Long, David C; and Nguyen, Thong N 08020599 Cl. 156-443.

Nguyen, Tuy T.: See--

Hoiness, Stuart E.; Napiorkowski, John J.; Blake, Kathleen E.; Brower, Boyd G.; and Nguyen, Tuy T. 08023997 Cl. 455-557.

Nguyen, Ut T.; to Broadcom Corporation Method and system for reconfigurable pattern filtering engine 08023409 Cl. 370-235.

Zimmel, Steven C.; Nhep, Ponharith; and Smith, Trevor 08023791 Cl. 385-135.

Suzuki, Hitoshi; Ogino, Takashi; and Miura, Takashi 08020424 Cl. 72-402.

Jung, Young-Sik; Choi, In-Hyuk; Song, Min-Chol; Paek, Jong-Won; Lee, Sung-Ho; Bang, Sang-Hee; and Jeon, Sang-Hun 08024559 Cl. 713-155.

Nguyen, David; Nan, Nan; Ni, Jim Chin-Nan; Yu, Frank I-Kang; Ma, Abraham C.; and Shen, Ming-Shiang 08021166 Cl. 439-76.1.

Miyata, Tadaaki; Kondo, Hideki; Mori, Naoki; Omori, Masaki; Ensher, Jason R.; and Harris, Rodney 08023549 Cl. 372-102.

Katayama, Toshiyuki; Nakano, Yoshio; Yagi, Takashi; and Matsui, Masamichi 08020897 Cl. 285-256.

Nicholas, Christopher P.; Bhattacharyya, Alakananda; and Mackowiak, David E., to UOP LLC Apparatus for oligomerizing dilute ethylene 08021620 Cl. 422-131.

Nicholson, Jeffrey W.; and Westbrook, Paul S., to OFS Fitel LLC Enhanced continuum generation in nonlinear bulk optic materials 08023179 Cl. 359-326.

Nicholson, John H.: See--

Challener, David Carroll; Nicholson, John H.; Pennisi, Joseph Michael; and Waltermann, Rod D. 08024579 Cl. 713-187.

Nicholson, Robert Bruce: See--

Bartfai, Robert Francis; Boyd, Kenneth Wayne; Chen, James Chien-Chiung; Day, III, Kenneth Fairclough; Fienblit, Shachar; McBride, Gregory Edward; Messina, David W.; Nicholson, Robert Bruce; and Spear, Gail Andrea 08024534 Cl. 711-162.

Nickel, Andreas; Stange, Olaf; Voigt, Ingolf; Fischer, Gundula; Stahn, Michael; and Köhler, Birgit, to Bayer Aktiengesellschaft Separation module, method for its production and its use 08021619 Cl. 422-130.

Boston, Brian; Behm, James; Floyd, Thomas; Hernandez, Alejandro; Leitz, Richard; Moots, Craig; Nickell, Andrew; and Rehman, Maqsood 08022276 Cl. 800-312.

Nickerson, Rand B.; Treschl, Mark A.; Rudman, Jay S.; and Krebs, Mark D., to OpinionLab, Inc. Receiving and reporting page-specific user feedback concerning one or more particular web pages of a website 08024668 Cl. 715-808.

Nicolson, Marcus; to Power Box AG Planer 08020592 Cl. 144-117.4.

Ito, Hideaki; Sugaya, Kenji; Yamashita, Kazufumi; Maehara, Toshio; and Oiwa, Shoji 08022648 Cl. 318-400.17.

Nie, Hong; and Chen, Zhizhang Impulse ultra-wideband radio communication system 08023571 Cl. 375-256.

Casasso, Paolo; Argento, Angelo; Parisi, Filippo; and Nieddu, Stefano 08022336 Cl. 219-262.

Heuer, Jörg; Hutter, Andreas; and Niedermeier, Ulrich 08024366 Cl. 707-802.

Croy, David J.; Ramaswamy, Arun; and Mears, Paul 08023882 Cl. 455-2.01.

Nielsen, Elsebet Østergaard: See--

Peters, Dan; Olsen, Gunnar; and Nielsen, Elsebet Østergaard 08022081 Cl. 514-286.

Nielsen, Flemming Elmelund: See--

Petersen, Anders Klarskov; Olesen, Preben Houlberg; Christiansen, Lise Brown; Hansen, Holger Claus; and Nielsen, Flemming Elmelund 08022066 Cl. 514-223.2.

Nielsen, Jorgen S.: See--

Jin, Xin; and Nielsen, Jorgen S. 08023984 Cl. 455-522.

Nielsen, Klaus Gregorius: See--

Eskling, Marie; and Nielsen, Klaus Gregorius 08022039 Cl. 514-21.2.

Nielsen, Thomas Steiniche Bjertrup: See--

Godsk, Kristian Balschmidt; Nielsen, Thomas Steiniche Bjertrup; and Sloth, Erik Billeskov 08021111 Cl. 416-1.

Moll, Frederic H.; Wallace, Daniel T.; Younge, Robert G.; Martin, Kenneth M.; Stahler, Gregory J.; Moore, David F.; Adams, Daniel T.; Zinn, Michael R.; and Niemeyer, Gunter D. 08021326 Cl. 604-95.04.

Niemeyer, Michael John: See--

Qin, Jian; Rogers, Sandra Marie; Niemeyer, Michael John; Schueler, Jr., Kenneth Raymond; Hurley, Steven Michael; Sawyer, Lawrence Howell; Hsu, Whei-Neen; Joy, Mark C.; Smith, Scott J.; Frank, Markus; and Lange, Nancy Birbiglia 08021998 Cl. 442-414.

Nies, Alexander Antonius Franciscus; Wendrich, Albertus Robert; and Wilders, Richard Anthony, to Assembleon N.V. Method of adjusting at least one optional setting of a process characteristic of a component placement device, as well as a component placement device and an electronic key 08020285 Cl. 29-832.

Laufenberg, Xaver; Eynius, Dominique; Suelzle, Helmut; Usbeck, Stephan; Spaeth, Matthias; Neuser-Hoffmann, Miriam; Myrzik, Christian; Schmid, Manfred; Nietfeld, Franz; Thiel, Alexander; Braun, Harald; and Ebner, Norbert 08022677 Cl. 322-28.

Gurbani, Vijay K.; Sabnis, Suhasini; Hiering, Victoria; Nieto, Luis; Gokhale, Aniruddha; Hull, Richard B.; Klemm, Reinhard P.; Kumar, Bharat; and Zhou, Gang 08024401 Cl. 709-204.

Maida-Smith, Kathy J.; Lindsey, John H.; Engle, Steven W.; and Nieves, Michael J. 08024786 Cl. 726-12.

Niezgoda, Thomas A.; Leppien, Thomas J.; and Evans, Gregory K., to Access Business Group International LLC Control methods for an air treatment system 08021469 Cl. 96-417.

Niezur, Michael C.; and Robertson, Taylor S., to Sika Technology AG Integrated reinforcing crossmember 08020924 Cl. 296-187.02.

Nigam, Indra B.; Muessig, Dirk; and Kraetschmer, Hannes, to Biotronik CRM Patent AG Device, method and computer-readable storage medium for classifying atrial tachyarrhythmia 08024031 Cl. 600-518.

Aoyagi, Takuo; Fuse, Masayoshi; and Kobayashi, Naoki 08024021 Cl. 600-336.

Nihon Medi-Physics Co., Ltd.: See--

Tanifuji, Shigeyuki; Nakamura, Daisaku; and Takasaki, Shinya 08022207 Cl. 544-179.

Niitsuma, Kenichi; Negishi, Hirooki; Tanabe, Jinichi; Sano, Koji; Uno, Koji; Terauchi, Tatsuya; and Matsumoto, Tomoki, to TS Tech Co., Ltd. Coupling mechanism for headrest of vehicle seat 08020930 Cl. 297-216.12.

Niiya, Norimasa; to Kabushiki Kaisha Toshiba Communication system and voice mail apparatus 08023625 Cl. 379-88.17.

Oda, Shuzo; Yatsuzuka, Shinichi; Niiyama, Yasunori; Kaneko, Takashi; and Okemoto, Shunji 08020380 Cl. 60-508.

Shimizu, Masaki; Noguchi, Chikahisa; Torii, Kentaro; and Niizeki, Tomoyasu 08020500 Cl. 112-103.

Sokolowski, Susan 08020317 Cl. 36-69.

Niklewski, Andrzej; to Metso Minerals (Brasil) LTDA Belt conveyor and crushing unit 08020691 Cl. 198-564.

Maiya, Nobuhiko 08022373 Cl. 250-461.2.

Masugi, Saburo 08023198 Cl. 359-689.

Shibazaki, Yuichi; and Kanaya, Yuho 08023106 Cl. 355-72.

Shibazaki, Yuichi; and Komatsuda, Hideki 08023103 Cl. 355-53.

Shiraishi, Kenichi 08023100 Cl. 355-30.

Watada, Tsutomu; and Endo, Masanori 08022323 Cl. 200-302.2.

Niles-Simmons Industrieanlagen GmbH: See--

Naumann, Hans 08020293 Cl. 29-888.08.

Shekalim, Avraham 08021334 Cl. 604-131.

Glass, Kevin William; Nilsson, C. Gary; Ghazikhanian, Leo; and Nilsson, Michael Terry 08022854 Cl. 341-160.

Nilsson, Johan: See--

Lindoff, Bengt; Nilsson, Johan; Nordström, Fredrik; and Wilhelmsson, Leif 08023600 Cl. 375-347.

Nilsson, Michael Terry: See--

Glass, Kevin William; Nilsson, C. Gary; Ghazikhanian, Leo; and Nilsson, Michael Terry 08022854 Cl. 341-160.

Nimbargi, Vijay Shivalingappa; Venkatesan, Ramesh; Bayram, Ersin; Vu, Anthony Tienhuan; and Michelich, Charles Robert, to General Electric Company Method and apparatus for view ordering of magnetic resonance imaging data for dynamic studies 08022700 Cl. 324-309.

Korolev, Eugenio; Apte, Charuta Vijaykumar; Ninan, Anoop George; and Farizon, Boris 08024712 Cl. 717-127.

Ninan, Lal: See--

Hiles, Michael C.; Hodde, Jason P.; Ernst, David M. J.; and Ninan, Lal 08021692 Cl. 424-550.

Wu, Yang; Ning, Chaofeng; Yuan, Xinbing; and Feng, Xinping 08022164 Cl. 528-85.

Ning, Gang; Sebald, Zebbie Lynn; and Rawal, Bharat, to AVX Corporation Substrate for use in wet capacitors 08023250 Cl. 361-516.

Ning, Ruola; and Zhang, Yan, to University of Rochester Method and apparatus for 3D metal and high-density artifact correction for cone-beam and fan-beam CT imaging 08023767 Cl. 382-275.

Ning, Tailu: See--

Yoshida, Kazuyoshi; Ning, Tailu; Masahiro, Yasushi; Abe, Rika; and Higuchi, Yutaka 08021579 Cl. 252-500.

Twellmann, Günter 08020951 Cl. 312-238.

Sato, Shuji; Iwazaki, Eisuke; Sugawara, Atsushi; Ninomiya, Masanobu; and Nakazawa, Hiroshi 08021813 Cl. 430-108.1.

Kurabayashi, Akira 08022962 Cl. 345-589.

Sakamoto, Yoshio; and Yamano, Katsuya 08021220 Cl. 463-5.

Yamamura, Yasuhisa; Asuke, Shigeyuki; and Kawai, Toshinori 08021232 Cl. 463-30.

Shigaki, Koichiro; and Inoue, Teruhisa 08022293 Cl. 136-263.

Shigaki, Koichiro; Kaneko, Masayoshi; Maenosono, Akira; Hoshi, Takayuki; and Inoue, Teruhisa 08022294 Cl. 136-263.

Nippon Sheet Glass Company, Limited: See--

Sasaki, Teruyuki; and Kamitani, Kazutaka 08021749 Cl. 428-331.

Nippon Steel Corporation: See--

Shima, Shinji; Nakayama, Toshitaka; and Shibata, Tomoaki 08021602 Cl. 266-177.

Suzuki, Noriyuki; Uenishi, Akihiro; Kuriyama, Yukihisa; Niwa, Toshiyuki; Kuwayama, Takuya; and Yamagata, Mitsuharu 08020418 Cl. 72-16.1.

Maeda, Shigeru; Mukunoki, Hirotaka; and Koike, Hideyuki 08020489 Cl. 102-202.11.

Mizuno, Masayuki; Ohashi, Keishi; Nose, Koichi; and Nishi, Kenichi 08023832 Cl. 398-202.

Nishi, Syoichi: See--

Inoue, Masafumi; Tsukamoto, Mitsuhaya; Nishi, Syoichi; and Kihara, Masahiro 08020286 Cl. 29-832.

Nishi, Takanori; Kitano, Takahiro; and Okumura, Katsuya, to Tokyo Electron Limited Developing apparatus and developing method 08021062 Cl. 396-611.

Nishi, Yasuo: See--

Kubo, Naomi; Nishi, Yasuo; and Yanata, Atsuro 08020971 Cl. 347-55.

Nishi, Yoshiyuki: See--

Maki, Nobuhiro; Hiraiwa, Yuri; Nishi, Yoshiyuki; Miyata, Katsuhisa; and Deguchi, Akira 08024537 Cl. 711-162.

Yamazaki, Shunpei; Nishida, Eriko; and Shimazu, Takashi 08021958 Cl. 438-455.

Nishida, Ikuo: See--

Narui, Yoichi; Nishida, Ikuo; Tanaka, Yoshiyuki; and Miki, Hisahiro 08024747 Cl. 720-623.

Nishida, Nobumichi: See--

Iwanaga, Masato; Takahashi, Kentaro; Oki, Yukihiro; Ikeda, Yoshihiko; Kinoshita, Akira; and Nishida, Nobumichi 08021787 Cl. 429-231.3.

Kawakubo, Takashi; Nagano, Toshihiko; and Nishigaki, Michihiko 08022599 Cl. 310-330.

Suzuki, Kenichi; Motomura, Shigeyuki; Yamasaki, Satoshi; Nishiguchi, Daisuke; and Kawanabe, Hisashi 08021995 Cl. 442-329.

Nishiguchi, Kohei: See--

Utani, Keisuke; and Nishiguchi, Kohei 08020458 Cl. 73-863.23.

Nishijima, Hiroshi; and Suzuki, Koji, to Honda Motor Co., Ltd. Method of and apparatus for adjusting a motorcycle headlight, and motorcycle incorporating same 08024093 Cl. 701-49.

Ozaki, Takayoshi; Ishikawa, Tomomi; and Nishikawa, Kentarou 08021052 Cl. 384-448.

Nishikawa, Shoji: See--

Asada, Ryoji; Motoda, Kazumasa; Nishikawa, Shoji; Awamoto, Shigeru; Kato, Shiro; and Uchida, Hirofumi 08023796 Cl. 386-232.

Nishikawa, Yuko: See--

Friedlander, Steven; Ho, Tracy; Nishikawa, Yuko; and Yeh, Sabrina 08024756 Cl. 725-52.

Nishikawa, Yuko; Golden, Dayan; Bergeron, Michael A.; Wibisono, Himgan; and McKay, Philip, to Sony Corporation Interactive program guide with preferred items list apparatus and method 08024755 Cl. 725-46.

Nishimori, Takehiro; to Ricoh Company, Ltd. Image forming apparatus 08020983 Cl. 347-92.

Nishimura, Hideki; and Nakashima, Mikio, to Tokyo Electron Limited Substrate processing method, substrate processing apparatus, and program storage medium 08020315 Cl. 34-350.

Nishimura, Hidetoshi: See--

Ozoe, Ritsuko; Taniguchi, Hiroki; Nishimura, Hidetoshi; Tamaru, Masaki; and Kondo, Hideaki 08022549 Cl. 257-758.

Nishimura, Isamu: See--

Yagi, Ryotaro; Nishimura, Isamu; and Yamaha, Takahisa 08022472 Cl. 257-330.

Nishimura, Kazuaki; and Yahata, Naoki, to Panasonic Electric Works Co., Ltd. Fluid pressure sensor package 08022806 Cl. 338-42.

Nishimura, Kazuki: See--

Kawamura, Masahiro; Nishimura, Kazuki; Takashima, Yoriyuki; Ito, Mitsunori; Iwakuma, Toshihiro; Ogiwara, Toshinari; Hosokawa, Chishio; and Fukuoka, Kenichi 08021574 Cl. 252-301.16.

Nishimura, Kazuko; and Kimura, Hiroshi, to Panasonic Corporation Optical transmission circuit 08023541 Cl. 372-34.

Nishimura, Kazumasa; Nakabayashi, Ryo; Hasegawa, Naoya; Saito, Masamichi; Ide, Yosuke; and Ishizone, Masahiko, to TDK Corporation Tunneling magnetic sensing element including free magnetic layer and IrMn protective layer disposed thereon and method for manufacturing the same 08023233 Cl. 360-324.2.

Nishimura, Kazuto; to Fujitsu Limited Bandwidth control apparatus and bandwidth control method 08023411 Cl. 370-235.

Nishimura, Masafumi: See--

Takiguchi, Tetsuya; and Nishimura, Masafumi 08024184 Cl. 704-227.

Nishimura, Ryutaro: See--

Ohmi, Tadahiro; Ikeda, Nobukazu; Nishino, Kouji; Nagase, Masaaki; Dohi, Kyousuke; and Nishimura, Ryutaro 08020574 Cl. 137-12.

Ohmi, Tadahiro; Ikeda, Nobukazu; Nishino, Kouji; Nagase, Masaaki; Dohi, Kyousuke; and Nishimura, Ryutaro 08020574 Cl. 137-12.

Nishino, Naoyuki: See--

Yoshida, Yutaka; Tsubota, Keiji; Kamiya, Takeshi; Ohta, Yasunori; and Nishino, Naoyuki 08021047 Cl. 378-207.

Aoyama, Takahisa; Nishio, Akihiko; and Fukui, Akito 08023470 Cl. 370-331.

Nishitani, Shuji; and Okubo, Takateru, to Canon Kabushiki Kaisha Image forming apparatus capable of preventing a sheet jamming during detected abnormal situations 08023837 Cl. 399-18.

Yamamichi, Junta; Ogawa, Miki; Handa, Yoichiro; Imamura, Takeshi; Utsunomiya, Norihiko; and Nishiuma, Satoru 08023109 Cl. 356-72.

Nishiyama, Junko; and Kanbe, Chika, to NEC Corporation Lithium ion secondary battery system, and method for operating lithium ion secondary battery 08022673 Cl. 320-129.

Nishiyama, Wataru: See--

Demizu, Koji; Sasaki, Hidekatsu; Kidera, Masayuki; and Nishiyama, Wataru 08022955 Cl. 345-474.

Torikai, Satoshi; Tanaka, Shinichi; Nishizawa, Itaru; and Imaki, Tsuneyuki 08024350 Cl. 707-769.

Nishizawa, Takatoshi: See--

Shiina, Masaki; Kimura, Kazuyuki; and Nishizawa, Takatoshi 08021727 Cl. 428-35.7.

Nishizawa, Tsuyoshi; Hagiwara, Yoshio; and Hariya, Hideki, to Shin-Etsu Handotai Co., Ltd. Susceptor and method for manufacturing silicon epitaxial wafer 08021968 Cl. 438-503.

Mita, Takeshi; Kikuchi, Takamasa; Mizukoshi, Takashi; Yaosaka, Manabu; and Komoda, Mitsuaki 08022089 Cl. 514-378.

Nissan Motor Co., Ltd.: See--

Ishimoto, Takeshi 08020947 Cl. 303-140.

Itou, Ken; and Nakayama, Hideaki 08022650 Cl. 318-432.

Kobayashi, Kojiro; Hirose, Akio; Nakagawa, Shigeyuki; Miyamoto, Kenji; Kasukawa, Minoru; Inoue, Masayuki; and Morita, Tetsuji 08020749 Cl. 228-178.

Nakayama, Tadayoshi 08020905 Cl. 293-115.

Oono, Akihiko; Asai, Souichi; Masaki, Michitomo; and Harada, Takashi 08021234 Cl. 464-68.92.

Suzuki, Tatsuya; Matsumoto, Shinji; Nakamura, Masahide; and Jimbo, Tomohiro 08024099 Cl. 701-70.

Nissan North America, Inc.: See--

Kwolek, Chad 08020913 Cl. 296-70.

Miura, Yasutaka; Asahi, Kenji; and Hanaki, Yoshihiko 08020674 Cl. 188-73.38.

Nissin Kogyo Co., Ltd.: See--

Iyatani, Masatoshi 08020946 Cl. 303-119.1.

Heikkonen, Teemu; Kaijalainen, Natalia; Nisula, Janne; and Rautakorpi, Tiina 08022953 Cl. 345-440.

Grimm, Jan; Nitsch, Roger; Knobloch, Marlen; Konietzko, Uwe; Rudin, Markus; Müggler, Thomas; and Kranz, Felicitas 08022268 Cl. 800-18.

Nitta, Izumi; to Fujitsu Limited Layout evaluation apparatus and method 08024673 Cl. 716-50.

Nitta, Izumi; Shibuya, Toshiyuki; and Homma, Katsumi, to Fujitsu Limited Delay analysis support apparatus, delay analysis support method and computer product 08024685 Cl. 716-113.

Ebe, Hirofumi; and Ishimaru, Yasuto 08022306 Cl. 174-252.

Hu, Szu-Han; Ho, Voon Yee; Yamazaki, Hiroshi; and McCaslin, Martin John 08022308 Cl. 174-254.

Iwakawa, Yasuko; Nakano, Shusaku; and Matsuda, Shoichi 08021572 Cl. 252-299.61.

Juni, Noriyuki 08023778 Cl. 385-14.

Juni, Noriyuki 08023780 Cl. 385-14.

Kitada, Kazuo; Nakazono, Takuya; Koshio, Satoru; and Yura, Tomokazu 08021510 Cl. 156-259.

Miyazaki, Junzo; and Matsuda, Shouichi 08023098 Cl. 349-194.

Naito, Tomonari; Umeda, Michio; and Takahashi, Akiko 08022125 Cl. 524-187.

Shimizu, Yusuke; and Toshikawa, Sakura 08023779 Cl. 385-14.

Suehiro, Ichiro; Katayama, Hiroyuki; Akazawa, Kouji; and Usui, Hideyuki 08021756 Cl. 428-447.

Yamamoto, Masayuki 08021509 Cl. 156-247.

Graupner, Sven; and Nitzsche, Tilo 08024736 Cl. 718-104.

Niwa, Shinji; Kawashima, Takeshi; Akahori, Ichiro; and Morishita, Toshiyuki, to DENSO CORPORATION Information device operation apparatus 08023698 Cl. 382-103.

Niwa, Takamasa; and Akamatsu, Hirotaka, to Seiko Epson Corporation Printing apparatus and printing method 08023124 Cl. 358-1.13.

Niwa, Takashi; Ichihara, Susumu; Jujo, Koichiro; and Hoshina, Hiroyuki, to Seiko Instruments Inc. Electroforming mold and method for manufacturing the same, and method for manufacturing electroformed component 08021534 Cl. 205-67.

Niwa, Toshiyuki: See--

Suzuki, Noriyuki; Uenishi, Akihiro; Kuriyama, Yukihisa; Niwa, Toshiyuki; Kuwayama, Takuya; and Yamagata, Mitsuharu 08020418 Cl. 72-16.1.

Davis, James W.; McGoldrick, Kevin J.; Fitzsimmons, Alan H.; Neil, Robert M.; and Rowley, John 08022663 Cl. 320-104.

Vakharia, Omar J.; Nobis, Rudolph H.; Swain, Christopher Paul; Mosse, Charles Alexander; and Ikeda, Keiichi 08021363 Cl. 606-47.

Noble, Gary P.; to International Business Machines Corporation Method and system for communication via a computer network 08024570 Cl. 713-169.

Nobutoki, Tomoko; and Ota, Ken, to Elpida Memory, Inc. Semiconductor memory device 08022484 Cl. 257-401.

Zhou, Jijie; Bronikowski, Michael; Noca, Flavio; and Sansom, Elijah B. 08021967 Cl. 438-492.

Asai, Motoo; Noda, Kouta; and Inagaki, Yasushi 08021748 Cl. 428-323.

Noda, Tomoki; Takeuchi, Masanori; and Enda, Kenji, to Sharp Kabushiki Kaisha Substrate for a display panel, and a display panel having the same 08022559 Cl. 257-797.

Noddings, Kenneth; Andrews, Daniel Marshall; Bishop, Thomas Alan; and Olla, Michael Anthony Fabrication of optical devices and assemblies 08021058 Cl. 385-94.

Yang, Chih-Chao; Horak, David Vaclav; Nogami, Takeshi; and Ponoth, Shom 08021974 Cl. 438-618.

Shimizu, Masaki; Noguchi, Chikahisa; Torii, Kentaro; and Niizeki, Tomoyasu 08020500 Cl. 112-103.

Noguchi, Daisuke: See--

Hiraoka, Junji; Doke, Takahiro; Haraga, Hisato; Noguchi, Daisuke; and Kawamata, Yoshio 08022011 Cl. 502-350.

Noguchi, Katsuhiro; to NTT DoCoMo, Inc. Relay device, authentication server, and authentication method 08024776 Cl. 726-2.

Noguchi, Takashi: See--

Cho, Hans S.; Noguchi, Takashi; Xianyu, Wenxu; Kim, Do-Young; Yin, Huaxiang; and Zhang, Xiaoxin 08022408 Cl. 257-64.

Noguchi, Takashi; Xianyu, Wenxu; Cho, Hans S.; and Yin, Huaxiang, to Samsung Electronics Co., Ltd. Method of manufacturing thin film transistor 08021936 Cl. 438-149.

Noguchi, Takuro; to Mitsubishi Electric Corporation Network system for diagnosing operational abnormality of nodes 08024625 Cl. 714-704.

Noguchi, Yukinori: See--

Kikuchi, Hiroaki; Sugimoto, Yusuke; Noguchi, Yukinori; and Kaku, Toshihiko 08022988 Cl. 348-157.

Kim, Dong-yong; and Noh, Yo-Hwan 08023014 Cl. 348-251.

Nohara, Osamu; Yokoyama, Katsuhiko; and Tanabe, Sadayuki, to Nabtesco Corporation Speed reducer for use in yaw drive apparatus for wind power generation apparatus, and yaw drive method and apparatus for wind power generation apparatus using the speed reducer 08022564 Cl. 290-44.

Katayama, Hiroshi; Miyano, Akifumi; Yoshida, Hirofumi; Murayama, Kei; and Nojima, Kazuhiro 08022872 Cl. 342-357.77.

Aaltonen, Janne La. 08023966 Cl. 455-456.3.

Colli, Alan 08022393 Cl. 257-24.

Doppler, Klaus; and Hottinen, Ari 08023524 Cl. 370-431.

Dosa, Ferenc; and Wikman, Johan 08023477 Cl. 370-338.

Isokangas, Jari 08023456 Cl. 370-329.

Kangasmaa, Seppo; Haapoja, Sami; and Parts, Ulo 08023438 Cl. 370-286.

Lintulampi, Raino; Parantainen, Janne; and Sebire, Guillaume 08023461 Cl. 370-329.

Riionheimo, Tanja 08023700 Cl. 382-116.

Ryhänen, Tapani; and Welland, Mark 08024279 Cl. 706-46.

Tang, Haitao; and Lakkakorpi, Jani 08023435 Cl. 370-256.

Tervaluoto, Jussi-Pekka; Ruha, Antti; and Ruotsalainen, Tarmo 08023923 Cl. 455-326.

Nokia Siemens Networks Oy: See--

Mattila, Jyrki 08023951 Cl. 455-444.

Nokia Siemens Networks S.p.A.: See--

Cavalli, Giulio; and Maggi, Giovanni 08023986 Cl. 455-522.

Deobhakta, Kalpita; Nolan, Sean; Hoof, Hubert Van; and Stokes, Michael 08024273 Cl. 705-52.

Nolde, Martin 08021364 Cl. 606-85.

Nolde, Martin; to Nolde, Martin Rasp attachment for a motor-driven surgical hand-held device 08021364 Cl. 606-85.

Pandey, Anjali; Scarborough, Robert M.; Matsuno, Kenji; Ichimura, Michio; Nomoto, Yuji; Ide, Shinichi; Tsukuda, Eiji; Sasaki, Junko; and Oda, Shoji 08022071 Cl. 514-234.5.

Nomura, Masatoshi; to Casio Computer Co., Ltd. Heat insulating container 08021622 Cl. 422-198.

Nomura, Takashi; and Sakano, Mitsuru, to Toyota Jidosha Kabushiki Kaisha Plating member 08021761 Cl. 428-557.

Nomura, Yujiro: See--

Kawada, Kunihiro; and Nomura, Yujiro 08023844 Cl. 399-49.

Sowa, Takeshi; Nomura, Yujiro; and Koizumi, Ryuta 08022975 Cl. 347-238.

Choki, Koji; Mori, Tetsuya; Ravikiran, Ramakrishna; Fujiwara, Makoto; Takahama, Keizo; Watanabe, Kei; Nonaka, Hirotaka; Otake, Yumiko; Bell, Andrew; Rhodes, Larry; Amoroso, Dino; and Matsuyama, Mutsuhiro 08021825 Cl. 430-270.1.

Nonaka, Manabu: See--

Higaki, Hideto; Togashi, Toshifumi; and Nonaka, Manabu 08020851 Cl. 271-18.1.

Moravec, Mark D.; and Nontprasat, Anucha 08024748 Cl. 720-659.

Carroll, Robert T.; Noon, James; Sreenivas, Venkat; and Martin, Gary D. 08024138 Cl. 702-60.

Mason, W. Anthony; Viscarola, Peter G.; Cariddi, Mark J.; and Noone, Scott J. 08024433 Cl. 709-221.

Nordby, David C.; Conohan, Dennis F.; Johnson, Noel R.; Mikelsons, Andi J.; Schultz, Steve O.; Lehman, Jerome P.; and Pulsfus, Seth T., to Alkar-RapidPak-MP Equipment, Inc. Food processing apparatus and method 08020487 Cl. 99-443C.

Lindoff, Bengt; Nilsson, Johan; Nordström, Fredrik; and Wilhelmsson, Leif 08023600 Cl. 375-347.

Nagai, Atsushi; and Nakayama, Kazutaka 08021821 Cl. 430-270.1.

Geppert, Helmut; Schmidt, Frank; and Sommer, Michael 08020814 Cl. 248-74.3.

Norma U.S. Holding LLC: See--

Ignaczak, Brian T. 08020898 Cl. 285-367.

Sheffer, Joseph; Norman, Thea; Dimarchi, Richard D.; Hays Putnam, Anna-Maria A.; Tian, Feng; Chu, Stephanie; Krawitz, Denise; and Cho, Ho Sung 08022186 Cl. 530-363.

Norrby, Sverker; Artal, Pablo; Piers, Patricia Ann; and Van Der Mooren, Marrie, to AMO Groningen BV Methods of obtaining ophthalmic lenses providing the eye with reduced aberrations 08020995 Cl. 351-212.

Daniels, John; Waters, George; Norris, Mark; Brown, J. Ernest; Bryant, Ian D.; Mauth, Kevin; and Swaren, Jason 08020620 Cl. 166-297.

Norris, William Robert: See--

Allard, James; Wienhold, Kathleen A.; Norris, William Robert; and Catalfano, Anthony Francis 08020657 Cl. 180-167.

Eriksson, Bengt-Arne; Gunnarsson, Johan; Norrman, Percy; and Svensson, Kjell-Åke 08020801 Cl. 241-207.

Azad, Mina 08024457 Cl. 709-224.

Bowles, Gregory J.; and Widdowson, Scott 08022768 Cl. 330-295.

Livshitz, Michael; Purkovic, Aleksandar; Burns, Nina; Sukhobok, Sergey; and Chaudhry, Muhammad 08024641 Cl. 714-758.

Szwerinski, Helge; Dade, Nicolas S; Vivek, Vibhu; and Karunakaran, Kumara Das 08023985 Cl. 455-522.

Wiget, Marcel; Pluim, Robert; Blyden, Simon David; and Mattson, Geoffrey 08024474 Cl. 709-230.

Elumalai, Sivamani; and Qu, Rongda 08022271 Cl. 800-295.

North Face Apparel Corp., The: See--

Liang, Ezra; Hadden, Page; Kim, Tae; and Shih, Winston 08020730 Cl. 222-175.

North, Geraint M.: See--

Sandham, John H.; and North, Geraint M. 08024555 Cl. 712-226.

North, Graham: See--

Davies, Phil; North, Graham; Lucas, Ian; and Verma, Mili 08024464 Cl. 709-225.

North, Greg; Haban, Scott; and Stein, Kyle, to nCipher Corporation Limited Computational method, system, and apparatus 08024392 Cl. 708-491.

Zeng, Yueping; and Northcutt, Scott T. 08024119 Cl. 701-221.

Northover, Stephen; and Quarti, Silenio, to International Business Machines Corporation Adjusting left-to-right graphics to a right-to-left orientation or vice versa using transformations with adjustments for line width and pixel orientation 08023771 Cl. 382-293.

Pesetski, Aaron A.; and Baumgardner, James E. 08022722 Cl. 326-7.

Brink, Jr., Kenneth A.; Johnson, Randy S.; Malkowski, Raymond T.; Martin, Jeffrey H.; Northway, Tedrick N.; Richards, Jr., Patrick J.; and Winkler, Duane L. 08024153 Cl. 702-182.

Solomon, Gemma; Andrews, David; and Ratner, Mark 08022394 Cl. 257-25.

Sulzer, Lindsay K.; Bull, Steven R.; Barron, Annelise Emily; and Meade, Thomas J 08021646 Cl. 424-9.36.

Baum, Norton; and Dziedzic, Jr., Norman John 08020271 Cl. 29-407.05.

Mizuno, Masayuki; Ohashi, Keishi; Nose, Koichi; and Nishi, Kenichi 08023832 Cl. 398-202.

Washisu, Koichi; Noto, Goro; and Saito, Junichi 08023809 Cl. 396-55.

Notohamiprodjo, Hubertus; and Pitigoi-Aron, Radu, to Marvell International Ltd. Control of delivery of current through one or more discharge lamps 08022636 Cl. 315-219.

Wang, XiaoChuan 08022143 Cl. 525-191.

Nova Measuring Instruments Ltd.: See--

Finarov, Moshe; and Brill, Boaz 08023122 Cl. 356-601.

Birnstock, Jan; Vehse, Martin; and Romainczk, Tilmann 08022619 Cl. 313-506.

Behnke, Dirk; Herold, Peter; Jelakovic, Stjepan; Mah, Robert; and Tschinke, Vincenzo 08022068 Cl. 514-230.5.

Behnke, Dirk; Herold, Peter; Jelakovic, Stjepan; Mah, Robert; and Tschinke, Vincenzo 08022069 Cl. 514-230.5.

Novartis Vaccines and Diagnostics, Inc.: See--

O'Hagan, Derek; Van Nest, Gary; Ott, Gary S.; and Singh, Manmohan 08021834 Cl. 435-5.

Hsu, Chih-Hsin; and Tseng, Ching-Wu 08022918 Cl. 345-98.

Eriksson, Ingvar; and Odén, Erik 08021089 Cl. 409-132.

Yu, Yongsik; Sriram, Mandyam; Shaviv, Roey; Chattopadhyay, Kaushik; and Wu, Hui-Jung 08021486 Cl. 118-719.

Gaudreau, Michel 08020353 Cl. 52-520.

Hansen, Birthe Lykkegaard; Jensen, Michael Bech; and Kornfelt, Troels 08022031 Cl. 514-1.1.

Viksoe-Nielsen, Anders; Fukuyama, Shiro; Behr, Regine Kopp; and Andersen, Carsten 08021863 Cl. 435-102.

Heldwein, Thomas C.; Agnello, Joseph; Muck, Aaron J.; Xu, Zhanping; and Nowak, Brian J. 08020838 Cl. 261-114.5.

Nowak, Edward J.: See--

Anderson, Brent A.; and Nowak, Edward J. 08022478 Cl. 257-347.

Nowak, Rüdiger; Michel, Werner; and Buckel, Pia, to Evonik Degussa GmbH Adhesive and sealant systems 08022130 Cl. 524-493.

Nozawa, Hiroshi; to Sumitomo Chemical Company, Limited Polypropylene resin composition and film made thereof 08022148 Cl. 525-387.

Nozawa, Kenji: See--

Okamoto, Masami; Okamoto, Jun; Suno, Kazuo; Nozawa, Kenji; Suzuki, Naoto; Sonohara, Yoshihiro; Kaneko, Syoichi; Kubota, Keisuke; Kagami, Takashi; and Shimada, Hiroyuki 08023850 Cl. 399-67.

Nozawa, Shingo; to Canon Kabushiki Kaisha Video recording/reproducing apparatus and video recording/reproducing method 08023801 Cl. 386-294.

Nozawa, Toshihisa: See--

Miyatani, Kotaro; Kawamura, Kohei; Nozawa, Toshihisa; and Matsuoka, Takaaki 08021975 Cl. 438-623.

Nozu, Tetsuro; to Kabushiki Kaisha Toshiba Semiconductor apparatus 08022479 Cl. 257-355.

Iyer, Subramanian 08021553 Cl. 210-636.

Nakamura, Tsuyoshi; and Saji, Nobuhito 08021485 Cl. 118-719.

Hirai, Isao; Takubo, Takayasu; Shibata, Kiyotake; and Suzuki, Syougo 08021054 Cl. 384-544.

Kaimi, Masayuki; Shimizu, Kazuto; Bitou, Kimihiko; Ishiyama, Nao; and Yamashita, Nobuyoshi 08020301 Cl. 29-898.02.

Ozaki, Takayoshi; Ishikawa, Tomomi; and Nishikawa, Kentarou 08021052 Cl. 384-448.

Gentry, Craig B.; Ramzan, Zulfikar Amin; and Bruhn, Bernhard 08024562 Cl. 713-158.

Inoue, Masahiro; Okajima, Ichiro; and Umeda, Narumi 08023493 Cl. 370-349.

Kawamoto, Junichiro; Hayashi, Takahiro; Ishii, Hiroyuki; Hanaki, Akihito; Goto, Yoshikazu; and Furutani, Koji 08023933 Cl. 455-418.

Motegi, Masayuki; Kato, Yasuhiro; Ishii, Minami; and Nakamura, Takehiro 08023460 Cl. 370-329.

Noguchi, Katsuhiro 08024776 Cl. 726-2.

Okumura, Yukihiko 08023906 Cl. 455-101.

Prehofer, Christian 08023465 Cl. 370-331.

Suzuki, Yoshinori; Boon, Choong Seng; and Tan, Thiow Keng 08023754 Cl. 382-236.

Tsuboi, Masashi; and Horikoshi, Tsutomu 08022344 Cl. 250-201.9.

Xu, Huilin; Chong, Chia-Chin; and Guvenc, Ismail 08023595 Cl. 375-340.

Bleifuss, Rodney L.; Englund, David J.; Iwasaki, Iwao; Lindgren, Andrew J.; and Kiesel, Richard F. 08021460 Cl. 75-484.

Cross, Jr., Charles W.; Jaramillo, David; and McCobb, Gerald M. 08024194 Cl. 704-270.

Takiguchi, Tetsuya; and Nishimura, Masafumi 08024184 Cl. 704-227.

Orth, Andreas; Hirsch, Martin; Weber, Peter; Sneyd, Stuart; Nuber, Dirk; and Stroeder, Michael 08021600 Cl. 266-172.

Nuber, Dirk; Stroeder, Michael; Stockhausen, Werner; Formanek, Lothar; Hirsch, Martin; and Beyzavi, Ali-Naghi, to Outotec Oyj Plant for the heat treatment of solids containing titanium 08021601 Cl. 266-172.

Shutts, Adam J.; Elinburg, II, John Carlton; Otts, Jonathon David; Gurley, George; and Parsley, David Walton 08020605 Cl. 164-491.

Nugent, Alex; to Knowmtech, LLC Universal logic gate utilizing nanotechnology 08022732 Cl. 326-104.

Konopa, Helmut; and Nuiding, Wolfgang 08020392 Cl. 62-150.

Takimoto, Hitoshi; Ide, Kenta; Asahi, Toru; Nukada, Hidemi; Suzuki, Takahiro; and Bando, Koji 08021810 Cl. 430-57.1.

Nukanobu, Koki; Yamamoto, Keisuke; Kobayashi, Tamaki; and Moriguchi, Takuto, to Canon Kabushiki Kaisha Electron-emitting device, electron-emitting apparatus, electron source, image display device and information display/reproduction apparatus 08022608 Cl. 313-309.

Braunecker, Laura; Gordon, Alice; Elwood, Jr., Ward; Peters, Timothy J.; Fedel, Anthony N.; and Nukuto, George I. 08021454 Cl. 55-483.

Bupp, II, Charles Robert; Choi, K. Yeon; Holmes-Davis, Rachel Anne; Izmailov, Alexander; Koshinsky, Heather; Nulf, Christopher Jon; Urdea, Mickey; Wang, Miaomiao; Warner, Brian David; and Zwick, Michael 08021839 Cl. 435-6.

Iijima, Tomokuni; Ishikawa, Takashi; Numai, Ikuo; Hayakawa, Masahito; and Takai, Aki 08023016 Cl. 348-265.

Numata, Hajime; to Sony Corporation Imaging apparatus and method of controlling imaging apparatus for determining exposure based on intenisty signals from color filter pixels or infrared pixels 08023034 Cl. 348-342.

Nunez, Chris E.; and Wojozynski, Robert J., to Grandville Printing Company Method of printing, distributing and placing price information 08020765 Cl. 235-383.

Knöll, Sebastian; and Nüssler, Gerhard 08021009 Cl. 362-92.

Nuthalapati, Rao; to Lockheed Martin Corporation Spatially variant apodization (SVA) filter 08022863 Cl. 342-189.

Donovan, Walter E.; and McAllister, David K. 08023752 Cl. 382-233.

Jatou, Ross F.; Shu, Charlie J.; and Subraman, Nandan 08021193 Cl. 439-638.

Jatou, Ross F.; Shu, Charlie J.; and Subraman, Nandan 08021194 Cl. 439-638.

Marquette, Brian; Clark, Michael; and Corfield, Charles 08023635 Cl. 379-265.02.

Amtmann, Franz 08022813 Cl. 340-10.2.

Boyle, Kevin 08024014 Cl. 455-575.1.

Gajadharsing, Radjindrepersad; Neo, Weng Chuen Edmund; Pelk, Marco Johannes; De Vreede, Leonardus Cornelis Nicolaas; and Zhao, Ji 08022760 Cl. 330-124R.

Huard, Vincent 08022741 Cl. 327-161.

Joseph, Briaire 08022851 Cl. 341-144.

Koutsoures, Dennis 08022727 Cl. 326-82.

Lienhard, Martin 08022914 Cl. 345-94.

Ludikhuize, Adrianus W. 08022506 Cl. 257-592.

Milanesi, Andrea 08022945 Cl. 345-204.

Pelgrom, Marcel J. M.; Veendrick, Hendricus J. M.; and Zieren, Victor 08022752 Cl. 327-539.

Pietig, Rainer 08022783 Cl. 333-1.1.

Van Rijnswou, Sander Matthijs 08023645 Cl. 380-28.

Zhang, Yifeng 08023593 Cl. 375-340.

Endresen, Jan; Carlson, Erik; Sjöberg, Ralph; and Nylén, Olov 08022655 Cl. 318-568.24.

Nyman, Bror; Ekman, Eero; Hultholm, Stig-Erik; Pekkala, Pertti; Lyyra, Juhani; Lilja, Launo; and Kuusisto, Raimo, to Outotec Oyj Method and equipment for liquid-liquid extraction 08020710 Cl. 210-511.

Gastineau, Gary L.; and Weber, Clifford 08024258 Cl. 705-37.