US 7,593,569 B2
Pixel defect correction device
Junzo Sakurai, Hachioju (Japan)
Assigned to Eastman Kodak Company, Rochester, N.Y. (US)
Filed on Oct. 12, 2005, as Appl. No. 11/248,882.
Claims priority of application No. 2004-369737 (JP), filed on Dec. 21, 2004.
Prior Publication US 2006/0132626 A1, Jun. 22, 2006
Int. Cl. G06K 9/00 (2006.01)
U.S. Cl. 382—167  [348/246] 12 Claims
OG exemplary drawing
 
1. A pixel defect correction circuit which corrects a point defect and a line defect of a plurality of pixels arranged along a horizontal direction and a vertical direction, the pixel defect correction circuit comprising:
a unit which detects presence and a position of a point defect and a line defect;
a unit which corrects a point defect pixel by calculating a pixel value of the point defect pixel from pixel values of surrounding pixels which are adjacent to the point defect pixel;
a unit which calculates a first difference value between pixel values of an upper-right pixel and a lower-left pixel which are adjacent to a target pixel to be corrected within a line defect pixel, a second difference value between pixel values of an upper-left pixel and a lower-right pixel which are adjacent to the target pixel, a third difference value between a sum of the pixel values of the upper-left pixel and the lower-left pixel and a sum of the pixel values of the upper-right pixel and the lower-right pixel, and a fourth difference value between a sum of the pixel values of the upper-left pixel and the upper-right pixel and a sum of the pixel values of the lower-left pixel and the lower-right pixel, and
a unit which corrects the line defect pixel by calculating a pixel value of the target pixel from at least one of the pixel values of the upper-right pixel, the lower-right pixel, the upper-left pixel, and the lower-left pixel using a correction pattern corresponding to a relationship in magnitude of the first difference value, the second difference value, the third difference value, and the fourth difference value.