| US 7,593,113 B2 | ||
| Large areas undistorted imaging apparatus for light speckles and method thereof | ||
| Yi-Yuh Hwang, Taoyuan (Taiwan); Ming Chen, Tao-Yuan (Taiwan); Mau-Ran Wang, Taipei (Taiwan); Wen-Chen Huang, Taipei (Taiwan); Shin-I Ma, Tao-Yuan (Taiwan); Chin-Der Hwang, Jhubei (Taiwan); and Guang-Sheen Liu, Longtan Township, Taoyuan County (Taiwan) | ||
| Assigned to Chung Shan Institute of Science and Technology, Armaments Bureau, M.N.D., Taoyuan County (Taiwan) | ||
| Filed on Feb. 15, 2008, as Appl. No. 12/71,071. | ||
| Prior Publication US 2009/0207419 A1, Aug. 20, 2009 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G01B 11/02 (2006.01) | ||
| U.S. Cl. 356—498 | 24 Claims |
| 1. An undistorted imaging apparatus for light speckles, comprising:
a light-emitting device, emitting light to an object surface, and producing one or more rays of scattered light;
a light-limiting module, comprising a plurality of light-limiting members for limiting said one or more rays of scattered
light and producing a plurality of rays of diffraction light, which interferes with each other and produces a plurality of
light speckles, said plurality of light-limiting members for limiting the incident angle field of view at which said one or
more rays of scattered light enter a sensor, each having a linear dimension of the field of view for an undistorted image
being less than
 where:
λ=is the wavelength of the highly coherent light,
2δ=is the average diameter of the light speckles,
2γ=is the distance between the sensor and the object surface, θ=is the angle between the optical axis of the imaging apparatus and the normal of the object surface; and
said sensor, adapted behind the light-limiting module, receiving the plurality of light speckles, and producing a light-speckle
pattern according to the plurality of light speckles.
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