| US 7,592,589 B2 | ||
| Method of mass spectrometry and mass spectrometer | ||
| Yuichiro Hashimoto, Tachikawa (Japan); Hideki Hasegawa, Tachikawa (Japan); Takashi Baba, Kawagoe (Japan); and Izumi Waki, Tokyo (Japan) | ||
| Assigned to Hitachi, Ltd., Tokyo (Japan) | ||
| Filed on Mar. 12, 2007, as Appl. No. 11/716,615. | ||
| Application 11/716615 is a division of application No. 11/631033, filed on Dec. 28, 2006. | ||
| Prior Publication US 2007/0181804 A1, Aug. 09, 2007 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. H01J 49/42 (2006.01) | ||
| U.S. Cl. 250—292 | 5 Claims |
| 1. A mass spectrometry device, comprising:
an ion source for ionizing a sample,
an ion trap for trapping ions ionized by said ion source, said ion trap including an inlet end lens, an outlet end lens, quadrupole
rods, and a trap lens,
a control unit for controlling voltages applied to said lenses configuring said ion trap, and
a detection unit for detecting said ions trapped by said ion trap, wherein
said control unit causes a trap potential to be generated on central axis of said quadrupole rods, causes part of said trapped
ions to be oscillated in an intermediate direction between said quadrupole rods which are mutually adjacent to each other,
and applies a voltage for ejecting said oscillated ions in a central-axis direction of said quadrupole rods by generating
an extraction field.
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