US 7,591,180 B2
Contact inspection device, and contact inspection device and method for magnetic disk device
Masaru Nakakita, Ehime (Japan)
Assigned to Panasonic Corporation, Osaka (Japan)
Appl. No. 10/578,511
PCT Filed Oct. 27, 2004, PCT No. PCT/JP2004/015911
§ 371(c)(1), (2), (4) Date May 08, 2006,
PCT Pub. No. WO2005/045838, PCT Pub. Date May 19, 2005.
Claims priority of application No. 2003-379743 (JP), filed on Nov. 10, 2003.
Prior Publication US 2007/0070533 A1, Mar. 29, 2007
Int. Cl. G01N 29/07 (2006.01)
U.S. Cl. 73—597  [73/649] 9 Claims
OG exemplary drawing
 
9. A contact inspection device comprising:
a rotating magnetic disk;
a slider having a head for recording data to and reproducing data from the magnetic disk;
a slider-holding mechanism;
a suspension connecting the slider to the slider-holding mechanism;
a first detection element for detecting vibrations of the magnetic disk, the first detection element being attached to the magnetic disk;
a second detection element for detecting vibrations caused when the slider is removed from the magnetic disk, the second detection element being attached to one of the slider, the suspension and the slider holding mechanism; and
a measurement device for determining whether a contact mode when the vibration is detected by the first detection element is a first contact mode in which the slider contacts the magnetic disk by a squeeze force generated by an effect of air between the slider and the magnetic disk, or a second contact mode in which the slider contacts the magnetic disk due to a spring vibration after the slider is unloaded from the magnetic disk, based on a time difference between a detection output from the first detection element and a detection output from the second detection element.