LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 13th DAY OF September, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
N.V. Organon: See--
Karstens, Willem Frederik Johan; and Timmers, Cornelis Marius
08017782 Cl. 546-173.
Na, Jung Chan: See--
Chang, Beom Hwan; Jeong, Chi Yoon; Sohn, Seon Gyoung; Lee, Soo Hyung; Bang, Hyo Chan; Kim, Geon Lyang; Kim, Hyun Joo; Park, Won Joo; Ryu, Jong Ho; Kim, Jong Hyun; Na, Jung Chan; Jang, Jong Soo; and Sohn, Sung Won
08019865 Cl. 709-224.
Na, Kun: See--
Shin, Kyong-Min; Lee, Dong-ki; Lee, Don-haeng; Na, Kun; and Jo, Eun-ae
08017143 Cl. 424-426.
Na, Kyu-Tae: See--
Kim, Ju-Wan; Na, Kyu-Tae; Kim, Min; Park, Seung-Bae; Kim, Il-Woo; and Kwak, Dae-Young
08017495 Cl. 438-427.
Na, Shuo: See--
Allemand, Pierre-Marc; Dai, Haixia; Na, Shuo; Pakbaz, Hash; Pschenitzka, Florian; Quan, Xina; Sepa, Jelena; Spaid, Michael A.; and Wolk, Jeffrey
08018568 Cl. 349-187.
Na, Yoo Sam: See--
Kim, Moon Sun; and Na, Yoo Sam
08018285 Cl. 330-284.
Nabar, Rohit U.: See--
Lee, Jungwon; Zhang, Hongyuan; and Nabar, Rohit U.
08019016 Cl. 375-299.
Nabel, Gary J.; Sullivan, Nancy J.; Geisbert, Thomas W.; and Jahrling, Peter B., to United States of America as represented by the Department of Health and Human Services, The Method of accelerated vaccination against Ebola viruses
08017130 Cl. 424-199.1.
Nachenberg, Carey S.; to Symantec Corporation Deriving reputation scores for web sites that accept personally identifiable information
08019689 Cl. 705-64.
Nadreau, Michael; Yvin, Jean-Claude; and Le Moine, Patrick, to Egg-Chick Automated Technologies System and method for automatically determining the sex of chicks and device for conveying living animals
08019125 Cl. 382-110.
Nagadome, Ryuji: See--
Korenaga, Tetsuo; and Nagadome, Ryuji
08016974 Cl. 156-345.31.
Nagahama, Hiroyuki: See--
Endo, Takayuki; and Nagahama, Hiroyuki
08019308 Cl. 455-307.
Nagahashi, Kouji: See--
Yamaguchi, Tomohiro; Tanaka, Junpei; Otsuzuki, Shiro; Tohi, Yasushi; Nagahashi, Kouji; Yamahira, Nobukazu; Ikenaga, Shigenobu; Moorthi, Sunil Krzysztof; and Kamio, Kazunori
08017705 Cl. 526-160.
Nagai, Hiroshi: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou
08018538 Cl. 349-38.
Nagai, Hiroshi; to NEC LCD Technologies, Ltd Liquid crystal display device having a biaxial first anisotropic film and a second anisotropic film having an optical axis in a thickness direction
08018556 Cl. 349-118.
Nagai, Kazukiyo; and Horiuchi, Tamotsu, to Ricoh Company Limited Tetrahydroxy compound, method for preparing the tetrahydroxy compound, and photoreceptor using the tetrahydroxy compound
08017807 Cl. 564-443.
Nagai, Masao: See--
Llewellyn, David; Kanayama, Tetsuya; and Nagai, Masao
08016694 Cl. 473-334.
Nagai, Nobuo: See--
Matsumoto, Takao; and Nagai, Nobuo
08017922 Cl. 250-492.21.
Nagai, Shoji: See--
Ishibashi, Yoshihito; Odaka, Kentaro; Nagai, Shoji; and Kubono, Fumio
08018426 Cl. 345-102.
Nagai, Takayuki: See--
Morimura, Tomohiro; Nagai, Takayuki; Sugauchi, Kiminori; Kuroda, Takaki; and Arato, Yoshihiro
08020045 Cl. 714-26.
Nagaishi, Michihiro: See--
Karaki, Isuke; Inoguchi, Makoto; and Nagaishi, Michihiro
08019224 Cl. 398-115.
Nagamine, Kentaro: See--
Notomi, Tsugunori; and Nagamine, Kentaro
08017357 Cl. 435-91.2.
Nagano, Hajime; to Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device and method of fabricating the same
08017990 Cl. 257-316.
Nagao, Manabu: See--
Momosaki, Kohei; Uehara, Tatsuya; Imoto, Kazunori; Masai, Yasuyuki; Abe, Kazuhiko; Nagao, Manabu; and Sasajima, Munehiko
08019163 Cl. 382-212.
Nagao, Ritsuko: See--
Sakakura, Masayuki; Nagao, Ritsuko; Osame, Mitsuaki; Anazai, Aya; Yamazaki, Yu; and Tanada, Yoshifumi
08018403 Cl. 345-76.
Nagaoka, Eiichi; and Sakamoto, Keiji, to Panasonic Corporation Lens barrel, image pickup device, lens barrel inspecting method, and lens barrel manufacturing method
08018522 Cl. 348-335.
Nagaoka, Kazuma: See--
Houmura, Toshikazu; Yoshihara, Kazuhiro; Yamaguchi, Takako; and Nagaoka, Kazuma
08019061 Cl. 379-100.14.
Nagarajan, Ramesh; to Xerox Corporation Customized system and method of billing for printing service costs by examining the contents of printed pages
08019695 Cl. 705-400.
Nagarajan, Vasantha: See--
Bramucci, Michael G.; Kane, Helene M. A.; and Nagarajan, Vasantha
08017364 Cl. 435-160.
Nagarajrao, Sunil K.; Merbach, David L.; Basham, Robert; Heitman, Allen R.; Padbidri, Sumant; and Axberg, Gary T., to International Business Machines Corporation Intelligent discovery of network information from multiple information gathering agents
08019851 Cl. 709-223.
Nagasaku, Toshiyuki: See--
Wachi, Yusuke; and Nagasaku, Toshiyuki
08018292 Cl. 331-117R.
Nagasawa, Nobuyuki: See--
Natori, Yasuaki; and Nagasawa, Nobuyuki
08017903 Cl. 250-216.
Nagase, Shigeki; to JTEKT Corporation Electric power steering system
08018191 Cl. 318-479.
Nagase, Toshiaki: See--
Onishi, Hiroyuki; Nagase, Toshiaki; Ishikawa, Jun; Kontani, Kazuyoshi; Fukatsu, Toshinari; Kobayashi, Hiroyuki; Kanie, Naohito; and Nakamura, Takahiro
08018730 Cl. 361-763.
Nagashima, Yukihito: See--
Seto, Hiromitsu; Koyama, Akihiro; and Nagashima, Yukihito
08017537 Cl. 501-71.
Nagata, Makoto; to Semiconductor Technology Academic Research Center Timing analysis apparatus and method for semiconductor integrated circuit in consideration of power supply and ground noises
08020130 Cl. 716-115.
Nagata, Shigemi: See--
Uehara, Yusuke; Baba, Takayuki; Endo, Susumu; Shiitani, Shuichi; Masumoto, Daiki; and Nagata, Shigemi
08019761 Cl. 707-737.
Nagatsuka, Masaaki: See--
Hosoe, Koji; and Nagatsuka, Masaaki
08019952 Cl. 711-156.
Nagatsuka, Masato: See--
Matsuda, Mamoru; Mori, Toshiyuki; Kawashima, Kenji; Nagatsuka, Masato; Kobayashi, Sachiko; Yamamoto, Minoru; Kato, Masatomo; Takai, Miwa; and Oda, Tomoko
08017775 Cl. 546-18.
Nagaya, Mitsuhiro: See--
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio
08018242 Cl. 324-755.01.
Nagayama, Katsuhiro: See--
Kitagawa, Takashi; Nagayama, Katsuhiro; and Otsuka, Masayuki
08019242 Cl. 399-43.
Nagoya, Mitsugu; to Duaxes Corporation Determining device and determining method for determining processing to be performed based on acquired data
08019776 Cl. 707-769.
Nagumo, Hirobumi: See--
Shirasu, Toshiyuki; Oka, Daizo; Nagumo, Hirobumi; and Ishida, Tessho
08016433 Cl. 353-85.
Nagy, Sandor; Pater, Joachim T. M.; and Morini, Giampiero, to Equistar Chemicals, LP Nitroso-modified Ziegler-Natta catalyst system
08017708 Cl. 526-220.
Naick, Indran; and Wilson, Jeffrey Kenneth, to International Business Machines Corporation Apparatus and method for providing automatic language preference
08019053 Cl. 379-88.06.
Nair, Ajith N.: See--
Claussen, Paul J.; Nair, Ajith N.; and Russ, Samuel H.
08020182 Cl. 725-25.
Nair, Hari N.; to Tamiras Per Pte. Ltd., LLC Robust camera pan vector estimation using iterative center of mass
08019124 Cl. 382-107.
Nair, Ramesh: See--
Bao, Xiaoming; Singletary, George W.; Wetterberg, Deborah J.; Nair, Ramesh; Dhugga, Kanwarpal S.; Liebergesell, Matthias; and Selinger, David A.
08017831 Cl. 800-285.
Naito, Koji; and Ikeda, Akihiko, to Toyota Jidosha Kabushiki Kaisha Powertrain
08016070 Cl. 180-380.
Naito, Toshiki; Ohsawa, Tetsuya; and Kataoka, Kouji, to Nitto Denko Corporation Wired circuit board assembly sheet
08017871 Cl. 174-250.
Najafi, Nader: See--
Sparks, Douglas Ray; and Najafi, Nader
08016798 Cl. 604-246.
Najanguaq Søvsø Andreasen Struijk, Lotte; to TKS A/S Tongue based control method and system for performing the method
08018320 Cl. 340-4.11.
Naka, Kenichirou: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou
08018538 Cl. 349-38.
Nakada, Hideki; Kohama, Kouhei; Uemura, Tetsuro; Sato, Takashi; and Hamada, Ryosuke, to C. Uyemura & Co., Ltd. Surface treatment apparatus
08015983 Cl. 134-76.
Nakade, Isamu: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu
08020178 Cl. 720-662.
Nakagawa, Atsuo; Murakami, deceased, Ichiroh; and Murakami, legal representative, Masanori, to Panasonic Corporation Solid-state image sensor and manufacturing method thereof
08018012 Cl. 257-432.
Nakagawa, Hideo: See--
Morinaga, Yasunori; and Nakagawa, Hideo
08017518 Cl. 438-637.
Nakagawa, Hisashi; Akiyama, Masahiro; Furukawa, Tsuyoshi; and Tokushige, Naohisa, to JSR Corporation Polycarbosilane, method for producing same, silica composition for coating application, and silica film
08017700 Cl. 525-474.
Nakagawa, Tomonori: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji
08017615 Cl. 514-253.07.
Nakagawa, Yoshinori: See--
Iwasaki, Osamu; Takahashi, Kiichiro; Nishikori, Hitoshi; Otsuka, Naoji; Teshigawara, Minoru; Edamura, Tetsuya; Nakagawa, Yoshinori; and Seki, Satoshi
08016386 Cl. 347-43.
Nakahara, Hironori; Takeshita, Nobuo; and Ogawa, Masaharu, to Mitsubishi Electric Corporation Optical disc and optical disc device
08018812 Cl. 369-94.
Nakahara, Masanori: See--
Takakuwa, Nobuyuki; Fukuda, Yasuko; Sawabe, Takao; Kanegae, Tohru; Nakahara, Masanori; Koda, Takeshi; and Imamura, Akira
08019196 Cl. 386-248.
Nakahara, Yuji: See--
Miyake, Nobuaki; Nakahara, Yuji; Yuya, Masahiro; Karata, Yukinobu; and Hashimoto, Akira
08015691 Cl. 29-596.
Nakai, Tohru: See--
En, Honchin; Hayashi, Masayuki; Wang, Dongdong; Shimada, Kenichi; Asai, Motoo; Sekine, Koji; Nakai, Tohru; Ichikawa, Shinichiro; and Toyoda, Yukihiko
08018045 Cl. 257-700.
Nakai, Tomoaki: See--
Kinukawa, Tatsuya; Ichinose, Kimitaka; Nakai, Tomoaki; Kume, Takao; and Seki, Hiroyuki
08019243 Cl. 399-43.
Nakai, Yasuhiro: See--
Osaki, Shintaro; Kodama, Hiroyuki; Takeda, Masayoshi; Kadowaki, Kazunori; Nakai, Yasuhiro; Kumabe, Hajime; and Fukuda, Shotaro
08019520 Cl. 701-69.
Nakajima, Atsushi: See--
Fujiwara, Yoshinobu; Honsawa, Kunio; and Nakajima, Atsushi
08020214 Cl. 726-31.
Nakajima, Kazuaki; and Suguro, Kyoichi, to Kabushiki Kaisha Toshiba Semiconductor device and manufacturing method for the same
08017466 Cl. 438-199.
Nakajima, Kazuo: See--
Kida, Michio; Pan, Wugen; Kaneko, Kyojiro; Nakajima, Kazuo; Usami, Noritaka; and Fujiwara, Kozo
08017862 Cl. 136-261.
Nakajima, Ryuta; and Mashimo, Hidehiko, to Sumitomo Heavy Industries, Ltd. Stage device
08019448 Cl. 700-60.
Nakajima, Takeshi: See--
Miyashita, Harumitsu; Nakajima, Takeshi; and Kimura, Naohiro
08018810 Cl. 369-59.22.
Nakajima, Yoshiharu: See--
Koyama, Hirotoshi; Nakajima, Yoshiharu; Kida, Yoshitoshi; and Ito, Daisuke
08018415 Cl. 345-96.
Nakamatsu, Hiroki; Sugiura, Kenji; Sugimoto, Naomi; Naruse, Osamu; and Yano, Hidetoshi, to Ricoh Company Limited Polarity controlling device, and cleaner and image forming apparatus using the polarity controlling device
08019268 Cl. 399-349.
Nakamura, Atsushi; Fujiune, Kenji; and Hino, Yasumori, to Panasonic Corporation Method for inspecting optical information recording medium, inspection apparatus, optical information recording medium and recording method
08018808 Cl. 369-53.28.
Nakamura, Daisuke: See--
Suzuki, Takayoshi; and Nakamura, Daisuke
08016625 Cl. 440-1.
Suzuki, Takayoshi; Ryuman, Mitsuhiro; and Nakamura, Daisuke
08016626 Cl. 440-75.
Nakamura, deceased, Takeshi: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi
08017809 Cl. 568-3.
Nakamura, Fusashi: See--
Murakami, Akiko; Nakamura, Fusashi; and Nasukawa, Tetsuya
08019756 Cl. 707-729.
Nakamura, Hidekazu; to Canon Kabushiki Kaisha Optical apparatus
08018667 Cl. 359-824.
Nakamura, Hiroyuki; Uehara, Masato; Wang, Hongzhi; Maeda, Hideaki; Miyazaki, Masaya; Yamaguchi, Yoshiko; Yamashita, Kenichi; Shimizu, Hazime; and Li, Xyanying, to National Institute of Advanced Industrial Science and Technology Method for manufacturing fine composite particles, apparatus for manufacturing fine composite particles, and fine composite particles
08017235 Cl. 428-403.
Nakamura, Junichi; and Kobayashi, Yuji, to Shinko Electric Industries Co., Ltd. Method of fabricating wiring board and method of fabricating semiconductor device
08015700 Cl. 29-830.
Nakamura, Katsuhisa: See--
Saito, Hirofumi; Nakamura, Yoshihito; Matsukawa, Akihiro; Nakamura, Katsuhisa; and Asami, Masaaki
08015918 Cl. 101-425.
Nakamura, Kimiaki: See--
Sasaki, Takahiro; Takeda, Arihiro; Ohmuro, Katsufumi; Chida, Hideo; Koike, Yoshio; Nakamura, Kimiaki; and Tashiro, Kunihiro
08018559 Cl. 349-129.
Nakamura, Koji; Tajima, Rie; Kumar, Shankar; Tso, J. Yun; and Tsurushita, Naoya, to LivTech Inc. — Teikyo University Biotechnology Research Center Anti-hDlk-1 antibody having an antitumor activity in vivo
08017118 Cl. 424-133.1.
Nakamura, legal representative, Aiko: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi
08017809 Cl. 568-3.
Nakamura, legal representative, Kyoko: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi
08017809 Cl. 568-3.
Nakamura, Makoto: See--
Ohtani, Hiroki; Nakamura, Makoto; Yamada, Kenji; Okamura, Masaki; and Hanada, Hideto
08018195 Cl. 318-812.
Nakamura, Minoru; and Izutani, Akira, to Ricoh Company, Ltd. Image forming method and image forming apparatus
08017290 Cl. 430-48.
Nakamura, Mitsuyoshi; and Matsui, Toru, to Honda Motor Co., Ltd. Seat-form storage apparatus
08016338 Cl. 296-37.15.
Nakamura, Naofumi: See--
Sasaki, Hirokazu; Nakamura, Naofumi; Morikawa, Shigeru; Hashimoto, Hideto; Kimura, Takaaki; and Kawai, Yoshihiko
08015851 Cl. 72-347.
Nakamura, Nobuhiro; Hayashi, Kazutaka; Imakita, Kenji; Ohkawa, Hiroyuki; Odaka, Hidefumi; and Ishibashi, Nao, to Asahi Glass Company, Limited Translucent substrate, process for producing the same, organic LED element and process for producing the same
08018140 Cl. 313-503.
Nakamura, Norikazu; Chiba, Hiroshi; Kasamatsu, Yoshiharu; Musashi, Takayuki; Oshikubo, Yukiko; and Itani, Tsukasa, to Fujitsu Limited Head slider and magnetic recording device therewith
08018683 Cl. 360-235.1.
Nakamura, Tadashi; to Fujitsu Limited Wireless communication device
08019285 Cl. 455-63.4.
Nakamura, Takafumi: See--
Furukawa, Chisato; and Nakamura, Takafumi
08017954 Cl. 257-88.
Nakamura, Takahiro: See--
Onishi, Hiroyuki; Nagase, Toshiaki; Ishikawa, Jun; Kontani, Kazuyoshi; Fukatsu, Toshinari; Kobayashi, Hiroyuki; Kanie, Naohito; and Nakamura, Takahiro
08018730 Cl. 361-763.
Nakamura, Takao: See--
Yoshizumi, Yusuke; Ueno, Masaki; and Nakamura, Takao
08018029 Cl. 257-615.
Nakamura, Tohru: See--
Sakakibara, Mizuho; Kawakami, Hideo; Kume, Yohei; and Nakamura, Tohru
D0644850 Cl. D6-383.
Nakamura, Yasunori: See--
Horiuchi, Takashi; Nakamura, Yasunori; and Suito, Yoshikatsu
08016285 Cl. 271-145.
Nakamura, Yasuo: See--
Yamazaki, Shunpei; Nomura, Ryoji; Seo, Satoshi; Abe, Hiroko; and Nakamura, Yasuo
08018152 Cl. 313-509.
Nakamura, Yoshihito: See--
Saito, Hirofumi; Nakamura, Yoshihito; Matsukawa, Akihiro; Nakamura, Katsuhisa; and Asami, Masaaki
08015918 Cl. 101-425.
Nakane, Eiji; to Konica Minolta Business Technologies, Inc. User-friendly image forming apparatus with current supplier for supplying cleaning current, image forming method and recording medium
08019244 Cl. 399-44.
Nakane, Shinichi: See--
Yamasaki, Isamu; Mori, Takanobu; Nakane, Shinichi; Achiwa, Noriyuki; and Harada, Kohta
08016001 Cl. 141-21.
Nakanishi, Hiroyuki; to Canon Kabushiki Kaisha Display apparatus, display control apparatus, and control method
08018483 Cl. 348-53.
Nakanishi, Nozomu: See--
Minowa, Nobuto; Nakanishi, Nozomu; and Mitomi, Masaaki
08017797 Cl. 560-51.
Nakanishi, Tetsuya; Onishi, Masashi; Yokokawa, Tomoyuki; Hirano, Masaaki; and Taira, Nobuyuki, to Sumitomo Electric Industries, Ltd. Glass tube processing method
08015845 Cl. 65-384.
Nakano, Haruhiko: See--
Takenobu, Hideya; and Nakano, Haruhiko
08016588 Cl. 425-566.
Nakao, Masahiro: See--
Maeda, Mitsuru; Nakao, Masahiro; and Fukami, Harukazu
08017587 Cl. 514-27.
Nakao, Shuji: See--
Ishibashi, Takeo; Saito, Takayuki; Itoh, Maya; and Nakao, Shuji
08017305 Cl. 430-311.
Nakao, Takashi: See--
Ozawa, Yoshio; Mizushima, Ichiro; Nakao, Takashi; Yamamoto, Akihito; Suzuki, Takashi; and Kiyotoshi, Masahiro
08017989 Cl. 257-315.
Nakaoki, Ariyoshi: See--
Kim, SunMin; Ishimoto, Tsutomu; Kondo, Takao; and Nakaoki, Ariyoshi
08018827 Cl. 369-300.
Nakashiba, Yasutaka; to Renesas Electronics Corporation Circuit board and semiconductor device
08018026 Cl. 257-531.
Nakashima, Moriyoshi: See--
Ajika, Natsuo; Shukuri, Shoji; Mihara, Masaaki; and Nakashima, Moriyoshi
08017994 Cl. 257-324.
Nakaso, Suguru: See--
Tian, Minquan; Hirokawa, Kazuhiko; Ito, Yuka; Nakaso, Suguru; Hasegawa, Shinji; Watanabe, Miho; Matsubara, Takashi; Anazawa, Kazunori; Miyahara, Tomoco; and Furuki, Makoto
08017291 Cl. 430-108.1.
Nakata, Hidetoshi; to Renesas Electronics Corporation Method of manufacturing semiconductor device
08017511 Cl. 438-597.
Nakatani, Shuhei; Hotta, Sadayoshi; and Yoshida, Hidehiro, to Panasonic Corporation Organic transistor, method of forming organic transistor and organic EL display with organic transistor
08017940 Cl. 257-40.
Nakatani, Yuuya: See--
Ishida, Kazuo; Ohta, Atsushi; Nakatani, Yuuya; Itoh, Hiroshi; and Inomata, Chiaki
08019257 Cl. 399-274.
Nakatsue, Takehiro: See--
Matsumoto, Tatsuhiko; Imai, Yutaka; and Nakatsue, Takehiro
08018468 Cl. 345-589.
Nakatsura, Tetsuya: See--
Nishimura, Yasuharu; Nakatsura, Tetsuya; and Ikuta, Yoshiaki
08017345 Cl. 435-7.1.
Nakauchi, Rachel: See--
Provos, Niels; Zhou, Yunkai; Bavor, Jr., Clayton W.; Davis, Eric L.; Palatucci, Mark; Nigam, Kamal P.; Monson, Christopher K.; Mavrommatis, Panayiotis; and Nakauchi, Rachel
08019700 Cl. 706-12.
Nakayama, Brian L.: See--
Fitzpatrick, Richard M.; Mayberry, Michael T.; and Nakayama, Brian L.
D0645113 Cl. D22-108.
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio, to NHK Spring Co., Ltd. Probe card
08018242 Cl. 324-755.01.
Nakayama, Masayoshi; Akatsu, Shinichi; and Takenaka, Tomohide, to Ricoh Company, Limited Device and method for detecting life of organic photoreceptor and image forming apparatus
08019239 Cl. 399-26.
Nakayama, Shinya: See--
Sabu, Akiyoshi; Kotsugai, Akihiro; Nakayama, Shinya; Yamashita, Hiroshi; Sugimoto, Tsuyoshi; Yamada, Hiroshi; and Awamura, Junichi
08017292 Cl. 430-109.4.
Nakayama, Tsukasa: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu
08020178 Cl. 720-662.
Nakazato, Hiroaki; and Hashimoto, Sunao, to Fuji Xerox Co., Ltd. Information processing apparatus and computer readable medium
08019955 Cl. 711-163.
Nakazawa, Namio; to Monoco Technologies Corp. Lighting device for enhanced lighting
08018129 Cl. 313-318.01.
Nakazono, Takuya; Umemoto, Seiji; and Shimanoe, Fumihito, to Nitto Denko Corporation Information storing, readout and calculation system for use in a system for continuously manufacturing liquid-crystal display elements, and method for producing the same
08016965 Cl. 156-64.
Nakil, Harshad: See--
Reddy, Rajashekar; Singla, Ankur; Nakil, Harshad; Marques, Pedro R.; and Ranjan, Ashish
08018891 Cl. 370-320.
Nakiri, Kazuhiro; Kawakami, Yoshio; and Suzuki, Tetsuo, to Furukawa Electric Co., Ltd., The Chamfering apparatus for chamfering glass substrates
08016645 Cl. 451-180.
Nalco Company: See--
Yoon, Seong-Hoon; Collins, John H.; Koppes, Jeroen A.; and Huisman, Ingmar H.
08017014 Cl. 210-605.
Nalesnik, Theodore E.; to Chemtura Corporation Diaromatic amines
08017805 Cl. 564-305.
Nalux Co., Ltd: See--
Inoue, Yasuaki; Ikeda, Katsumoto; and Miyazaki, Hideki
08017923 Cl. 250-504R.
Nam, Choong-Hee; to Techous Co., Ltd. Anti keylog editor of activex base
08020215 Cl. 726-34.
Nam, Hui: See--
Kim, Beom-Shik; Lee, Jang-Doo; Jang, Hyoung-Wook; Nam, Hui; and Song, Myoung-Seop
08018482 Cl. 348-42.
Nam, Hui; Kim, Beom-Shik; Park, Chan-Young; and Ku, Ja-Seung, to Samsung Mobile Display Co., Ltd. Electronic imaging device and driving method therefor
08018535 Cl. 349-15.
Nam, Kyung-Woo: See--
Oh, Chi-Sung; Kim, Yong-Jun; Nam, Kyung-Woo; Kim, Jin-Kuk; and Kim, Soo-Young
08019948 Cl. 711-149.
Namie, Hisanori: See--
Shimamoto, Kenichi; and Namie, Hisanori
08018287 Cl. 330-298.
Nan, Ning-Han: See--
Pan, Jiung-Cheng; and Nan, Ning-Han
08019395 Cl. 455-575.3.
Nan Ya Plastics Corporation: See--
Shieh, Sung-Yueh; Fung, Dein-Run; Hsu, Han-Ching; and Liu, Yang-Tu
08017799 Cl. 560-127.
Nanda, Sanjiv; and Krishnan, Ranganathan, to QUALCOMM, Incorporated Multi-hop communications in a wireless network
08019351 Cl. 455-452.2.
Nanoink, Inc.: See--
Haaheim, Jason; and Athas, Gregory
08017191 Cl. 427-430.1.
Nanya Technology Corporation: See--
Naoaki, Komiya: See--
Kwak, Won Kvu; and Naoaki, Komiya
08018405 Cl. 345-82.
Naoe, Kunihiro: See--
Ichikawa, Masateru; Naoe, Kunihiro; and Ajimura, Shoji
08017876 Cl. 174-267.
Naono, Takayuki; and Fujii, Takamichi, to Fujifilm Corporation Patterned inorganic film, piezoelectric device, and process for producing the same
08017185 Cl. 427-264.
Napier, Johnathan A.; and Sayanova, Olga, to BASF Plant Science GmbH Process for the production of arachidonic acid and/or eicosapentaenoic acid
08017839 Cl. 800-298.
Napper, Jonathon Leigh; to Silverbrook Research Pty Ltd Method of modifying classification scheme for hand-written characters
08019160 Cl. 382-186.
Naqvi, Farrukh Reza: See--
Ruello, Natale; Naqvi, Farrukh Reza; Elangovan, Anusankar; Borgione, Gaetano; and De Silva, Suran
08018845 Cl. 370-229.
Narahara, Tatsuya; to Sony Corporation Information processing apparatus, and method and program for searching text information candidate
08019774 Cl. 707-769.
Narang, Navan: See--
Shatzkamer, Kevin; Oswal, Anand K.; Iyer, Jayaraman; Grayson, Mark; and Narang, Navan
08018948 Cl. 370-395.2.
Narasimha, Shreesh: See--
Freeman, Gregory G.; Narasimha, Shreesh; Su, Ning; Nayfeh, Hasan M.; Rovedo, Nivo; Rausch, Werner A.; and Yu, Jian
08017483 Cl. 438-286.
Narayanan, Raman: See--
Ozzie, Raymond E.; Ozzie, Jack E.; Moromisato, George P.; Suthar, Paresh S.; Narayanan, Raman; and Augustine, Matthew S.
08020112 Cl. 715-770.
Nardacci, Nicholas M.; and Bissonnette, Laurent, to Acushnet Company Golf ball with improved flight performance
08016695 Cl. 473-373.
Nardell, Carl A.: See--
Meyer, Jay L.; Messick, Glenn C.; Nardell, Carl A.; and Hendlin, Martin J.
08016438 Cl. 359-872.
Nardone, Vincent C.: See--
Bertolotti, Fabio R.; Liscinsky, David S.; Nardone, Vincent C.; Sabatino, Daniel R.; Sahm, Michael K.; and Noack, Bernd R.
08015827 Cl. 60-785.
Nardozza, Jr., Joseph A: See--
Sledge, Rory T.; Gramelspacher, Michael S.; Weinstock, Brian Fuller; and Nardozza, Jr., Joseph A
D0645096 Cl. D21-328.
Narendar, Yeshwanth; Simpson, Matthew A.; and Hengst, Richard R. Semiconductor processing components and semiconductor processing utilizing same
08017062 Cl. 264-500.
Narita, Mitsuo; Hatayama, Atsushi; and Umezawa, Hiroshi, to Shin-Etsu Chemical Co., Ltd. Methods for preparing alkali cellulose and cellulose ether
08017766 Cl. 536-84.
Narramore, Jimmy Charles: See--
Agnihotri, Ashok K.; Narramore, Jimmy Charles; and Schillings, John J.
08016566 Cl. 416-223R.
Narumi, Satoshi; Kato, Masaaki; Hoashi, Masaharu; and Suzuki, Toshiya, to Renesas Electronics Corporation Motor drive apparatus
08018189 Cl. 318-400.35.
Naruo, Toshihiro: See--
Kiyono, Yasuhiro; and Naruo, Toshihiro
08017883 Cl. 200-520.
Narus Inc.: See--
Nucci, Antonio; Ranjan, Supranamaya; and Kuzmanovic, Aleksandar
08019764 Cl. 707-739.
Narusawa, Hideyuki; to Seiko Epson Corporation Printing method with respect to scanning a medium
08016499 Cl. 400-76.
Naruse, Osamu: See--
Nakamatsu, Hiroki; Sugiura, Kenji; Sugimoto, Naomi; Naruse, Osamu; and Yano, Hidetoshi
08019268 Cl. 399-349.
Narvalus S.R.L.: See--
Vassanelli, Stefano; and Cellere, Giorgio
08017367 Cl. 435-173.6.
Nascimento, Ivan Carlos Ribeiro; to Freescale Semiconductor, Inc. Voltage reference device and methods thereof
08018197 Cl. 320-116.
Nash, Dennis C.; and Nash, Holly B. Boat trailer fender cover
D0644980 Cl. D12-401.
Nash, Holly B.: See--
Nash, Dennis C.; and Nash, Holly B.
D0644980 Cl. D12-401.
Nash, Stephen; O'Beirne, Patricia; Johnson, David; Gormley, Stephen; and Kelly, Grace, to Medtronic Vascular, Inc. Catheter having a detachable tip
08016799 Cl. 604-265.
Nasu, Hiroshi: See--
Asano, Masayasu; Nasu, Hiroshi; Yamamoto, Masayuki; and Maki, Nobuhiro
08019930 Cl. 711-103.
Nasu, Mineyuki: See--
Okamoto, Hideo; Hiraga, Tadayuki; Ohta, Hiroitsu; Nasu, Mineyuki; and Sasaki, Hiroaki
08015950 Cl. 122-31.1.
Nasukawa, Tetsuya: See--
Murakami, Akiko; Nakamura, Fusashi; and Nasukawa, Tetsuya
08019756 Cl. 707-729.
Nath, Sanjeev; and Patel, Rajesh Method for deactivating an image capturing device when present in a restricted or prohibited zone
08018496 Cl. 348-211.2.
Nathanson, Harvey C.; Young, Robert M.; Smith, Joseph T.; Howell, Robert S.; and Mitchell, Archer S., to Northrop Grumman Systems Corporation Heat transfer device
08018053 Cl. 257-717.
National Chiao Tung University: See--
Meng, Hsin-Fei; Horng, Sheng-Fu; Hsu, Chain-Shu; Lin, Shi-Cheng; and Liao, Hua-Hsien
08017175 Cl. 427-74.
National Flooring Equipment, Inc.: See--
Anderson, Martin L.
06609762 Cl. 299-37.2.
National Gypsum Properties, LLC: See--
Martin, William C.; Stav, Eli; Plante, Matthew J.; and Heermann, Maryn L.
08016961 Cl. 156-43.
National Institute of Advanced Industrial Science and Technology: See--
Nakamura, Hiroyuki; Uehara, Masato; Wang, Hongzhi; Maeda, Hideaki; Miyazaki, Masaya; Yamaguchi, Yoshiko; Yamashita, Kenichi; Shimizu, Hazime; and Li, Xyanying
08017235 Cl. 428-403.
National Oilwell Varco, L.P.: See--
Bloom, Robert; Ellison, Leon D.; Kammann, Reinhold; Worms, Manfred; Lam, Clive; and McClung, III, Guy L.
08016037 Cl. 166-255.1.
National Semiconductor Corporation: See--
Evans, Jr., Joseph T.; Miller, William D.; and Womack, Richard H.
08018754 Cl. 365-145.
Griesert, Nathanael; and Swank, Damian
08018215 Cl. 323-282.
How, You Chye; and Yeong, Shee Min
08018050 Cl. 257-704.
Small, Jeffrey A.; and Oberoi, Anirudh
08018176 Cl. 315-291.
National Taiwan University of Science and Technology: See--
Chou, Chen-Chia; and Yeh, Tsung-Her
08016988 Cl. 204-424.
National University Corporation Hokkaido University: See--
Ohtani, Bunsho; Abe, Ryu; Sakatani, Yoshiaki; Murata, Makoto; and Nishimine, Hiroaki
08017238 Cl. 428-403.
Nationwide Children's Hospital, Inc.: See--
Caldas, Hannah; and Altura, Rachel A.
08017747 Cl. 536-23.1.
Natoli, Chris: See--
Purdy, Eric; Natoli, Chris; and Montena, Noah
D0644998 Cl. D13-151.
Natoli, Christopher P.: See--
Montena, Noah; and Natoli, Christopher P.
08016605 Cl. 439-322.
Natori, Yasuaki; and Nagasawa, Nobuyuki, to Olympus Corporation Observation apparatus
08017903 Cl. 250-216.
Natsume, Shigeru G.: See--
Davis, Brian T.; Schumacher, Donald J.; Healey, Gregory E.; Price, Bradley H.; Chan, Eric Ping Pang; and Natsume, Shigeru G.
D0644926 Cl. D9-448.
Naughton, Ron: See--
Mahoney, Michael; Dziedzic, Sara; Birkmeyer, Paul; Beardsley, Timothy; Frank, Dale; and Naughton, Ron
08016829 Cl. 606-86A.
Naughton, Ronald: See--
Birkmeyer, Paul; Sicvol, Christopher W.; Serhan, Hassan; Selover, Sean; Naughton, Ronald; and Sheehy, Nancy M.
08016835 Cl. 606-97.
Nault, Gabe: See--
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert
08020192 Cl. 726-1.
Nautilus Hyosung Inc.: See--
Kwak, Jae Hoon; Lee, Woo Ho; Lee, Hee Chang; and Yoon, Joon Hyun
08016186 Cl. 235-379.
Nautilus, Inc.: See--
Kuo, Hai Pin; and Piaget, Gary D.
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Navarro, Abraham J.: See--
Thomas, Jeffrey J.; Navarro, Abraham J.; Read, Gordon K.; and Zdyrko, Jr., David M.
08016664 Cl. 463-23.
Navia, Juan: See--
Kabbani, Fiesal El; Brohmi, Amal; Heiss, Christian; Navia, Juan; and Catani, Steven J.
08017767 Cl. 536-123.13.
Navigon AG: See--
Hess, Philipp; and Thomas, Bernd
08018461 Cl. 345-467.
Navon, Ariel Device and method for monitoring blood parameters
08017407 Cl. 436-164.
NAVTEQ North America, LLC: See--
DeVries, Steven P.; Herbst, James M.; Hopkins, Karen A.; McGrath, Suzanne M.; Bauer, Ellen M.; Bennett, James R.; and Borak, Jason M.
08019537 Cl. 701-211.
Nawata, Teruhiko; Yasumura, Ken; Yanagi, Hiroyuki; and Nishijima, Eiichi, to Tokuyama Corporation Process for producing metal fluoride single crystal
08016942 Cl. 117-30.
Nayak, Asha Shrinivas: See--
Mourlas, Nicholas J.; Eversull, Christian Scott; Leeflang, Stephen Arie; Nayak, Asha Shrinivas; and Miller, David John
08016748 Cl. 600-115.
Nayak, Ratnakar Aravind; to Agere Systems Inc. Systems and methods for mitigating latency in a data detector feedback loop
08018360 Cl. 341-118.
Nayan, Azlina N.: See--
Lim, Kevin W.; Too, Seah S.; Nayan, Azlina N.; Keok, Kee Hean; and Yong, Soon Tatt Ow
08017434 Cl. 438-106.
Nayar, Naresh: See--
Armstrong, William Joseph; Corrigan, Michael J.; Jacobs, Stuart Zachary; Larson, David Anthony; Nayar, Naresh; and Ouren, Wade Byron
08019962 Cl. 711-173.
Nayfeh, Hasan M.: See--
Freeman, Gregory G.; Narasimha, Shreesh; Su, Ning; Nayfeh, Hasan M.; Rovedo, Nivo; Rausch, Werner A.; and Yu, Jian
08017483 Cl. 438-286.
Naylor, Matthew S.: See--
Schilling, Robin B.; Naylor, Matthew S.; and Chahley, Dennis W.
08015933 Cl. 111-129.
Naylor, Matthew S.; Thompson, Dennis G.; and Georgison, Ryan R., to CNH Canada, Ltd. Marker assembly having breakaway feature
08016043 Cl. 172-126.
Nazarenko, Igor: See--
Baccash, Jonathan M.; Nazarenko, Igor; Rodny, Uri; and Shatdal, Ambuj
08019751 Cl. 707-719.
nCircle Network Security, Inc.: See--
Keanini, Timothy D.; Quiroga, Martin A.; Buchanan, Brian W.; and Flowers, John S.
08020211 Cl. 726-25.
NDSU Research Foundation: See--
Webster, Dean C.; Chen, Zhigang; and Ravindran, Neena
08017795 Cl. 549-547.
Nease, Brant: See--
Chung, Ki Sup; Sin, Kyusik; Yang, Danning; Chen, Yingjian; and Nease, Brant
08018677 Cl. 360-125.03.
NEC Corporation: See--
Kajita, Mikihiro
08018240 Cl. 324-750.3.
Kaneta, Hiroshi; and Kanbe, Chika
08017260 Cl. 429-62.
Kuroda, Nahoko; Hamabe, Kojirou; and Lee, Jinsock
08019375 Cl. 455-522.
Nose, Koichi; Ishizaki, Haruya; and Mizuno, Masayuki
08018295 Cl. 332-100.
Nose, Koichi; and Mizuno, Masayuki
08019560 Cl. 702-57.
Shimobayashi, Shinya
08018901 Cl. 370-331.
Yamaguchi, Hiroshi
08019033 Cl. 375-362.
Yoshida, Shousei; and Kimata, Masayuki
08019031 Cl. 375-349.
NEC Laboratories America, Inc.: See--
Bachwani, Rekha N; Gryz, Leszek R; Bianchini, Ricardo G; and Dubnicki, Cezary
08019728 Cl. 707-658.
Jiang, Guofei; Chen, Haifeng; and Yoshihira, Kenji
08019584 Cl. 703-13.
NEC LCD Technologies, Ltd: See--
NEC LCD Technologies, Ltd.: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou
08018538 Cl. 349-38.
NEC Lighting, Ltd: See--
Minamoto, Maki; Ohmi, Koutoku; and Tsuji, Kazuaki
08017037 Cl. 252-301.4S.
NEC Tokin Corporation: See--
Yoshida, Yuji; Yoshida, Katsuhiro; Kasuga, Takeo; Takahashi, Masanori; Saito, Takeshi; and Sakata, Koji
08018713 Cl. 361-523.
Needelman, David D.; Li, Rongsheng; and Wu, Yeong-Wei A., to Boeing Company, The Real-time refinement method of spacecraft star tracker alignment estimates
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Needlebot Incorporated: See--
Collins, John Barrett; Verlin, Jerome; Akyuz, Can Deniz; and Donnelly, Stuart
08019754 Cl. 707-728.
Neef, Edwin: See--
Pinkus, Ayal; Neef, Edwin; Jurgens, Sven-Erik; and Gretton, Mark
08019531 Cl. 701-200.
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Durst, Bartley P.; Neeley, Billy D.; O'Neil, Edward F.; and Cummins, Toney K.
08016938 Cl. 106-713.
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Van De Ven, Antony Paul; and Negley, Gerald H.
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08018372 Cl. 342-107.
Neidhardt, Ronald: See--
Burger, Kurt; Schneider, Guenter; Neidhardt, Ronald; Hauser, Manfred; Burghoff, Klaus; Grosse, Stefan; Schattke, Alexander; Henke, Sascha; Bayer, Christian; and Schmautz, Oliver
08017196 Cl. 427-568.
Neiley, Roger; and Scaturro, Anthony, to Flow Sports, Inc. Modular binding for sports board
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Allen, Jennifer R.; Biswas, Kaustav; Burli, Roland; Dao, Jennifer; Frohn, Michael J.; Golden, Jennifer E.; Hungate, Randall W.; Kurzeja, Robert; Mercede, Stephanie J.; Muller, Kristine M.; Neira, Susana C.; Peterkin, Tanya A. N.; Tegley, Christopher M.; and Yu, Violeta
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Nekhamkin, Michael; and Yu, Liangkai, to iBiquity Digital Corporation Systems and methods for DC component recovery in a zero-IF radio receiver
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Nellcor Purtian Bennett LLC: See--
Sanchez, Gabriel; Doyle, Peter; Leone, Kenneth; Cleveland, Donna; Palmer, Marc; and Hyde, David
D0645158 Cl. D24-231.
Nellor, Howard J.: See--
Cocotis, Thomas A.; Curtis, Alan D.; Emmett, David M.; Fan, Shengkuo; Henderson, Kristofer P.; Luepke, Jack W.; Nellor, Howard J.; Treptow, Jay A.; and Wong, Gregory H.
08019829 Cl. 709-217.
Nelson, Adam; to Good Nite Lite, LLC Night light wake up indicator
08018327 Cl. 340-309.16.
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Keefer, Bowie G.; Roy, Surajit; St.-Pierre, Jean; Nelson, Amy E.; and Knights, Shanna D.
08015808 Cl. 60-517.
Nelson, Andrew J.: See--
Novak, Julia E.; Presnell, Scott R.; Sprecher, Cindy A.; Foster, Donald C.; Holly, Richard D.; Gross, Jane A.; Johnston, Janet V.; Nelson, Andrew J.; Dillon, Stacey R.; and Hammond, Angela K.
08017343 Cl. 435-7.1.
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Nelson, Daniel: See--
Zhang, Min; Wright, David Howell; Cooper, Scott; Dykstra, Regina; Ramaswamy, Arun; and Nelson, Daniel
08019162 Cl. 382-199.
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Nelson, Benny Kevin; and Nelson, David W.
08016903 Cl. 55-357.
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Bargiel, Michael; Nelson, Joshua J.; Walters, Glenn; and Pollard, Frank
08015653 Cl. 15-144.2.
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Bartlett, Philip Nigel; Owen, John Robert; and Nelson, Phillip A
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Nelson, Robert Sigurd; and Nelson, William Bert Slit and slot scan, SAR, and compton devices and systems for radiation imaging
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Chisholm, Matthew; Nelson, Stephen; and Lundquist, Steven D.
08016069 Cl. 180-307.
Nelson, William Bert: See--
Nelson, Robert Sigurd; and Nelson, William Bert
08017906 Cl. 250-252.1.
Nemeth, Attila Csaba: See--
Collier, Gordon Bruce; Wood, John Allister; MacLeod, Jason Andrew; Dicke, William Charles; Nemeth, Attila Csaba; and Miller, Cary James
08017340 Cl. 435-6.12.
Nemirovsky, Edward: See--
Baraz, Benjamin; Nemirovsky, Edward; and Newman, Yona
08019278 Cl. 455-11.1.
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Kanbe, Takao; Ono, Shinobu; Harada, Shinichiro; and Nemoto, Satoru
08018665 Cl. 359-823.
Nentwick, Brian: See--
Bettuchi, Michael; and Nentwick, Brian
08016177 Cl. 227-176.1.
Neo, Muay Kheng: See--
Amesbury, Marjan S.; Baxter, Barbara Helen; King, Michael O.; Hardin, Mark T.; Chen, Qiong; Neo, Muay Kheng; and Rozario, Louis-Raymond
08017886 Cl. 219-121.63.
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Goto, Michiyo; Teo, Chun Woei; Neo, Sua Hong; and Yoshida, Koji
08019087 Cl. 381-17.
Nerone, Louis Robert; to General Electric Company Risk of shock protection circuit
08018700 Cl. 361-91.1.
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Pastorello, Douglas F.; De Bakker, Patrick; and Nervegna, Louis J.
08020010 Cl. 713-300.
Nerviano Medical Sciences S.R.L.: See--
Tonani, Roberto; Bindi, Simona; Fancelli, Daniele; Pittala′, Valeria; and Varasi, Mario
08017643 Cl. 514-407.
Nesargi, Sanket: See--
Tenneti, Surya; Nesargi, Sanket; and Li, Jun
08019343 Cl. 455-436.
Nesargi, Sanket; Li, Jun; Chowdhury, Kuntal; and Vasudevan, Mini, to Ericsson AB Admission control and policing in wireless packet data communication system
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Matityahu, Eldad; Shaw, Robert; Carpio, Dennis; Liu, Xiaochun; Fung, Randy; and Hui, Siuman
08018856 Cl. 370-241.
NetApp, Inc.: See--
Kong, George; Aiello, Anthony F.; Aster, Radek; and Thelen, Randal
08019842 Cl. 709-223.
Schwartz, Barry; and Johnson, Colin
08020037 Cl. 714-6.3.
NetBio, Inc.: See--
Tan, Eugene; Lam, Heung Chuan; Bogdanov, Valery Leonidovich; Kellogg, Gregory John; Wright, John A.; Thomann, Ulrich Hans; and Selden, Richard F.
08018593 Cl. 356-344.
Netherlands Cancer Institute, The: See--
Dai, Hongyue; Van't Veer, Laura J.; Lamb, John; Stoughton, Roland; Friend, Stephen H.; and He, Yudong
08019552 Cl. 702-19.
Netlist, Inc.: See--
Yu, Enchao; and An, Zhiyong
08018723 Cl. 361-715.
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Maheshwari, Dinesh; Wright, Andrew; Jiang, Bin; and Banachowicz, Bartosz
08018751 Cl. 365-49.11.
Nettekoven, Matthias; and Roche, Olivier, to Hoffmann-La Roche Inc. Cyclohexyl sulfonamide derivatives
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Philipp, Jens; and Neumann, Andreas
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Neumetzler, Heiko; to ADC GmbH Wire connection module
08016617 Cl. 439-620.08.
Neurogenetic Pharmaceuticals, Inc.: See--
Cheng, Soan; Comer, Daniel D.; Mao, Long; Balow, Guity P.; and Pleynet, David
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Neurologix, Inc.: See--
Kaplitt, Michael; and Moussatov, Serguei
08017385 Cl. 435-320.1.
Neurosearch A/S: See--
Dahl, Bjarne H.; Peters, Dan; Olsen, Gunnar M.; Timmermann, Daniel B.; and Jørgensen, Susanne
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Smith, Steven; and Nevel, Lewis V.
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New York Air Brake Corporation: See--
Matusiak, Jr., Richard; and Horst, Folkert
08019496 Cl. 701-19.
New Zealand Insitiute for Plant and Food Research Limited, The: See--
Hall, Harvey K.; and Stephens, Joseph
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Sewell, Peter B.; and Luscombe-Mills, Richard J.
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Newfrey LLC: See--
Hain, Jochen; Lippert, Stefan; Pohl, Alexander; Moser, Joachim; and Ziegert, Thomas
08015686 Cl. 29-432.2.
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Paschen, Dean A.; Newhall, William G.; and Leifer, Mark C.
08018371 Cl. 342-90.
Newman, Linda; Happ, Venus; Happ, Jim; and Moulton, Tom, to Labcon, North America Container label
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Baraz, Benjamin; Nemirovsky, Edward; and Newman, Yona
08019278 Cl. 455-11.1.
Nexeon Ltd.: See--
Nexify, Inc.: See--
NeXolve Corporation: See--
Poe, Garrett; and Farmer, Brandon
08017698 Cl. 525-418.
Nextel Communications, Inc.: See--
Izdepski, Erich J.
08019271 Cl. 455-3.01.
Nexter Munitions: See--
Nezaki, Takuya; to Toyota Jidosha Kabushiki Kaisha Vehicle occupant restraint apparatus
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NFR Security Inc.: See--
Frantzen, Michael T.; and Yee, Andre
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Ng, John: See--
Balestriere, Giacomo; Woodman, III, Gilbert Rouse; and Ng, John
08019893 Cl. 709-246.
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Hawkins, Gilbert A.; Gao, Zhanjun; Xie, Yonglin; Furlani, Edward P.; and Ng, Kam C.
08016395 Cl. 347-74.
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Chan, Juliana C. N.; Ng, Maggie C. Y.; and So, Wing Yee
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NGK Insulators, Ltd.: See--
Tomita, Takahiro; Takahashi, Kaori; Morimoto, Kenji; and Noguchi, Yasushi
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NGK Spark Plug Co., Ltd.: See--
Sasanuma, Takeo; and Sato, Yoshikuni
08017080 Cl. 422-82.12.
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08016990 Cl. 204-428.
Nguyen, Corinne: See--
Gilbert, Ian; Nguyen, Corinne; Schipani, Alessandro; Kasinathan, Ganasan; Johansson, Nils-Gunnar; Pacanowska, Dolores Gonzalez; and Ruda, Gian Filippo
08017620 Cl. 514-269.
Nguyen, Cuong Duy Pedicure chair base with side glass panels and removable trim
D0644847 Cl. D6-336.
Nguyen, David: See--
Barth, Richard M.; Ware, Frederick A.; Stark, Donald C.; Hampel, Craig E.; Davis, Paul G.; Abhyankar, Abhijit M.; Gasbarre, James A.; and Nguyen, David
08019958 Cl. 711-167.
Nguyen, Hung O.: See--
Nguyen, Sang Thanh; Tran, Hieu Van; Nguyen, Hung O.; and Klotzkin, Phil
08020055 Cl. 714-718.
Nguyen, Hung Q.: See--
Tran, Hieu Van; Ly, Anh; Nguyen, Hung Q.; and Vu, Thuan T.
08018773 Cl. 365-185.2.
Nguyen, Huy T. Vertical windmill
08016544 Cl. 415-60.
Nguyen, Khiem K.: See--
Chandrachood, Madhavi R.; Grimbergen, Michael N.; Nguyen, Khiem K.; Lewington, Richard; Ibrahim, Ibrahim M.; Panayil, Sheeba J.; and Kumar, Ajay
08017029 Cl. 216-59.
Nguyen, Lamson; and Weller, Jeanne Marie, to Reckitt Benckiser Inc. Dispensing device
08015629 Cl. 4-227.1.
Nguyen, Lau: See--
Wu, Zining; Nguyen, Lau; Sutardja, Pantas; Lee, Chi-Kong; and Yoon, Tony
08019959 Cl. 711-171.
Nguyen, Le Trong: See--
Brashears, Cheryl Senter; Wang, Johannes; Nguyen, Le Trong; Lentz, Derek J.; Miyayama, Yoshiyuki; Garg, Sanjiv; Hagiwara, Yasuaki; Lau, Te-Li; Wang, Sze-Shun; and Trang, Quang H.
08019975 Cl. 712-225.
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08019857 Cl. 709-224.
Nguyen, Philip D.; to Halliburton Energy Services, Inc. Resin compositions and methods of using such resin compositions in subterranean applications
08017561 Cl. 507-221.
Nguyen, Sang Thanh; Tran, Hieu Van; Nguyen, Hung O.; and Klotzkin, Phil, to Silicon Storage Technology, Inc. Method and apparatus for testing the connectivity of a flash memory chip
08020055 Cl. 714-718.
Nguyen, Thao Thu: See--
Rosenberg, Stuart; Keel, Allen; Ryu, Kyungmoo; Hou, Wenbo; Noren, Kjell; Nguyen, Thao Thu; and Yang, Michael
08019409 Cl. 600-513.
Nguyen, The-Linh: See--
Daghighian, Henry M.; Nguyen, The-Linh; and Ekkizogloy, Luke M.
08019225 Cl. 398-135.
Nguyen, Uoc: See--
Mathieson, Rono; Schacht, Bryan K.; Chrisop, Roy; Richardson, Tanna; Plewnia, Bogdan; Sojian, Lena; Lum, Joey; Stevens, Mark; Nguyen, Uoc; and Yamamura, Shinichi
08018610 Cl. 358-1.15.
NHK Spring Co., Ltd.: See--
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio
08018242 Cl. 324-755.01.
Nice, Nir: See--
Shiran, Tomer; Bitan, Sara; Nice, Nir; de Borst, Jeroen; Field, Dave; and Herzog, Shai
08020197 Cl. 726-5.
Nicholas, George F.: See--
Moores, Nigel G.; and Nicholas, George F.
08016241 Cl. 244-171.7.
Nicholas, Michael: See--
Vardis, Nicholas; and Nicholas, Michael
D0644960 Cl. D12-92.
Nicholson, John: See--
Kerschner, Judith; Murphy, Gerald J.; and Nicholson, John
08017687 Cl. 524-731.
Nickel, Alexander: See--
Kawakami, Keiji; and Nickel, Alexander
08017870 Cl. 174-153G.
Nickell, Andrew: See--
Behm, James; Boston, Brian; Floyd, Thomas; Hernandez, Alejandro; Leitz, Richard; Moots, Craig; and Nickell, Andrew
08017841 Cl. 800-312.
Nicolas, Florence: See--
Constancis, Alain; Nicolas, Florence; Meyrueix, Rémi; and Soula, Olivier
08017156 Cl. 424-499.
Nicolette, Michael R.; Schweigert, Bradley D.; and Chen, Xiaojian, to Karsten Manufacturing Corporation Golf club head
D0645104 Cl. D21-759.
Nidec Corporation: See--
Teshima, Hiroyoshi; Takeshita, Kazumi; Konishi, Hideaki; Ida, Kiyoto; and Takaoka, Tsukasa
08016556 Cl. 415-206.
Yasumoto, Nobuaki; Takaki, Hitoshi; Yamada, Masahiro; and Kawano, Yosuke
08018107 Cl. 310-91.
Nidec Motor Corporation: See--
Lyle, David M.
08018115 Cl. 310-216.009.
Nidec Sankyo Corporation: See--
Nidek Co., Ltd.: See--
Kawai, Noriji; Miwa, Tetsuyuki; and Otake, Kunihiko
08016418 Cl. 351-205.
Matsuyama, Yoshinori
08015716 Cl. 33-200.
Nie, Kaibao; Atlas, Les; Rubinstein, Jay; Li, Xing; and Clark, Charles Pascal, to University of Washington Enhanced signal processing for cochlear implants
08019431 Cl. 607-57.
Nie, Xiaochun: See--
Tong, Xin; and Nie, Xiaochun
08018994 Cl. 375-240.
Niedecken, Timothy G.: See--
Stroman, Richard D.; Afimiwala, Khurshid A.; Gibb, James B.; Brink, Philip C.; Crain, Scott L.; and Niedecken, Timothy G.
08019633 Cl. 705-7.11.
Niedermeier, Christoph: See--
Dillinger, Markus; Niedermeier, Christoph; and Schmid, Reiner
08020061 Cl. 714-746.
Niegowski, James A.: See--
Berner, Jr., William E.; Shum, Albert; Case, Jr., Charles W.; Schrock, Allan M.; Niegowski, James A.; and Rauchholz, William F.
08015732 Cl. 36-136.
Niehorster, Keith; Udupi, Kishan Kumar; Kumble, Rajaram; and Roberts, Paul, to Meritor Heavy Vehicle Braking Systems (UK) Limited Disc brake operating mechanism
08016082 Cl. 188-72.9.
Nielsen, Arnold T.: See--
Norris, William P.; and Nielsen, Arnold T.
08017768 Cl. 540-554.
Nielsen Company (US), LLC, The: See--
Mears, Paul M.; and Ramaswamy, Arun
08020179 Cl. 725-9.
Zhang, Min; Wright, David Howell; Cooper, Scott; Dykstra, Regina; Ramaswamy, Arun; and Nelson, Daniel
08019162 Cl. 382-199.
Nielsen, Hanne Wulf: See--
Grarup, Jesper; and Nielsen, Hanne Wulf
08017627 Cl. 514-317.
Nielsen, Jorgen Duelund: See--
Kristensen, Martin Borchsenius; and Nielsen, Jorgen Duelund
08015854 Cl. 72-420.
Nielsen, Thomas Alan; to Google Inc. Systems and methods for indicating a user state in a social network
08019875 Cl. 709-227.
Niermeyer, J. Karl: See--
Brodeur, Craig L.; Laverdiere, Marc; McLoughlin, Robert F.; Niermeyer, J. Karl; and Shyu, Jieh-Hwa
08015995 Cl. 137-487.5.
Nieuw-Amerongen, Arie: See--
Mollenhauer, Jan; End, Caroline; Blaich, Stephanie; Bergmann, Gaby; Renner, Marcus; Lyer, Stefan; Wittig, Rainer; Poustka, Annemarie; Bikker, Floris; Ligtenberg, Antoon; Nieuw-Amerongen, Arie; and Veerman, Enno
08017124 Cl. 424-185.1.
Nifty Home Products, Inc.: See--
Nigam, Kamal P.: See--
Provos, Niels; Zhou, Yunkai; Bavor, Jr., Clayton W.; Davis, Eric L.; Palatucci, Mark; Nigam, Kamal P.; Monson, Christopher K.; Mavrommatis, Panayiotis; and Nakauchi, Rachel
08019700 Cl. 706-12.
Niheu, Eric K.; Blakey, Robert V.; Chiu, Sherwin S.; and Haynie, Roger, to Accenture Global Services Limited System and method of integrating enterprise applications
08019632 Cl. 705-7.11.
Nihon Dempa Kogyo Co., Ltd.: See--
Umeki, Mitoshi; Saito, Takefumi; and Ichikawa, Ryoichi
08018126 Cl. 310-344.
Nihon University: See--
Takao, Kyoichi; Hidai, Chiaki; Koike, Fumihiko; Takao, Tetsuya; and Suga, Hinako
08017334 Cl. 435-6.12.
Takao, Kyoichi; Ikeda, Minoru; and Onoda, Keiko
08017336 Cl. 435-6.12.
Nii, Koji: See--
Yabuuchi, Makoto; and Nii, Koji
08018785 Cl. 365-189.11.
Niigata University: See--
Toda, Kenji; Uematsu, Kazuyoshi; Sato, Mineo; Umeda, Tetsu; and Ito, Yutaka
08017039 Cl. 252-301.4P.
Niimi, Yasuhiko: See--
Fujita, Tatsuya; Niimi, Yasuhiko; Kotoh, Takashi; Mizuno, Hideaki; Watanabe, Nobuo; and Matsumoto, Tadaichi
08017276 Cl. 429-432.
Niina, Hiroshi; to Kabushiki Kaisha Toshiba System, method, and apparatus for searching information across distributed databases
08019778 Cl. 707-770.
NIKE, Inc.: See--
Berner, Jr., William E.; Shum, Albert; Case, Jr., Charles W.; Schrock, Allan M.; Niegowski, James A.; and Rauchholz, William F.
08015732 Cl. 36-136.
Hazenberg, Klaas Pieter
08015730 Cl. 36-29.
Stites, John Thomas
08016691 Cl. 473-290.
Nikitin, Vladimir: See--
Hsiao, Wen-Chien David; and Nikitin, Vladimir
08018679 Cl. 360-125.07.
Nikolaev, Igor; and Madrid, Susan Mampusti, to Danisco A/S Transcription factors
08017341 Cl. 435-6.15.
Nikolchev, Julian; to Biosensors International Group, Ltd. Guidewire-less stent delivery methods
08016869 Cl. 623-1.11.
Nikon Corporation: See--
Adachi, Hiroaki; and Kitano, Hiroshi
08016940 Cl. 117-8.
Morishita, Akihiko; Toyoda, Takafumi; and Ito, Daiki
08018503 Cl. 348-231.6.
Yamamoto, Hajime; Isogami, Tohru; Suzuki, Kazuaki; and Hirayanagi, Noriyuki
08018577 Cl. 355-67.
Nilsen, Martin J.; to Illinois Tool Works Inc. Fastener assembly and manufacturing method therefor
08016534 Cl. 411-360.
Nilsson, David: See--
Tehrani, Payman; Robertsson, Mats; Nilsson, David; Larsson, Oscar; Robinson, Nathaniel D.; and Groppfeldt, Rune
08018347 Cl. 340-588.
Nimri, Alain: See--
Shao, Junqing; and Nimri, Alain
08018481 Cl. 348-14.01.
Ningbo Changsheng Electric Appliances Co., Ltd.: See--
Ninomiya, Masanobu: See--
Takemasa, Kenji; Fuse, Toshihiko; Kudari, Mitsuru; and Ninomiya, Masanobu
08016264 Cl. 251-208.
Nintendo Co., Ltd.: See--
Yamamoto, Masao; and Kawanobe, Naoya
08016671 Cl. 463-30.
Yoshino, Hiroshi; Ohta, Keizo; Yasumoto, Yoshitaka; Nishida, Kenji; Sugino, Kenichi; Ibuki, Masato; Murakawa, Teruki; and Yamamoto, Soichi
08016681 Cl. 463-43.
Nippon Kayaku Kabushiki Kaisha: See--
Sudo, Atsushi; Kurakami, Tatsuhiko; Kojima, Toshitake; Hayashimoto, Shigeo; and Kobayashi, Yasushi
08017547 Cl. 502-318.
Nippon Light Metal Company, Ltd.: See--
Zhao, Pizhi; Anami, Toshiya; Kobayashi, Takayuki; and Tsuchiya, Kiyomi
08016958 Cl. 148-440.
Nippon Oil Corporation: See--
Ikeda, Satoru; and Uesaka, Tetsuya
08018552 Cl. 349-75.
Yanagawa, Shinichirou; Kondo, Hidesato; and Hara, Michikazu
08017724 Cl. 528-481.
Nippon Sheet Glass Company, Limited: See--
Seto, Hiromitsu; Koyama, Akihiro; and Nagashima, Yukihito
08017537 Cl. 501-71.
Nippon Shokubai Co., Ltd.: See--
Shima, Masahide; Sento, Tadashi; Mikawa, Masatsugu; and Hirota, Hiroyuki
08017546 Cl. 502-243.
Nippon Steel Corporation: See--
Arai, Satoshi; Hamamura, Hideyuki; Sakai, Tatsuhiko; Sato, Kaoru; and Kobayashi, Hideyuki
08016951 Cl. 148-308.
Yamasaki, Shingo; Hirakami, Daisuke; Tarui, Toshimi; and Nishida, Seiki
08016953 Cl. 148-328.
Nippon Telegraph and Telephone Corporation: See--
Mitasaki, Tokinobu; Senda, Masakatsu; Ueno, Masahiro; and Tanabe, Takaya
08018636 Cl. 359-2.
Nishi, Yuji; and Takemoto, Takeshi, to Toyota Jidosha Kabushiki Kaisha Control system of secondary battery and hybrid vehicle equipped with the same
08018203 Cl. 320-136.
Nishibori, Shin: See--
Andre, Bartley K.; Coster, Daniel J.; De Iuliis, Daniele; Howarth, Richard P.; Ive, Jonathan P.; Jobs, Steve; Kerr, Duncan Robert; Nishibori, Shin; Rohrbach, Matthew Dean; Satzger, Douglas B.; Seid, deceased, Calvin Q.; Stringer, Christopher J.; Whang, Eugene Antony; and Zorkendorfer, Rico
D0645037 Cl. D14-341.
Nishida, Hiroto: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu
08020178 Cl. 720-662.
Nishida, Junji; to Ricoh Company, Ltd. Switching regulator
08018207 Cl. 323-222.
Nishida, Kazuhiro: See--
Mizutani, Hiroyuki; Nishida, Kazuhiro; Tsuru, Masaomi; Kawakami, Kenji; Hieda, Morishige; and Miyazaki, Moriyasu
08018290 Cl. 331-60.
Nishida, Kenji: See--
Yoshino, Hiroshi; Ohta, Keizo; Yasumoto, Yoshitaka; Nishida, Kenji; Sugino, Kenichi; Ibuki, Masato; Murakawa, Teruki; and Yamamoto, Soichi
08016681 Cl. 463-43.
Nishida, Seiki: See--
Yamasaki, Shingo; Hirakami, Daisuke; Tarui, Toshimi; and Nishida, Seiki
08016953 Cl. 148-328.
Nishida, Shinichi; Yokoyama, Katsunori; Shimizu, Yasushi; Hagiwara, Kazunari; Sakaizawa, Katsuhiro; Endo, Rie; and Kichijima, Naoto, to Canon Kabushiki Kaisha Developing apparatus
08019258 Cl. 399-274.
Nishide, Hiroyuki: See--
Endo, Hiroko; Nishide, Hiroyuki; Sonai, Atsuo; Tago, Takahiro; and Okayasu, Teruyuki
08017659 Cl. 521-25.
Nishide, Shuichi: See--
Sato, Masahiro; and Nishide, Shuichi
08019262 Cl. 399-302.
Nishihara, Tokihiro: See--
Ueda, Masanori; Iwaki, Masafumi; Nishihara, Tokihiro; Taniguchi, Shinji; Endo, Go; and Ebata, Yasuo
08018298 Cl. 333-133.
Nishijima, Eiichi: See--
Nawata, Teruhiko; Yasumura, Ken; Yanagi, Hiroyuki; and Nishijima, Eiichi
08016942 Cl. 117-30.
Nishikawa, Kazuhiko: See--
Bokui, Takahiro; and Nishikawa, Kazuhiko
08019565 Cl. 702-107.
Nishikori, Hitoshi: See--
Iwasaki, Osamu; Takahashi, Kiichiro; Nishikori, Hitoshi; Otsuka, Naoji; Teshigawara, Minoru; Edamura, Tetsuya; Nakagawa, Yoshinori; and Seki, Satoshi
08016386 Cl. 347-43.
Nishimine, Hiroaki: See--
Ohtani, Bunsho; Abe, Ryu; Sakatani, Yoshiaki; Murata, Makoto; and Nishimine, Hiroaki
08017238 Cl. 428-403.
Nishimuda, Keiichi; to Renesas Electronics Corporation Semiconductor integrated circuit with multi-cut via and automated layout method for the same
08020133 Cl. 716-122.
Nishimura, Akito: See--
Takaoka, Atsushi; Nishimura, Akito; and Hayashi, Yukio
08016491 Cl. 385-60.
Nishimura, Shunsuke: See--
Fujii, Takayuki; Yamauchi, Manabu; Watanabe, Naoto; Nishimura, Shunsuke; Oka, Yushi; Miyake, Toshiyuki; and Yokoya, Takashi
08019270 Cl. 399-408.
Nishimura, Yasuharu; Nakatsura, Tetsuya; and Ikuta, Yoshiaki, to Kumamoto University Diagnostic kit for malignant melanoma
08017345 Cl. 435-7.1.
Nishimura, Yoshiko; to Kyocera Mita Corporation Image forming device storing print data corresponding to threshold value
08018608 Cl. 358-1.14.
Nishino, Hajime: See--
Fujikawa, Masato; Kasamatsu, Shinji; Nishino, Hajime; Takezawa, Hideharu; and Shimada, Mikinari
08017262 Cl. 429-144.
Nishino, Seiji: See--
Shiono, Teruhiro; Nishino, Seiji; and Itoh, Tatsuo
08018801 Cl. 369-44.23.
Nishino, Yuuki: See--
Okamura, Daiji; Takuhara, Hiroyuki; Nishino, Yuuki; Sanada, Mikio; Moribe, Kenji; and Kudo, Satoshi
08016932 Cl. 106-31.89.
Nishioka, Yoshihiro: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji
08017615 Cl. 514-253.07.
Nishitani, Hikaru: See--
Fukui, Yusuke; Tsujita, Takuji; Hashimoto, Jun; Nishitani, Hikaru; Terauchi, Masaharu; and Nishitani, Mikihiko
08018154 Cl. 313-582.
Nishitani, Mikihiko: See--
Fukui, Yusuke; Tsujita, Takuji; Hashimoto, Jun; Nishitani, Hikaru; Terauchi, Masaharu; and Nishitani, Mikihiko
08018154 Cl. 313-582.
Nishiyama, Koji: See--
Hamada, Tetsuya; and Nishiyama, Koji
08015985 Cl. 134-99.1.
Nishiyama, Toshihiko; and Iijima, Koji, to Komatsu Ltd. Exhaust gas purification device for internal combustion engine
08015802 Cl. 60-286.
Nishizaki, Masahiro: See--
Kato, Masahito; and Nishizaki, Masahiro
08016404 Cl. 347-96.
Nishizawa, Hirotaka; Yukawa, Yosuke; and Totsuka, Takashi, to Renesas Electronics Corporation IC card with terminals for direct access to internal components
08018038 Cl. 257-679.
Nissan Motor Co., Ltd.: See--
Murayama, Masami; and Iriyama, Masahiro
08016723 Cl. 477-110.
Nissha Printing Co., Ltd.: See--
Omote, Ryoumei; and Takagi, Takayuki
08018645 Cl. 359-320.
Nisshin Steel Co., Ltd.: See--
Sasaki, Hirokazu; Nakamura, Naofumi; Morikawa, Shigeru; Hashimoto, Hideto; Kimura, Takaaki; and Kawai, Yoshihiko
08015851 Cl. 72-347.
Nissin Ion Equipment Co., Ltd.: See--
Matsumoto, Takao; and Nagai, Nobuo
08017922 Cl. 250-492.21.
Nissl, Florian Dieter; to Bayerische Motoren Werke Aktiengesellschaft Wheel or wheel cover
D0644976 Cl. D12-209.
Nito, Yasuhiro: See--
Hakamada, Shinichi; Imai, Takashi; Sanada, Mikio; Nito, Yasuhiro; Iwata, Tetsu; and Sugama, Sadayuki
08016406 Cl. 347-100.
Nitto Denko Corporation: See--
Honjo, Mitsuru; and Kamei, Katsutoshi
08017874 Cl. 174-255.
Ito, Hisataka; Ota, Shinya; Fuke, Kazuhiro; and Uenishi, Shinjiro
08017670 Cl. 523-400.
Kanagawa, Hitoki; Ohsawa, Tetsuya; and Ooyabu, Yasunari
08015703 Cl. 29-842.
Kuriu, Atsushi; Itou, Takio; Ukei, Hiroichi; and Matsunaga, Manabu
08017533 Cl. 442-221.
Naito, Toshiki; Ohsawa, Tetsuya; and Kataoka, Kouji
08017871 Cl. 174-250.
Nakazono, Takuya; Umemoto, Seiji; and Shimanoe, Fumihito
08016965 Cl. 156-64.
Niu, Nolen P.; to Skyline Beauty & Spa Products, Inc. Pedicure spa platform
D0645155 Cl. D24-204.
Niwa, Masakazu: See--
Iwashita, Yasusuke; Okita, Tadashi; Niwa, Masakazu; and Yamamoto, Kenta
08018747 Cl. 363-89.
Niwa, Yoshikatsu: See--
Takase, Tsunemitsu; Niwa, Yoshikatsu; Masunaga, Shinya; Takemura, Tomoaki; and Otani, Junichi
08019202 Cl. 386-350.
Niwas, Shri: See--
Merrill, Bryon A.; Haraldson, Chad A.; Kshirsagar, Tushar A.; and Niwas, Shri
08017779 Cl. 546-82.
Noack, Bernd R.: See--
Bertolotti, Fabio R.; Liscinsky, David S.; Nardone, Vincent C.; Sabatino, Daniel R.; Sahm, Michael K.; and Noack, Bernd R.
08015827 Cl. 60-785.
Nobel Biocare Services AG: See--
Nobels, Jonathan; to Research in Motion Limited Device and method for inserting captured image data into a document
08018518 Cl. 348-333.02.
Nobori, Kunio: See--
Azuma, Takeo; Nobori, Kunio; Motomura, Hideto; and Hirose, Yoshifumi
08018500 Cl. 348-222.1.
Noda, Masahide; and Okuyama, Satoshi, to Fujitsu Limited Telephone conversation resumption system, telephone conversation resumption program, telephone conversation resumption method, portable terminal and relay apparatus
08019349 Cl. 455-445.
Noe, Daniel: See--
Buckles, John; Noe, Daniel; Butz, Gregory; Besselle, Shereen; Harter, Adam; and Jafa, Emad
D0644859 Cl. D6-491.
Noel, Thomas Olivier Marie: See--
Cazalens, Michel Pierre; and Noel, Thomas Olivier Marie
08015813 Cl. 60-737.
Noguchi, Eri: See--
Marumoto, Yoshitomo; Yamaguchi, Hiromitsu; Tsuboi, Hitoshi; Jahana, Ryoki; Uji, Ayako; and Noguchi, Eri
08018621 Cl. 358-1.9.
Noguchi, Kouichi; Matsumura, Kazuyuki; Mitsunaga, Takesi; and Kanegasaki, Shiro, to Hirata Corporation Solution temperature control device in cell observation chamber
08017383 Cl. 435-288.7.
Noguchi, Toru: See--
Abe, Hiroyuki; Tanaka, Masahiro; Sugimoto, Kazuyuki; Suma, Akira; Yokota, Masahiro; Shiozaki, Makoto; Iio, Kiyosei; Ueyama, Kazuhito; Motoda, Dai; Noguchi, Toru; Adachi, Tsuyoshi; Tsuruha, Junichiro; and Doi, Satoki
08017612 Cl. 514-252.12.
Noguchi, Yasushi: See--
Tomita, Takahiro; Takahashi, Kaori; Morimoto, Kenji; and Noguchi, Yasushi
08017214 Cl. 428-116.
Noguchi, Yuji: See--
Adachi, Eiji; Kato, Yuichi; Soeno, Daisuke; Noguchi, Yuji; Fuse, Tomohiro; and Hayashi, Kazuhito
08016307 Cl. 280-152.1.
Noh, Hyung-Gon; to Samsung SDI Co., Ltd. Electrode for a fuel cell, and a membrane-electrode assembly and fuel cell system comprising the same
08017284 Cl. 429-532.
Noh, Sok Won; Kim, Mu Hyun; Kim, Sun Hoe; Song, Myung Won; Seong, Jin Wook; Lee, Seong Taek; and Lee, Sang Bong, to Samsung Mobile Display Co., Ltd. Laser induced thermal imaging apparatus and laser induced thermal imaging method and organic light emitting display device using the same
08017295 Cl. 430-200.
Noh, Yo-Hwan; to Mtekvision Co., Ltd. Image processing method and device using different clock rates for preview and capture modes
08018499 Cl. 348-222.1.
Noh, Yu Jin: See--
Lee, Dae Won; Kim, Ki Jun; Roh, Dong Wook; Noh, Yu Jin; Ahn, Joon Kui; and Lee, Jung Hoon
08019332 Cl. 455-422.1.
Nokia Corporation: See--
Frederiksen, Frank; and Kolding, Troels Emil
RE042692 Cl. 370-335.
Grigoriev, Nikolai; Thorkelsson, Haraldur; and Regnier, Jean
08019055 Cl. 379-88.17.
Hämäläinen, Jyri; and Tiirola, Esa
08018904 Cl. 370-334.
Ignatius, Jan; and Kokkonen, Petri
08019361 Cl. 455-456.5.
Koskela, Jarkko T.; and Sebire, Benoist P.
08019334 Cl. 455-423.
Kossi, Jouni; and Virtanen, Martti E.
08019383 Cl. 455-553.1.
Ojanen, Martti; and Virta, Hannu
08019294 Cl. 455-127.1.
Sipila, Juha P.; and Gustafsson, Sture
08019374 Cl. 455-522.
Trevelyan, Philip; Ivanov, Angel; Kirilov, Emil; and Vasilev, Ivan
08018525 Cl. 348-371.
Nokia Siemens Networks GmbH & Co. KG: See--
Falk, Rainer; Luo, Jijun; Mohyeldin, Eiman Bushra; and Schulz, Egon
08019341 Cl. 455-434.
Nold, III, Raymond V.; Zazovsky, Alexander F.; Landsiedel, Nathan; Ellson, Nicholas; and Vaynshteyn, Vladimir, to Schlumberger Technology Corporation Methods and apparatus to perform pressure testing of geological formations
08015869 Cl. 73-152.51.
Noldus, Rogier August; to Telefonaktiebolaget L M Ericsson (Publ) Charging of a short message transmission
08019319 Cl. 455-406.
Noller, Thomas; to Eisenmann Anlagenbau GmbH & Co. KG Electrodipping device
08016994 Cl. 204-623.
Nollet, Vincent; Coene, Paul; Marescaux, Theodore; Avasare, Prabhat; Mignolet, Jean-Yves; Vernalde, Serge; and Verkest, Diederik, to Interuniversitair Microelektronica Centrum (IMEC) Heterogeneous multiprocessor network on chip devices, methods and operating systems for control thereof
08020163 Cl. 718-104.
Nomoto, Akhiro; to Sony Corporation Method for manufacturing semiconductor device
08017431 Cl. 438-99.
Nomura, Akihiko; to Oki Semiconductor Co., Ltd. Sensor device and method for fabricating sensor device
08015875 Cl. 73-514.33.
Nomura, Hiroshi; and Kakiuchi, Shinichi, to Hoya Corporation Optical axis correction apparatus of an imaging device, and optical axis correction method for an imaging device
08019209 Cl. 396-55.
Nomura, Katsuyoshi: See--
Shimada, Tatsuya; Takada, Tooru; Tomikawa, Jun; Kageyama, Dan; Sasaki, Yuri; and Nomura, Katsuyoshi
08015638 Cl. 5-611.
Nomura, Kazukiyo: See--
Horikoshi, Takahiro; Nomura, Kazukiyo; Kawamoto, Naoshi; and Tobita, Etsuo
08017678 Cl. 524-168.
Nomura, Ryoji: See--
Yamazaki, Shunpei; Nomura, Ryoji; Seo, Satoshi; Abe, Hiroko; and Nakamura, Yasuo
08018152 Cl. 313-509.
Nonaka, Isao: See--
Tsukahara, Koju; Ozawa, Shigeyuki; and Nonaka, Isao
08016989 Cl. 204-428.
Nonami, Hideaki: See--
Arai, Mitsuru; Wada, Shinichiro; and Nonami, Hideaki
08018006 Cl. 257-374.
Nonomura, Itaru: See--
Hotta, Yoshihiko; Saito, Seiichi; Hamasaki, Hiroyuki; Hara, Hirotaka; and Nonomura, Itaru
08018784 Cl. 365-189.05.
Nord, Richard J.: See--
Low, Steven C.; Clark, Jerry G.; Muylaert, Neal W; Nord, Richard J.; Thompson, Blair E.; Ake, Bryan E.; and Williams, Reid W.
08017070 Cl. 419-26.
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Wilson, Jody W.; Nordlund, Raymond Scott; and Weaver, Adam
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Nordson Corporation: See--
Noren, Kjell: See--
Rosenberg, Stuart; Keel, Allen; Ryu, Kyungmoo; Hou, Wenbo; Noren, Kjell; Nguyen, Thao Thu; and Yang, Michael
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Norimatsu, Takeshi: See--
Takagi, Yoshiaki; Chong, Kok Seng; Norimatsu, Takeshi; Miyasaka, Shuji; Kawamura, Akihisa; Ono, Kojiro; and Ishikawa, Tomokazu
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Bloksberg, Leonard N.; Frost, Michael J.; Forster, Richard; Higgins, Colleen; Rottmann, William H.; and Norris-Caneda, Kim
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Norsworthy, Steven R.; and Redgrave, Jason Rupert, to STMicroelectronics NV Noise shaped interpolator and decimator apparatus and method
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Nortel Networks Limited: See--
Ellis, Donald Russell; and Charbonneau, Martin
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Tenneti, Surya; Nesargi, Sanket; and Li, Jun
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North American Rescue, LLC: See--
McKay, Sean; O'Neal, David E.; and Dobbins, Arthur L.
08015619 Cl. 2-69.
Northern Technologies International Corporation: See--
Lyublinski, Efim Ya; and Kubik, Donald A.
08017203 Cl. 428-34.1.
Northrop Grumman Systems Corporation: See--
Ewing, Kenneth James; Whiton, Jr., Fred; Kahl, Jr., Paul George; and Santori, John Paul
08019466 Cl. 700-225.
Jones, Gregory O.; and Campbell, Michael E.
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Rice, Robert Rex; and Folkman, Mark Alan
08018647 Cl. 359-334.
Veliadis, John Victor D.; and Snook, Megan J.
08018022 Cl. 257-491.
Northwest University: See--
Zheng, Xiaohui; Zhang, Qunzheng; Wang, Shixiang; and Zhao, Xinfeng
08017786 Cl. 546-318.
Northwestern University: See--
Chiesl, Thomas N.; and Barron, Annelise E.
08017682 Cl. 524-555.
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Saha, Arup; and Olson, Gregory B.
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Silverstein, Barry D.; Bietry, Joseph R.; Metzger, Robert; Nothhard, Gary E.; and Corey, Richard P.
08016422 Cl. 353-20.
Notomi, Tsugunori; and Nagamine, Kentaro, to Eiken Kagaku Kabushiki Kaisha Method of amplifying nucleic acid by using double-stranded nucleic acid as template
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Nottingham Spirk: See--
Saunders, Craig; Kalman, Jeffrey; and Spirk, Evan
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Novack, Edward: See--
Kunkle, Jonathan; and Novack, Edward
08018735 Cl. 361-801.
Novak, Carol L.: See--
Odry, Benjamin; Kiraly, Atilla Peter; and Novak, Carol L.
08019140 Cl. 382-131.
Novak, Julia E.; Presnell, Scott R.; Sprecher, Cindy A.; Foster, Donald C.; Holly, Richard D.; Gross, Jane A.; Johnston, Janet V.; Nelson, Andrew J.; Dillon, Stacey R.; and Hammond, Angela K., to ZymoGenetics, Inc. Cytokine zalpha11 ligand antibodies and methods of use
08017343 Cl. 435-7.1.
Novak, Petr: See--
Hennige, Volker; Hying, Christian; Hoerpel, Gerhard; Novak, Petr; and Vetter, Jens
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Novakovic, Zoran: See--
Smith, Alan; Eppstein, Jonathan A.; Messier, Bernadette; Novakovic, Zoran; and McRae, Stuart
08016811 Cl. 604-501.
Novartis AG: See--
Bloomfield, Graham Charles; Bruce, Ian; Leblanc, Catherine; Oza, Mrinalini Sachin; Whithead, Lewis; Cuenoud, Bernard; Keller, Thomas Hugo; Kirman, Louise; McCarthy, Clive; and Woodward, Gaynor Elizabeth
08017608 Cl. 514-235.8.
Buchdunger, Elisabeth; and Fabbro, Doriano
08017621 Cl. 514-275.
Novartis Forschungesstiftung Zweigniederlassung Friedrich Miescher Institute for Biomedical Research: See--
Chiquet-Ehrismann, Ruth; and Orend, Gertraud
08017725 Cl. 530-300.
Novatek Microelectronics Corp.: See--
Chen, Ke-Horng; Chiu, Chia-Lin; and Cheng, Lan-Shan
08018170 Cl. 315-192.
Tsao, Wen-Yuan; Lin, Che-Li; and Yuan, Chi-Ming
08018418 Cl. 345-98.
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Brewer, Alberto; Wilber, Clint; Conklin, Todd; and Hertlein, Robert
08018734 Cl. 361-800.
Novell, Inc.: See--
Kumar, Chendil; and Jothimani, Premkumar
08020203 Cl. 726-15.
Novellus Systems, Inc.: See--
Dhas, Arul N.; Li, Ming; and Laird, Joseph Bradley
08017527 Cl. 438-778.
Wu, Hui-Jung; Juliano, Daniel R.; Wu, Wen; and Dixit, Girish
08017523 Cl. 438-687.
Novem Car Interior Design GmbH: See--
Egerer, Gerhard; Wagner, Michael; and Abach, Andreas
08016465 Cl. 362-489.
Novoa, Manuel: See--
Rios, Jennifer E.; Wang, Lan; Ali, Valluddin Y.; and Novoa, Manuel
08019994 Cl. 713-168.
Novocure Ltd.: See--
Novozymes A/S: See--
Andersen, Kim Vilbour; Schulein, deceased, Martin; Christiansen, Lars; Damgaard, Bo; and Von der Osten, Claus
08017372 Cl. 435-209.
Svendesn, Allan; and Beier, Lars
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Svendsen, Allan; and Gregory, Peter Collin
08017351 Cl. 435-22.
Novus Scientific Pte. Ltd.: See--
Magnusson, Henrik; and Mathisen, Torbjörn
08016841 Cl. 606-151.
Nowak, Edward J.: See--
Appenzeller, Joerg; Kleinosowski, AJ; Nowak, Edward J.; and Williams, Richard Q.
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Nowinski, Wieslaw L.; and Beauchamp, Norman J., to Agency for Science, Technology and Research Superimposing brain atlas images and brain images with delineation of infarct and penumbra for stroke diagnosis
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Nowlin, Brett: See--
Weiser, Michael F.; Mamo, George; Chu, Michael S. H.; and Nowlin, Brett
08016741 Cl. 600-30.
Noxilizer, Inc.: See--
Arnold, Ernst V.; Doletski, Blaine G.; Dunn, Thomas M.; Raulli, Robert E.; Mueller, Edward P.; Benedek, Karen R.; and Murville, Marie-Louise
08017074 Cl. 422-33.
Noyes, Ying Xie: See--
Li, Jingqiang; Noyes, Ying Xie; and Qi, Yingyong
08019179 Cl. 382-294.
Nozaki, Tatsuya: See--
Imai, Kengo; Sekine, Toshinari; Nozaki, Tatsuya; and Kabasawa, Kazuhiro
08016479 Cl. 366-314.
NSK Ltd.: See--
Hosoya, Masachi; Yamaguchi, Toshiaki; Saitou, Tsuyoshi; Itou, Hiroyuki; Tomizuka, Yasushi; and Yamamoto, Toyohisa
08016490 Cl. 384-531.
NTN Corporation: See--
Murata, Itsuo; Soeda, Masaya; Hori, Masaharu; and Toda, Masaaki
08016488 Cl. 384-107.
Takahashi, Toru; and Ishikawa, Tomomi
08018237 Cl. 324-661.
NTT Docomo, Inc.: See--
Higuchi, Kenichi; Sawahashi, Mamoru; and Atarashi, Hiroyuki
08018896 Cl. 370-329.
Inoue, Masahiro; Okajima, Ichiro; and Umeda, Narumi
08018915 Cl. 370-349.
Kobayashi, Motonari; and Suzuki, Toshihiro
08019372 Cl. 455-519.
Ofuji, Yoshiaki; Higuchi, Kenichi; and Sawahashi, Mamoru
08018898 Cl. 370-329.
Yamada, Takefumi; Suda, Hirohito; and Tomisato, Shigeru
08019013 Cl. 375-267.
Nu Inc.: See--
Nuance Communications, Inc.: See--
Agapi, Ciprian; Blass, Oscar J.; Patel, Paritosh D.; and Vila, Roberto
08019605 Cl. 704-260.
Bareis, Bernard F.; Foster, Peter J.; and Schalk, Thomas B.
08019387 Cl. 455-563.
Creamer, Thomas E.; Moore, Victor S.; Nusbickel, Wendi L.; Dos Santos, Ricardo; and Sliwa, James J.
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Nucor Corporation: See--
Blejde, Walter N.; Mahapatra, Rama Ballav; and Strezov, Lazar
08016021 Cl. 164-480.
Nugent, Benjamin M.: See--
Loso, Michael R.; Nugent, Benjamin M.; Zhu, Yuanming; Rogers, Richard B.; Huang, Jim X.; Renga, James M.; Whiteker, Gregory T.; Breaux, Nneka T.; and Daeuble, John F.
08017788 Cl. 548-200.
Nuintek Co., Ltd.: See--
Yang, Chang Hoon; Park, Dae Jin; and Jun, Yong Won
08018712 Cl. 361-328.
Numata, Hajime; to Sony Corporation Image input processing apparatus and method
08018509 Cl. 348-276.
Numata, Michio; to Fujitsu Limited Power-on self test program management apparatus and its management method and program
08020048 Cl. 714-54.
Number 14 B.V.: See--
Eschauzier, Rudy G. H.; and van Rijn, Nico
08018275 Cl. 330-9.
Nunan, John G.: See--
Southward, Barry W. L.; and Nunan, John G.
08017097 Cl. 423-213.2.
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08016199 Cl. 235-462.42.
Nusbickel, Wendi L.: See--
Creamer, Thomas E.; Moore, Victor S.; Nusbickel, Wendi L.; Dos Santos, Ricardo; and Sliwa, James J.
08019607 Cl. 704-270.1.
Nuttall, Jr., Gordon R.; and Aas, Eric F., to Hewlett-Packard Development Company, L.P. Scanner power management system and method
08018607 Cl. 358-1.14.
NuVasive, Inc.: See--
Miles, Patrick; Martinelli, Scot; and Finley, Eric
08016767 Cl. 600-554.
Nuzman, Carl J.; de Lind van Wijngaarden, Adriaan J.; Whiting, Philip A.; Maes, Jochen J. M.; Kramer, Gerhard G. T.; Chow, Hungkei; and Ashikhmin, Alexei E., to Alcatel Lucent Device and associated method for crosstalk estimation
08018868 Cl. 370-252.
NVIDIA Corporation: See--
Han, Gang; and Leroy, Lieven P.
08020150 Cl. 717-124.
Scheuermann, W. James
08018463 Cl. 345-502.
Shebanow, Michael C.; Keller, Robert C.; and Silkebakken, Richard A.
08019978 Cl. 712-228.
Singh, Inderjit; Marks, Howard Lee; and Greco, Joseph David
08017520 Cl. 438-666.
Solanki, Gopal; and Dawallu, Kioumars Kevin
08018467 Cl. 345-582.
NXP B.V.: See--
Van Beek, Jozef Thomas Martinus; and Steeneken, Peter Gerard
08018307 Cl. 335-78.
van der Tuijn, Roland
08018960 Cl. 370-412.
Nycomed Danmark APS: See--
Grarup, Jesper; and Nielsen, Hanne Wulf
08017627 Cl. 514-317.
Nycomed GmbH: See--
Kley, Hans-Peter; Hanauer, Guido; Hauser, Daniela; Schmidt, Beate; Bredenbroeker, Dirk; Wurst, Wilhelm; and Kemkowski, Joerg
08017633 Cl. 514-352.
Nycz, Jeffrey H.: See--
Donofrio, William T.; Nycz, Jeffrey H.; Tethrake, Steven; and Olson, Jr., Stanley Warren
08016859 Cl. 606-246.
Nygaard, Jr., Richard A.; Saponas, Robert; Schulze, William C.; and Wallace, Hugh S. Conely, to Agilent Technologies, Inc. System and method for adjusting a serial communications link
08018989 Cl. 375-224.
Nyrt, Allami Nyomda: See--
Bolotin, Boris Markovich; Birgen, Yevgeniy Alexeyevich; Kukushkina, Maria Leonardovna; and Yakovleva, Yelena Viktorovna
08017769 Cl. 544-194.