LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 13th DAY OF September, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N.V. Organon: See--
Karstens, Willem Frederik Johan; and Timmers, Cornelis Marius 08017782 Cl. 546-173.
Na, Jung Chan: See--
Chang, Beom Hwan; Jeong, Chi Yoon; Sohn, Seon Gyoung; Lee, Soo Hyung; Bang, Hyo Chan; Kim, Geon Lyang; Kim, Hyun Joo; Park, Won Joo; Ryu, Jong Ho; Kim, Jong Hyun; Na, Jung Chan; Jang, Jong Soo; and Sohn, Sung Won 08019865 Cl. 709-224.
Na, Kun: See--
Shin, Kyong-Min; Lee, Dong-ki; Lee, Don-haeng; Na, Kun; and Jo, Eun-ae 08017143 Cl. 424-426.
Na, Kyu-Tae: See--
Kim, Ju-Wan; Na, Kyu-Tae; Kim, Min; Park, Seung-Bae; Kim, Il-Woo; and Kwak, Dae-Young 08017495 Cl. 438-427.
Na, Shuo: See--
Allemand, Pierre-Marc; Dai, Haixia; Na, Shuo; Pakbaz, Hash; Pschenitzka, Florian; Quan, Xina; Sepa, Jelena; Spaid, Michael A.; and Wolk, Jeffrey 08018568 Cl. 349-187.
Na, Yoo Sam: See--
Kim, Moon Sun; and Na, Yoo Sam 08018285 Cl. 330-284.
Nabar, Rohit U.: See--
Lee, Jungwon; Zhang, Hongyuan; and Nabar, Rohit U. 08019016 Cl. 375-299.
Nabel, Gary J.; Sullivan, Nancy J.; Geisbert, Thomas W.; and Jahrling, Peter B., to United States of America as represented by the Department of Health and Human Services, The Method of accelerated vaccination against Ebola viruses 08017130 Cl. 424-199.1.
Nachenberg, Carey S.; to Symantec Corporation Deriving reputation scores for web sites that accept personally identifiable information 08019689 Cl. 705-64.
Nadreau, Michael; Yvin, Jean-Claude; and Le Moine, Patrick, to Egg-Chick Automated Technologies System and method for automatically determining the sex of chicks and device for conveying living animals 08019125 Cl. 382-110.
Nagadome, Ryuji: See--
Korenaga, Tetsuo; and Nagadome, Ryuji 08016974 Cl. 156-345.31.
Nagahama, Hiroyuki: See--
Endo, Takayuki; and Nagahama, Hiroyuki 08019308 Cl. 455-307.
Nagahashi, Kouji: See--
Yamaguchi, Tomohiro; Tanaka, Junpei; Otsuzuki, Shiro; Tohi, Yasushi; Nagahashi, Kouji; Yamahira, Nobukazu; Ikenaga, Shigenobu; Moorthi, Sunil Krzysztof; and Kamio, Kazunori 08017705 Cl. 526-160.
Nagai, Hiroshi: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou 08018538 Cl. 349-38.
Nagai, Hiroshi; to NEC LCD Technologies, Ltd Liquid crystal display device having a biaxial first anisotropic film and a second anisotropic film having an optical axis in a thickness direction 08018556 Cl. 349-118.
Nagai, Kazukiyo; and Horiuchi, Tamotsu, to Ricoh Company Limited Tetrahydroxy compound, method for preparing the tetrahydroxy compound, and photoreceptor using the tetrahydroxy compound 08017807 Cl. 564-443.
Nagai, Masao: See--
Llewellyn, David; Kanayama, Tetsuya; and Nagai, Masao 08016694 Cl. 473-334.
Nagai, Nobuo: See--
Matsumoto, Takao; and Nagai, Nobuo 08017922 Cl. 250-492.21.
Nagai, Shoji: See--
Ishibashi, Yoshihito; Odaka, Kentaro; Nagai, Shoji; and Kubono, Fumio 08018426 Cl. 345-102.
Nagai, Takayuki: See--
Morimura, Tomohiro; Nagai, Takayuki; Sugauchi, Kiminori; Kuroda, Takaki; and Arato, Yoshihiro 08020045 Cl. 714-26.
Nagaishi, Michihiro: See--
Karaki, Isuke; Inoguchi, Makoto; and Nagaishi, Michihiro 08019224 Cl. 398-115.
Nagamine, Kentaro: See--
Notomi, Tsugunori; and Nagamine, Kentaro 08017357 Cl. 435-91.2.
Nagano, Hajime; to Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device and method of fabricating the same 08017990 Cl. 257-316.
Nagao, Manabu: See--
Momosaki, Kohei; Uehara, Tatsuya; Imoto, Kazunori; Masai, Yasuyuki; Abe, Kazuhiko; Nagao, Manabu; and Sasajima, Munehiko 08019163 Cl. 382-212.
Nagao, Ritsuko: See--
Sakakura, Masayuki; Nagao, Ritsuko; Osame, Mitsuaki; Anazai, Aya; Yamazaki, Yu; and Tanada, Yoshifumi 08018403 Cl. 345-76.
Nagaoka, Eiichi; and Sakamoto, Keiji, to Panasonic Corporation Lens barrel, image pickup device, lens barrel inspecting method, and lens barrel manufacturing method 08018522 Cl. 348-335.
Nagaoka, Kazuma: See--
Houmura, Toshikazu; Yoshihara, Kazuhiro; Yamaguchi, Takako; and Nagaoka, Kazuma 08019061 Cl. 379-100.14.
Nagarajan, Ramesh; to Xerox Corporation Customized system and method of billing for printing service costs by examining the contents of printed pages 08019695 Cl. 705-400.
Nagarajan, Vasantha: See--
Bramucci, Michael G.; Kane, Helene M. A.; and Nagarajan, Vasantha 08017364 Cl. 435-160.
Nagarajrao, Sunil K.; Merbach, David L.; Basham, Robert; Heitman, Allen R.; Padbidri, Sumant; and Axberg, Gary T., to International Business Machines Corporation Intelligent discovery of network information from multiple information gathering agents 08019851 Cl. 709-223.
Nagasaku, Toshiyuki: See--
Wachi, Yusuke; and Nagasaku, Toshiyuki 08018292 Cl. 331-117R.
Nagasawa, Nobuyuki: See--
Natori, Yasuaki; and Nagasawa, Nobuyuki 08017903 Cl. 250-216.
Nagase, Shigeki; to JTEKT Corporation Electric power steering system 08018191 Cl. 318-479.
Nagase, Toshiaki: See--
Onishi, Hiroyuki; Nagase, Toshiaki; Ishikawa, Jun; Kontani, Kazuyoshi; Fukatsu, Toshinari; Kobayashi, Hiroyuki; Kanie, Naohito; and Nakamura, Takahiro 08018730 Cl. 361-763.
Nagashima, Yukihito: See--
Seto, Hiromitsu; Koyama, Akihiro; and Nagashima, Yukihito 08017537 Cl. 501-71.
Nagata, Makoto; to Semiconductor Technology Academic Research Center Timing analysis apparatus and method for semiconductor integrated circuit in consideration of power supply and ground noises 08020130 Cl. 716-115.
Nagata, Shigemi: See--
Uehara, Yusuke; Baba, Takayuki; Endo, Susumu; Shiitani, Shuichi; Masumoto, Daiki; and Nagata, Shigemi 08019761 Cl. 707-737.
Nagatsuka, Masaaki: See--
Hosoe, Koji; and Nagatsuka, Masaaki 08019952 Cl. 711-156.
Nagatsuka, Masato: See--
Matsuda, Mamoru; Mori, Toshiyuki; Kawashima, Kenji; Nagatsuka, Masato; Kobayashi, Sachiko; Yamamoto, Minoru; Kato, Masatomo; Takai, Miwa; and Oda, Tomoko 08017775 Cl. 546-18.
Nagaya, Mitsuhiro: See--
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio 08018242 Cl. 324-755.01.
Nagayama, Katsuhiro: See--
Kitagawa, Takashi; Nagayama, Katsuhiro; and Otsuka, Masayuki 08019242 Cl. 399-43.
Nagoya, Mitsugu; to Duaxes Corporation Determining device and determining method for determining processing to be performed based on acquired data 08019776 Cl. 707-769.
Nagumo, Hirobumi: See--
Shirasu, Toshiyuki; Oka, Daizo; Nagumo, Hirobumi; and Ishida, Tessho 08016433 Cl. 353-85.
Nagy, Sandor; Pater, Joachim T. M.; and Morini, Giampiero, to Equistar Chemicals, LP Nitroso-modified Ziegler-Natta catalyst system 08017708 Cl. 526-220.
Naick, Indran; and Wilson, Jeffrey Kenneth, to International Business Machines Corporation Apparatus and method for providing automatic language preference 08019053 Cl. 379-88.06.
Nair, Ajith N.: See--
Claussen, Paul J.; Nair, Ajith N.; and Russ, Samuel H. 08020182 Cl. 725-25.
Nair, Hari N.; to Tamiras Per Pte. Ltd., LLC Robust camera pan vector estimation using iterative center of mass 08019124 Cl. 382-107.
Nair, Ramesh: See--
Bao, Xiaoming; Singletary, George W.; Wetterberg, Deborah J.; Nair, Ramesh; Dhugga, Kanwarpal S.; Liebergesell, Matthias; and Selinger, David A. 08017831 Cl. 800-285.
Naito, Koji; and Ikeda, Akihiko, to Toyota Jidosha Kabushiki Kaisha Powertrain 08016070 Cl. 180-380.
Naito, Toshiki; Ohsawa, Tetsuya; and Kataoka, Kouji, to Nitto Denko Corporation Wired circuit board assembly sheet 08017871 Cl. 174-250.
Najafi, Nader: See--
Sparks, Douglas Ray; and Najafi, Nader 08016798 Cl. 604-246.
Najanguaq Søvsø Andreasen Struijk, Lotte; to TKS A/S Tongue based control method and system for performing the method 08018320 Cl. 340-4.11.
Naka, Kenichirou: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou 08018538 Cl. 349-38.
Nakada, Hideki; Kohama, Kouhei; Uemura, Tetsuro; Sato, Takashi; and Hamada, Ryosuke, to C. Uyemura & Co., Ltd. Surface treatment apparatus 08015983 Cl. 134-76.
Nakade, Isamu: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu 08020178 Cl. 720-662.
Nakagawa, Atsuo; Murakami, deceased, Ichiroh; and Murakami, legal representative, Masanori, to Panasonic Corporation Solid-state image sensor and manufacturing method thereof 08018012 Cl. 257-432.
Nakagawa, Hideo: See--
Morinaga, Yasunori; and Nakagawa, Hideo 08017518 Cl. 438-637.
Nakagawa, Hisashi; Akiyama, Masahiro; Furukawa, Tsuyoshi; and Tokushige, Naohisa, to JSR Corporation Polycarbosilane, method for producing same, silica composition for coating application, and silica film 08017700 Cl. 525-474.
Nakagawa, Tomonori: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji 08017615 Cl. 514-253.07.
Nakagawa, Yoshinori: See--
Iwasaki, Osamu; Takahashi, Kiichiro; Nishikori, Hitoshi; Otsuka, Naoji; Teshigawara, Minoru; Edamura, Tetsuya; Nakagawa, Yoshinori; and Seki, Satoshi 08016386 Cl. 347-43.
Nakahara, Hironori; Takeshita, Nobuo; and Ogawa, Masaharu, to Mitsubishi Electric Corporation Optical disc and optical disc device 08018812 Cl. 369-94.
Nakahara, Masanori: See--
Takakuwa, Nobuyuki; Fukuda, Yasuko; Sawabe, Takao; Kanegae, Tohru; Nakahara, Masanori; Koda, Takeshi; and Imamura, Akira 08019196 Cl. 386-248.
Nakahara, Yuji: See--
Miyake, Nobuaki; Nakahara, Yuji; Yuya, Masahiro; Karata, Yukinobu; and Hashimoto, Akira 08015691 Cl. 29-596.
Nakai, Tohru: See--
En, Honchin; Hayashi, Masayuki; Wang, Dongdong; Shimada, Kenichi; Asai, Motoo; Sekine, Koji; Nakai, Tohru; Ichikawa, Shinichiro; and Toyoda, Yukihiko 08018045 Cl. 257-700.
Nakai, Tomoaki: See--
Kinukawa, Tatsuya; Ichinose, Kimitaka; Nakai, Tomoaki; Kume, Takao; and Seki, Hiroyuki 08019243 Cl. 399-43.
Nakai, Yasuhiro: See--
Osaki, Shintaro; Kodama, Hiroyuki; Takeda, Masayoshi; Kadowaki, Kazunori; Nakai, Yasuhiro; Kumabe, Hajime; and Fukuda, Shotaro 08019520 Cl. 701-69.
Nakajima, Atsushi: See--
Fujiwara, Yoshinobu; Honsawa, Kunio; and Nakajima, Atsushi 08020214 Cl. 726-31.
Nakajima, Kazuaki; and Suguro, Kyoichi, to Kabushiki Kaisha Toshiba Semiconductor device and manufacturing method for the same 08017466 Cl. 438-199.
Nakajima, Kazuo: See--
Kida, Michio; Pan, Wugen; Kaneko, Kyojiro; Nakajima, Kazuo; Usami, Noritaka; and Fujiwara, Kozo 08017862 Cl. 136-261.
Nakajima, Ryuta; and Mashimo, Hidehiko, to Sumitomo Heavy Industries, Ltd. Stage device 08019448 Cl. 700-60.
Nakajima, Takeshi: See--
Miyashita, Harumitsu; Nakajima, Takeshi; and Kimura, Naohiro 08018810 Cl. 369-59.22.
Nakajima, Yoshiharu: See--
Koyama, Hirotoshi; Nakajima, Yoshiharu; Kida, Yoshitoshi; and Ito, Daisuke 08018415 Cl. 345-96.
Nakamatsu, Hiroki; Sugiura, Kenji; Sugimoto, Naomi; Naruse, Osamu; and Yano, Hidetoshi, to Ricoh Company Limited Polarity controlling device, and cleaner and image forming apparatus using the polarity controlling device 08019268 Cl. 399-349.
Nakamura, Atsushi; Fujiune, Kenji; and Hino, Yasumori, to Panasonic Corporation Method for inspecting optical information recording medium, inspection apparatus, optical information recording medium and recording method 08018808 Cl. 369-53.28.
Nakamura, Daisuke: See--
Suzuki, Takayoshi; and Nakamura, Daisuke 08016625 Cl. 440-1.
Suzuki, Takayoshi; Ryuman, Mitsuhiro; and Nakamura, Daisuke 08016626 Cl. 440-75.
Nakamura, deceased, Takeshi: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi 08017809 Cl. 568-3.
Nakamura, Fusashi: See--
Murakami, Akiko; Nakamura, Fusashi; and Nasukawa, Tetsuya 08019756 Cl. 707-729.
Nakamura, Hidekazu; to Canon Kabushiki Kaisha Optical apparatus 08018667 Cl. 359-824.
Nakamura, Hiroyuki; Uehara, Masato; Wang, Hongzhi; Maeda, Hideaki; Miyazaki, Masaya; Yamaguchi, Yoshiko; Yamashita, Kenichi; Shimizu, Hazime; and Li, Xyanying, to National Institute of Advanced Industrial Science and Technology Method for manufacturing fine composite particles, apparatus for manufacturing fine composite particles, and fine composite particles 08017235 Cl. 428-403.
Nakamura, Junichi; and Kobayashi, Yuji, to Shinko Electric Industries Co., Ltd. Method of fabricating wiring board and method of fabricating semiconductor device 08015700 Cl. 29-830.
Nakamura, Katsuhisa: See--
Saito, Hirofumi; Nakamura, Yoshihito; Matsukawa, Akihiro; Nakamura, Katsuhisa; and Asami, Masaaki 08015918 Cl. 101-425.
Nakamura, Kimiaki: See--
Sasaki, Takahiro; Takeda, Arihiro; Ohmuro, Katsufumi; Chida, Hideo; Koike, Yoshio; Nakamura, Kimiaki; and Tashiro, Kunihiro 08018559 Cl. 349-129.
Nakamura, Koji; Tajima, Rie; Kumar, Shankar; Tso, J. Yun; and Tsurushita, Naoya, to LivTech Inc. — Teikyo University Biotechnology Research Center Anti-hDlk-1 antibody having an antitumor activity in vivo 08017118 Cl. 424-133.1.
Nakamura, legal representative, Aiko: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi 08017809 Cl. 568-3.
Nakamura, legal representative, Kyoko: See--
Mikoshiba, Katsuhiko; Ozaki, Shoichiro; Suzuki, Akinobu; and Nakamura, deceased, Takeshi 08017809 Cl. 568-3.
Nakamura, Makoto: See--
Ohtani, Hiroki; Nakamura, Makoto; Yamada, Kenji; Okamura, Masaki; and Hanada, Hideto 08018195 Cl. 318-812.
Nakamura, Minoru; and Izutani, Akira, to Ricoh Company, Ltd. Image forming method and image forming apparatus 08017290 Cl. 430-48.
Nakamura, Mitsuyoshi; and Matsui, Toru, to Honda Motor Co., Ltd. Seat-form storage apparatus 08016338 Cl. 296-37.15.
Nakamura, Naofumi: See--
Sasaki, Hirokazu; Nakamura, Naofumi; Morikawa, Shigeru; Hashimoto, Hideto; Kimura, Takaaki; and Kawai, Yoshihiko 08015851 Cl. 72-347.
Nakamura, Nobuhiro; Hayashi, Kazutaka; Imakita, Kenji; Ohkawa, Hiroyuki; Odaka, Hidefumi; and Ishibashi, Nao, to Asahi Glass Company, Limited Translucent substrate, process for producing the same, organic LED element and process for producing the same 08018140 Cl. 313-503.
Nakamura, Norikazu; Chiba, Hiroshi; Kasamatsu, Yoshiharu; Musashi, Takayuki; Oshikubo, Yukiko; and Itani, Tsukasa, to Fujitsu Limited Head slider and magnetic recording device therewith 08018683 Cl. 360-235.1.
Nakamura, Tadashi; to Fujitsu Limited Wireless communication device 08019285 Cl. 455-63.4.
Nakamura, Takafumi: See--
Furukawa, Chisato; and Nakamura, Takafumi 08017954 Cl. 257-88.
Nakamura, Takahiro: See--
Onishi, Hiroyuki; Nagase, Toshiaki; Ishikawa, Jun; Kontani, Kazuyoshi; Fukatsu, Toshinari; Kobayashi, Hiroyuki; Kanie, Naohito; and Nakamura, Takahiro 08018730 Cl. 361-763.
Nakamura, Takao: See--
Yoshizumi, Yusuke; Ueno, Masaki; and Nakamura, Takao 08018029 Cl. 257-615.
Nakamura, Tohru: See--
Sakakibara, Mizuho; Kawakami, Hideo; Kume, Yohei; and Nakamura, Tohru D0644850 Cl. D6-383.
Nakamura, Yasunori: See--
Horiuchi, Takashi; Nakamura, Yasunori; and Suito, Yoshikatsu 08016285 Cl. 271-145.
Nakamura, Yasuo: See--
Yamazaki, Shunpei; Nomura, Ryoji; Seo, Satoshi; Abe, Hiroko; and Nakamura, Yasuo 08018152 Cl. 313-509.
Nakamura, Yoshihito: See--
Saito, Hirofumi; Nakamura, Yoshihito; Matsukawa, Akihiro; Nakamura, Katsuhisa; and Asami, Masaaki 08015918 Cl. 101-425.
Nakane, Eiji; to Konica Minolta Business Technologies, Inc. User-friendly image forming apparatus with current supplier for supplying cleaning current, image forming method and recording medium 08019244 Cl. 399-44.
Nakane, Shinichi: See--
Yamasaki, Isamu; Mori, Takanobu; Nakane, Shinichi; Achiwa, Noriyuki; and Harada, Kohta 08016001 Cl. 141-21.
Nakanishi, Hiroyuki; to Canon Kabushiki Kaisha Display apparatus, display control apparatus, and control method 08018483 Cl. 348-53.
Nakanishi, Nozomu: See--
Minowa, Nobuto; Nakanishi, Nozomu; and Mitomi, Masaaki 08017797 Cl. 560-51.
Nakanishi, Tetsuya; Onishi, Masashi; Yokokawa, Tomoyuki; Hirano, Masaaki; and Taira, Nobuyuki, to Sumitomo Electric Industries, Ltd. Glass tube processing method 08015845 Cl. 65-384.
Nakano, Haruhiko: See--
Takenobu, Hideya; and Nakano, Haruhiko 08016588 Cl. 425-566.
Nakao, Masahiro: See--
Maeda, Mitsuru; Nakao, Masahiro; and Fukami, Harukazu 08017587 Cl. 514-27.
Nakao, Shuji: See--
Ishibashi, Takeo; Saito, Takayuki; Itoh, Maya; and Nakao, Shuji 08017305 Cl. 430-311.
Nakao, Takashi: See--
Ozawa, Yoshio; Mizushima, Ichiro; Nakao, Takashi; Yamamoto, Akihito; Suzuki, Takashi; and Kiyotoshi, Masahiro 08017989 Cl. 257-315.
Nakaoki, Ariyoshi: See--
Kim, SunMin; Ishimoto, Tsutomu; Kondo, Takao; and Nakaoki, Ariyoshi 08018827 Cl. 369-300.
Nakashiba, Yasutaka; to Renesas Electronics Corporation Circuit board and semiconductor device 08018026 Cl. 257-531.
Nakashima, Moriyoshi: See--
Ajika, Natsuo; Shukuri, Shoji; Mihara, Masaaki; and Nakashima, Moriyoshi 08017994 Cl. 257-324.
Nakaso, Suguru: See--
Tian, Minquan; Hirokawa, Kazuhiko; Ito, Yuka; Nakaso, Suguru; Hasegawa, Shinji; Watanabe, Miho; Matsubara, Takashi; Anazawa, Kazunori; Miyahara, Tomoco; and Furuki, Makoto 08017291 Cl. 430-108.1.
Nakata, Hidetoshi; to Renesas Electronics Corporation Method of manufacturing semiconductor device 08017511 Cl. 438-597.
Nakatani, Shuhei; Hotta, Sadayoshi; and Yoshida, Hidehiro, to Panasonic Corporation Organic transistor, method of forming organic transistor and organic EL display with organic transistor 08017940 Cl. 257-40.
Nakatani, Yuuya: See--
Ishida, Kazuo; Ohta, Atsushi; Nakatani, Yuuya; Itoh, Hiroshi; and Inomata, Chiaki 08019257 Cl. 399-274.
Nakatsue, Takehiro: See--
Matsumoto, Tatsuhiko; Imai, Yutaka; and Nakatsue, Takehiro 08018468 Cl. 345-589.
Nakatsura, Tetsuya: See--
Nishimura, Yasuharu; Nakatsura, Tetsuya; and Ikuta, Yoshiaki 08017345 Cl. 435-7.1.
Nakauchi, Rachel: See--
Provos, Niels; Zhou, Yunkai; Bavor, Jr., Clayton W.; Davis, Eric L.; Palatucci, Mark; Nigam, Kamal P.; Monson, Christopher K.; Mavrommatis, Panayiotis; and Nakauchi, Rachel 08019700 Cl. 706-12.
Nakayama, Brian L.: See--
Fitzpatrick, Richard M.; Mayberry, Michael T.; and Nakayama, Brian L. D0645113 Cl. D22-108.
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio, to NHK Spring Co., Ltd. Probe card 08018242 Cl. 324-755.01.
Nakayama, Masayoshi; Akatsu, Shinichi; and Takenaka, Tomohide, to Ricoh Company, Limited Device and method for detecting life of organic photoreceptor and image forming apparatus 08019239 Cl. 399-26.
Nakayama, Shinya: See--
Sabu, Akiyoshi; Kotsugai, Akihiro; Nakayama, Shinya; Yamashita, Hiroshi; Sugimoto, Tsuyoshi; Yamada, Hiroshi; and Awamura, Junichi 08017292 Cl. 430-109.4.
Nakayama, Tsukasa: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu 08020178 Cl. 720-662.
Nakazato, Hiroaki; and Hashimoto, Sunao, to Fuji Xerox Co., Ltd. Information processing apparatus and computer readable medium 08019955 Cl. 711-163.
Nakazawa, Namio; to Monoco Technologies Corp. Lighting device for enhanced lighting 08018129 Cl. 313-318.01.
Nakazono, Takuya; Umemoto, Seiji; and Shimanoe, Fumihito, to Nitto Denko Corporation Information storing, readout and calculation system for use in a system for continuously manufacturing liquid-crystal display elements, and method for producing the same 08016965 Cl. 156-64.
Nakil, Harshad: See--
Reddy, Rajashekar; Singla, Ankur; Nakil, Harshad; Marques, Pedro R.; and Ranjan, Ashish 08018891 Cl. 370-320.
Nakiri, Kazuhiro; Kawakami, Yoshio; and Suzuki, Tetsuo, to Furukawa Electric Co., Ltd., The Chamfering apparatus for chamfering glass substrates 08016645 Cl. 451-180.
Nalco Company: See--
Sharpe, Ron 08017910 Cl. 250-339.01.
Yoon, Seong-Hoon; Collins, John H.; Koppes, Jeroen A.; and Huisman, Ingmar H. 08017014 Cl. 210-605.
Nalesnik, Theodore E.; to Chemtura Corporation Diaromatic amines 08017805 Cl. 564-305.
Nalux Co., Ltd: See--
Inoue, Yasuaki; Ikeda, Katsumoto; and Miyazaki, Hideki 08017923 Cl. 250-504R.
Nam, Choong-Hee; to Techous Co., Ltd. Anti keylog editor of activex base 08020215 Cl. 726-34.
Nam, Hui: See--
Kim, Beom-Shik; Lee, Jang-Doo; Jang, Hyoung-Wook; Nam, Hui; and Song, Myoung-Seop 08018482 Cl. 348-42.
Nam, Hui; Kim, Beom-Shik; Park, Chan-Young; and Ku, Ja-Seung, to Samsung Mobile Display Co., Ltd. Electronic imaging device and driving method therefor 08018535 Cl. 349-15.
Nam, Kyung-Woo: See--
Oh, Chi-Sung; Kim, Yong-Jun; Nam, Kyung-Woo; Kim, Jin-Kuk; and Kim, Soo-Young 08019948 Cl. 711-149.
Namie, Hisanori: See--
Shimamoto, Kenichi; and Namie, Hisanori 08018287 Cl. 330-298.
Nan, Ning-Han: See--
Pan, Jiung-Cheng; and Nan, Ning-Han 08019395 Cl. 455-575.3.
Nan Ya Plastics Corporation: See--
Shieh, Sung-Yueh; Fung, Dein-Run; Hsu, Han-Ching; and Liu, Yang-Tu 08017799 Cl. 560-127.
Nanda, Sanjiv; and Krishnan, Ranganathan, to QUALCOMM, Incorporated Multi-hop communications in a wireless network 08019351 Cl. 455-452.2.
Nanoink, Inc.: See--
Haaheim, Jason; and Athas, Gregory 08017191 Cl. 427-430.1.
Nanya Technology Corporation: See--
Lai, Jung-Chin 08019393 Cl. 455-571.
Naoaki, Komiya: See--
Kwak, Won Kvu; and Naoaki, Komiya 08018405 Cl. 345-82.
Naoe, Kunihiro: See--
Ichikawa, Masateru; Naoe, Kunihiro; and Ajimura, Shoji 08017876 Cl. 174-267.
Naono, Takayuki; and Fujii, Takamichi, to Fujifilm Corporation Patterned inorganic film, piezoelectric device, and process for producing the same 08017185 Cl. 427-264.
Napier, Johnathan A.; and Sayanova, Olga, to BASF Plant Science GmbH Process for the production of arachidonic acid and/or eicosapentaenoic acid 08017839 Cl. 800-298.
Napper, Jonathon Leigh; to Silverbrook Research Pty Ltd Method of modifying classification scheme for hand-written characters 08019160 Cl. 382-186.
Naqvi, Farrukh Reza: See--
Ruello, Natale; Naqvi, Farrukh Reza; Elangovan, Anusankar; Borgione, Gaetano; and De Silva, Suran 08018845 Cl. 370-229.
Narahara, Tatsuya; to Sony Corporation Information processing apparatus, and method and program for searching text information candidate 08019774 Cl. 707-769.
Narang, Navan: See--
Shatzkamer, Kevin; Oswal, Anand K.; Iyer, Jayaraman; Grayson, Mark; and Narang, Navan 08018948 Cl. 370-395.2.
Narasimha, Shreesh: See--
Freeman, Gregory G.; Narasimha, Shreesh; Su, Ning; Nayfeh, Hasan M.; Rovedo, Nivo; Rausch, Werner A.; and Yu, Jian 08017483 Cl. 438-286.
Narayanan, Raman: See--
Ozzie, Raymond E.; Ozzie, Jack E.; Moromisato, George P.; Suthar, Paresh S.; Narayanan, Raman; and Augustine, Matthew S. 08020112 Cl. 715-770.
Nardacci, Nicholas M.; and Bissonnette, Laurent, to Acushnet Company Golf ball with improved flight performance 08016695 Cl. 473-373.
Nardell, Carl A.: See--
Meyer, Jay L.; Messick, Glenn C.; Nardell, Carl A.; and Hendlin, Martin J. 08016438 Cl. 359-872.
Nardone, Vincent C.: See--
Bertolotti, Fabio R.; Liscinsky, David S.; Nardone, Vincent C.; Sabatino, Daniel R.; Sahm, Michael K.; and Noack, Bernd R. 08015827 Cl. 60-785.
Nardozza, Jr., Joseph A: See--
Sledge, Rory T.; Gramelspacher, Michael S.; Weinstock, Brian Fuller; and Nardozza, Jr., Joseph A D0645096 Cl. D21-328.
Narendar, Yeshwanth; Simpson, Matthew A.; and Hengst, Richard R. Semiconductor processing components and semiconductor processing utilizing same 08017062 Cl. 264-500.
Narita, Mitsuo; Hatayama, Atsushi; and Umezawa, Hiroshi, to Shin-Etsu Chemical Co., Ltd. Methods for preparing alkali cellulose and cellulose ether 08017766 Cl. 536-84.
Narramore, Jimmy Charles: See--
Agnihotri, Ashok K.; Narramore, Jimmy Charles; and Schillings, John J. 08016566 Cl. 416-223R.
Narumi, Satoshi; Kato, Masaaki; Hoashi, Masaharu; and Suzuki, Toshiya, to Renesas Electronics Corporation Motor drive apparatus 08018189 Cl. 318-400.35.
Naruo, Toshihiro: See--
Kiyono, Yasuhiro; and Naruo, Toshihiro 08017883 Cl. 200-520.
Narus Inc.: See--
Nucci, Antonio; Ranjan, Supranamaya; and Kuzmanovic, Aleksandar 08019764 Cl. 707-739.
Narusawa, Hideyuki; to Seiko Epson Corporation Printing method with respect to scanning a medium 08016499 Cl. 400-76.
Naruse, Osamu: See--
Nakamatsu, Hiroki; Sugiura, Kenji; Sugimoto, Naomi; Naruse, Osamu; and Yano, Hidetoshi 08019268 Cl. 399-349.
Narvalus S.R.L.: See--
Vassanelli, Stefano; and Cellere, Giorgio 08017367 Cl. 435-173.6.
Nascimento, Ivan Carlos Ribeiro; to Freescale Semiconductor, Inc. Voltage reference device and methods thereof 08018197 Cl. 320-116.
Nash, Dennis C.; and Nash, Holly B. Boat trailer fender cover D0644980 Cl. D12-401.
Nash, Holly B.: See--
Nash, Dennis C.; and Nash, Holly B. D0644980 Cl. D12-401.
Nash, Stephen; O'Beirne, Patricia; Johnson, David; Gormley, Stephen; and Kelly, Grace, to Medtronic Vascular, Inc. Catheter having a detachable tip 08016799 Cl. 604-265.
Nasu, Hiroshi: See--
Asano, Masayasu; Nasu, Hiroshi; Yamamoto, Masayuki; and Maki, Nobuhiro 08019930 Cl. 711-103.
Nasu, Mineyuki: See--
Okamoto, Hideo; Hiraga, Tadayuki; Ohta, Hiroitsu; Nasu, Mineyuki; and Sasaki, Hiroaki 08015950 Cl. 122-31.1.
Nasukawa, Tetsuya: See--
Murakami, Akiko; Nakamura, Fusashi; and Nasukawa, Tetsuya 08019756 Cl. 707-729.
Nath, Sanjeev; and Patel, Rajesh Method for deactivating an image capturing device when present in a restricted or prohibited zone 08018496 Cl. 348-211.2.
Nathanson, Harvey C.; Young, Robert M.; Smith, Joseph T.; Howell, Robert S.; and Mitchell, Archer S., to Northrop Grumman Systems Corporation Heat transfer device 08018053 Cl. 257-717.
National Chiao Tung University: See--
Meng, Hsin-Fei; Horng, Sheng-Fu; Hsu, Chain-Shu; Lin, Shi-Cheng; and Liao, Hua-Hsien 08017175 Cl. 427-74.
National Flooring Equipment, Inc.: See--
Anderson, Martin L. 06609762 Cl. 299-37.2.
National Gypsum Properties, LLC: See--
Martin, William C.; Stav, Eli; Plante, Matthew J.; and Heermann, Maryn L. 08016961 Cl. 156-43.
National Institute of Advanced Industrial Science and Technology: See--
Igari, Sanekazu 08016439 Cl. 362-1.
Nakamura, Hiroyuki; Uehara, Masato; Wang, Hongzhi; Maeda, Hideaki; Miyazaki, Masaya; Yamaguchi, Yoshiko; Yamashita, Kenichi; Shimizu, Hazime; and Li, Xyanying 08017235 Cl. 428-403.
National Oilwell Varco, L.P.: See--
Bloom, Robert; Ellison, Leon D.; Kammann, Reinhold; Worms, Manfred; Lam, Clive; and McClung, III, Guy L. 08016037 Cl. 166-255.1.
National Semiconductor Corporation: See--
Evans, Jr., Joseph T.; Miller, William D.; and Womack, Richard H. 08018754 Cl. 365-145.
Griesert, Nathanael; and Swank, Damian 08018215 Cl. 323-282.
How, You Chye; and Yeong, Shee Min 08018050 Cl. 257-704.
Small, Jeffrey A.; and Oberoi, Anirudh 08018176 Cl. 315-291.
National Taiwan University of Science and Technology: See--
Chou, Chen-Chia; and Yeh, Tsung-Her 08016988 Cl. 204-424.
National University Corporation Hokkaido University: See--
Ohtani, Bunsho; Abe, Ryu; Sakatani, Yoshiaki; Murata, Makoto; and Nishimine, Hiroaki 08017238 Cl. 428-403.
Nationwide Children's Hospital, Inc.: See--
Caldas, Hannah; and Altura, Rachel A. 08017747 Cl. 536-23.1.
Natoli, Chris: See--
Purdy, Eric; Natoli, Chris; and Montena, Noah D0644998 Cl. D13-151.
Natoli, Christopher P.: See--
Montena, Noah; and Natoli, Christopher P. 08016605 Cl. 439-322.
Natori, Yasuaki; and Nagasawa, Nobuyuki, to Olympus Corporation Observation apparatus 08017903 Cl. 250-216.
Natsume, Shigeru G.: See--
Davis, Brian T.; Schumacher, Donald J.; Healey, Gregory E.; Price, Bradley H.; Chan, Eric Ping Pang; and Natsume, Shigeru G. D0644926 Cl. D9-448.
Naughton, Ron: See--
Mahoney, Michael; Dziedzic, Sara; Birkmeyer, Paul; Beardsley, Timothy; Frank, Dale; and Naughton, Ron 08016829 Cl. 606-86A.
Naughton, Ronald: See--
Birkmeyer, Paul; Sicvol, Christopher W.; Serhan, Hassan; Selover, Sean; Naughton, Ronald; and Sheehy, Nancy M. 08016835 Cl. 606-97.
Nault, Gabe: See--
Wright, Michael; Boucher, Peter; Nault, Gabe; Smith, Merrill; Jacobson, Sterling K.; Wood, Jonathan; and Mims, Robert 08020192 Cl. 726-1.
Nautilus Hyosung Inc.: See--
Kwak, Jae Hoon; Lee, Woo Ho; Lee, Hee Chang; and Yoon, Joon Hyun 08016186 Cl. 235-379.
Nautilus, Inc.: See--
Kuo, Hai Pin; and Piaget, Gary D. RE042698 Cl. 482-54.
Webb, Gregory M. 08016729 Cl. 482-97.
Navarro, Abraham J.: See--
Thomas, Jeffrey J.; Navarro, Abraham J.; Read, Gordon K.; and Zdyrko, Jr., David M. 08016664 Cl. 463-23.
Navia, Juan: See--
Kabbani, Fiesal El; Brohmi, Amal; Heiss, Christian; Navia, Juan; and Catani, Steven J. 08017767 Cl. 536-123.13.
Navigon AG: See--
Hess, Philipp; and Thomas, Bernd 08018461 Cl. 345-467.
Navon, Ariel Device and method for monitoring blood parameters 08017407 Cl. 436-164.
NAVTEQ North America, LLC: See--
DeVries, Steven P.; Herbst, James M.; Hopkins, Karen A.; McGrath, Suzanne M.; Bauer, Ellen M.; Bennett, James R.; and Borak, Jason M. 08019537 Cl. 701-211.
Nawata, Teruhiko; Yasumura, Ken; Yanagi, Hiroyuki; and Nishijima, Eiichi, to Tokuyama Corporation Process for producing metal fluoride single crystal 08016942 Cl. 117-30.
Nayak, Asha Shrinivas: See--
Mourlas, Nicholas J.; Eversull, Christian Scott; Leeflang, Stephen Arie; Nayak, Asha Shrinivas; and Miller, David John 08016748 Cl. 600-115.
Nayak, Ratnakar Aravind; to Agere Systems Inc. Systems and methods for mitigating latency in a data detector feedback loop 08018360 Cl. 341-118.
Nayan, Azlina N.: See--
Lim, Kevin W.; Too, Seah S.; Nayan, Azlina N.; Keok, Kee Hean; and Yong, Soon Tatt Ow 08017434 Cl. 438-106.
Nayar, Naresh: See--
Armstrong, William Joseph; Corrigan, Michael J.; Jacobs, Stuart Zachary; Larson, David Anthony; Nayar, Naresh; and Ouren, Wade Byron 08019962 Cl. 711-173.
Nayfeh, Hasan M.: See--
Freeman, Gregory G.; Narasimha, Shreesh; Su, Ning; Nayfeh, Hasan M.; Rovedo, Nivo; Rausch, Werner A.; and Yu, Jian 08017483 Cl. 438-286.
Naylor, Matthew S.: See--
Schilling, Robin B.; Naylor, Matthew S.; and Chahley, Dennis W. 08015933 Cl. 111-129.
Naylor, Matthew S.; Thompson, Dennis G.; and Georgison, Ryan R., to CNH Canada, Ltd. Marker assembly having breakaway feature 08016043 Cl. 172-126.
Nazarenko, Igor: See--
Baccash, Jonathan M.; Nazarenko, Igor; Rodny, Uri; and Shatdal, Ambuj 08019751 Cl. 707-719.
nCircle Network Security, Inc.: See--
Keanini, Timothy D.; Quiroga, Martin A.; Buchanan, Brian W.; and Flowers, John S. 08020211 Cl. 726-25.
NDSU Research Foundation: See--
Webster, Dean C.; Chen, Zhigang; and Ravindran, Neena 08017795 Cl. 549-547.
Nease, Brant: See--
Chung, Ki Sup; Sin, Kyusik; Yang, Danning; Chen, Yingjian; and Nease, Brant 08018677 Cl. 360-125.03.
NEC Corporation: See--
Abe, Shinji 08019890 Cl. 709-245.
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Yamaguchi, Hiroshi 08019033 Cl. 375-362.
Yoshida, Shousei; and Kimata, Masayuki 08019031 Cl. 375-349.
NEC Laboratories America, Inc.: See--
Bachwani, Rekha N; Gryz, Leszek R; Bianchini, Ricardo G; and Dubnicki, Cezary 08019728 Cl. 707-658.
Jiang, Guofei; Chen, Haifeng; and Yoshihira, Kenji 08019584 Cl. 703-13.
NEC LCD Technologies, Ltd: See--
Nagai, Hiroshi 08018556 Cl. 349-118.
NEC LCD Technologies, Ltd.: See--
Mori, Kenichi; Sakamoto, Michiaki; Nagai, Hiroshi; and Naka, Kenichirou 08018538 Cl. 349-38.
NEC Lighting, Ltd: See--
Minamoto, Maki; Ohmi, Koutoku; and Tsuji, Kazuaki 08017037 Cl. 252-301.4S.
NEC Tokin Corporation: See--
Yoshida, Yuji; Yoshida, Katsuhiro; Kasuga, Takeo; Takahashi, Masanori; Saito, Takeshi; and Sakata, Koji 08018713 Cl. 361-523.
Needelman, David D.; Li, Rongsheng; and Wu, Yeong-Wei A., to Boeing Company, The Real-time refinement method of spacecraft star tracker alignment estimates 08019544 Cl. 701-222.
Needlebot Incorporated: See--
Collins, John Barrett; Verlin, Jerome; Akyuz, Can Deniz; and Donnelly, Stuart 08019754 Cl. 707-728.
Neef, Edwin: See--
Pinkus, Ayal; Neef, Edwin; Jurgens, Sven-Erik; and Gretton, Mark 08019531 Cl. 701-200.
Neeley, Billy D.: See--
Durst, Bartley P.; Neeley, Billy D.; O'Neil, Edward F.; and Cummins, Toney K. 08016938 Cl. 106-713.
Negley, Gerald H.: See--
Van De Ven, Antony Paul; and Negley, Gerald H. 08018135 Cl. 313-498.
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Neidhardt, Ronald: See--
Burger, Kurt; Schneider, Guenter; Neidhardt, Ronald; Hauser, Manfred; Burghoff, Klaus; Grosse, Stefan; Schattke, Alexander; Henke, Sascha; Bayer, Christian; and Schmautz, Oliver 08017196 Cl. 427-568.
Neiley, Roger; and Scaturro, Anthony, to Flow Sports, Inc. Modular binding for sports board 08016315 Cl. 280-611.
Neira, Susana C.: See--
Allen, Jennifer R.; Biswas, Kaustav; Burli, Roland; Dao, Jennifer; Frohn, Michael J.; Golden, Jennifer E.; Hungate, Randall W.; Kurzeja, Robert; Mercede, Stephanie J.; Muller, Kristine M.; Neira, Susana C.; Peterkin, Tanya A. N.; Tegley, Christopher M.; and Yu, Violeta 08017626 Cl. 514-312.
Nekhamkin, Michael; and Yu, Liangkai, to iBiquity Digital Corporation Systems and methods for DC component recovery in a zero-IF radio receiver 08019311 Cl. 455-313.
Nellcor Purtian Bennett LLC: See--
Sanchez, Gabriel; Doyle, Peter; Leone, Kenneth; Cleveland, Donna; Palmer, Marc; and Hyde, David D0645158 Cl. D24-231.
Nellor, Howard J.: See--
Cocotis, Thomas A.; Curtis, Alan D.; Emmett, David M.; Fan, Shengkuo; Henderson, Kristofer P.; Luepke, Jack W.; Nellor, Howard J.; Treptow, Jay A.; and Wong, Gregory H. 08019829 Cl. 709-217.
Nelson, Adam; to Good Nite Lite, LLC Night light wake up indicator 08018327 Cl. 340-309.16.
Nelson, Amy E.: See--
Keefer, Bowie G.; Roy, Surajit; St.-Pierre, Jean; Nelson, Amy E.; and Knights, Shanna D. 08015808 Cl. 60-517.
Nelson, Andrew J.: See--
Novak, Julia E.; Presnell, Scott R.; Sprecher, Cindy A.; Foster, Donald C.; Holly, Richard D.; Gross, Jane A.; Johnston, Janet V.; Nelson, Andrew J.; Dillon, Stacey R.; and Hammond, Angela K. 08017343 Cl. 435-7.1.
Nelson, Benny Kevin; and Nelson, David W., to Donaldson Company, Inc. Z-filter media pack arrangement; filter cartridge; air cleaner arrangement; and, methods 08016903 Cl. 55-357.
Nelson, Daniel: See--
Zhang, Min; Wright, David Howell; Cooper, Scott; Dykstra, Regina; Ramaswamy, Arun; and Nelson, Daniel 08019162 Cl. 382-199.
Nelson, David W.: See--
Nelson, Benny Kevin; and Nelson, David W. 08016903 Cl. 55-357.
Nelson, Joshua J.: See--
Bargiel, Michael; Nelson, Joshua J.; Walters, Glenn; and Pollard, Frank 08015653 Cl. 15-144.2.
Nelson, Phillip A: See--
Bartlett, Philip Nigel; Owen, John Robert; and Nelson, Phillip A 08017270 Cl. 429-223.
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Nelson, Robert Sigurd; and Nelson, William Bert Slit and slot scan, SAR, and compton devices and systems for radiation imaging 08017906 Cl. 250-252.1.
Nelson, Stephen: See--
Chisholm, Matthew; Nelson, Stephen; and Lundquist, Steven D. 08016069 Cl. 180-307.
Nelson, William Bert: See--
Nelson, Robert Sigurd; and Nelson, William Bert 08017906 Cl. 250-252.1.
Nemeth, Attila Csaba: See--
Collier, Gordon Bruce; Wood, John Allister; MacLeod, Jason Andrew; Dicke, William Charles; Nemeth, Attila Csaba; and Miller, Cary James 08017340 Cl. 435-6.12.
Nemirovsky, Edward: See--
Baraz, Benjamin; Nemirovsky, Edward; and Newman, Yona 08019278 Cl. 455-11.1.
Nemoto, Satoru: See--
Kanbe, Takao; Ono, Shinobu; Harada, Shinichiro; and Nemoto, Satoru 08018665 Cl. 359-823.
Nentwick, Brian: See--
Bettuchi, Michael; and Nentwick, Brian 08016177 Cl. 227-176.1.
Neo, Muay Kheng: See--
Amesbury, Marjan S.; Baxter, Barbara Helen; King, Michael O.; Hardin, Mark T.; Chen, Qiong; Neo, Muay Kheng; and Rozario, Louis-Raymond 08017886 Cl. 219-121.63.
Neo, Sua Hong: See--
Goto, Michiyo; Teo, Chun Woei; Neo, Sua Hong; and Yoshida, Koji 08019087 Cl. 381-17.
Nerone, Louis Robert; to General Electric Company Risk of shock protection circuit 08018700 Cl. 361-91.1.
Nervegna, Louis J.: See--
Pastorello, Douglas F.; De Bakker, Patrick; and Nervegna, Louis J. 08020010 Cl. 713-300.
Nerviano Medical Sciences S.R.L.: See--
Tonani, Roberto; Bindi, Simona; Fancelli, Daniele; Pittala′, Valeria; and Varasi, Mario 08017643 Cl. 514-407.
Nesargi, Sanket: See--
Tenneti, Surya; Nesargi, Sanket; and Li, Jun 08019343 Cl. 455-436.
Nesargi, Sanket; Li, Jun; Chowdhury, Kuntal; and Vasudevan, Mini, to Ericsson AB Admission control and policing in wireless packet data communication system 08018881 Cl. 370-310.
Net Optic, Inc.: See--
Matityahu, Eldad; Shaw, Robert; Carpio, Dennis; Liu, Xiaochun; Fung, Randy; and Hui, Siuman 08018856 Cl. 370-241.
NetApp, Inc.: See--
Kong, George; Aiello, Anthony F.; Aster, Radek; and Thelen, Randal 08019842 Cl. 709-223.
Schwartz, Barry; and Johnson, Colin 08020037 Cl. 714-6.3.
NetBio, Inc.: See--
Tan, Eugene; Lam, Heung Chuan; Bogdanov, Valery Leonidovich; Kellogg, Gregory John; Wright, John A.; Thomann, Ulrich Hans; and Selden, Richard F. 08018593 Cl. 356-344.
Netherlands Cancer Institute, The: See--
Dai, Hongyue; Van't Veer, Laura J.; Lamb, John; Stoughton, Roland; Friend, Stephen H.; and He, Yudong 08019552 Cl. 702-19.
Netlist, Inc.: See--
Yu, Enchao; and An, Zhiyong 08018723 Cl. 361-715.
Netlogic Microsystems, Inc.: See--
Maheshwari, Dinesh; Wright, Andrew; Jiang, Bin; and Banachowicz, Bartosz 08018751 Cl. 365-49.11.
Nettekoven, Matthias; and Roche, Olivier, to Hoffmann-La Roche Inc. Cyclohexyl sulfonamide derivatives 08017773 Cl. 544-391.
Network Appliance, Inc.: See--
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Neumann, Andreas: See--
Philipp, Jens; and Neumann, Andreas 08016875 Cl. 623-1.15.
Neumetzler, Heiko; to ADC GmbH Wire connection module 08016617 Cl. 439-620.08.
Neurogenetic Pharmaceuticals, Inc.: See--
Cheng, Soan; Comer, Daniel D.; Mao, Long; Balow, Guity P.; and Pleynet, David 08017629 Cl. 514-336.
Neurologix, Inc.: See--
Kaplitt, Michael; and Moussatov, Serguei 08017385 Cl. 435-320.1.
Neurosearch A/S: See--
Dahl, Bjarne H.; Peters, Dan; Olsen, Gunnar M.; Timmermann, Daniel B.; and Jørgensen, Susanne 08017631 Cl. 514-340.
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Smith, Steven; and Nevel, Lewis V. 08016819 Cl. 606-1.
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Leng, Luhao 08017212 Cl. 428-73.
New York Air Brake Corporation: See--
Matusiak, Jr., Richard; and Horst, Folkert 08019496 Cl. 701-19.
New Zealand Insitiute for Plant and Food Research Limited, The: See--
Hall, Harvey K.; and Stephens, Joseph PP022141 Cl. PLT-204.
Newaire, Inc.: See--
Sewell, Peter B.; and Luscombe-Mills, Richard J. 08017919 Cl. 250-423R.
Newfrey LLC: See--
Hain, Jochen; Lippert, Stefan; Pohl, Alexander; Moser, Joachim; and Ziegert, Thomas 08015686 Cl. 29-432.2.
Newhall, William G.: See--
Paschen, Dean A.; Newhall, William G.; and Leifer, Mark C. 08018371 Cl. 342-90.
Newman, Linda; Happ, Venus; Happ, Jim; and Moulton, Tom, to Labcon, North America Container label D0645092 Cl. D20-22.
Newman, Yona: See--
Baraz, Benjamin; Nemirovsky, Edward; and Newman, Yona 08019278 Cl. 455-11.1.
Nexeon Ltd.: See--
Green, Mino 08017430 Cl. 438-95.
Nexify, Inc.: See--
Hauser, Eduardo 08019777 Cl. 707-769.
NeXolve Corporation: See--
Poe, Garrett; and Farmer, Brandon 08017698 Cl. 525-418.
Nextel Communications, Inc.: See--
Izdepski, Erich J. 08019271 Cl. 455-3.01.
Nexter Munitions: See--
Caillaut, Nicolas 08015923 Cl. 102-431.
Nezaki, Takuya; to Toyota Jidosha Kabushiki Kaisha Vehicle occupant restraint apparatus 08016318 Cl. 280-733.
NFR Security Inc.: See--
Frantzen, Michael T.; and Yee, Andre 08020208 Cl. 726-23.
Ng, John: See--
Balestriere, Giacomo; Woodman, III, Gilbert Rouse; and Ng, John 08019893 Cl. 709-246.
Ng, Kam C.: See--
Hawkins, Gilbert A.; Gao, Zhanjun; Xie, Yonglin; Furlani, Edward P.; and Ng, Kam C. 08016395 Cl. 347-74.
Ng, Maggie C. Y.: See--
Chan, Juliana C. N.; Ng, Maggie C. Y.; and So, Wing Yee 08017333 Cl. 435-6.1.
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Ngia, Lester S. H.; Pruthi, Tarun; and Vlach, Christopher F., to Think-A-Move Ltd. Earset assembly having acoustic waveguide 08019107 Cl. 381-338.
NGK Insulators, Ltd.: See--
Tomita, Takahiro; Takahashi, Kaori; Morimoto, Kenji; and Noguchi, Yasushi 08017214 Cl. 428-116.
NGK Spark Plug Co., Ltd.: See--
Sasanuma, Takeo; and Sato, Yoshikuni 08017080 Cl. 422-82.12.
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Nguyen, Corinne: See--
Gilbert, Ian; Nguyen, Corinne; Schipani, Alessandro; Kasinathan, Ganasan; Johansson, Nils-Gunnar; Pacanowska, Dolores Gonzalez; and Ruda, Gian Filippo 08017620 Cl. 514-269.
Nguyen, Cuong Duy Pedicure chair base with side glass panels and removable trim D0644847 Cl. D6-336.
Nguyen, David: See--
Barth, Richard M.; Ware, Frederick A.; Stark, Donald C.; Hampel, Craig E.; Davis, Paul G.; Abhyankar, Abhijit M.; Gasbarre, James A.; and Nguyen, David 08019958 Cl. 711-167.
Nguyen, Hung O.: See--
Nguyen, Sang Thanh; Tran, Hieu Van; Nguyen, Hung O.; and Klotzkin, Phil 08020055 Cl. 714-718.
Nguyen, Hung Q.: See--
Tran, Hieu Van; Ly, Anh; Nguyen, Hung Q.; and Vu, Thuan T. 08018773 Cl. 365-185.2.
Nguyen, Huy T. Vertical windmill 08016544 Cl. 415-60.
Nguyen, Khiem K.: See--
Chandrachood, Madhavi R.; Grimbergen, Michael N.; Nguyen, Khiem K.; Lewington, Richard; Ibrahim, Ibrahim M.; Panayil, Sheeba J.; and Kumar, Ajay 08017029 Cl. 216-59.
Nguyen, Lamson; and Weller, Jeanne Marie, to Reckitt Benckiser Inc. Dispensing device 08015629 Cl. 4-227.1.
Nguyen, Lau: See--
Wu, Zining; Nguyen, Lau; Sutardja, Pantas; Lee, Chi-Kong; and Yoon, Tony 08019959 Cl. 711-171.
Nguyen, Le Trong: See--
Brashears, Cheryl Senter; Wang, Johannes; Nguyen, Le Trong; Lentz, Derek J.; Miyayama, Yoshiyuki; Garg, Sanjiv; Hagiwara, Yasuaki; Lau, Te-Li; Wang, Sze-Shun; and Trang, Quang H. 08019975 Cl. 712-225.
Nguyen, Man; to Microsoft Corporation Flexible system health and remediation agent 08019857 Cl. 709-224.
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Nguyen, Sang Thanh; Tran, Hieu Van; Nguyen, Hung O.; and Klotzkin, Phil, to Silicon Storage Technology, Inc. Method and apparatus for testing the connectivity of a flash memory chip 08020055 Cl. 714-718.
Nguyen, Thao Thu: See--
Rosenberg, Stuart; Keel, Allen; Ryu, Kyungmoo; Hou, Wenbo; Noren, Kjell; Nguyen, Thao Thu; and Yang, Michael 08019409 Cl. 600-513.
Nguyen, The-Linh: See--
Daghighian, Henry M.; Nguyen, The-Linh; and Ekkizogloy, Luke M. 08019225 Cl. 398-135.
Nguyen, Uoc: See--
Mathieson, Rono; Schacht, Bryan K.; Chrisop, Roy; Richardson, Tanna; Plewnia, Bogdan; Sojian, Lena; Lum, Joey; Stevens, Mark; Nguyen, Uoc; and Yamamura, Shinichi 08018610 Cl. 358-1.15.
NHK Spring Co., Ltd.: See--
Nakayama, Hiroshi; Nagaya, Mitsuhiro; and Yamada, Yoshio 08018242 Cl. 324-755.01.
Nice, Nir: See--
Shiran, Tomer; Bitan, Sara; Nice, Nir; de Borst, Jeroen; Field, Dave; and Herzog, Shai 08020197 Cl. 726-5.
Nicholas, George F.: See--
Moores, Nigel G.; and Nicholas, George F. 08016241 Cl. 244-171.7.
Nicholas, Michael: See--
Vardis, Nicholas; and Nicholas, Michael D0644960 Cl. D12-92.
Nicholson, John: See--
Kerschner, Judith; Murphy, Gerald J.; and Nicholson, John 08017687 Cl. 524-731.
Nickel, Alexander: See--
Kawakami, Keiji; and Nickel, Alexander 08017870 Cl. 174-153G.
Nickell, Andrew: See--
Behm, James; Boston, Brian; Floyd, Thomas; Hernandez, Alejandro; Leitz, Richard; Moots, Craig; and Nickell, Andrew 08017841 Cl. 800-312.
Nicolas, Florence: See--
Constancis, Alain; Nicolas, Florence; Meyrueix, Rémi; and Soula, Olivier 08017156 Cl. 424-499.
Nicolette, Michael R.; Schweigert, Bradley D.; and Chen, Xiaojian, to Karsten Manufacturing Corporation Golf club head D0645104 Cl. D21-759.
Nidec Corporation: See--
Teshima, Hiroyoshi; Takeshita, Kazumi; Konishi, Hideaki; Ida, Kiyoto; and Takaoka, Tsukasa 08016556 Cl. 415-206.
Yasumoto, Nobuaki; Takaki, Hitoshi; Yamada, Masahiro; and Kawano, Yosuke 08018107 Cl. 310-91.
Nidec Motor Corporation: See--
Lyle, David M. 08018115 Cl. 310-216.009.
Nidec Sankyo Corporation: See--
Shimoyama, Takeshi 08018101 Cl. 310-51.
Nidek Co., Ltd.: See--
Kawai, Noriji; Miwa, Tetsuyuki; and Otake, Kunihiko 08016418 Cl. 351-205.
Matsuyama, Yoshinori 08015716 Cl. 33-200.
Nie, Kaibao; Atlas, Les; Rubinstein, Jay; Li, Xing; and Clark, Charles Pascal, to University of Washington Enhanced signal processing for cochlear implants 08019431 Cl. 607-57.
Nie, Xiaochun: See--
Tong, Xin; and Nie, Xiaochun 08018994 Cl. 375-240.
Niedecken, Timothy G.: See--
Stroman, Richard D.; Afimiwala, Khurshid A.; Gibb, James B.; Brink, Philip C.; Crain, Scott L.; and Niedecken, Timothy G. 08019633 Cl. 705-7.11.
Niedermeier, Christoph: See--
Dillinger, Markus; Niedermeier, Christoph; and Schmid, Reiner 08020061 Cl. 714-746.
Niegowski, James A.: See--
Berner, Jr., William E.; Shum, Albert; Case, Jr., Charles W.; Schrock, Allan M.; Niegowski, James A.; and Rauchholz, William F. 08015732 Cl. 36-136.
Niehorster, Keith; Udupi, Kishan Kumar; Kumble, Rajaram; and Roberts, Paul, to Meritor Heavy Vehicle Braking Systems (UK) Limited Disc brake operating mechanism 08016082 Cl. 188-72.9.
Nielsen, Arnold T.: See--
Norris, William P.; and Nielsen, Arnold T. 08017768 Cl. 540-554.
Nielsen Company (US), LLC, The: See--
Deng, Kevin 08020180 Cl. 725-19.
Mears, Paul M.; and Ramaswamy, Arun 08020179 Cl. 725-9.
Zhang, Min; Wright, David Howell; Cooper, Scott; Dykstra, Regina; Ramaswamy, Arun; and Nelson, Daniel 08019162 Cl. 382-199.
Nielsen, Hanne Wulf: See--
Grarup, Jesper; and Nielsen, Hanne Wulf 08017627 Cl. 514-317.
Nielsen, Jorgen Duelund: See--
Kristensen, Martin Borchsenius; and Nielsen, Jorgen Duelund 08015854 Cl. 72-420.
Nielsen, Thomas Alan; to Google Inc. Systems and methods for indicating a user state in a social network 08019875 Cl. 709-227.
Niermeyer, J. Karl: See--
Brodeur, Craig L.; Laverdiere, Marc; McLoughlin, Robert F.; Niermeyer, J. Karl; and Shyu, Jieh-Hwa 08015995 Cl. 137-487.5.
Nieuw-Amerongen, Arie: See--
Mollenhauer, Jan; End, Caroline; Blaich, Stephanie; Bergmann, Gaby; Renner, Marcus; Lyer, Stefan; Wittig, Rainer; Poustka, Annemarie; Bikker, Floris; Ligtenberg, Antoon; Nieuw-Amerongen, Arie; and Veerman, Enno 08017124 Cl. 424-185.1.
Nifty Home Products, Inc.: See--
Tiemann, Frank R. D0644882 Cl. D7-601.
Nigam, Kamal P.: See--
Provos, Niels; Zhou, Yunkai; Bavor, Jr., Clayton W.; Davis, Eric L.; Palatucci, Mark; Nigam, Kamal P.; Monson, Christopher K.; Mavrommatis, Panayiotis; and Nakauchi, Rachel 08019700 Cl. 706-12.
Niheu, Eric K.; Blakey, Robert V.; Chiu, Sherwin S.; and Haynie, Roger, to Accenture Global Services Limited System and method of integrating enterprise applications 08019632 Cl. 705-7.11.
Nihon Dempa Kogyo Co., Ltd.: See--
Umeki, Mitoshi; Saito, Takefumi; and Ichikawa, Ryoichi 08018126 Cl. 310-344.
Nihon University: See--
Takao, Kyoichi; Hidai, Chiaki; Koike, Fumihiko; Takao, Tetsuya; and Suga, Hinako 08017334 Cl. 435-6.12.
Takao, Kyoichi; Ikeda, Minoru; and Onoda, Keiko 08017336 Cl. 435-6.12.
Nii, Koji: See--
Yabuuchi, Makoto; and Nii, Koji 08018785 Cl. 365-189.11.
Niigata University: See--
Toda, Kenji; Uematsu, Kazuyoshi; Sato, Mineo; Umeda, Tetsu; and Ito, Yutaka 08017039 Cl. 252-301.4P.
Niimi, Yasuhiko: See--
Fujita, Tatsuya; Niimi, Yasuhiko; Kotoh, Takashi; Mizuno, Hideaki; Watanabe, Nobuo; and Matsumoto, Tadaichi 08017276 Cl. 429-432.
Niina, Hiroshi; to Kabushiki Kaisha Toshiba System, method, and apparatus for searching information across distributed databases 08019778 Cl. 707-770.
NIKE, Inc.: See--
Berner, Jr., William E.; Shum, Albert; Case, Jr., Charles W.; Schrock, Allan M.; Niegowski, James A.; and Rauchholz, William F. 08015732 Cl. 36-136.
Hazenberg, Klaas Pieter 08015730 Cl. 36-29.
Stites, John Thomas 08016691 Cl. 473-290.
Nikitin, Vladimir: See--
Hsiao, Wen-Chien David; and Nikitin, Vladimir 08018679 Cl. 360-125.07.
Nikolaev, Igor; and Madrid, Susan Mampusti, to Danisco A/S Transcription factors 08017341 Cl. 435-6.15.
Nikolchev, Julian; to Biosensors International Group, Ltd. Guidewire-less stent delivery methods 08016869 Cl. 623-1.11.
Nikon Corporation: See--
Adachi, Hiroaki; and Kitano, Hiroshi 08016940 Cl. 117-8.
Ebihara, Akimitsu 08018575 Cl. 355-53.
Fujiwara, Tomoharu 08018571 Cl. 355-30.
Kameyama, Masaomi 08018570 Cl. 355-30.
Morishita, Akihiko; Toyoda, Takafumi; and Ito, Daiki 08018503 Cl. 348-231.6.
Novak, W. Thomas 08018657 Cl. 359-649.
Yamamoto, Hajime; Isogami, Tohru; Suzuki, Kazuaki; and Hirayanagi, Noriyuki 08018577 Cl. 355-67.
Nilsen, Martin J.; to Illinois Tool Works Inc. Fastener assembly and manufacturing method therefor 08016534 Cl. 411-360.
Nilsson, David: See--
Tehrani, Payman; Robertsson, Mats; Nilsson, David; Larsson, Oscar; Robinson, Nathaniel D.; and Groppfeldt, Rune 08018347 Cl. 340-588.
Nimri, Alain: See--
Shao, Junqing; and Nimri, Alain 08018481 Cl. 348-14.01.
Ningbo Changsheng Electric Appliances Co., Ltd.: See--
Pan, Huandong 08015916 Cl. 99-388.
Ninomiya, Masanobu: See--
Takemasa, Kenji; Fuse, Toshihiko; Kudari, Mitsuru; and Ninomiya, Masanobu 08016264 Cl. 251-208.
Nintendo Co., Ltd.: See--
Yamamoto, Masao; and Kawanobe, Naoya 08016671 Cl. 463-30.
Yoshino, Hiroshi; Ohta, Keizo; Yasumoto, Yoshitaka; Nishida, Kenji; Sugino, Kenichi; Ibuki, Masato; Murakawa, Teruki; and Yamamoto, Soichi 08016681 Cl. 463-43.
Nippon Kayaku Kabushiki Kaisha: See--
Sudo, Atsushi; Kurakami, Tatsuhiko; Kojima, Toshitake; Hayashimoto, Shigeo; and Kobayashi, Yasushi 08017547 Cl. 502-318.
Nippon Light Metal Company, Ltd.: See--
Zhao, Pizhi; Anami, Toshiya; Kobayashi, Takayuki; and Tsuchiya, Kiyomi 08016958 Cl. 148-440.
Nippon Oil Corporation: See--
Ikeda, Satoru; and Uesaka, Tetsuya 08018552 Cl. 349-75.
Yanagawa, Shinichirou; Kondo, Hidesato; and Hara, Michikazu 08017724 Cl. 528-481.
Nippon Sheet Glass Company, Limited: See--
Seto, Hiromitsu; Koyama, Akihiro; and Nagashima, Yukihito 08017537 Cl. 501-71.
Nippon Shokubai Co., Ltd.: See--
Shima, Masahide; Sento, Tadashi; Mikawa, Masatsugu; and Hirota, Hiroyuki 08017546 Cl. 502-243.
Nippon Steel Corporation: See--
Arai, Satoshi; Hamamura, Hideyuki; Sakai, Tatsuhiko; Sato, Kaoru; and Kobayashi, Hideyuki 08016951 Cl. 148-308.
Yamasaki, Shingo; Hirakami, Daisuke; Tarui, Toshimi; and Nishida, Seiki 08016953 Cl. 148-328.
Nippon Telegraph and Telephone Corporation: See--
Mitasaki, Tokinobu; Senda, Masakatsu; Ueno, Masahiro; and Tanabe, Takaya 08018636 Cl. 359-2.
Nishi, Yuji; and Takemoto, Takeshi, to Toyota Jidosha Kabushiki Kaisha Control system of secondary battery and hybrid vehicle equipped with the same 08018203 Cl. 320-136.
Nishibori, Shin: See--
Andre, Bartley K.; Coster, Daniel J.; De Iuliis, Daniele; Howarth, Richard P.; Ive, Jonathan P.; Jobs, Steve; Kerr, Duncan Robert; Nishibori, Shin; Rohrbach, Matthew Dean; Satzger, Douglas B.; Seid, deceased, Calvin Q.; Stringer, Christopher J.; Whang, Eugene Antony; and Zorkendorfer, Rico D0645037 Cl. D14-341.
Nishida, Hiroto: See--
Hasegawa, Kazunori; Nakayama, Tsukasa; Nishida, Hiroto; and Nakade, Isamu 08020178 Cl. 720-662.
Nishida, Junji; to Ricoh Company, Ltd. Switching regulator 08018207 Cl. 323-222.
Nishida, Kazuhiro: See--
Mizutani, Hiroyuki; Nishida, Kazuhiro; Tsuru, Masaomi; Kawakami, Kenji; Hieda, Morishige; and Miyazaki, Moriyasu 08018290 Cl. 331-60.
Nishida, Kenji: See--
Yoshino, Hiroshi; Ohta, Keizo; Yasumoto, Yoshitaka; Nishida, Kenji; Sugino, Kenichi; Ibuki, Masato; Murakawa, Teruki; and Yamamoto, Soichi 08016681 Cl. 463-43.
Nishida, Seiki: See--
Yamasaki, Shingo; Hirakami, Daisuke; Tarui, Toshimi; and Nishida, Seiki 08016953 Cl. 148-328.
Nishida, Shinichi; Yokoyama, Katsunori; Shimizu, Yasushi; Hagiwara, Kazunari; Sakaizawa, Katsuhiro; Endo, Rie; and Kichijima, Naoto, to Canon Kabushiki Kaisha Developing apparatus 08019258 Cl. 399-274.
Nishide, Hiroyuki: See--
Endo, Hiroko; Nishide, Hiroyuki; Sonai, Atsuo; Tago, Takahiro; and Okayasu, Teruyuki 08017659 Cl. 521-25.
Nishide, Shuichi: See--
Sato, Masahiro; and Nishide, Shuichi 08019262 Cl. 399-302.
Nishihara, Tokihiro: See--
Ueda, Masanori; Iwaki, Masafumi; Nishihara, Tokihiro; Taniguchi, Shinji; Endo, Go; and Ebata, Yasuo 08018298 Cl. 333-133.
Nishijima, Eiichi: See--
Nawata, Teruhiko; Yasumura, Ken; Yanagi, Hiroyuki; and Nishijima, Eiichi 08016942 Cl. 117-30.
Nishikawa, Kazuhiko: See--
Bokui, Takahiro; and Nishikawa, Kazuhiko 08019565 Cl. 702-107.
Nishikori, Hitoshi: See--
Iwasaki, Osamu; Takahashi, Kiichiro; Nishikori, Hitoshi; Otsuka, Naoji; Teshigawara, Minoru; Edamura, Tetsuya; Nakagawa, Yoshinori; and Seki, Satoshi 08016386 Cl. 347-43.
Nishimine, Hiroaki: See--
Ohtani, Bunsho; Abe, Ryu; Sakatani, Yoshiaki; Murata, Makoto; and Nishimine, Hiroaki 08017238 Cl. 428-403.
Nishimuda, Keiichi; to Renesas Electronics Corporation Semiconductor integrated circuit with multi-cut via and automated layout method for the same 08020133 Cl. 716-122.
Nishimura, Akito: See--
Takaoka, Atsushi; Nishimura, Akito; and Hayashi, Yukio 08016491 Cl. 385-60.
Nishimura, Shunsuke: See--
Fujii, Takayuki; Yamauchi, Manabu; Watanabe, Naoto; Nishimura, Shunsuke; Oka, Yushi; Miyake, Toshiyuki; and Yokoya, Takashi 08019270 Cl. 399-408.
Nishimura, Yasuharu; Nakatsura, Tetsuya; and Ikuta, Yoshiaki, to Kumamoto University Diagnostic kit for malignant melanoma 08017345 Cl. 435-7.1.
Nishimura, Yoshiko; to Kyocera Mita Corporation Image forming device storing print data corresponding to threshold value 08018608 Cl. 358-1.14.
Nishino, Hajime: See--
Fujikawa, Masato; Kasamatsu, Shinji; Nishino, Hajime; Takezawa, Hideharu; and Shimada, Mikinari 08017262 Cl. 429-144.
Nishino, Seiji: See--
Shiono, Teruhiro; Nishino, Seiji; and Itoh, Tatsuo 08018801 Cl. 369-44.23.
Nishino, Yuuki: See--
Okamura, Daiji; Takuhara, Hiroyuki; Nishino, Yuuki; Sanada, Mikio; Moribe, Kenji; and Kudo, Satoshi 08016932 Cl. 106-31.89.
Nishioka, Yoshihiro: See--
Bando, Takuji; Aoki, Satoshi; Kawasaki, Junichi; Ishigami, Makoto; Taniguchi, Youichi; Yabuuchi, Tsuyoshi; Fujimoto, Kiyoshi; Nishioka, Yoshihiro; Kobayashi, Noriyuki; Fujimura, Tsutomu; Takahashi, Masanori; Abe, Kaoru; Nakagawa, Tomonori; Shinhama, Koichi; Utsumi, Naoto; Tominaga, Michiaki; Ooi, Yoshihiro; Yamada, Shohei; and Tomikawa, Kenji 08017615 Cl. 514-253.07.
Nishitani, Hikaru: See--
Fukui, Yusuke; Tsujita, Takuji; Hashimoto, Jun; Nishitani, Hikaru; Terauchi, Masaharu; and Nishitani, Mikihiko 08018154 Cl. 313-582.
Nishitani, Mikihiko: See--
Fukui, Yusuke; Tsujita, Takuji; Hashimoto, Jun; Nishitani, Hikaru; Terauchi, Masaharu; and Nishitani, Mikihiko 08018154 Cl. 313-582.
Nishiyama, Koji: See--
Hamada, Tetsuya; and Nishiyama, Koji 08015985 Cl. 134-99.1.
Nishiyama, Toshihiko; and Iijima, Koji, to Komatsu Ltd. Exhaust gas purification device for internal combustion engine 08015802 Cl. 60-286.
Nishizaki, Masahiro: See--
Kato, Masahito; and Nishizaki, Masahiro 08016404 Cl. 347-96.
Nishizawa, Hirotaka; Yukawa, Yosuke; and Totsuka, Takashi, to Renesas Electronics Corporation IC card with terminals for direct access to internal components 08018038 Cl. 257-679.
Nissan Motor Co., Ltd.: See--
Hirata, Takeshi 08016367 Cl. 303-151.
Murayama, Masami; and Iriyama, Masahiro 08016723 Cl. 477-110.
Nissha Printing Co., Ltd.: See--
Omote, Ryoumei; and Takagi, Takayuki 08018645 Cl. 359-320.
Nisshin Steel Co., Ltd.: See--
Sasaki, Hirokazu; Nakamura, Naofumi; Morikawa, Shigeru; Hashimoto, Hideto; Kimura, Takaaki; and Kawai, Yoshihiko 08015851 Cl. 72-347.
Nissin Ion Equipment Co., Ltd.: See--
Matsumoto, Takao; and Nagai, Nobuo 08017922 Cl. 250-492.21.
Nissl, Florian Dieter; to Bayerische Motoren Werke Aktiengesellschaft Wheel or wheel cover D0644976 Cl. D12-209.
Nito, Yasuhiro: See--
Hakamada, Shinichi; Imai, Takashi; Sanada, Mikio; Nito, Yasuhiro; Iwata, Tetsu; and Sugama, Sadayuki 08016406 Cl. 347-100.
Nitto Denko Corporation: See--
Honjo, Mitsuru; and Kamei, Katsutoshi 08017874 Cl. 174-255.
Ito, Hisataka; Ota, Shinya; Fuke, Kazuhiro; and Uenishi, Shinjiro 08017670 Cl. 523-400.
Kanagawa, Hitoki; Ohsawa, Tetsuya; and Ooyabu, Yasunari 08015703 Cl. 29-842.
Kuriu, Atsushi; Itou, Takio; Ukei, Hiroichi; and Matsunaga, Manabu 08017533 Cl. 442-221.
Naito, Toshiki; Ohsawa, Tetsuya; and Kataoka, Kouji 08017871 Cl. 174-250.
Nakazono, Takuya; Umemoto, Seiji; and Shimanoe, Fumihito 08016965 Cl. 156-64.
Takemura, Keiji 08017309 Cl. 430-322.
Niu, Nolen P.; to Skyline Beauty & Spa Products, Inc. Pedicure spa platform D0645155 Cl. D24-204.
Niwa, Masakazu: See--
Iwashita, Yasusuke; Okita, Tadashi; Niwa, Masakazu; and Yamamoto, Kenta 08018747 Cl. 363-89.
Niwa, Yoshikatsu: See--
Takase, Tsunemitsu; Niwa, Yoshikatsu; Masunaga, Shinya; Takemura, Tomoaki; and Otani, Junichi 08019202 Cl. 386-350.
Niwas, Shri: See--
Merrill, Bryon A.; Haraldson, Chad A.; Kshirsagar, Tushar A.; and Niwas, Shri 08017779 Cl. 546-82.
Noack, Bernd R.: See--
Bertolotti, Fabio R.; Liscinsky, David S.; Nardone, Vincent C.; Sabatino, Daniel R.; Sahm, Michael K.; and Noack, Bernd R. 08015827 Cl. 60-785.
Nobel Biocare Services AG: See--
Hall, Jan 08016593 Cl. 433-174.
Nobels, Jonathan; to Research in Motion Limited Device and method for inserting captured image data into a document 08018518 Cl. 348-333.02.
Nobori, Kunio: See--
Azuma, Takeo; Nobori, Kunio; Motomura, Hideto; and Hirose, Yoshifumi 08018500 Cl. 348-222.1.
Noda, Masahide; and Okuyama, Satoshi, to Fujitsu Limited Telephone conversation resumption system, telephone conversation resumption program, telephone conversation resumption method, portable terminal and relay apparatus 08019349 Cl. 455-445.
Noe, Daniel: See--
Buckles, John; Noe, Daniel; Butz, Gregory; Besselle, Shereen; Harter, Adam; and Jafa, Emad D0644859 Cl. D6-491.
Noel, Thomas Olivier Marie: See--
Cazalens, Michel Pierre; and Noel, Thomas Olivier Marie 08015813 Cl. 60-737.
Noguchi, Eri: See--
Marumoto, Yoshitomo; Yamaguchi, Hiromitsu; Tsuboi, Hitoshi; Jahana, Ryoki; Uji, Ayako; and Noguchi, Eri 08018621 Cl. 358-1.9.
Noguchi, Kouichi; Matsumura, Kazuyuki; Mitsunaga, Takesi; and Kanegasaki, Shiro, to Hirata Corporation Solution temperature control device in cell observation chamber 08017383 Cl. 435-288.7.
Noguchi, Toru: See--
Abe, Hiroyuki; Tanaka, Masahiro; Sugimoto, Kazuyuki; Suma, Akira; Yokota, Masahiro; Shiozaki, Makoto; Iio, Kiyosei; Ueyama, Kazuhito; Motoda, Dai; Noguchi, Toru; Adachi, Tsuyoshi; Tsuruha, Junichiro; and Doi, Satoki 08017612 Cl. 514-252.12.
Noguchi, Yasushi: See--
Tomita, Takahiro; Takahashi, Kaori; Morimoto, Kenji; and Noguchi, Yasushi 08017214 Cl. 428-116.
Noguchi, Yuji: See--
Adachi, Eiji; Kato, Yuichi; Soeno, Daisuke; Noguchi, Yuji; Fuse, Tomohiro; and Hayashi, Kazuhito 08016307 Cl. 280-152.1.
Noh, Hyung-Gon; to Samsung SDI Co., Ltd. Electrode for a fuel cell, and a membrane-electrode assembly and fuel cell system comprising the same 08017284 Cl. 429-532.
Noh, Sok Won; Kim, Mu Hyun; Kim, Sun Hoe; Song, Myung Won; Seong, Jin Wook; Lee, Seong Taek; and Lee, Sang Bong, to Samsung Mobile Display Co., Ltd. Laser induced thermal imaging apparatus and laser induced thermal imaging method and organic light emitting display device using the same 08017295 Cl. 430-200.
Noh, Yo-Hwan; to Mtekvision Co., Ltd. Image processing method and device using different clock rates for preview and capture modes 08018499 Cl. 348-222.1.
Noh, Yu Jin: See--
Lee, Dae Won; Kim, Ki Jun; Roh, Dong Wook; Noh, Yu Jin; Ahn, Joon Kui; and Lee, Jung Hoon 08019332 Cl. 455-422.1.
Nokia Corporation: See--
Faccin, Stefano 08019344 Cl. 455-437.
Frederiksen, Frank; and Kolding, Troels Emil RE042692 Cl. 370-335.
Grigoriev, Nikolai; Thorkelsson, Haraldur; and Regnier, Jean 08019055 Cl. 379-88.17.
Hämäläinen, Jyri; and Tiirola, Esa 08018904 Cl. 370-334.
Ignatius, Jan; and Kokkonen, Petri 08019361 Cl. 455-456.5.
Kallio, Janne 08019335 Cl. 455-426.1.
Koskela, Jarkko T.; and Sebire, Benoist P. 08019334 Cl. 455-423.
Kossi, Jouni; and Virtanen, Martti E. 08019383 Cl. 455-553.1.
Makinen, Jari 08019599 Cl. 704-221.
Mantysalo, Tapio 08018834 Cl. 370-210.
Ojanen, Martti; and Virta, Hannu 08019294 Cl. 455-127.1.
Sipila, Juha P.; and Gustafsson, Sture 08019374 Cl. 455-522.
Trevelyan, Philip; Ivanov, Angel; Kirilov, Emil; and Vasilev, Ivan 08018525 Cl. 348-371.
Nokia Siemens Networks GmbH & Co. KG: See--
Falk, Rainer; Luo, Jijun; Mohyeldin, Eiman Bushra; and Schulz, Egon 08019341 Cl. 455-434.
Nold, III, Raymond V.; Zazovsky, Alexander F.; Landsiedel, Nathan; Ellson, Nicholas; and Vaynshteyn, Vladimir, to Schlumberger Technology Corporation Methods and apparatus to perform pressure testing of geological formations 08015869 Cl. 73-152.51.
Noldus, Rogier August; to Telefonaktiebolaget L M Ericsson (Publ) Charging of a short message transmission 08019319 Cl. 455-406.
Noller, Thomas; to Eisenmann Anlagenbau GmbH & Co. KG Electrodipping device 08016994 Cl. 204-623.
Nollet, Vincent; Coene, Paul; Marescaux, Theodore; Avasare, Prabhat; Mignolet, Jean-Yves; Vernalde, Serge; and Verkest, Diederik, to Interuniversitair Microelektronica Centrum (IMEC) Heterogeneous multiprocessor network on chip devices, methods and operating systems for control thereof 08020163 Cl. 718-104.
Nomoto, Akhiro; to Sony Corporation Method for manufacturing semiconductor device 08017431 Cl. 438-99.
Nomura, Akihiko; to Oki Semiconductor Co., Ltd. Sensor device and method for fabricating sensor device 08015875 Cl. 73-514.33.
Nomura, Hiroshi; and Kakiuchi, Shinichi, to Hoya Corporation Optical axis correction apparatus of an imaging device, and optical axis correction method for an imaging device 08019209 Cl. 396-55.
Nomura, Katsuyoshi: See--
Shimada, Tatsuya; Takada, Tooru; Tomikawa, Jun; Kageyama, Dan; Sasaki, Yuri; and Nomura, Katsuyoshi 08015638 Cl. 5-611.
Nomura, Kazukiyo: See--
Horikoshi, Takahiro; Nomura, Kazukiyo; Kawamoto, Naoshi; and Tobita, Etsuo 08017678 Cl. 524-168.
Nomura, Ryoji: See--
Yamazaki, Shunpei; Nomura, Ryoji; Seo, Satoshi; Abe, Hiroko; and Nakamura, Yasuo 08018152 Cl. 313-509.
Nonaka, Isao: See--
Tsukahara, Koju; Ozawa, Shigeyuki; and Nonaka, Isao 08016989 Cl. 204-428.
Nonami, Hideaki: See--
Arai, Mitsuru; Wada, Shinichiro; and Nonami, Hideaki 08018006 Cl. 257-374.
Nonomura, Itaru: See--
Hotta, Yoshihiko; Saito, Seiichi; Hamasaki, Hiroyuki; Hara, Hirotaka; and Nonomura, Itaru 08018784 Cl. 365-189.05.
Nord, Richard J.: See--
Low, Steven C.; Clark, Jerry G.; Muylaert, Neal W; Nord, Richard J.; Thompson, Blair E.; Ake, Bryan E.; and Williams, Reid W. 08017070 Cl. 419-26.
Nordby, II, David C.; Conohan, Dennis F.; Johnson, Noel R.; Mikelsons, Andi J.; Schultz, Steve O.; Lehman, Jerome P.; and Pulsfus, Seth T., to Alkar-RapidPak-MP Equipment, Inc. Food product carrier 08015917 Cl. 99-443C.
Nordlund, Raymond Scott: See--
Wilson, Jody W.; Nordlund, Raymond Scott; and Weaver, Adam 08015818 Cl. 60-755.
Nordson Corporation: See--
Fort, Wesley C. 08016734 Cl. 493-264.
Noren, Kjell: See--
Rosenberg, Stuart; Keel, Allen; Ryu, Kyungmoo; Hou, Wenbo; Noren, Kjell; Nguyen, Thao Thu; and Yang, Michael 08019409 Cl. 600-513.
Noriega, Dimas; to AT&T Intellectual Property I, L.P. System and method for multi-services packet network traffic engineering 08018925 Cl. 370-370.
Norimatsu, Takeshi: See--
Takagi, Yoshiaki; Chong, Kok Seng; Norimatsu, Takeshi; Miyasaka, Shuji; Kawamura, Akihisa; Ono, Kojiro; and Ishikawa, Tomokazu 08019614 Cl. 704-501.
Norin, John; and Ho, Kesse, to DIRECTV Group, Inc., The Band upconverter approach to KA/KU signal distribution 08019275 Cl. 455-3.02.
Norman, Daren R.; Yoon, Woo Y.; Jones, James L.; Haskell, Kevin J.; Bennett, Brion D.; Tschaggeny, Charles W.; and Jones, Warren F., to Battelle Energy Allliance, LLC Radiation collimator and systems incorporating same 08017926 Cl. 250-505.1.
Norman, Robert; to Unity Semiconductor Corporation Serial memory interface 08018790 Cl. 365-230.05.
Norman, Robert; to Unity Semiconductor Corporation Combined memories in integrated circuits 08020132 Cl. 716-119.
Noro, Masaki; and Yoneyama, Hiroyuki, to Fujifilm Corporation Antireflection film, polarizing plate and image display 08017242 Cl. 428-421.
Norris-Caneda, Kim: See--
Bloksberg, Leonard N.; Frost, Michael J.; Forster, Richard; Higgins, Colleen; Rottmann, William H.; and Norris-Caneda, Kim 08017833 Cl. 800-286.
Norris, James W.; and Merry, Brian D., to United Technologies Corporation Geared counter-rotating gas turbofan engine 08015798 Cl. 60-268.
Norris, Joseph Thomas; Mayers, Jeffrey; and Stagl, Peter Dispenser 08016157 Cl. 221-286.
Norris, William P.; and Nielsen, Arnold T., to United States of America as represented by the Secretary of the Navy, The Catalitic synthesis of caged polynitramine compounds 08017768 Cl. 540-554.
Norsworthy, Steven R.; and Redgrave, Jason Rupert, to STMicroelectronics NV Noise shaped interpolator and decimator apparatus and method 08019035 Cl. 375-372.
Nortel Networks Limited: See--
Ellis, Donald Russell; and Charbonneau, Martin 08019841 Cl. 709-223.
Jian, Chun-Yun 08018304 Cl. 333-189.
Ma, Jianglei; Jia, Ming; Zhu, Peiying; and Tong, Wen 08018975 Cl. 370-509.
Tenneti, Surya; Nesargi, Sanket; and Li, Jun 08019343 Cl. 455-436.
North American Rescue, LLC: See--
McKay, Sean 08016335 Cl. 294-152.
McKay, Sean; O'Neal, David E.; and Dobbins, Arthur L. 08015619 Cl. 2-69.
Northern Technologies International Corporation: See--
Lyublinski, Efim Ya; and Kubik, Donald A. 08017203 Cl. 428-34.1.
Northrop Grumman Systems Corporation: See--
Ewing, Kenneth James; Whiton, Jr., Fred; Kahl, Jr., Paul George; and Santori, John Paul 08019466 Cl. 700-225.
Jones, Gregory O.; and Campbell, Michael E. 08019336 Cl. 455-431.
May, Jack; and Stearns, Stephen D. 08017894 Cl. 250-203.3.
Nathanson, Harvey C.; Young, Robert M.; Smith, Joseph T.; Howell, Robert S.; and Mitchell, Archer S. 08018053 Cl. 257-717.
Rice, Robert Rex; and Folkman, Mark Alan 08018647 Cl. 359-334.
Veliadis, John Victor D.; and Snook, Megan J. 08018022 Cl. 257-491.
Northwest University: See--
Zheng, Xiaohui; Zhang, Qunzheng; Wang, Shixiang; and Zhao, Xinfeng 08017786 Cl. 546-318.
Northwestern University: See--
Chiesl, Thomas N.; and Barron, Annelise E. 08017682 Cl. 524-555.
Marks, Tobin J.; Facchetti, Antonio; Byrne, Paul D.; and Kim, Hyun Sung 08017458 Cl. 438-149.
Saha, Arup; and Olson, Gregory B. 08016954 Cl. 148-328.
Norton, Richard Elliott; Poirier-Beauchemin, Louis-Rene; Héroux, Robert; and Lavalliere, Mario Joseph Leo Claude, to Vantrix Corporation Method and system for rule-based content filtering 08019709 Cl. 706-45.
Nose, Koichi; Ishizaki, Haruya; and Mizuno, Masayuki, to Nec Corporation Modulation device and pulse wave generation device 08018295 Cl. 332-100.
Nose, Koichi; and Mizuno, Masayuki, to NEC Corporation Signal measuring device 08019560 Cl. 702-57.
Nothhard, Gary E.: See--
Silverstein, Barry D.; Bietry, Joseph R.; Metzger, Robert; Nothhard, Gary E.; and Corey, Richard P. 08016422 Cl. 353-20.
Notomi, Tsugunori; and Nagamine, Kentaro, to Eiken Kagaku Kabushiki Kaisha Method of amplifying nucleic acid by using double-stranded nucleic acid as template 08017357 Cl. 435-91.2.
Nottingham Spirk: See--
Saunders, Craig; Kalman, Jeffrey; and Spirk, Evan D0644938 Cl. D9-716.
Novack, Edward: See--
Kunkle, Jonathan; and Novack, Edward 08018735 Cl. 361-801.
Novak, Carol L.: See--
Odry, Benjamin; Kiraly, Atilla Peter; and Novak, Carol L. 08019140 Cl. 382-131.
Novak, Julia E.; Presnell, Scott R.; Sprecher, Cindy A.; Foster, Donald C.; Holly, Richard D.; Gross, Jane A.; Johnston, Janet V.; Nelson, Andrew J.; Dillon, Stacey R.; and Hammond, Angela K., to ZymoGenetics, Inc. Cytokine zalpha11 ligand antibodies and methods of use 08017343 Cl. 435-7.1.
Novak, Petr: See--
Hennige, Volker; Hying, Christian; Hoerpel, Gerhard; Novak, Petr; and Vetter, Jens 08016896 Cl. 29-623.5.
Novak, W. Thomas; to Nikon Corporation Optical arrangement of autofocus elements for use with immersion lithography 08018657 Cl. 359-649.
Novakovic, Zoran: See--
Smith, Alan; Eppstein, Jonathan A.; Messier, Bernadette; Novakovic, Zoran; and McRae, Stuart 08016811 Cl. 604-501.
Novartis AG: See--
Bloomfield, Graham Charles; Bruce, Ian; Leblanc, Catherine; Oza, Mrinalini Sachin; Whithead, Lewis; Cuenoud, Bernard; Keller, Thomas Hugo; Kirman, Louise; McCarthy, Clive; and Woodward, Gaynor Elizabeth 08017608 Cl. 514-235.8.
Buchdunger, Elisabeth; and Fabbro, Doriano 08017621 Cl. 514-275.
Novartis Forschungesstiftung Zweigniederlassung Friedrich Miescher Institute for Biomedical Research: See--
Chiquet-Ehrismann, Ruth; and Orend, Gertraud 08017725 Cl. 530-300.
Novatek Microelectronics Corp.: See--
Chen, Ke-Horng; Chiu, Chia-Lin; and Cheng, Lan-Shan 08018170 Cl. 315-192.
Tsao, Wen-Yuan; Lin, Che-Li; and Yuan, Chi-Ming 08018418 Cl. 345-98.
Novatel Wireless, Inc.: See--
Brewer, Alberto; Wilber, Clint; Conklin, Todd; and Hertlein, Robert 08018734 Cl. 361-800.
Novell, Inc.: See--
Kumar, Chendil; and Jothimani, Premkumar 08020203 Cl. 726-15.
Novellus Systems, Inc.: See--
Dhas, Arul N.; Li, Ming; and Laird, Joseph Bradley 08017527 Cl. 438-778.
Wu, Hui-Jung; Juliano, Daniel R.; Wu, Wen; and Dixit, Girish 08017523 Cl. 438-687.
Novem Car Interior Design GmbH: See--
Egerer, Gerhard; Wagner, Michael; and Abach, Andreas 08016465 Cl. 362-489.
Novoa, Manuel: See--
Rios, Jennifer E.; Wang, Lan; Ali, Valluddin Y.; and Novoa, Manuel 08019994 Cl. 713-168.
Novocure Ltd.: See--
Palti, Yoram 08019414 Cl. 607-3.
Novozymes A/S: See--
Andersen, Kim Vilbour; Schulein, deceased, Martin; Christiansen, Lars; Damgaard, Bo; and Von der Osten, Claus 08017372 Cl. 435-209.
Svendesn, Allan; and Beier, Lars 08017371 Cl. 435-201.
Svendsen, Allan; and Gregory, Peter Collin 08017351 Cl. 435-22.
Novus Scientific Pte. Ltd.: See--
Magnusson, Henrik; and Mathisen, Torbjörn 08016841 Cl. 606-151.
Nowak, Edward J.: See--
Appenzeller, Joerg; Kleinosowski, AJ; Nowak, Edward J.; and Williams, Richard Q. 08017934 Cl. 257-24.
Nowinski, Wieslaw L.; and Beauchamp, Norman J., to Agency for Science, Technology and Research Superimposing brain atlas images and brain images with delineation of infarct and penumbra for stroke diagnosis 08019142 Cl. 382-131.
Nowlin, Brett: See--
Weiser, Michael F.; Mamo, George; Chu, Michael S. H.; and Nowlin, Brett 08016741 Cl. 600-30.
Noxilizer, Inc.: See--
Arnold, Ernst V.; Doletski, Blaine G.; Dunn, Thomas M.; Raulli, Robert E.; Mueller, Edward P.; Benedek, Karen R.; and Murville, Marie-Louise 08017074 Cl. 422-33.
Noyes, Ying Xie: See--
Li, Jingqiang; Noyes, Ying Xie; and Qi, Yingyong 08019179 Cl. 382-294.
Nozaki, Tatsuya: See--
Imai, Kengo; Sekine, Toshinari; Nozaki, Tatsuya; and Kabasawa, Kazuhiro 08016479 Cl. 366-314.
NSK Ltd.: See--
Hosoya, Masachi; Yamaguchi, Toshiaki; Saitou, Tsuyoshi; Itou, Hiroyuki; Tomizuka, Yasushi; and Yamamoto, Toyohisa 08016490 Cl. 384-531.
NTN Corporation: See--
Murata, Itsuo; Soeda, Masaya; Hori, Masaharu; and Toda, Masaaki 08016488 Cl. 384-107.
Takahashi, Toru; and Ishikawa, Tomomi 08018237 Cl. 324-661.
Tanio, Masayuki 08015903 Cl. 82-112.
NTT Docomo, Inc.: See--
Higuchi, Kenichi; Sawahashi, Mamoru; and Atarashi, Hiroyuki 08018896 Cl. 370-329.
Inoue, Masahiro; Okajima, Ichiro; and Umeda, Narumi 08018915 Cl. 370-349.
Kobayashi, Motonari; and Suzuki, Toshihiro 08019372 Cl. 455-519.
Ofuji, Yoshiaki; Higuchi, Kenichi; and Sawahashi, Mamoru 08018898 Cl. 370-329.
Yamada, Takefumi; Suda, Hirohito; and Tomisato, Shigeru 08019013 Cl. 375-267.
Nu Inc.: See--
Tseng, Eric D0644990 Cl. D13-108.
Nuance Communications, Inc.: See--
Agapi, Ciprian; Blass, Oscar J.; Patel, Paritosh D.; and Vila, Roberto 08019605 Cl. 704-260.
Bareis, Bernard F.; Foster, Peter J.; and Schalk, Thomas B. 08019387 Cl. 455-563.
Creamer, Thomas E.; Moore, Victor S.; Nusbickel, Wendi L.; Dos Santos, Ricardo; and Sliwa, James J. 08019607 Cl. 704-270.1.
Nucci, Antonio; Ranjan, Supranamaya; and Kuzmanovic, Aleksandar, to Narus Inc. System and method for internet endpoint profiling 08019764 Cl. 707-739.
Nucor Corporation: See--
Blejde, Walter N.; Mahapatra, Rama Ballav; and Strezov, Lazar 08016021 Cl. 164-480.
Nugent, Benjamin M.: See--
Loso, Michael R.; Nugent, Benjamin M.; Zhu, Yuanming; Rogers, Richard B.; Huang, Jim X.; Renga, James M.; Whiteker, Gregory T.; Breaux, Nneka T.; and Daeuble, John F. 08017788 Cl. 548-200.
Nuintek Co., Ltd.: See--
Yang, Chang Hoon; Park, Dae Jin; and Jun, Yong Won 08018712 Cl. 361-328.
Numata, Hajime; to Sony Corporation Image input processing apparatus and method 08018509 Cl. 348-276.
Numata, Michio; to Fujitsu Limited Power-on self test program management apparatus and its management method and program 08020048 Cl. 714-54.
Number 14 B.V.: See--
Eschauzier, Rudy G. H.; and van Rijn, Nico 08018275 Cl. 330-9.
Nunan, John G.: See--
Southward, Barry W. L.; and Nunan, John G. 08017097 Cl. 423-213.2.
Nunez, Jorge Licona; Hong, Ju Hi; Zhou, Ting; and Chuang, I-Scheng, to LSI Corporation Media type detection using a lock indicator 08018805 Cl. 369-53.23.
Nunnink, Laurens; to Cognex Corporation Illumination devices for image acquisition systems 08016199 Cl. 235-462.42.
Nusbickel, Wendi L.: See--
Creamer, Thomas E.; Moore, Victor S.; Nusbickel, Wendi L.; Dos Santos, Ricardo; and Sliwa, James J. 08019607 Cl. 704-270.1.
Nuttall, Jr., Gordon R.; and Aas, Eric F., to Hewlett-Packard Development Company, L.P. Scanner power management system and method 08018607 Cl. 358-1.14.
NuVasive, Inc.: See--
Miles, Patrick; Martinelli, Scot; and Finley, Eric 08016767 Cl. 600-554.
Nuzman, Carl J.; de Lind van Wijngaarden, Adriaan J.; Whiting, Philip A.; Maes, Jochen J. M.; Kramer, Gerhard G. T.; Chow, Hungkei; and Ashikhmin, Alexei E., to Alcatel Lucent Device and associated method for crosstalk estimation 08018868 Cl. 370-252.
NVIDIA Corporation: See--
Han, Gang; and Leroy, Lieven P. 08020150 Cl. 717-124.
Scheuermann, W. James 08018463 Cl. 345-502.
Shebanow, Michael C.; Keller, Robert C.; and Silkebakken, Richard A. 08019978 Cl. 712-228.
Singh, Inderjit; Marks, Howard Lee; and Greco, Joseph David 08017520 Cl. 438-666.
Solanki, Gopal; and Dawallu, Kioumars Kevin 08018467 Cl. 345-582.
NXP B.V.: See--
Van Beek, Jozef Thomas Martinus; and Steeneken, Peter Gerard 08018307 Cl. 335-78.
van der Tuijn, Roland 08018960 Cl. 370-412.
Nycomed Danmark APS: See--
Grarup, Jesper; and Nielsen, Hanne Wulf 08017627 Cl. 514-317.
Nycomed GmbH: See--
Kley, Hans-Peter; Hanauer, Guido; Hauser, Daniela; Schmidt, Beate; Bredenbroeker, Dirk; Wurst, Wilhelm; and Kemkowski, Joerg 08017633 Cl. 514-352.
Nycz, Jeffrey H.: See--
Donofrio, William T.; Nycz, Jeffrey H.; Tethrake, Steven; and Olson, Jr., Stanley Warren 08016859 Cl. 606-246.
Nygaard, Jr., Richard A.; Saponas, Robert; Schulze, William C.; and Wallace, Hugh S. Conely, to Agilent Technologies, Inc. System and method for adjusting a serial communications link 08018989 Cl. 375-224.
Nyrt, Allami Nyomda: See--
Bolotin, Boris Markovich; Birgen, Yevgeniy Alexeyevich; Kukushkina, Maria Leonardovna; and Yakovleva, Yelena Viktorovna 08017769 Cl. 544-194.