| US 7,590,974 B2 | ||
| Recovery from corruption using event offset format in data trace | ||
| John M. Johnsen, Dallas, Tex. (US); Manisha Agarwala, Richardson, Tex. (US); and Maria B. H. Gill, Plano, Tex. (US) | ||
| Assigned to Texas Instruments Incorporated, Dallas, Tex. (US) | ||
| Filed on Jul. 12, 2006, as Appl. No. 11/456,990. | ||
| Application 11/456990 is a division of application No. 10/302024, filed on Nov. 22, 2002, granted, now 7,100,151. | ||
| Prior Publication US 2006/0248397 A1, Nov. 02, 2006 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G06F 9/44 (2006.01) | ||
| U.S. Cl. 717—128 | 2 Claims |
| 1. A data processor integrated circuit comprising:
a data processor (201) generating plural types of trace data including program counter data and at least one additional type of trace data;
a trace data collection unit (230) connected to said data processor and receiving said plural types of trace data;
a trace data export unit (240) connected to said trace data collection unit operable to
periodically transmit program counter sync points indicating a current program counter address of the data processor, and
upon detection of corruption
if a first trace data following detection of corruption is not a program counter sync point, transmitting an indication of
the current program counter address in an offset format from the program counter address of a last transmitted program counter
sync point followed by trace data in an event offset format indicating a difference between the program counter offset in
a current log and a prior log, and
if a first trace data following detection of corruption is a program counter sync point, transmitting trace data in said event
offset format.
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