| US 7,590,282 B2 | ||
| Optimal test patch level selection for systems that are modeled using low rank eigen functions, with applications to feedback controls | ||
| Zhigang Fan, Webster, N.Y. (US); Lalit Keshav Mestha, Fairport, N.Y. (US); Yao Rong Wang, Webster, N.Y. (US); Robert P. Loce, Webster, N.Y. (US); and Yeqing Zhang, Penfield, N.Y. (US) | ||
| Assigned to Xerox Corporation, Norwalk, Conn. (US) | ||
| Filed on Dec. 21, 2005, as Appl. No. 11/314,670. | ||
| Prior Publication US 2007/0140552 A1, Jun. 21, 2007 | ||
| Int. Cl. G06K 9/00 (2006.01) | ||
| U.S. Cl. 382—162 | 25 Claims |
| 1. A method of selecting a set of S number of calibration patches obtained from an image for an image producing system possessing
G number of colors, the method comprising:
determining S such that S is a minimal number which meets a quality specification of the image producing system; and
performing a minimum error optimization between an estimated printer performance and a measured printer performance for different
combinations of S number of colors;
wherein the error optimization represents a minimal variable set for optimizing the calibration patches.
|