US 7,587,836 B2
Detecting apparatus
Bing-Jun Zhang, Shenzhen (China); and Lian-Zhong Gong, Shenzhen (China)
Assigned to Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province (China); and Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien (Taiwan)
Filed on Oct. 10, 2007, as Appl. No. 11/869,751.
Claims priority of application No. 2006 1 0201297 (CN), filed on Dec. 14, 2006.
Prior Publication US 2008/0141547 A1, Jun. 19, 2008
Int. Cl. G01B 7/30 (2006.01); G01B 5/24 (2006.01)
U.S. Cl. 33—534  [33/549; 33/555] 16 Claims
OG exemplary drawing
 
1. A detecting apparatus for detecting an angle of a bend in an electrically conductive workpiece, the detecting apparatus comprising:
a platform;
a holding bracket mounted on the platform and being grounded, configured for holding and electrically connecting with the workpiece;
at least one detecting portion slidably mounted to the platform, and comprising a short pin and a long pin, wherein the pins are normally at high potential and go low potential if contacting the workpiece when the at least one detecting portion is slid;
a processor, the pins of the at least one detecting portion electrically connected to the processor, the processor judging an eligibility of the angle of the bend in the workpiece according to the potential pattern of each of the pins; and
an indicator electrically connected to the processor, configured to show a detecting result done by the processor.