US 7,586,785 B2
Non-volatile semiconductor memory device
Koji Hosono, Yokohama (Japan); Kenichi Imamiya, Tokyo (Japan); and Hiroshi Nakamura, Fujisawa (Japan)
Assigned to Kabushiki Kaisha Toshiba, Tokyo (Japan)
Filed on Jan. 28, 2008, as Appl. No. 12/20,981.
Application 12/020981 is a continuation of application No. 11/366110, filed on Mar. 01, 2006, granted, now 7,330,372.
Application 11/366110 is a continuation of application No. 11/077046, filed on Mar. 09, 2005, granted, now 7,038,946.
Application 11/077046 is a continuation of application No. 10/918686, filed on Aug. 13, 2004, granted, now 6,882,569.
Application 10/918686 is a continuation of application No. 10/360586, filed on Feb. 06, 2003, granted, now 6,798,697.
Claims priority of application No. 2002-029972 (JP), filed on Feb. 06, 2002.
Prior Publication US 2008/0175052 A1, Jul. 24, 2008
This patent is subject to a terminal disclaimer.
Int. Cl. G11C 16/04 (2006.01)
U.S. Cl. 365—185.12  [365/185.18; 365/185.17] 11 Claims
OG exemplary drawing
 
1. A non-volatile semiconductor memory device comprising:
a memory cell array with electrically erasable and programmable memory cells arranged therein; and
a read/write circuit configured to hold write data, which is to be written into the memory cell array, and read data of the memory cell array,
wherein said read/write circuit further comprises a plurality of page buffers, each of which including latch circuits in units of bit lines, said page buffers configured to temporarily hold write/read data,
wherein data read operation for reading out data of the memory cell array to one of the page buffers is so performed as to interrupt a data write operation for writing data from another one of said page buffers to the memory cell array.