| US 7,586,091 B2 | ||
| Mass spectrometric system and mass spectrometry | ||
| Katsutoshi Takahashi, Tokyo (Japan); Kazuhiro Iida, Tokyo (Japan); Masakazu Baba, Tokyo (Japan); Noriyuki Iguchi, Tokyo (Japan); Toru Sano, Tokyo (Japan); Hisao Kawaura, Tokyo (Japan); Toshitsugu Sakamoto, Tokyo (Japan); Wataru Hattori, Tokyo (Japan); and Hiroko Someya, Tokyo (Japan) | ||
| Assigned to NEC Corporation, Tokyo (Japan) | ||
| Appl. No. 10/549,587 PCT Filed Mar. 15, 2004, PCT No. PCT/JP2004/003427 § 371(c)(1), (2), (4) Date Mar. 23, 2006, PCT Pub. No. WO2004/081555, PCT Pub. Date Sep. 23, 2004. |
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| Claims priority of application No. 2003-069793 (JP), filed on Mar. 14, 2003. | ||
| Prior Publication US 2006/0214101 A1, Sep. 28, 2006 | ||
| Int. Cl. H01J 49/00 (2006.01) | ||
| U.S. Cl. 250—288 [250/281; 250/282; 435/6; 204/451; 204/452; 204/453] | 10 Claims |
| 1. A mass spectrometry system comprising:
a microchip which has a channel through which a sample passes and a sample separation area being provided in said channel;
a light irradiation unit irradiating with a laser beam while moving a light irradiation position along said sample separation
area; and
an analytical unit analyzing a fragment of said sample to obtain mass spectrometric data, said fragment of said sample being
generated by a light irradiation,
wherein said channel is provided on a surface of a substrate, said sample separation area has a plurality of columnar bodies,
and
said sample separation area having said plurality of columnar bodies is irradiated with said laser beam.
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