US 7,584,550 B2
Apparatus and method for measuring waviness of sheet materials
Edgar Robert Campbell, Hartsville, S.C. (US); Robert Shean Cumbee, Hartsville, S.C. (US); and Jeffrey Thomas Moffat, Hartsville, S.C. (US)
Assigned to Sonoco Development, Inc., Hartsville, S.C. (US)
Filed on Dec. 27, 2006, as Appl. No. 11/616,393.
Prior Publication US 2008/0155850 A1, Jul. 03, 2008
Int. Cl. G01B 5/00 (2006.01)
U.S. Cl. 33—806  [33/533] 18 Claims
OG exemplary drawing
 
1. An apparatus for measuring waviness of sheet materials, comprising:
a base having a horizontal planar upper surface for supporting a stack of sheets thereon;
a weight that rests freely atop an uppermost sheet of the stack; and
a measuring device for measuring a vertical distance between an upper datum plane corresponding to a top surface of the stack and a lower datum plane corresponding to a lower surface of the stack, the vertical distance being indicative of a height H of the stack.