LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 1st DAY OF September, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
N & W Global Vending S.p.A.: See--
Mosconi, Claudio; and Personeni, Silvano
07581658 Cl. 221-161.
N.V. Organon: See--
Van Der Louw, Jaap; Leysen, Dirk; Grootenhuis, Arij Jan; and De Gooijer, Marcel Evert
07582622 Cl. 514-178.
Na, Jong Hyun: See--
Park, Eun Soo; Na, Jong Hyun; Chang, Hye Jung; Lee, Ju Yeon; Park, Byung Joo; Kim, Won Tae; and Kim, Do Hyang
07582173 Cl. 148-403.
Na, Kl Cheol: See--
Lyu, Gae Goo; Na, Kl Cheol; Kim, Myoung Soo; Kim, Hyun Jae; and Seo, Jae Kwan
07582837 Cl. 200-50.21.
Nackoul, Michael E.: See--
Farah, Jorge I.; Nackoul, Michael E.; and Cintrón, José M.
07581399 Cl. 60-770.
Nadeau, Thomas D.: See--
Guichard, James N.; Vasseur, Jean-Philippe; Nadeau, Thomas D.; Filsfils, Clarence A. M.; Ward, David D.; and Previdi, Stefano
07583593 Cl. 370-225.
Nader, Timothy C.; Carter, James; Alonso, Michael; Stroud, Daniel; Beeson, Thomas H.; and Brunsen, William E., to Verizon Business Global LLC Systems and methods for generating reports
07584425 Cl. 715-255.
Nadot, Vladimir V.: See--
Fishman, Oleg S.; and Nadot, Vladimir V.
07582851 Cl. 219-660.
Nafus, Kathleen: See--
Ho, Chung-Peng; Nafus, Kathleen; Yoshioka, Kaz; and Yamaguchi, Richard
07582414 Cl. 430-322.
Nagabukuro, Hiroshi: See--
Matsumoto, Takahiro; Kurasawa, Osamu; Oda, Tsuneo; Nagabukuro, Hiroshi; and Mochizuki, Manabu
07582651 Cl. 514-300.
Nagae, Norihiko: See--
Sakai, Morio; Mori, Masaki; Izawa, Minoru; Hasegawa, Yasunori; Itoh, Daisuke; and Nagae, Norihiko
07584037 Cl. 701-45.
Nagai, Makoto; and Ochiai, Fumiharu, to Honda Motor Co., Ltd. Airbag device
07581755 Cl. 280-743.1.
Nagai, Nobuyuki; Sudo, Go; Tanaka, Koichi; and Watanabe, Yasuhiro, to Sony Corporation Actuator
07583009 Cl. 310-328.
Nagai, Takeshi: See--
Yamauchi, Yasunobu; Yanagawa, Shingo; Sekine, Masahiro; Nagai, Takeshi; Ueno, Hideyuki; and Kogure, Nakaba
07583846 Cl. 382-232.
Nagamura, Yoshikazu; Tange, Kouji; Hayashi, Kouki; and Ikeda, Hidehiro, to Renesas Technology Corp. Photomask, and method and apparatus for producing the same
07582397 Cl. 430-5.
Nagano Keiki Co., Ltd.: See--
Iimori, Yukinobu; Yamada, Nobuaki; Tohyama, Shuji; and Yokoyama, Takayuki
07581448 Cl. 73-714.
Nagano, Masao: See--
Kimura, Kouya; Nagano, Masao; and Hirakawa, Mitsuaki
07583064 Cl. 323-262.
Nagano, Takahiro: See--
Kondo, Tetsujiro; Ishibashi, Junichi; Sawao, Takashi; Wada, Seiji; Miyake, Tohru; Nagano, Takahiro; and Fujiwara, Naoki
07583292 Cl. 348-208.4.
Nagano, Youji; to Epson Toyocom Corporation Piezoelectric device and method for manufacturing the piezoelectric device
07583162 Cl. 333-187.
Nagano, Yuji: See--
Miyajima, Shinichirou; Ichiyanagi, Kazuhiro; Kusumoto, Akiko; Nagano, Yuji; Hashizume, Iwao; Inomoto, Kazuyuki; Endoh, Jun; and Senuki, Toshikazu
07583978 Cl. 455-525.
Nagao, Kouichi: See--
Shimoishizaka, Nozomi; Nagao, Kouichi; and Imamura, Hiroyuki
07582968 Cl. 257-738.
Nagarajan, Viswanath: See--
Woo, Hsien; Tsui, Felicia; and Nagarajan, Viswanath
07583633 Cl. 370-331.
Nagarathnam, Dhanapalan: See--
Dixon, Julie A.; Nagarathnam, Dhanapalan; Zhang, Lei; Wang, Chunguang; Yi, Lin; Chen, Yuanwei; Chen, Jianqing; Bear, Brian; Brands, Michael; Hillisch, Alexander; Bierer, Donald; Wang, Ming; Fu, Wenlang; Hentemann, Martin F.; and Bullion, Ann-Marie
07582645 Cl. 514-269.
Dixon, Julie A.; Nagarathnam, Dhanapalan; Zhang, Lei; Wang, Chunguang; Yi, Lin; Chen, Yuanwei; Chen, Jianqing; Bear, Brian R.; Brands, Michael; Hillisch, Alexander; Bierer, Donald; Wang, Ming; Fu, Wenlang; Hentemann, Martin F.; Bullion, Ann-Marie; and Patel, Manoj
07582646 Cl. 514-269.
Nagareda, Takeshi: See--
Onoda, Hiroyuki; Endo, Hiroumi; Igarashi, Hiroshi; Takamoto, Junji; and Nagareda, Takeshi
07582015 Cl. 463-30.
Nagasawa, Nobuhiro: See--
Sakai, Hajime; and Nagasawa, Nobuhiro
07582817 Cl. 800-320.2.
Nagata, Chikayuki: See--
Takeuchi, Yasuhiro; Nakayama, Yoshio; Oishi, Tsuyoshi; Nakamura, Satoshi; Nakamura, Shinji; Dohi, Tsuyoshi; and Nagata, Chikayuki
07581395 Cl. 60-653.
Nagata, Takahiro: See--
Fukushima, Yoshiharu; Nagata, Takahiro; and Seto, Katsuyuki
07581310 Cl. 29-743.
Nagorcka, James Arthur: See--
Radke, Daniel Dean; Nagorcka, James Arthur; Allen, Lyal Douglas; and Bergquist, Lawrence William
07581598 Cl. 172-819.
Nagpal, Sunil: See--
Lu, Jianliang; Ma, Tainwei; Nagpal, Sunil; Shen, Quanrong; Warshawsky, Alan M.; Yee, Ying Kwong; and Rupp, Michael John
07582775 Cl. 549-49.
Nair, Vijay: See--
Roes, Augustinus Wilhelmus Maria; Mo, Weijian; Muylle, Michel Serge Marie; Mandema, Remco Hugo; and Nair, Vijay
07581589 Cl. 166-267.
Naito, Takahiro; and Ito, Takafumi, to DENSO CORPORATION Automobile navigation system
07584050 Cl. 701-211.
Najafi, Nader: See--
Sparks, Douglas Ray; Smith, Rick; and Najafi, Nader
07581429 Cl. 73-32A.
Naka, Yoji: See--
Ito, Yoshihiro; Naka, Yoji; Senba, Takehiko; Onozuka, Haruo; and Manabe, Mitsuo
07582995 Cl. 310-80.
Nakagawa, Kenichi: See--
Fujii, Takamichi; and Nakagawa, Kenichi
07583340 Cl. 349-117.
Nakagawa Laboratories, Inc.: See--
Nakagawa, Masao; Komine, Toshihiko; Haruyama, Shinichiro; Ishigure, Takaaki; Koike, Yasuhiro; Kitano, Shogo; and Sugawara, Yasuo
07583901 Cl. 398-183.
Nakagawa, Masao; Komine, Toshihiko; Haruyama, Shinichiro; Ishigure, Takaaki; Koike, Yasuhiro; Kitano, Shogo; and Sugawara, Yasuo, to Nakagawa Laboratories, Inc. Illuminative light communication device
07583901 Cl. 398-183.
Nakagawa, Masaru: See--
Koyama, Etsutaro; Nakagawa, Masaru; Ito, Akio; and Suzuki, Atsuko
07584063 Cl. 702-47.
Nakagawa, Shigetada; and Ibuki, Tsutomu, to Mitsubishi Rayon Co., Ltd. Process for production of fiber-reinforced plastic tubing
07582177 Cl. 156-192.
Nakagawa, Yoshihiko; Terada, Michinari; and Ogawa, Daisuke, to Sega Corporation Apparatus and program for image generation
07583264 Cl. 345-426.
Nakagawa, Yusuke; Hidesaka, Shinichi; and Nakayama, Kazuhiko, to Tokyo Ohka Kogyo Co., Ltd. Resist composition and method for forming resist pattern
07582406 Cl. 430-270.1.
Nakahama, Masahiro; Ishii, Yoshihiro; Yanagi, Katsuyuki; and Dai, Koji, to Furuno Electric Co., Ltd. Radar apparatus with automatic local oscillator tuning function
07583224 Cl. 342-100.
Nakahama, Takayuki: See--
Yamashita, Hiroshi; and Nakahama, Takayuki
07581728 Cl. 271-127.
Nakahara, Ken: See--
Tamura, Kentaro; and Nakahara, Ken
07582905 Cl. 257-79.
Nakahara, Kouji; Adachi, Koichiro; Shiota, Takashi; Tsuchiya, Tomonobu; and Shinoda, Kazunori, to Opnext Japan, Inc. Vertical cavity surface emitting semiconductor laser device
07583714 Cl. 372-45.01.
Nakai, Junji: See--
Komoda, Nobuhito; and Nakai, Junji
07583913 Cl. 399-124.
Nakai, Masanobu: See--
Aizawa, Mitsuaki; Itoh, Hiroki; and Nakai, Masanobu
07583309 Cl. 348-340.
Nakai, Masaya: See--
Hayashi, Nobuhiko; Matsumoto, Mitsuaki; Kuramoto, Keiichi; and Nakai, Masaya
07582358 Cl. 428-447.
Nakai, Takashi; and Kawase, Kinya, to Mitsubishi Materials PMG Corporation Warm molding raw material powder and warm molding method
07582255 Cl. 419-66.
Nakajima, Akira; to DENSO CORPORATION Ultrasonic sensor
07583563 Cl. 367-188.
Nakajima, Hiroki: See--
Miyairi, Shuji; Kuribayashi, Hiroshi; and Nakajima, Hiroki
07581472 Cl. 82-121.
Nakajima, Takeshi: See--
Kimura, Naohiro; Miyashita, Harumitsu; Nakajima, Takeshi; Ishibashi, Hiromichi; Yamamoto, Yoshikazu; and Nakata, Kohei
07584315 Cl. 710-69.
Nakamo, Shiro: See--
Tano, Tamotsu; Nakamo, Shiro; Oyama, Takashi; Ono, Hideki; Ikai, Keizou; and Takeshita, Kiwamu
07582902 Cl. 257-71.
Nakamura, Atsushi: See--
Eguchi, Takeo; Ono, Shogo; Takenaka, Kazuyasu; Nakamura, Atsushi; Ikemoto, Yuichiro; Hirashima, Shigeyoshi; Nakayama, Atsushi; Nishi, Shota; Yakura, Yuji; Fujiki, Shigeyoshi; and Matsuda, Manabu
07581809 Cl. 347-20.
Kadowaki, Shin-ichi; Shoji, Mamoru; Nakamura, Atsushi; and Ishida, Takashi
07583578 Cl. 369-53.34.
Nakamura, David J.: See--
Huang, James P.; Abbott, Russell M.; Nakamura, David J.; Momoda, Leslie A.; Rooney, Kevin J.; Drolen, Bruce L.; Belk, John H.; Barvosa-Carter, William; and Foy, Brian R.
07583506 Cl. 361-719.
Nakamura, David J.; Yu, Man-Fai; and Igawa, Bruce A., to Boeing Company, The Method and assembly for establishing an electrical interface between parts
07581994 Cl. 439-886.
Nakamura, Junichi: See--
Uchiyama, Shoichi; Nakamura, Junichi; Nitta, Takashi; and Asahi, Tsunemori
07581836 Cl. 353-30.
Nakamura, Keitaroh; and Fujii, Takashi, to Nisshin Seifun Group Inc. Process for producing ultrafine particles
07582135 Cl. 75-346.
Nakamura, Kentaro; Yuki, Masahiro; Hoshida, Takeshi; and Ishikawa, George, to Fujitsu Limited Polarization scrambler, optical add/drop multiplexer, optical route switching apparatus and wavelength division multiplexing optical transmission system
07583895 Cl. 398-65.
Nakamura, Kimio: See--
Kubota, Takashi; Kobae, Kenji; and Nakamura, Kimio
07582553 Cl. 438-617.
Nakamura, Mitsutoshi: See--
Nishinohara, Kazumi; Nakamura, Mitsutoshi; Suguro, Kyoichi; Shirai, Koji; and Taguchi, Ichiro
07584011 Cl. 700-95.
Nakamura, Nobuo: See--
Abe, Takashi; Nakamura, Nobuo; Mabuchi, Keiji; Umeda, Tomoyuki; Fujita, Hiroaki; Funatsu, Eiichi; and Sato, Hiroki
07582503 Cl. 438-65.
Nakamura, Norimi: See--
Shimamura, Teruo; Nakamura, Norimi; Hirooka, Yoshimi; and Nakamura, Taro
07581780 Cl. 296-183.2.
Nakamura, Satoshi: See--
Takeuchi, Yasuhiro; Nakayama, Yoshio; Oishi, Tsuyoshi; Nakamura, Satoshi; Nakamura, Shinji; Dohi, Tsuyoshi; and Nagata, Chikayuki
07581395 Cl. 60-653.
Nakamura, Shinji: See--
Takeuchi, Yasuhiro; Nakayama, Yoshio; Oishi, Tsuyoshi; Nakamura, Satoshi; Nakamura, Shinji; Dohi, Tsuyoshi; and Nagata, Chikayuki
07581395 Cl. 60-653.
Nakamura, Shu: See--
Arai, Hideto; Suzuki, Nobuyuki; Osano, Hidekazu; and Nakamura, Shu
07583706 Cl. 370-513.
Nakamura, Takashi: See--
Kai, Takeshi; Nakamura, Takashi; Aoki, Takashi; Onda, Kazuhiro; and Sakamoto, Rei
07581752 Cl. 280-730.2.
Nakamura, Taro: See--
Shimamura, Teruo; Nakamura, Norimi; Hirooka, Yoshimi; and Nakamura, Taro
07581780 Cl. 296-183.2.
Nakamura, Tomoaki: See--
Abe, Kenji; Nakamura, Tomoaki; and Yamanami, Masahiko
07581291 Cl. 16-367.
Nakamura, Yoshiaki; Miyakawa, Tatsuya; Morikawa, Shigeru; and Iihama, Tomomi, to Casio Computer Co., Ltd. Image reading apparatus and its driving method
07583826 Cl. 382-124.
Nakane, Hideo: See--
Yamamoto, Takaya; Matsuura, Tatsuji; Kasahara, Masumi; Nakane, Hideo; Kudo, Junya; and Jingu, Yoshitaka
07583215 Cl. 341-143.
Nakanishi, Hitoshi: See--
Nanjo, Yusuke; and Nakanishi, Hitoshi
07583300 Cl. 348-240.99.
Nakanishi, Kiyoshi: See--
Miyashita, Akihiro; Nakanishi, Kiyoshi; Tsumura, Toshiyuki; Muramatsu, Fumihiro; and Suzuki, Michitaka
07583316 Cl. 348-376.
Nakanishi, Koichiro: See--
Nojiri, Hidetoshi; Akaike, Masatake; Kaneko, Norio; Kawasaki, Takehiko; Nakanishi, Koichiro; Gemma, Naoyo; and Morimoto, Toshitsugu
07583413 Cl. 358-3.24.
Nakanishi, Koichiro; to Canon Kabushiki Kaisha Piezoelectric film element, method of manufacturing the same, and liquid discharge head
07581823 Cl. 347-68.
Nakano, Keitaro: See--
Oyanagi, Takashi; and Nakano, Keitaro
07581829 Cl. 347-100.
Nakano, Kimio: See--
Matsunaga, Tadao; Suzuki, Masayoshi; Hashimoto, Nobuhiro; and Nakano, Kimio
07583884 Cl. 385-134.
Nakano, Koichi: See--
Yoneno, Noriyuki; Uno, Hiroshi; Kikutani, Fumitaka; Nakano, Koichi; Nozawa, Shintaro; Arima, Satoshi; Yoneyama, Mitsuru; and Moriya, Yoshifumi
07581584 Cl. 165-202.
Nakano, Takaji Automatic air-feeding mechanism for pneumatic tire
07581576 Cl. 152-421.
Nakano, Yoshiki: See--
Terada, Yuuichi; Tanino, Toshihiro; Yamamoto, Toshio; Itou, Yasuhide; Nakano, Yoshiki; and Kageyama, Ryohei
07583004 Cl. 310-233.
Nakano, Yuusuke: See--
Kawakami, Yuichi; and Nakano, Yuusuke
07583271 Cl. 345-582.
Nakao, Hidetoshi: See--
Tanaka, Hiroshi; Nakao, Hidetoshi; Shindo, Naoki; Yamashita, Atushi; Hirayama, Tsukasa; and Tsurusaki, Kotaro
07581335 Cl. 34-391.
Nakao, Sayako: See--
Ishimaru, Yoshiaki; Saito, Takashi; Hayashi, Akiko; Nakao, Sayako; and Watanabe, Yoshifumi
07582153 Cl. 106-31.86.
Nakao, Takashi; to Murata Kikai Kabushiki Kaisha Rail vehicle system and transportation method of using the rail vehicle system
07581502 Cl. 104-130.07.
Nakaoki, Ariyoshi: See--
Saito, Kimihiro; Yamasaki, Takeshi; and Nakaoki, Ariyoshi
07583580 Cl. 369-112.23.
Nakashima, Shota; Inoue, Atsuo; and Inagaki, Seizo, to Panasonic Corporation Two-wire type data communication method and system, controller and data recording apparatus
07583734 Cl. 375-257.
Nakashima, Toshirou: See--
Kawano, Hiroyuki; Okamoto, Tatsuki; Nakashima, Toshirou; and Takashima, Kazuo
07581880 Cl. 374-161.
Nakashio, Eiji; Honda, Junichi; Tamura, Takashi; Suzuki, Koji; Inaguma, Teruo; Aizawa, Manabu; Takahashi, Kazuo; and Sakurai, Tadashi, to Sony Corporation Piezoelectric element and method for manufacturing piezoelectric element
07583012 Cl. 310-358.
Nakata, Kohei: See--
Kimura, Naohiro; Miyashita, Harumitsu; Nakajima, Takeshi; Ishibashi, Hiromichi; Yamamoto, Yoshikazu; and Nakata, Kohei
07584315 Cl. 710-69.
Nakatake, Shigetoshi: See--
Nakatake, Shigetoshi; Kawakita, Masahiro; and Ito, Takao
07584445 Cl. 716-9.
Nakatake, Shigetoshi; Kawakita, Masahiro; and Ito, Takao, to Nakatake, Shigetoshi Sequence-pair creating apparatus and sequence-pair creating method
07584445 Cl. 716-9.
Nakatani, Yoshio; to Funai Electric Co., Ltd. Recording device and HDD built-in recording device
07583537 Cl. 365-185.24.
Nakatate, Kenichi: See--
Toriya, Tomoaki; Tsumanuma, Takashi; Nakatate, Kenichi; Ishii, Takashi; Oka, Kiyoshi; Osaki, Toshio; and Hayakawa, Akiyoshi
07582057 Cl. 600-160.
Nakayama, Atsushi: See--
Eguchi, Takeo; Ono, Shogo; Takenaka, Kazuyasu; Nakamura, Atsushi; Ikemoto, Yuichiro; Hirashima, Shigeyoshi; Nakayama, Atsushi; Nishi, Shota; Yakura, Yuji; Fujiki, Shigeyoshi; and Matsuda, Manabu
07581809 Cl. 347-20.
Nakayama, Ichiro: See--
Jin, Cheng-Guo; Sasaki, Yuichiro; Mizuno, Bunji; Okashita, Katsumi; Ito, Hiroyuki; Okumura, Tomohiro; Maeshima, Satoshi; and Nakayama, Ichiro
07582492 Cl. 438-16.
Nakayama, Kazuhiko: See--
Nakagawa, Yusuke; Hidesaka, Shinichi; and Nakayama, Kazuhiko
07582406 Cl. 430-270.1.
Nakayama, Kouichi; and Zanka, Yukihito, to Japan Polypropylene Corporation Polypropylene-based resin composition and molded article thereof
07582696 Cl. 524-496.
Nakayama, Yoshio: See--
Takeuchi, Yasuhiro; Nakayama, Yoshio; Oishi, Tsuyoshi; Nakamura, Satoshi; Nakamura, Shinji; Dohi, Tsuyoshi; and Nagata, Chikayuki
07581395 Cl. 60-653.
Nakayama, Yukinori; Teramoto, Kouzou; Mizuhata, Hiroshi; and Satou, Kousuke, to Kyocera Mita Corporation Magnetic toner and image forming method using the same
07582400 Cl. 430-106.2.
Nakazawa, Isao; to Canon Kabushiki Kaisha Focus detection apparatus for detecting a relative positional relationship between a pair of object images
07582854 Cl. 250-201.2.
Nakazawa, Wataru: See--
Matsui, Yoshitaka; Tsujimoto, Kei; Nakazawa, Wataru; and Kaifuki, Masahiko
07581754 Cl. 280-743.1.
Nalla, Ravi: See--
Bchir, Omar J.; Salama, Islam; Gurumurthy, Charan; Jomaa, Houssam; Nalla, Ravi; and Li, Yonggang
07583871 Cl. 385-14.
Nam, Ki-Won: See--
Han, Ky-Hyun; and Nam, Ki-Won
07582560 Cl. 438-637.
Nam, Kyung-Tae: See--
Ha, Young-Ki; Lee, Jang-Eun; Oh, Se-Chung; Bae, Jun-Soo; Kim, Hyun-Jo; and Nam, Kyung-Tae
07582890 Cl. 257-9.
Namco Bandai Games Inc.: See--
Onoda, Hiroyuki; Endo, Hiroumi; Igarashi, Hiroshi; Takamoto, Junji; and Nagareda, Takeshi
07582015 Cl. 463-30.
Namikata, Takeshi; to Canon Kabushiki Kaisha Image processing method and apparatus
07583420 Cl. 358-518.
Namiki, Tsunehisa: See--
Kobayashi, Akira; Yamada, Kouji; Kurashima, Hideo; Namiki, Tsunehisa; Aihara, Takeshi; and Onozawa, Yasunori
07582845 Cl. 219-121.43.
Nance, Christopher J.: See--
Hennings, George N.; Wild, Edwin J.; Hanna, Bradley L.; Nance, Christopher J.; and Reynolds, Richard K.
07581496 Cl. 102-202.7.
Nanda, Mangala Gowri: See--
Chafle, Girish Bhimrao; Chandra, Sunil; Karnik, Neeran M; Mann, Vijay; and Nanda, Mangala Gowri
07584276 Cl. 709-223.
Nanjo, Yusuke; and Nakanishi, Hitoshi, to Sony Corporation Imaging device and zoom lens
07583300 Cl. 348-240.99.
Nanjundiah, Bhavani Shringari: See--
Choudhury, Shubhodeep Roy; Bag, Sandip; Dusanapudi, Manoj; Hatti, Sunil Suresh; Kapoor, Shakti; and Nanjundiah, Bhavani Shringari
07584394 Cl. 714-738.
Nanogen, Inc.: See--
Sosnowski, Ronald G.; Nerenberg, Michael I.; Canter, David M.; Radtkey, Ray R.; Wang, Ling; and O'Connell, James P.
07582421 Cl. 435-6.
Nantero, Inc.: See--
Bertin, Claude L.; Rueckes, Thomas; and Segal, Brent M.
07583526 Cl. 365-151.
Nanya Technology Corporation: See--
Chiu, Chui-fu; and Wu, Wen-Bin
07582395 Cl. 430-5.
Nara, Masayuki; to Mitutoyo Corporation Measurement method and measurement apparatus using tracking type laser interferometer
07583374 Cl. 356-152.3.
Narahara, Tatsuya; Asazu, Hideki; Fujiwara, Nobuyuki; and Sumiyoshi, Kazuhito, to Sony Corporation Information processing apparatus, information processing method, and computer program
07584214 Cl. 707-104.1.
Narahashi, Shoichi: See--
Kawai, Kunihiro; Okazaki, Hiroshi; and Narahashi, Shoichi
07583168 Cl. 333-238.
Narang, Kristi Jean: See--
D'Evelyn, Mark Philip; Cao, Xian-An; Zhang, Anping; LeBoeuf, Steven Francis; Hong, Huicong; Park, Dong-Sil; and Narang, Kristi Jean
07582498 Cl. 438-46.
Narendra, Siva G.; Spitzer, Thomas N.; and Tadepalli, Prabhakar, to Tyfone, Inc. Electronic transaction card
07581678 Cl. 235-451.
Nariman, Mohammad; to Broadcom Corporation Apparatus and method to adjust and filter current DAC signals
07583941 Cl. 455-127.2.
Narojnyi, Vladislav: See--
Rekai, Andre; and Narojnyi, Vladislav
07583727 Cl. 375-225.
Naruka, Ajaypal: See--
Varanasi, Chakrapani V.; Brumleve, Timothy R.; Lamouri, Abbas; and Naruka, Ajaypal
07583030 Cl. 313-640.
Narus, Inc.: See--
Naruse, Yusuke: See--
Aida, Futoshi; Yasuda, Yukio; and Naruse, Yusuke
07581534 Cl. 123-644.
Nass, David R.: See--
Walker, James L.; Mumick, Pavneet; Parsons, John C.; Nass, David R.; and Barcomb, Christopher
07582699 Cl. 524-832.
Nasuti, Tonino: See--
Buchert, Ryan S.; Nasuti, Tonino; and Timmerman, Chayil S.
07583767 Cl. 375-346.
Nathan, John F.: See--
Kennedy, Karl; Maue, H. Winston; and Nathan, John F.
07581706 Cl. 248-424.
National Institute of Advanced Industrial Science and Technology: See--
Kasai, Yuji; Murakawa, Masahiro; and Higuchi, Tetsuya
07583749 Cl. 375-294.
National Institute of Information and Communications Technology, Incorporated Administrative Agency: See--
Jatowt, Adam; Kawai, Yukiko; and Tanaka, Katsumi
07584185 Cl. 707-5.
National Jewish Health: See--
Gelfand, Erwin; Born, Willi K.; Lahn, Michael F.; and Kanehiro, Arihiko
07582300 Cl. 424-184.1.
National Semiconductor Corporation: See--
DeStasi, Frank; and Broach, Michael Eugene
07583138 Cl. 330-10.
Lim, Peng Soon; Yii, Terh Kuen; How, You Chye; Chong, Sek Hoi; and Yeong, Shee Min
07582954 Cl. 257-666.
National University Corporation Nagoya University: See--
Ikeda, Seiichi; Fukuda, Toshio; and Takahashi, Ikuo
07583367 Cl. 356-32.
National University Corporation Shiga University of Medical Science: See--
Sato, Hiroshi; Fujiyama, Yoshihide; and Yamamoto, Kazuo
07582427 Cl. 435-6.
National Yunlin University of Science and Technology: See--
Chou, Jung-Chuan; and Tzeng, Diing-Jia
07582500 Cl. 438-49.
Natrogen Therapeutics, Inc.: See--
Wang, Longgui; Liu, Xiao Mei; Mo, Lian; Mencher, Simon K.; and McCarron, Jr., James P.
07582670 Cl. 514-414.
Nauha, Jukka: See--
Mella, Perttu; Karbu, Jyri; Marjelund, Pekka; Sakko, Vesa; Vuorinen, Petri J.; Nauha, Jukka; and Kohonen, Pekka Tapani
07583969 Cl. 455-450.
Navarro, George Arthur: See--
Oughton, Jr., George W.; and Navarro, George Arthur
07583109 Cl. 327-108.
Naveh, Alon: See--
Gutman, Michael; Naveh, Alon; Martwick, Andrew W.; and Solomon, Gary A.
07584375 Cl. 713-323.
Navteq North America, LLC: See--
Hegedus, Ildiko; Lasser, George; and Hegedus, Miklos Robert
07583818 Cl. 382-104.
Nawano, Maseo: See--
Fyfe, Matthew Colin Thor; Gardner, Lisa Sarah; Nawano, Maseo; Procter, Martin James; Rasamison, Chrystelle Marie; Schofield, Karen Lesley; Shah, Vilasben Kanji; and Yasuda, Kosuke
07582632 Cl. 514-252.01.
Nay, Renato; Bentz, Markus; and Ackermann, Rene, to Hamilton Bonaduz AG Drip-resistant pipetting device and drip-resistant pipetting method
07581660 Cl. 222-61.
Naylor, Charles A.: See--
Tsikos, Constantine J.; Knowles, C. Harry; Zhu, Xiaoxun; Schnee, Michael D.; Au, Ka Man; Wirth, Allan; Good, Timothy A.; Jankevics, Andrew; Ghosh, Sankar; Naylor, Charles A.; Amundsen, Thomas; Blake, Robert; Svedas, William; Defoney, Shawn; Skypala, Edward; Vatan, Pirooz; Dobbs, Russell Joseph; Kolis, George; Schmidt, Mark C.; Yorsz, Jeffery; Giordano, Patrick A.; Colavito, Stephen J.; Wilz, Sr., David W.; Schwartz, Barry E.; Kim, Steven Y.; Fisher, Dale; and Van Tassell, Jon
07581681 Cl. 235-462.42.
Nazarian, Hagop A.; to Micron Technology, Inc. Zero power start-up circuit for self-bias circuit
07583070 Cl. 323-315.
Neal, Bradley E.: See--
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07582643 Cl. 514-264.11.
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07583389 Cl. 356-512.
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07581910 Cl. 411-403.
NEC Corporation: See--
Fukumoto, Yoshiyuki; Suzuki, Tetsuhiro; and Suemitsu, Katsumi
07582923 Cl. 257-295.
Hamaguchi, Hiroyuki
07582973 Cl. 257-778.
Haseba, Yukio; Kondo, Daisuke; Sakuma, Emiko; Nishimura, Osami; Kawabata, Hisashi; and Iwasaki, Motoya
07583966 Cl. 455-436.
Mori, Shigeru; Korenari, Takahiro; Matsuzaki, Tadahiro; and Tanabe, Hiroshi
07582933 Cl. 257-347.
Ochiai, Katsuhiro; Koike, Yuichi; and Tabuchi, Masahiro
07584247 Cl. 709-203.
NEC Display Solutions, Ltd.: See--
NEC Electronics Corporation: See--
Hasegawa, Atsushi; and Tangoda, Atsushi
07583118 Cl. 327-158.
Kaneda, Yoshiharu; and Shimizu, Motoaki
07582974 Cl. 257-783.
Ohnishi, Sadayuki; Owto, Kouichi; Usami, Tatsuya; Morita, Noboru; Arita, Kouji; Kitao, Ryouhei; and Sasaki, Youichi
07582970 Cl. 257-758.
Yoshino, Akira; and Akiyama, Yutaka
07582930 Cl. 257-317.
NEC LCD Technologies, Ltd.: See--
Nedd, Kevin: See--
Scriffignano, Anthony; Nedd, Kevin; Shao, Peihsin; Gan, Simpeng; Lu, Sarah; Okada, Masayuki; Kasai, Mayako; Prower, Julian N. N.; Teoh, Nicholas; Sy, Jeremy; and Matthews, Warwick
07584188 Cl. 707-6.
Nedungadi, Kishnan: See--
Rajarajan, Vij; Nedungadi, Kishnan; Kiernan, Casey; Bhatia, Brijesh; MacMahon, Mel; and Hodge, Kevin
07584278 Cl. 709-226.
Neemann, Trey: See--
Bishop, Fred; Neemann, Trey; Voltmer, Theodore S; and Ariff, Fauziah B
07584149 Cl. 705-51.
Negishi, Yoshihisa: See--
Maeda, Hiroshi; Nishida, Kazuhiro; Negishi, Yoshihisa; and Hosaka, Shunichi
07582505 Cl. 438-75.
Neises, Bernd: See--
Fiedler, Wolfgang; Neises, Bernd; and Hachtel, Jochen
07582794 Cl. 562-475.
Nektar Therapeutics: See--
Kordikowski, Andreas; Walker, Stephen Ernest; and York, Peter
07582284 Cl. 424-46.
Nelson, Dan: See--
Headley, Weston P.; Deng, Kevin; and Nelson, Dan
07584484 Cl. 725-19.
Nelson, Daniel: See--
Fischetti, Vincent; Nelson, Daniel; and Schuch, Raymond
07582729 Cl. 530-350.
Yoong, Pauline; Schuch, Raymond; Nelson, Daniel; and Fischetti, Vincent A.
07582291 Cl. 424-93.6.
Nelson, Paul Gilbert; and Ji, Baowei, to Samsung Electronics Co., Ltd. Adjacent-cell assisted redundancy for wireless communication networks
07583962 Cl. 455-424.
Nemec, Brian R.: See--
Bourke, Brian P.; Lehmann, Steven M.; and Nemec, Brian R.
07583037 Cl. 318-34.
Nemoto, Hirotomi; and Ishiguro, Tetsuya, to Honda Motor Co., Ltd. Vibration isolation system and method for engine, and control system and method for active vibration isolation support system
07581720 Cl. 267-140.14.
Nemoto, Satoru: See--
Hirunuma, Ken; and Nemoto, Satoru
07583891 Cl. 396-55.
Nereim, Brian D.: See--
Shaefer, David M.; and Nereim, Brian D.
07581931 Cl. 416-198A.
Nerenberg, Michael I.: See--
Sosnowski, Ronald G.; Nerenberg, Michael I.; Canter, David M.; Radtkey, Ray R.; Wang, Ling; and O'Connell, James P.
07582421 Cl. 435-6.
Neri, Bruce P.: See--
Hall, Jeff G.; Skrzypczynski, Zbigniev; Wayland, Sarah; Reimer, Ned D.; Reynaldo, Luis P.; Baier, Joerg; Lyamichev, Victor; and Neri, Bruce P.
07582436 Cl. 435-6.
NetApp, Inc.: See--
Chapman, Dennis E.
07584279 Cl. 709-226.
Nethala, Vinod B.: See--
Sharma, Vishnu; Zamanian, Elaheh; French, Dale A.; Rolling, Patrick; Zhang, Yichun; and Nethala, Vinod B.
07581894 Cl. 400-62.
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07581777 Cl. 296-121.
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07583275 Cl. 345-633.
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07583488 Cl. 361-119.
Neutron Sciences, Inc.: See--
Wallace, Steven; Stephan, Andrew C.; Dai, Sheng; and Im, Hee-Jung
07582880 Cl. 250-390.11.
New Vision Gaming & Development, Inc.: See--
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07583776 Cl. 377-6.
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07581708 Cl. 248-647.
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Christensen, Steven M.
07581959 Cl. 439-64.
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Kurtz, Thomas Harold; Simonson, Brian Theodore; Borgstrom, John William; Dubbs, Timothy J.; Newman, Edward; Berrett, Claire Mary; Higgins, Pamela Jean; and Omtvedt, Karen Ingrid
07584131 Cl. 705-36R.
Newman, Tye: See--
Boehnlein, Al; Eckhoff, Paul J.; Watt, Brandon; and Newman, Tye
07581988 Cl. 439-585.
Newmatics Licensing LLC: See--
Newsome, Christopher: See--
Li, Shunpu; Newsome, Christopher; Russell, David; and Kugler, Thomas
07582509 Cl. 438-99.
Newton, Angela Mae: See--
Chung, Lynn Keat; Funk, Mark Robert; Kirkman, Richard Karl; Newton, Angela Mae; and Reed, Don Darrell
07584476 Cl. 718-104.
Nexpak Corporation: See--
Belden, Jr., Dennis D.; Marsilio, Ronald M.; McMahan, Aaron; and Wells, Jesse D.
07581419 Cl. 70-57.1.
NextAxiom Technology, Inc.: See--
Neyt, Jean-Lois: See--
Cousin, Benoit; and Neyt, Jean-Lois
07584074 Cl. 702-183.
Ng, Albert: See--
Kyowski, Timothy; Pang, Suzanne Man; and Ng, Albert
07582839 Cl. 200-310.
Ng, James: See--
Yang, Yi; Tran, Thuan Van; Savage, Donnie Van; Slice, Donald; Ng, James; and Retana, Alvaro
07583672 Cl. 370-392.
Ng, Kwok-Lam; Zoch, Roger; and Schwandt, Brian, to Cummins Filtration IP Inc. Coalescing filter assembly
07582130 Cl. 55-385.3.
Ng, Wing-Chak: See--
Hughes, Janis W.; Ng, Wing-Chak; Calhoun, Patricia H.; and Walton, Glynis A.
07582178 Cl. 156-229.
NGK Insulators, Ltd.: See--
Aihara, Yasufumi; Matsuda, Hiroto; Nobori, Kazuhiro; and Kato, Tsutomu
07582367 Cl. 428-701.
Tomita, Yasumitsu; and Tsuruta, Hideyoshi
07582184 Cl. 156-345.43.
NGK Spark Plug Co., Ltd.: See--
Fujita, Shigeo; Enuma, Masahiro; and Mitsumatsu, Shinichiro
07581998 Cl. 445-7.
Miyahara, Akihiro; and Hanzawa, Go
07581879 Cl. 374-148.
Ngo, Chiu: See--
Niu, Huaning; and Ngo, Chiu
07584406 Cl. 714-790.
Nguyen, Andy T.: See--
Simmons, Tuyet Ngoc; Nguyen, Andy T.; Lai, Andrew W.; Simmons, Randy J.; and Lakkapragada, Shankar
07583102 Cl. 326-38.
Nguyen, Dai Quoc: See--
Bird, Paul; Ellsworth, Edmund Lee; Nguyen, Dai Quoc; Sanchez, Joseph Peter; Showalter, Howard Daniel Hollis; Singh, Rajeshwar; Stier, Michael Andrew; Tran, Tuan Phong; Watson, Brian Morgan; and Yip, Judy
07582627 Cl. 514-228.5.
Nguyen, Hong T.: See--
Roberts, Linda A.; Nguyen, Hong T.; Silver, Edward Michael; Hensey, Robert G.; and Bradberry, John L.
07583274 Cl. 345-629.
Nguyen, Thanh Van: See--
Teitelbaum, George P.; Shaolian, Samuel M.; Pham, To V.; and Nguyen, Thanh Van
07582106 Cl. 606-250.
Nguyen, Truc: See--
Kuwata, Katie; Su, William; and Nguyen, Truc
07584089 Cl. 704-7.
Nichia Corporation: See--
Matsumura, Hiroaki; and Kotani, Yasuhisa
07583716 Cl. 372-46.01.
Nichias Corporation: See--
Kurosawa, Masaji; Yamashita, Katsuhiro; and Deguchi, Tomohiro
07582139 Cl. 95-113.
Nichols, Charles E.; Marti, Drew M.; and Deitz, William G., to LSI Corporation Apparatus and methods for power management and spin-up in a storage system
07584368 Cl. 713-300.
Nicholson, Thomas: See--
Shuler, Richard O.; Godbersen, Lynn; Norwood, James; Young, Joseph; Fleck, William; Lind, David; DeHaan, Kevin; Nicholson, Thomas; and Sarzen, Marcell J.
07584136 Cl. 705-37.
Nickolls, John R.: See--
Nordquist, Bryon S.; Nickolls, John R.; and Bacayo, Luis I.
07584342 Cl. 712-22.
Nicponski, Henry: See--
Ray, Lawrence A.; and Nicponski, Henry
07583294 Cl. 348-222.1.
Niculae, Marian; and Bucur, Constantin, to O2Mcro International Limited Variable power output regulator
07583067 Cl. 323-274.
Niddam-Hildesheim, Valerie; Shenkar, Natalia; Chen, Kobi; and Balanov, Anna, to Teva Pharmaceutical Industries Ltd. Diastereomeric purification of rosuvastatin
07582759 Cl. 544-297.
Niebler, Ludwig: See--
Gogeissl, Christian; Lüftl, Manuela; and Niebler, Ludwig
07583170 Cl. 335-17.
Niederl, Josef: See--
Sibrai, Andreas; and Niederl, Josef
07583127 Cl. 327-337.
Nieken, Ulrich: See--
Penzo, Giuseppe; Ahmadzade-Youssefi, Cyrus; Karer, Rainer; and Nieken, Ulrich
07582723 Cl. 528-483.
Nielaba, Leonard Josef Arnold: See--
Snijder, Carina Sacha; and Nielaba, Leonard Josef Arnold
07582576 Cl. 442-1.
Nielsen Company (US), LLC, The: See--
Headley, Weston P.; Deng, Kevin; and Nelson, Dan
07584484 Cl. 725-19.
Nielsen, Henning Roar; and Petersen, Jesper Winston, to American Power Conversion Corporation Over voltage clamp
07583521 Cl. 363-53.
Niemiec, Halina: See--
Caccia, Massimo; Conte, Leopoldo; Alemi, Mario; Cappellini, Chiara; Airoldi, Antonello Luigi; Bianchi, Carla; Novario, Raffaele; De Boer, Wim; Grigoriev, Eugene; Niemiec, Halina; Kucewicz, Wojciech; Cannillo, Francesco; Clauss, Gilles; Colledani, Claude; Deptuch, Grzegorz; Dulinski, Wojciech; Grabiec, Piotr; Marczewski, Jacek; Domanski, Krzysztof; Jaroszewicz, Bohdan; Kucharski, Krzysztof; Badano, Laura; Ferrando, Omella; Popowski, Georg; Zalewska, Agnieszka; and Czermak, Adam
07582875 Cl. 250-370.07.
Niessen, Marcus B.: See--
Bulow, Jeffrey A.; and Niessen, Marcus B.
07581326 Cl. 33-355R.
Niessen, Rudolf: See--
Krane, Rolf; and Niessen, Rudolf
07584193 Cl. 707-10.
Nieves, Anthony L.: See--
Guzzo, Jr., Louis J.; and Nieves, Anthony L.
07581987 Cl. 439-578.
Nihei, Makoto: See--
Akahoshi, Kenji; Saito, Atsushi; Nihei, Makoto; and Ishii, Junichi
07583572 Cl. 369-47.51.
Nihon University: See--
Niioka, Koji; to Seiko Epson Corporation Printer and detachable printer tray
07581806 Cl. 347-19.
Nijakowski, Michael R.: See--
Borders, Harley Allen; Nijakowski, Michael R.; Thome, William J.; and McKenzie, Raymond L.
07581948 Cl. 431-158.
Nike, Inc.: See--
Baron, Michael Robert; Carter, Karin Elizabeth; Hung, Chia Pei C.; Davis, Carrie Lynn; Hurd, Rebecca P.; and Wise, LaShurya M.
07581258 Cl. 2-69.
Wilskey, Michael J.; Leftwich, Robert B.; and Zimmer, Shelley D.
07581643 Cl. 206-736.
Nikiema, Hilaire: See--
Nikiema, Roger; Nikiema, Hilaire; and Nikiema, Wend Kouni
07582029 Cl. 473-415.
Nikiema, Roger; Nikiema, Hilaire; and Nikiema, Wend Kouni Method for playing a game of ball
07582029 Cl. 473-415.
Nikiema, Wend Kouni: See--
Nikiema, Roger; Nikiema, Hilaire; and Nikiema, Wend Kouni
07582029 Cl. 473-415.
Nikitin, Andrey: See--
Andreev, Alexandre; Nikitin, Andrey; Scepanovic, Ranko; and Vikhliantsev, Igor A.
07584442 Cl. 716-6.
Nikitina, Marina: See--
Rosenfeld, Leonard G.; Wysocki, Theresa; Yang, Morris; Nikitina, Marina; and Poccia, John
07582074 Cl. 604-385.01.
Nikken Rentacom Co., Ltd.: See--
Niklason, Loren: See--
Jing, Zhenxue; Niklason, Loren; Stein, Jay; Shaw, Ian; DeFreitas, Ken; Farbizio, Tom; Ruth, Christopher; Ren, Baorui; and Smith, Andrew
07583786 Cl. 378-37.
Nikolai, Malimonenko: See--
Kim, Won Kook; Chun, Sung Ho; Paik, Kyung Lim; Sergey, Belyaev; and Nikolai, Malimonenko
07582339 Cl. 428-1.3.
Nikolic, Serjan D.: See--
Khairkhahan, Alexander; Sharkey, Hugh R.; Nikolic, Serjan D.; and Radovancevic, Branislav
07582051 Cl. 600-16.
Nikon Corporation: See--
Hsin, Yi-Ping; Hashimoto, Hideyuki; Nishikawa, Jin; Yuan, Bausan; and Watson, Douglas C.
07583361 Cl. 355-72.
Nilsen, Roy Arnulf Helge: See--
Tang, Xiangyang; Hsieh, Jiang; Dutta, Sandeep; and Nilsen, Roy Arnulf Helge
07583777 Cl. 378-4.
Nilsson, David A.: See--
Armgarth, Marten; Chen, Miaioxiang M.; Nilsson, David A.; Berggren, Rolf M.; Kugler, Thomas; Remonen, Tommi M.; and Forchheimer, Robert
07582895 Cl. 257-40.
Ninesling, Matthew John: See--
Starr, Matthew Thomas; Wong, Walter; Figaro, Micheal Edward; Duren, Ronald Gregory; Ninesling, Matthew John; Carter, Joshua Daniel; and Bacom, Scott Edward
07583507 Cl. 361-727.
Ninomiya, Yoshiki: See--
Kimura, Yoshikatsu; and Ninomiya, Yoshiki
07583817 Cl. 382-104.
Nintendo Co., Ltd.: See--
Takahashi, Hiroyuki; Takahashi, Shugo; Taguchi, Yasuhiro; and Izuno, Toshiharu
07582010 Cl. 463-3.
Wakitani, Noboru; Takamoto, Junji; and Kitano, Yasuhisa
07581865 Cl. 362-602.
Nippon Electric Glass Co., Ltd.: See--
Kawaguchi, Masataka; and Takagi, Masataka
07582581 Cl. 501-67.
Nippon Oil Corporation: See--
Tano, Tamotsu; Nakamo, Shiro; Oyama, Takashi; Ono, Hideki; Ikai, Keizou; and Takeshita, Kiwamu
07582902 Cl. 257-71.
Nippon Shokubai Co., Ltd.: See--
Dairoku, Yorimichi; Adachi, Yoshifumi; Nogi, Kozo; Inoue, Hiroki; Wada, Katsuyuki; and Irie, Yoshio
07582705 Cl. 525-379.
Nippon Steel Chemical Co., Ltd.: See--
Yoshitake, Osamu; Miyazaki, Hiroshi; Suzaki, Daisuke; and Yamada, Yu
07582364 Cl. 428-690.
Nippon Telegraph and Telephone Corporation: See--
Minotani, Tadashi; Shibata, Nobutarou; and Shinagawa, Mitsuru
07583930 Cl. 455-41.1.
Taniguchi, Tomohiro; and Sakurai, Naoya
07583896 Cl. 398-72.
Yasukawa, Seisho; Sugisono, Koji; and Uga, Masanori
07583601 Cl. 370-238.
Nirschl, Thomas: See--
Kakoschke, Ronald; and Nirschl, Thomas
07582546 Cl. 438-526.
Nishi, Shota: See--
Eguchi, Takeo; Ono, Shogo; Takenaka, Kazuyasu; Nakamura, Atsushi; Ikemoto, Yuichiro; Hirashima, Shigeyoshi; Nakayama, Atsushi; Nishi, Shota; Yakura, Yuji; Fujiki, Shigeyoshi; and Matsuda, Manabu
07581809 Cl. 347-20.
Nishi, Takafumi: See--
Fukuhara, Masaki; Nishi, Takafumi; and Fujii, Yasuyuki
07582124 Cl. 8-405.
Nishi, Tomomi: See--
Wright, Kathryn J.; Willis, Carl L.; Nishi, Tomomi; Masuko, Norio; Handlin, Jr., Dale L.; and Bening, Robert C.
07582702 Cl. 525-98.
Nishi, Yoshiko: See--
Hirotsune, Akemi; Miyamoto, Harukazu; and Nishi, Yoshiko
07584150 Cl. 705-52.
Nishida, Akio: See--
Matsukawa, Kazuhito; Koga, Tsuyoshi; Nishida, Akio; Higashide, Yoshiko; Shibata, Jun; and Tobimatsu, Hiroshi
07582950 Cl. 257-622.
Nishida, Kazuhiro: See--
Maeda, Hiroshi; Nishida, Kazuhiro; Negishi, Yoshihisa; and Hosaka, Shunichi
07582505 Cl. 438-75.
Nishida, Yusuke: See--
Ochiai, Fumiharu; Yasuhara, Fumitoshi; Nishida, Yusuke; Kobayashi, Satoshi; and Higano, Makoto
07581751 Cl. 280-730.2.
Nishigaki, Yasuo: See--
Kobayashi, Jun; and Nishigaki, Yasuo
07582369 Cl. 428-847.
Nishiie, Takehiro: See--
Komiya, Takaaki; Murakami, Kazushi; Ichikawa, Hiroaki; Onuki, Yoshio; Kura, Yasuhito; and Nishiie, Takehiro
07582055 Cl. 600-106.
Nishikawa, Genshi: See--
Sakata, Eiji; Nishikawa, Genshi; and Morikawa, Haruyuki
07582237 Cl. 264-7.
Nishikawa, Jin: See--
Hsin, Yi-Ping; Hashimoto, Hideyuki; Nishikawa, Jin; Yuan, Bausan; and Watson, Douglas C.
07583361 Cl. 355-72.
Nishikawa, Koji: See--
Ogawa, Yoshihiro; Hasegawa, Yusuke; Sano, Tomohisa; Nishiyama, Junko; Okazaki, Miho; Kasuya, Takashige; and Nishikawa, Koji
07582401 Cl. 430-109.3.
Nishikawa, Takahiro: See--
Ogasawara, Hirotsugu; Nishikawa, Takahiro; Hara, Masayuki; Yoshida, Hiroyuki; Kogure, Yoshihisa; and Hashimoto, Akira
07581936 Cl. 418-63.
Nishikawa, Takahiro; Ogasawara, Hirotsugu; Kanayama, Takao; Hiruma, Yoshiaki; Takenaka, Manabu; Sakaniwa, Masazumi; Hashimoto, Akira; and Suzuki, Junichi, to Sanyo Electric Co., Ltd. Rotary type compressor having an intermediate pressure on a surface side of its compression member
07581937 Cl. 418-232.
Nishikori, Hitoshi: See--
Yoshikawa, Hirokazu; Tajika, Hiroshi; Nishikori, Hitoshi; Ide, Daisaku; Yazawa, Takeshi; Masuyama, Atsuhiko; Maru, Akiko; and Takamiya, Hideaki
07581810 Cl. 347-23.
Nishimura, Michiyo; Teramoto, Yoji; and Fujiwara, Ryoji, to Canon Kabushiki Kaisha Producing method for electron-emitting device and electron source, and image display apparatus utilizing producing method for electron-emitting device
07583016 Cl. 313-311.
Nishimura, Osami: See--
Haseba, Yukio; Kondo, Daisuke; Sakuma, Emiko; Nishimura, Osami; Kawabata, Hisashi; and Iwasaki, Motoya
07583966 Cl. 455-436.
Nishinohara, Kazumi; Nakamura, Mitsutoshi; Suguro, Kyoichi; Shirai, Koji; and Taguchi, Ichiro, to Kabushiki Kaisha Toshiba Method for optimizing an industrial product, system for optimizing an industrial product and method for manufacturing an industrial product
07584011 Cl. 700-95.
Nishio, Tetsushi: See--
Fukuda, Toshiyuki; Takayama, Yoshiki; Minamio, Masanori; Nishio, Tetsushi; and Harada, Yutaka
07582944 Cl. 257-432.
Nishitani, Mikihiko; Terauchi, Masaharu; Morita, Yukihiro; Yamamoto, Shinichi; and Kitagawa, Masatoshi, to Panasonic Corporation Plasma display panel having a protective layer preventing an increase in firing voltage
07583026 Cl. 313-587.
Nishiura, Masahide; to Kabushiki Kaisha Toshiba Medical-use image data analyzing apparatus and method of analysis using the same
07583820 Cl. 382-107.
Nishiyama, Fumihiro: See--
Morioka, Yuichi; Nishiyama, Fumihiro; and Yamaura, Tomoya
07583644 Cl. 370-338.
Nishiyama, Junko: See--
Ogawa, Yoshihiro; Hasegawa, Yusuke; Sano, Tomohisa; Nishiyama, Junko; Okazaki, Miho; Kasuya, Takashige; and Nishikawa, Koji
07582401 Cl. 430-109.3.
Nissan Motor Co., Ltd.: See--
Asano, Junichi; Kusukawa, Hirotaka; and Sugitani, Osamu
07581626 Cl. 192-48.6.
Goto, Kenichi; and Kamihara, Tetsuya
07582370 Cl. 429-13.
Nissan Technical Center North America, Inc.: See--
Nissani (Nissensohn), Daniel Nathan; to MIMOpro Ltd. Multi input multi output wireless communication reception method and apparatus
07583763 Cl. 375-341.
Nissenkorn, Israel: See--
Gross, Yossi; Cohen, Ehud; Nissenkorn, Israel; and Lifschitz, David
07582053 Cl. 600-30.
Nisshin Seifun Group Inc.: See--
Nakamura, Keitaroh; and Fujii, Takashi
07582135 Cl. 75-346.
Nitta, Koichi: See--
Komoto, Satoshi; Ishikawa, Masayuki; Umeji, Tadashi; Konno, Kuniaki; Nitta, Koichi; and Okazaki, Haruhiko
07583019 Cl. 313-501.
Nitta, Takashi: See--
Uchiyama, Shoichi; Nakamura, Junichi; Nitta, Takashi; and Asahi, Tsunemori
07581836 Cl. 353-30.
Nitti, Robert Anthony; to Boss Licensing Group, Inc. Shipping bag reversible into a tote
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Niu, Deqiang: See--
Moore, Joel D.; Niu, Deqiang; Xu, Guoyou; Liu, Dong; Or, Yat Sun; and Wang, Zhe
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Niu, Huaning; and Ngo, Chiu, to Samsung Electronics Co., Ltd. LDPC concatenation rules for IEEE 802.11n system with packets length specific in octets
07584406 Cl. 714-790.
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Kim, Jong Seok; No, Yang Hwan; Cho, Han Ki; Jung, Yeon Su; Kang, Jung Hoon; Park, Myung Sik; and Ha, Young Hoon
07581412 Cl. 68-24.
Kim, Jong Seok; No, Yang Hwan; Cho, Han Ki; Jung, Yeon Su; Kang, Jung Hoon; Park, Myung Sik; and Ha, Young Hoon
07581414 Cl. 68-196.
Nobert, Philippe: See--
Picard, Pierre; L'heureux, Andre; Lacoursiere, Jean; Nobert, Philippe; Letarte, Sylvain; Vallieres, Alexandre; Paquin, Réal; and Lessard, Denis
07582863 Cl. 250-288.
Noble, Bryan: See--
Dallesasse, John; Scheibenreif, Joseph; Noble, Bryan; Whitehead, Thomas; Wachtel, Paul; Andrei, Bogdan; Richardson, Dean; Lane, Brett; Moretti, Anthony; and McCallum, David
07583900 Cl. 398-135.
Noble, David Edward: See--
Bell, Andrew David; Fargie, David Andrew; Noble, David Edward; Power, Michael Bernard; and Ross, Iain David
07582710 Cl. 526-68.
Noble, Gary Paul: See--
Barker, David Alexander; and Noble, Gary Paul
07584470 Cl. 717-177.
Noble, Kyle: See--
Faris, Gregory W.; Kotz, Kenneth T.; and Noble, Kyle
07582858 Cl. 250-251.
Nobori, Kazuhiro: See--
Aihara, Yasufumi; Matsuda, Hiroto; Nobori, Kazuhiro; and Kato, Tsutomu
07582367 Cl. 428-701.
Nobuhara, Hiroyuki: See--
Terada, Koji; Matsui, Jun; and Nobuhara, Hiroyuki
07583867 Cl. 385-14.
Noda, Kazuyuki: See--
Sato, Nobuhiro; Fujimine, Takuya; Noda, Kazuyuki; Todo, Minoru; Ozaki, Kazuhisa; Nozaki, Kazutoshi; Kinoshita, Masafumi; Honda, Atsushi; and Abe, Akiharu
07582042 Cl. 477-158.
Noda, Kenji; and Hashimoto, Shin, to Panasonic Corporation Photomask and method for forming pattern
07582394 Cl. 430-5.
Noda, Naohiro: See--
Mizutani, Takaaki; and Noda, Naohiro
07582483 Cl. 436-63.
Noda, Tatsuya; to Honda Motor Co., Ltd. Electric actuator
07582994 Cl. 310-60R.
Nodwell, Matthew B.: See--
Moran, Edmund J.; Jacobsen, John R.; Leadbetter, Michael R.; Nodwell, Matthew B.; Trapp, Sean G.; Aggen, James; and Church, Timothy J.
07582765 Cl. 546-157.
Nogi, Kozo: See--
Dairoku, Yorimichi; Adachi, Yoshifumi; Nogi, Kozo; Inoue, Hiroki; Wada, Katsuyuki; and Irie, Yoshio
07582705 Cl. 525-379.
Noguchi, Mineo; to Oki Semiconductor Co., Ltd. Temperature sensor
07581882 Cl. 374-178.
Noguchi, Toshiaki; Hasegawa, Hitoshi; Gocho, Masanori; Suzuki, Eiri; and Kuroshima, Hisashi, to Olympus Corporation Endoscope system
07582056 Cl. 600-132.
Noguera-Rodriguez, Juan: See--
Graf, Leslie Gary; Terrill, Stephen Christopher; Groves, Christian Norman; Hollis, Mark Alan; Noguera-Rodriguez, Juan; and Rytina, Ian
07584293 Cl. 709-232.
Nojiri, Hidetoshi; Akaike, Masatake; Kaneko, Norio; Kawasaki, Takehiko; Nakanishi, Koichiro; Gemma, Naoyo; and Morimoto, Toshitsugu, to Canon Kabushiki Kaisha Signal output and image forming apparatus with method of judging sheet type by impact detection
07583413 Cl. 358-3.24.
NOK Corporation: See--
Ono, Shigeyuki; Shimazu, Takashi; and Sugiura, Yoshiaki
07582020 Cl. 464-111.
Nokia Corporation: See--
Fehmi, Chebil; and Asad, Islam
07583844 Cl. 382-232.
Hannuksela, Miska; Jarvinen, Roope; and Bouazizi, Imed
07584495 Cl. 725-101.
Heikkilä, Markku J
07583723 Cl. 375-148.
Hongming, Zheng; and Hao, Guan
07583766 Cl. 375-346.
Kongqiao, Wang; and Yanming, Zou
07583825 Cl. 382-119.
Makinen, Jari; Vainio, Janne; and Mikkola, Hannu
07584096 Cl. 704-230.
Mella, Perttu; Karbu, Jyri; Marjelund, Pekka; Sakko, Vesa; Vuorinen, Petri J.; Nauha, Jukka; and Kohonen, Pekka Tapani
07583969 Cl. 455-450.
Pasanen, Pirjo; and Tirkkonen, Olav
07583745 Cl. 375-267.
Tammi, Kalle; Myllymäki, Minna; Koivula, Jari; and Salonen, Sami N.
07583963 Cl. 455-435.1.
Terekhova, Karina; Paila, Toni; and Vermola, Larri
07583801 Cl. 380-201.
Vimpari, Markku; Hyytiä, Simo; Vallström, Jari; Kuure, Pekka; and Bontempi, Richard
07583695 Cl. 370-466.
Ylä-Outinen, Petteri; Mattila, Mika; and Sillanpää, Janne
07583647 Cl. 370-338.
Noma, Nobuhiko: See--
Katayama, Yumi; and Noma, Nobuhiko
07584295 Cl. 709-237.
Nomura, Takashi; to Xanavi Informatics Corporation Navigation method, processing method for navigation system, map data management device, map data management program, and computer program
07584049 Cl. 701-210.
Nonninger, Ralph; to ITN Nanovation AG Nanoscale rutile or anatase oxide and method for producing same
07582276 Cl. 423-592.1.
Nordman, John Emery: See--
Youngman, Todd Jason; Nordman, John Emery; and Ortmann, Daniel Dean
07584437 Cl. 716-1.
Nordquist, Bryon S.; Nickolls, John R.; and Bacayo, Luis I., to NVIDIA Corporation Parallel data processing systems and methods using cooperative thread arrays and SIMD instruction issue
07584342 Cl. 712-22.
Norgren GmbH: See--
Noridomi, Kenichi: See--
Inoue, Hisashi; Noridomi, Kenichi; and Ejima, Masataka
07583850 Cl. 382-251.
Norman, Mark H.: See--
Balan, Chenera; Bo, Yunxin; Dominguez, Celia; Fotsch, Christopher H.; Gore, Vijay K.; Ma, Vu Van; Norman, Mark H.; Ognyanov, Vassil I.; Qian, Yi-xin; Wang, Xianghong; Xi, Ning; and Xu, Shimin
07582761 Cl. 544-360.
Norman, Richard: See--
Vicknair, Tom; Beard, Sam; Norman, Richard; Riggleman, Mark; Roycroft, Max; Feagin, Dick; Day, Cliff; and Fielding, Paul
07584125 Cl. 705-35.
Noro, Junichi; and Abe, Makoto, to Mitsumi Electric Co., Ltd. Antenna module having a multilayered substrate with built-in components which are connected to mounted components
07583237 Cl. 343-860.
Norskog, Allen C.; to Aptina Imaging Corporation Apparatus and method for generating multi-image scenes with a camera
07583293 Cl. 348-218.1.
Norsten, Tyler B.: See--
Iftime, Gabriel; Kazmaier, Peter M.; and Norsten, Tyler B.
07582398 Cl. 430-19.
Nortel Networks Limited: See--
Edwards, Keith Russell
07583619 Cl. 370-279.
Guo, Ning; McGowan, Neil; and Boudreau, Gary
07583583 Cl. 370-204.
Janevski, Goran; Syed, Hamid; and Gage, Bill
07583632 Cl. 370-331.
North Carolina State University: See--
Lindsey, Jonathan S.; Taniguchi, Masahiko; Balakumar, Arumugham; and Fan, Dazhong
07582751 Cl. 540-145.
Northrop Grumman Space & Mission Systems Corp.: See--
Dang, Linh; Yoshida, Wayne; Mei, Gerry; Wang, Jennifer; Liu, Po-Hsin; Lee, Jane; Liu, Weidong; Barsky, Mike; and Lai, Rich
07582518 Cl. 438-182.
Northrop Grumman Systems Corporation: See--
Cassen, John; and Waterman, Timothy G.
07583238 Cl. 343-872.
Northrop, Valerie C.: See--
Danner, Guy M.; Northrop, Valerie C.; Rifai, Sandra; and Patry, Shamus Ford
07583427 Cl. 359-254.
Norwood, James: See--
Shuler, Richard O.; Godbersen, Lynn; Norwood, James; Young, Joseph; Fleck, William; Lind, David; DeHaan, Kevin; Nicholson, Thomas; and Sarzen, Marcell J.
07584136 Cl. 705-37.
Noss, Jeffery S.: See--
Gibson, Lawrence E; Pogany, Daniel T.; and Noss, Jeffery S.
07581828 Cl. 347-91.
Novak, Carol L.: See--
Kiraly, Atilla Peter; Novak, Carol L.; and Gündel, Lutz
07583829 Cl. 382-128.
Novario, Raffaele: See--
Caccia, Massimo; Conte, Leopoldo; Alemi, Mario; Cappellini, Chiara; Airoldi, Antonello Luigi; Bianchi, Carla; Novario, Raffaele; De Boer, Wim; Grigoriev, Eugene; Niemiec, Halina; Kucewicz, Wojciech; Cannillo, Francesco; Clauss, Gilles; Colledani, Claude; Deptuch, Grzegorz; Dulinski, Wojciech; Grabiec, Piotr; Marczewski, Jacek; Domanski, Krzysztof; Jaroszewicz, Bohdan; Kucharski, Krzysztof; Badano, Laura; Ferrando, Omella; Popowski, Georg; Zalewska, Agnieszka; and Czermak, Adam
07582875 Cl. 250-370.07.
Novartis AG: See--
Baeschlin, Daniel K; Maibaum, Juergen K; and Sellner, Holger
07582782 Cl. 554-35.
Qiu, Yongxing; Winterton, Lynn Cook; and Lally, John Martin
07582327 Cl. 427-2.1.
Novellus Systems, Inc.: See--
Lang, Chi-I; Huang, Judy H.; Barnes, Michael; and Shanker, Sunil
07582555 Cl. 438-623.
Novici Biotech LLC: See--
Padgett, Hal S.; Lindbo, John A.; and Fitzmaurice, Wayne P.
07582423 Cl. 435-6.
Novo Nordisk A/S: See--
Murray, Anthony; Lau, Jesper; Vedso, Per; Kristiansen, Marit; and Jeppesen, Lone
07582769 Cl. 548-185.
Novozymes North America, Inc.: See--
Noyau, Eric: See--
Gates, Patrick; Federighi, Craig; and Noyau, Eric
07584468 Cl. 717-172.
Nozaki, Kazutoshi: See--
Ootsuki, Takeshi; Fukatsu, Akira; Iwase, Mikio; Nozaki, Kazutoshi; and Honda, Atsushi
07582035 Cl. 475-121.
Sato, Nobuhiro; Fujimine, Takuya; Noda, Kazuyuki; Todo, Minoru; Ozaki, Kazuhisa; Nozaki, Kazutoshi; Kinoshita, Masafumi; Honda, Atsushi; and Abe, Akiharu
07582042 Cl. 477-158.
Nozaki, Shinji: See--
Higuchi, Hidemitsu; Sawada, Sunao; Nozaki, Shinji; and Tsuchiya, Kazuaki
07583698 Cl. 370-467.
Nozawa, Shintaro: See--
Yoneno, Noriyuki; Uno, Hiroshi; Kikutani, Fumitaka; Nakano, Koichi; Nozawa, Shintaro; Arima, Satoshi; Yoneyama, Mitsuru; and Moriya, Yoshifumi
07581584 Cl. 165-202.
Nozue, Hiroshi: See--
Sano, Hisatake; Hoga, Morihisa; Iimura, Yukio; Aritsuka, Yuki; Kurihara, Masaaki; Nozue, Hiroshi; and Yoshida, Akira
07582393 Cl. 430-5.
NTELS Co., Ltd.: See--
Shim, Jae-Hee; Yu, Gun-Woo; and Kim, Sang-Hee
07584506 Cl. 726-22.
NTN Corporation: See--
Koike, Takashi; Ishikawa, Tomomi; and Isobe, Hiroshi
07583079 Cl. 324-207.25.
NTT DoCoMo, Inc.: See--
Higuchi, Kenichi; Kawai, Hiroyuki; Maeda, Noriyuki; and Sawahashi, Mamoru
07583739 Cl. 375-260.
Kawai, Kunihiro; Okazaki, Hiroshi; and Narahashi, Shoichi
07583168 Cl. 333-238.
Onishi, Teruo; Kiminami, Katsuki; and Uebayashi, Shinji
07583089 Cl. 324-632.
Yamada, Akira; and Fujiwara, Atsushi
07583651 Cl. 370-345.
Nucci, Antonio; to Narus, Inc. Architecture, systems and methods to detect efficiently DoS and DDoS attacks for large scale internet
07584507 Cl. 726-23.
Nuesslein, Stefan: See--
Wolff, Guenter; Strauss, Bernd; Stier, Hubert; Goller, Helga; Nuesslein, Stefan; and Brendel, Reinhard
07581529 Cl. 123-469.
Nugent, Anthony J.: See--
Jones, Ronald M.; Worthy, Thomas E.; and Nugent, Anthony J.
07582484 Cl. 436-71.
Nukanobu, Koki; Yamamoto, Keisuke; Kobayahsi, Tamaki; and Moriguchi, Takuto, to Canon Kabushiki Kaisha Electron-emitting device, electron-emitting apparatus, electron source, image display device and information display/reproduction apparatus
07583015 Cl. 313-309.
Nunes, Geoffrey: See--
Bailey, Richard Kevin; Blanchet, Graciela Beatriz; Caspar, Jonathan V.; Catron, John W.; Chesterfield, Reid John; Felder, Thomas C.; Gao, Feng; Johnson, Lynda Kaye; Keusseyan, Roupen Leon; Keys, Dalen E.; Malajovich, Irina; Meth, Jeffrey Scott; Nunes, Geoffrey; O'Neil, Gerard; Schiffino, Rinaldo S.; and Tassi, Nancy G.
07582403 Cl. 430-200.
Nunnink, Laurens: See--
Küchen, Jörg; Müller, Frank; and Nunnink, Laurens
07581682 Cl. 235-473.
Nunokawa, Hirokazu: See--
Ishimoto, Bunji; and Nunokawa, Hirokazu
07581804 Cl. 347-16.
Nurenberg, Aundrea: See--
Allen, Clyde G; Nurenberg, Aundrea; Lajewski, Todd M.; Clark, Michael C.; and Logan, Richard J.
07581477 Cl. 83-454.
Nurul, Amin: See--
Price, James K.; Nurul, Amin; Shukh, Alaxender M.; Wang, Feng; and Plumer, Martin L.
07583477 Cl. 360-317.
Nutley, Bernard: See--
Fischer, Peter Martin; Jarman, Michael; McDonald, Edward; Nutley, Bernard; Raynaud, Florence; Wilson, Stuart; and Workman, Paul
07582642 Cl. 514-263.22.
NuVasive, Inc.: See--
Miles, Patrick; Martinelli, Scot; Finley, Eric; Gharib, James; Farquhar, Allen; Kaula, Norbert; and Blewett, deceased, Jeffrey
07582058 Cl. 600-202.
NVIDIA Corporation: See--
De Waal, Abraham B.
07583277 Cl. 345-649.
Lightstone, Michael L.; Eckart, Stefan; and Azar, Hassane S.
07584475 Cl. 718-104.
Malachowsky, Chris Alan; Reed, David G.; Treichler, Sean Jeffrey; and Simeral, Brad W.
07584321 Cl. 711-5.
Nordquist, Bryon S.; Nickolls, John R.; and Bacayo, Luis I.
07584342 Cl. 712-22.
Yang, Ge; Lin, Hwong-Kwo; and Young, Charles Chew-Yuen
07583126 Cl. 327-333.
NXP B.V.: See--
Brekelmans, Johannes H. A.
07583112 Cl. 327-117.
Collados Asensio, Manel; and De Jong, Gerben Willem
07583650 Cl. 370-339.
Fuhrmann, Peter; and Zinke, Manfred
07583692 Cl. 370-458.
Stopel, Rick Franciscus Jozef; and Tjia, Jerome
07583105 Cl. 326-85.
Tolle, Tobias Georg; Sluijs, Ferdinand Jacob; Büthker, Henricus Cornelis Johannes; and Walther, Matthias
07583066 Cl. 323-267.
Nyce, David S.: See--
Pchelnikov, Yuriy Nikitich; and Nyce, David Scott
07583090 Cl. 324-635.
Nyce, David Scott: See--
Pchelnikov, Yuriy Nikitich; and Nyce, David Scott
07583090 Cl. 324-635.