US 11,742,945 B2
Extinction ratio testing system for optical transceiver module and extinction ratio testing method for optical transceiver module
Chi-Hsien Sun, New Taipei (TW); and Chieh-Ming Cheng, New Taipei (TW)
Assigned to JESS-LINK PRODUCTS CO., LTD., New Taipei (TW)
Filed by JESS-LINK PRODUCTS CO., LTD., New Taipei (TW)
Filed on Sep. 21, 2022, as Appl. No. 17/949,508.
Application 17/949,508 is a continuation of application No. 17/486,714, filed on Sep. 27, 2021, granted, now 11,496,214.
Claims priority of application No. 110131265 (TW), filed on Aug. 24, 2021.
Prior Publication US 2023/0069106 A1, Mar. 2, 2023
Int. Cl. H04B 10/077 (2013.01); H04B 17/10 (2015.01)
CPC H04B 10/0775 (2013.01) [H04B 17/10 (2015.01)] 10 Claims
OG exemplary drawing
 
1. An extinction ratio testing system (10) applied to an optical transceiver module (20), the extinction ratio testing system (10) characterized by comprising:
a microcontroller (102) electrically connected to the optical transceiver module (20);
an extinction ratio tester (104) electrically connected to the optical transceiver module (20) and the microcontroller (102); and
a thermostat (106) electrically connected to the microcontroller (102),
wherein the extinction ratio testing system (10) is configured to perform a high temperature extinction ratio testing procedure; when the extinction ratio testing system (10) performs the high temperature extinction ratio testing procedure, the microcontroller (102) is configured to control the thermostat (106) to maintain the optical transceiver module (20) at a predetermined high temperature, and then the microcontroller (102) is configured to control the extinction ratio tester (104) to test an extinction ratio of the optical transceiver module (20);
wherein when the extinction ratio testing system (10) performs the high temperature extinction ratio testing procedure to maintain the optical transceiver module (20) at the predetermined high temperature and the extinction ratio of the optical transceiver module (20) is lower than a standard extinction ratio, the microcontroller (102) is configured to control the optical transceiver module (20) to increase a laser operating current (212) of the optical transceiver module (20) to increase the extinction ratio of the optical transceiver module (20);
wherein when the extinction ratio testing system (10) performs the high temperature extinction ratio testing procedure and the extinction ratio of the optical transceiver module (20) is lower than the standard extinction ratio, if a current increasing number that the microcontroller (102) controls the optical transceiver module (20) to increase the laser operating current (212) of the optical transceiver module (20) fails to reach three times, the microcontroller (102) is configured to control the optical transceiver module (20) to increase the laser operating current (212) of the optical transceiver module (20) by 2 mA to increase the extinction ratio of the optical transceiver module (20), and then the current increasing number is increased by one.