US 7,583,550 B2
Semiconductor memory device
Takeshi Ohgami, Tokyo (Japan)
Assigned to Elpida Memory, Inc., Tokyo (Japan)
Filed on Jan. 10, 2008, as Appl. No. 11/972,085.
Claims priority of application No. 2007-002273 (JP), filed on Jan. 10, 2007.
Prior Publication US 2008/0165563 A1, Jul. 10, 2008
Int. Cl. G11C 7/02 (2006.01)
U.S. Cl. 365—207  [365/205] 9 Claims
OG exemplary drawing
 
1. A sense amplifier circuit having a plurality of sense amplifier portions arranged in order,
wherein each of the plurality of sense amplifier portions comprises:
a bit line potential supply line to which a bit line potential is supplied;
a transistor that is connected to the bit line potential supply line and is turned on when a signal level of a precharge signal is in an active state, thereby to supply the bit line potential to a bit line pair in a corresponding column of a memory cell array; and
a gate electrode for supplying the precharge signal to a gate of the transistor;
wherein the gate electrode of the plurality of sense amplifier portions is provided as one piece as a whole and extends in a direction parallel to a row direction in the memory cell array, and
wherein a gate-electrode portion is ring-shaped, said gate electrode portion being a connected portion between the gate electrode in a k-th sense amplifier portion among the plurality of sense amplifier portions and the gate electrode in a (k+1)-th sense amplifier portion, k being an odd number.