| US 7,583,550 B2 | ||
| Semiconductor memory device | ||
| Takeshi Ohgami, Tokyo (Japan) | ||
| Assigned to Elpida Memory, Inc., Tokyo (Japan) | ||
| Filed on Jan. 10, 2008, as Appl. No. 11/972,085. | ||
| Claims priority of application No. 2007-002273 (JP), filed on Jan. 10, 2007. | ||
| Prior Publication US 2008/0165563 A1, Jul. 10, 2008 | ||
| Int. Cl. G11C 7/02 (2006.01) | ||
| U.S. Cl. 365—207 [365/205] | 9 Claims |

| 1. A sense amplifier circuit having a plurality of sense amplifier portions arranged in order,
wherein each of the plurality of sense amplifier portions comprises:
a bit line potential supply line to which a bit line potential is supplied;
a transistor that is connected to the bit line potential supply line and is turned on when a signal level of a precharge signal
is in an active state, thereby to supply the bit line potential to a bit line pair in a corresponding column of a memory cell
array; and
a gate electrode for supplying the precharge signal to a gate of the transistor;
wherein the gate electrode of the plurality of sense amplifier portions is provided as one piece as a whole and extends in
a direction parallel to a row direction in the memory cell array, and
wherein a gate-electrode portion is ring-shaped, said gate electrode portion being a connected portion between the gate electrode
in a k-th sense amplifier portion among the plurality of sense amplifier portions and the gate electrode in a (k+1)-th sense
amplifier portion, k being an odd number.
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