| US 7,583,388 B2 | ||
| Position measurement system | ||
| Yasuji Seko, Kanagawa (Japan); Yoshinori Yamaguchi, Kanagawa (Japan); and Yasuyuki Saguchi, Kanagawa (Japan) | ||
| Assigned to Fuji Xerox Co., Ltd., Tokyo (Japan) | ||
| Filed on Jun. 12, 2006, as Appl. No. 11/450,265. | ||
| Claims priority of application No. 2005-358687 (JP), filed on Dec. 13, 2005. | ||
| Prior Publication US 2007/0133006 A1, Jun. 14, 2007 | ||
| Int. Cl. G01B 11/02 (2006.01) | ||
| U.S. Cl. 356—498 | 12 Claims |
| 1. A position measurement system for measuring positional coordinates of a point under measurement, the system comprising:
one or more detectors configured to measure the point under measurement; and
a computer configured to:
process the measurements of the point under measurement to generate measured positional coordinates;
perform a first noise removal process to remove noise from the measured positional coordinates to acquire first positional
coordinate values;
determine a noise removal parameter on a basis of the first positional coordinate values; and
perform a second noise removal process to again remove noise from the first positional coordinate values by using the noise
removal parameter, without again measuring the point under measurement, and to acquire second positional coordinate values,
the computer outputting the second positional coordinate values.
|