US 7,582,866 B2
Ion trap mass spectrometry
Osamu Furuhashi, Kyoto (Japan); Kengo Takeshita, Kyoto (Japan); and Kiyoshi Ogawa, Kyoto (Japan)
Assigned to Shimadzu Corporation, Kyoto-Fu (Japan)
Filed on Oct. 03, 2007, as Appl. No. 11/866,794.
Prior Publication US 2009/0090860 A1, Apr. 09, 2009
Int. Cl. H01J 49/42 (2006.01); H01J 49/26 (2006.01)
U.S. Cl. 250—292  [250/282; 250/281; 250/290] 4 Claims
OG exemplary drawing
 
1. An ion trap mass spectrometer for MSn analysis, comprising:
a frequency-driven ion trap section operable to trap sample ions and isolate a precursor ion from said sample ions, while setting an ion-trapping RF voltage waveform at a first frequency providing a first low-mass cutoff (LMCO) value, and, then after setting the ion-trapping RF voltage waveform at a second frequency greater than said first frequency to provide a second LMCO value less than said first LMCO value, to irradiate said precursor ion in a tapped state with light so as to photodissociate said precursor ion into fragment ions; and
an analyzer section operable to subject said fragment ions ejected from said ion trap section, to mass spectrometry so as to obtain information about a molecular structure of said precursor ion.