LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 23th DAY OF August, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

N.V. Nutricia: See--
Hageman, Robert Johan Joseph 08003600 Cl. 514-2.
Na, Dae Seok: See--
Kim, Jai Kyeong; Kim, Dong Young; Jo, Seong Mu; Park, Jung Soo; Choi, June Whan; Na, Dae Seok; Yi, Byung Hong; and Lim, Jae Hyun 08004186 Cl. 313-506.
Na, Hyung Jin: See--
Kim, Dong Su; Na, Hyung Jin; Jang, Jae Ho; Kim, Hye-Kyung; and Park, Mo Yoel 08003340 Cl. 435-7.4.
Na, Myoung Joo: See--
Cho, Kyu Nam; Jung, Kwang Jo; Kim, Jong Ryul; and Na, Myoung Joo 08004787 Cl. 360-75.
Na, Yanxin; Wang, Genyuan; and Jin, Hang, to Cisco Technology, Inc. Beamforming techniques to improve ranging signal detection 08005060 Cl. 370-343.
Naam, Ramez; Kern, Randall F.; and Hurst-Hiller, Oliver, to Microsoft Corporation Scoping and biasing search to user preferred domains or blogs 08005810 Cl. 707-706.
Nabes, LLC: See--
Spaller, Robert W. 08004769 Cl. 359-630.
Nadas, Gyula Jozsef: See--
Palazzolo, Christina M.; Pankow, Greg; Nadas, Gyula Jozsef; Oh, Hee Kyu; Liccardo, Peter; Tebbe, Laura Jean; Webb, Guirong Zhou; Dorfman, Steve Scott; and Khullar, Rishi 08005689 Cl. 705-2.
Nadel, Gil; and Kolk, Kristiaan, to Precise Software Solutions, Inc. Object-level database performance management 08005860 Cl. 707-781.
Nadimpalli, Chandrasekhar: See--
Steinfield, Steven W.; Nadimpalli, Chandrasekhar; Moral, Francisco Lopez; Jolly, Jason D.; Portoles, Rafael Ulacia; Argemi, Maria Dinares; and Torgerson, Curtis N. 08002382 Cl. 347-33.
Naeem, Munir D.: See--
Cheng, Kangguo; Naeem, Munir D.; Dobuzinsky, David M.; and Kim, Byeong Y. 08003488 Cl. 438-430.
Naffziger, Samuel: See--
Fischer, Timothy C.; and Naffziger, Samuel 08006115 Cl. 713-501.
Nagabhushanam, Kalyanam: See--
Majeed, Muhammed; Nagabhushanam, Kalyanam; Ramanujam, Rajendran; and Chandramouli, Renukeshwar H. 08003614 Cl. 514-21.91.
Nagae, Masahiro: See--
Murata, Hiroki; Nagae, Masahiro; Shimizu, Hajime; Nakayama, Shigeki; and Onishi, Tomomi 08001953 Cl. 123-568.21.
Nagai, Keiji: See--
Takahashi, Masato; Nagai, Keiji; Dan, Koji; Nakamura, Yutaka; Inoue, Yuuki; Takahashi, Fujio; Hyakutake, Shogo; Murata, Yoshiaki; and Takeda, Kenichi 08005725 Cl. 705-26.8.
Nagai, Kouichi; to Fujitsu Semiconductor Limited Semiconductor device and method for manufacturing the same 08004030 Cl. 257-296.
Nagai, Shinji; Ishihara, Takanobu; Kakizaki, Kouji; Sobukawa, Hiroshi; Murakami, Takeshi; and Inoue, Masahiro, to Gigaphton Inc. Extreme ultraviolet light source apparatus 08003963 Cl. 250-504R.
Nagai, Yoshihiro: See--
Amanai, Masakazu; Kashimura, Masahiko; Nagai, Yoshihiro; Taki, Masato; Honda, Norihiro; and Yamanaka, Kazushi 08004902 Cl. 365-185.21.
Nagamiya, Katsumori; Ishida, Atsushi; and Motoki, Akihiro, to Murata Manufacturing Co., Ltd. Capacitor array and method for manufacturing the same 08004819 Cl. 361-303.
Nagamori, Masashi: See--
Narizuka, Satoru; Hagiwara, Yuji; Nagamori, Masashi; and Yamanaka, Kazuhiro 08003749 Cl. 528-173.
Nagao, Takeshi: See--
Sagara, Hiroaki; Taguchi, Kenji; Ueta, Tetsuji; Nagao, Takeshi; and Uchino, Takashi 08004126 Cl. 310-43.
Nagaoka, Shiro; Takahashi, Kuniaki; Ikehata, Tatsuhiko; and Tashiro, Kei, to Kabushiki Kaisha Toshiba Image pick-up apparatus 08004568 Cl. 348-207.99.
Nagaraj, Thadi M.; Radhakrishnan, Dhinakar; Green, Michael; Jain, Nikhil; Parekh, Nileshkumar J.; and Zou, Qiuzhen, to QUALCOMM Incorporated Method and system for mapping provisioning information of different communications networks 08005475 Cl. 455-432.1.
Nagarajan, Erumaipatty R: See--
Kim, Kimoon; Park, Kyeng-Min; Ko, Young-Ho; Selvapalam, Narayanan; and Nagarajan, Erumaipatty R 08002987 Cl. 210-635.
Nagasaka, Hiroyuki; to Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method 08004651 Cl. 355-53.
Nagasako, Shuuya: See--
Saito, Takashi; Tamura, Masahiro; Suzuki, Nobuyoshi; Nagasako, Shuuya; Kikkawa, Naohiro; Kobayashi, Kazuhiro; Furuhashi, Tomohiro; Hattori, Hitoshi; Tokita, Junichi; Kunieda, Akira; Ichihashi, Ichiro; Maeda, Hiroshi; and Kuriyama, Atsushi 08002274 Cl. 271-217.
Nagasawa, Johnny Yasuo: See--
Bilodeau, Mark T.; Chua, Peter C.; Cosford, Nicholas D. P.; Hoffman, Jacob M.; and Nagasawa, Johnny Yasuo 08003643 Cl. 514-235.8.
Nagase, Ayako: See--
Shigemori, Toshiaki; Fujita, Manabu; Nagase, Ayako; Matsui, Akira; and Nakatsuchi, Kazutaka 08002693 Cl. 600-101.
Nagase, Toshiyuki: See--
Negishi, Takeshi; and Nagase, Toshiyuki 08001682 Cl. 29-840.
Nagashima, Hisayuki; to Honda Motor Co., Ltd. Voice recognition device, voice recognition method, and voice recognition program 08005673 Cl. 704-235.
Nagashima, James M.: See--
Chakrabarti, Sibaprasad; Smith, Gregory S.; Nagashima, James M.; Welchko, Brian A.; Perisic, Milun; and John, George 08002056 Cl. 180-65.22.
Nagata, Akihiro: See--
Onita, Takafumi; and Nagata, Akihiro 08002922 Cl. 156-140.
Nagata, Koji: See--
Ishii, Kenji; Nonaka, Yusuke; and Nagata, Koji 08006054 Cl. 711-162.
Nagata, Toshihiro; Kogure, Atsushi; Kaneko, Isao; Yonekura, Norihisa; and Hanai, Ryo, to Kumiai Chemical Industry Co., Ltd. 3,4-dihalogenoisothiazole derivative, and agricultural or horticultural plant disease-controlling agent 08003675 Cl. 514-361.
Nagauker, Ariel: See--
Lerner, Moshe; Bahar, Ofer; Nagauker, Ariel; and Avidor, Tal 08005149 Cl. 375-240.26.
Nagaya, Toshiatsu; Noda, Kouji; Ikeda, Masatoshi; Nakamura, Masaya; and Shibata, Daisuke, to Denso Corporation Multilayered piezoelectric element and method of producing the same 08004161 Cl. 310-358.
Nagayasu, Hiromitsu: See--
Tamura, Kazuhisa; Ogawa, Naoki; Kawamura, Wataru; Nagayasu, Hiromitsu; Matsui, Takehiko; Fujita, Kinya; Tamai, Masatoshi; Katayama, Kenichi; and Inanaga, Shinobu 08001723 Cl. 47-77.
Nagel, Willi: See--
Baumann, Dietmar; Hofmann, Dirk; Vollert, Herbert; Nagel, Willi; Henke, Andreas; Foitzik, Bertram; and Goetzelmann, Bernd 08002088 Cl. 188-72.7.
Nago, Hajime; Tachibana, Koichi; Zaima, Kotaro; Saito, Shinji; Nunoue, Shinya; and Oka, Toshiyuki, to Kabushiki Kaisha Toshiba Semiconductor light emitting element, method for manufacturing the same, and light emitting device 08004004 Cl. 257-98.
Nagy, Tom: See--
Wang, James; and Nagy, Tom 08005032 Cl. 370-311.
Nai, Kenneth Cheng-Hoe: See--
McMurtry, David Roberts; McFarland, Geoff; Nai, Kenneth Cheng-Hoe; Trull, Stephen James; and Weston, Nicholas John 08001859 Cl. 73-866.5.
Naidu, A. Satyanarayan; to Naidu LP Angiogenin complexes (ANGex) 08003603 Cl. 514-2.5.
Naidu LP: See--
Naidu, A. Satyanarayan 08003603 Cl. 514-2.5.
Naik, Chandrakant Govind: See--
Mahajan, Girish Badrinath; George, Saji David; Ranadive, Prafull Vasant; Mishra, Prabhu Dutt Satyanarayan; Eyyammadichiyil, Sreekumar Sankaranarayanan; Panshikar, Rajan Mukund; Sawant, Satish Namdeo; Krishna, Sridevi; Sivakumar, Meenakshi; Pari, Koteppa; Thomas, Becky Mary; Patel, Zarine Eruch; Vishwakarma, Ram; Naik, Chandrakant Govind; D'Souza, Lisette; and Devi, Prabha 08003602 Cl. 514-2.4.
Naik, Shailesh I.: See--
Russo, Neil; Naik, Shailesh I.; and Silverstein, Steven M. 08002425 Cl. 362-148.
Nair, Rajesh: See--
Cheng, Wen-Chun; Wang, Po-Cheng; and Nair, Rajesh 08005049 Cl. 370-331.
Naito, Masayuki: See--
Kokubo, Koichi; Maki, Kazuya; and Naito, Masayuki 08002364 Cl. 303-155.
Naka, Kenji: See--
Asahara, Akinori; Naka, Kenji; Morioka, Michio; and Inayoshi, Hirokazu 08005612 Cl. 701-208.
Nakabayashi, Masaaki; to Fujitsu Semiconductor Limited Manufacture method for semiconductor device having MIM capacitor, and semiconductor device 08003462 Cl. 438-240.
Nakada, Yasuhiko: See--
Inoue, Osamu; Hasegawa, Shinya; Nakada, Yasuhiko; and Koshizuka, Tsutomu 08004193 Cl. 313-587.
Nakagami, Takashi: See--
Nakano, Koji; Nakagami, Takashi; Kamitani, Hiroyuki; Hattori, Makoto; and Toyama, Koji 08004221 Cl. 318-400.26.
Nakagami, Yasuhiro: See--
Meguro, Masaki; Oda, Tomichiro; Nakagami, Yasuhiro; Marumoto, Shinji; Koyama, Kazuo; and Kaneko, Isao 08003645 Cl. 514-245.
Nakagawa, Katsuya: See--
Naoi, Kanae; Nakagawa, Katsuya; Otokawa, Hideyuki; and Umemoto, Azusa 08005931 Cl. 709-222.
Nakagawa, Kazuhisa: See--
Abe, Toshiyuki; Mita, Junichi; Takaba, Tetsuro; Ono, Nobuhiro; Yamamoto, Shigeki; Nakagawa, Kazuhisa; and Yoshikawa, Kenichi 08002344 Cl. 297-180.13.
Nakagawa, Ken; Shimura, Masaru; Kanari, Kenji; Saito, Seiji; and Doda, Kazuhiro, to Canon Kabushiki Kaisha Image forming apparatus having a transfer unit including an elastic member 08005411 Cl. 399-303.
Nakagawa, Michihiro; Sakuraba, Tamotsu; Shinchi, Toshimi; and Ichikawa, Yukihiko, to Konica Minolta Business Technologies, Inc. Tab sheet insertion apparatus 08002258 Cl. 270-58.32.
Nakagawa, Noriaki; Yamaji, Hidenori; Narukawa, Yoshitaka; Koda, Michitomo; and Yoshimoto, Kazumi, to Sony Corporation Image taking apparatus and method with display and image storage communication with other image taking apparatus 08006276 Cl. 725-105.
Nakagawa, Shinji: See--
Kakuya, Hiromu; Nakagawa, Shinji; Yamaoka, Shiro; and Shimada, Atsushi 08001767 Cl. 60-285.
Nakagawa, Takatoshi: See--
Kondo, Akihiro; Li, Wenzhe; Nakagawa, Takatoshi; Koyama, Nobuto; Taniguchi, Naoyuki; and Kato, Ikunoshin 08003781 Cl. 536-24.5.
Nakagawa, Yoshinori: See--
Ishii, Yasuyuki; Kosugi, Hideki; Takahashi, Tomoko; Nakagawa, Yoshinori; Yamada, Masaaki; and Kadota, Ichiro 08005409 Cl. 399-289.
Oshio, Naomi; Iwasaki, Osamu; Nakagawa, Yoshinori; Masuyama, Atsuhiko; and Otsuka, Naoji 08001921 Cl. 118-114.
Nakahara, Hironori; Takeshita, Nobuo; and Ogawa, Masaharu, to Mitsubishi Electric Corporation Optical disc and optical disc device 08004949 Cl. 369-94.
Nakahara, Ken; and Yamaguchi, Atsushi, to Rohm Co., Ltd. Nitride semiconductor light emitting element 08004006 Cl. 257-99.
Nakahara, Takahito; Yamanaka, Kentaro; Kita, Aya; and Koutoku, Hiroshi, to Astellas Pharma Inc. Method of treating cancer by co-administration of anticancer agents 08003105 Cl. 424-155.1.
Nakahashi, Kensei: See--
Mikkaichi, Takayasu; Nakahashi, Kensei; Kaji, Kunihide; and Kawano, Hironobu 08002695 Cl. 600-104.
Nakahata, Seiji: See--
Hirota, Ryu; Nakahata, Seiji; and Ueno, Masaki 08002892 Cl. 117-84.
Nakahori, Wataru; to TDK Corporation Switching power supply unit 08004867 Cl. 363-56.05.
Nakai, Michihiro; and Sakai, Tetsuya, to Fujikura Ltd. Optical amplifier, fiber laser, and method of eliminating reflected light 08004753 Cl. 359-337.2.
Nakaishi, Hiroshi; and Kubota, Tatsuya, to NEC Corporation Station-side optical network terminal apparatus, subscriber-side optical network terminal apparatus, and optical communication system 08005361 Cl. 398-67.
Nakajima, Hiroyuki: See--
Nakazawa, Yoshihiro; Sumada, Takashi; Nakajima, Hiroyuki; Takenaka, Masahiko; and Inui, Shujiro 08003903 Cl. 200-61.58R.
Nakajima, Ryouichi: See--
Satoji, Fuminori; Nakajima, Ryouichi; Komori, Isao; Okamura, Kazuo; Okuma, Masafumi; and Mitani, Kenichi 08002471 Cl. 384-100.
Nakajima, Setsuo; and Arai, Yasuyuki, to Semiconductor Energy Laboratory Co., Ltd. Thin film semiconductor device having a terminal portion 08003989 Cl. 257-72.
Nakajima, Yuko: See--
Aoyama, Susumu; Nakajima, Yuko; and Takahashi, Tomohiko 08006099 Cl. 713-186.
Nakakado, Masaki; Ichiura, Yuzo; Tanaka, Satoshi; and Tachibana, Ikuo, to Zuiko Corporation Method and apparatus for producing wearing article 08002928 Cl. 156-229.
Nakamasu, Shin: See--
Kataoka, Yoshihiro; Aota, Keiji; and Nakamasu, Shin 08004139 Cl. 310-156.38.
Nakamichi, Koji; and Yamada, Akiko, to Fujitsu Limited QoS information notification method, communication apparatus and inter-domain signaling apparatus for transmitting QoS information over a multi-domain network 08005090 Cl. 370-395.21.
Nakamoto, Keiichi: See--
Sasaki, Yuichiro; Nakamoto, Keiichi; Okashita, Katsumi; Kanada, Hisataka; and Mizuno, Bunji 08004045 Cl. 257-369.
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru, to NOF Corporation Polyalkylene glycol derivative and modified bio-related substance 08003117 Cl. 424-400.
Nakamoto, Tsuyoshi: See--
Abe, Fumihiko; Tanaka, Kengo; Jin, Dongzhi; Matsuzaki, Kazuhiko; Nakamoto, Tsuyoshi; Matsui, Masakazu; Yonehara, Hideharu; Watanabe, Tomotaka; Yamawaki, Kosuke; and Ueno, Takahiro 08001851 Cl. 73-862.335.
Nakamura, Akimasa: See--
Cordonier, Christopher; Shichi, Tetsuya; Numata, Takafumi; Katsumata, Kenichi; Nakamura, Akimasa; Katsumata, Yasuhiro; Komine, Teruo; Amemiya, Kenichirou; Yamashita, Makoto; and Fujishima, Akira 08003219 Cl. 428-432.
Nakamura, Hiroshi: See--
Andoh, Fukashi; and Nakamura, Hiroshi 08005630 Cl. 702-41.
Ogawa, Mikio; Fujita, Norihiro; and Nakamura, Hiroshi 08004903 Cl. 365-185.21.
Nakamura, Hiroshi; Yamauchi, Hitoshi; Abe, Koji; Sekine, Katsuhiko; Tsuboi, Junji; and Souma, Shinji, to Fujikura Rubber Ltd. Developing blade and its manufacturing method 08005408 Cl. 399-284.
Nakamura, Hiroyuki: See--
Sugino, Yuji; Nakamura, Hiroyuki; and Shirai, Motohiro 08001675 Cl. 29-726.
Nakamura, Kazunori: See--
Morita, Takaaki; and Nakamura, Kazunori 08005356 Cl. 398-4.
Nakamura, Kazuo: See--
Uchino, Katsuhide; Yamashita, Junichi; Izumi, Gaku; Nakamura, Kazuo; and Yamamoto, Tetsuro 08004477 Cl. 345-76.
Nakamura, Kentaro: See--
Ebi, Daisuke; Nakamura, Kentaro; Hayashi, Kengo; Hiraishi, Yoshinobu; Morimoto, Shigeo; and Monden, Hiroshi 08002893 Cl. 117-222.
Nakamura, Mahina: See--
Okuma, Yumiko; Nakamura, Mahina; Sato, Maki; Motegi, Tsunehiro; and Sasaki, Yasutsugu 08006198 Cl. 715-810.
Nakamura, Makoto; to Hitachi, Ltd. Control apparatus for internal combustion engine and control method therefor 08001936 Cl. 123-90.16.
Nakamura, Masatoshi: See--
Takayanagi, Shinya; and Nakamura, Masatoshi 08004768 Cl. 359-630.
Nakamura, Masaya: See--
Nagaya, Toshiatsu; Noda, Kouji; Ikeda, Masatoshi; Nakamura, Masaya; and Shibata, Daisuke 08004161 Cl. 310-358.
Nakamura, Masayuki; to Advantest Corporation Duty ratio control apparatus and duty ratio control method 08004332 Cl. 327-175.
Nakamura, Nobuhiro; to Daikin Industries, Ltd. Control apparatus 08004808 Cl. 361-93.2.
Nakamura, Nobuo: See--
Fujita, Hiroaki; Suzuki, Ryoji; Nakamura, Nobuo; and Maruyama, Yasushi 08004019 Cl. 257-222.
Nakamura, Norinaga: See--
Nakashima, Masataka; Hirai, Takeshi; and Nakamura, Norinaga 08003206 Cl. 428-337.
Nakamura, Seiji; and Sou, Hirokazu, to Panasonic Corporation Memory controller for identifying the last valid page/segment in a physical block of a flash memory 08006030 Cl. 711-103.
Nakamura, Shigenobu: See--
Itoh, Kenji; Nakamura, Shigenobu; and Hitomi, Toshiki 08004144 Cl. 310-263.
Nakamura, Shigenobu; to Kyocera Corporation Multi-layer piezoelectric element 08004155 Cl. 310-328.
Nakamura, Taiga; to International Business Machines Corporation Data communications system, terminal, and program 08006312 Cl. 726-29.
Nakamura, Takafumi; and Wakayama, Atsushi, to Fujitsu Toshiba Mobile Communications Limited Mobile communication apparatus 08004996 Cl. 370-241.
Nakamura, Takahiko: See--
Kimura, Kenta; and Nakamura, Takahiko 08001900 Cl. 101-486.
Nakamura, Takahiro; to Sanyo Electric Co., Ltd. Projection-type image display device with cooling mechanism 08002415 Cl. 353-54.
Nakamura, Takehiro: See--
Ishii, Hiroyuki; and Nakamura, Takehiro 08005440 Cl. 455-101.
Nakamura, Takehiro; Hagiwara, Junichiro; Nakano, Etsuhiro; Ohno, Koji; Onoe, Seizo; Higashi, Akihiro; Tamura, Motoshi; Nakano, Masatomo; Kawakami, Hiroshi; and Morikawa, Hiroki, to NTT DoCoMo, Inc. Base station apparatus of mobile communication system 08005120 Cl. 370-509.
Nakamura, Takeshi: See--
Tokumoto, Naoki; and Nakamura, Takeshi 08003196 Cl. 428-172.
Nakamura, Toshikazu; Matsumoto, Kunio; Fukuta, Kazuhiro; Adachi, Kiichi; and Hayata, Daichika, to Kringle Pharma Inc. HGF precursor protein variant and active protein thereof 08003607 Cl. 514-9.5.
Nakamura, Yutaka: See--
Takahashi, Masato; Nagai, Keiji; Dan, Koji; Nakamura, Yutaka; Inoue, Yuuki; Takahashi, Fujio; Hyakutake, Shogo; Murata, Yoshiaki; and Takeda, Kenichi 08005725 Cl. 705-26.8.
Nakane, Masafumi: See--
Tajima, Kenichi; Hayashi, Ryoji; and Nakane, Masafumi 08004324 Cl. 327-156.
Nakanishi, Hiromi: See--
Michitsuji, Yasunori; Nakanishi, Hiromi; and Hirayama, Kenji 08002478 Cl. 385-92.
Nakanishi, Hiromi; and Kihara, Toshiaki, to Sumitomo Electric Industries, Ltd. Bi-directional optical module with improved optical crosstalk 08005367 Cl. 398-138.
Nakanishi, Kazuyuki: See--
Ikegami, Tomoaki; Nishimura, Hidetoshi; and Nakanishi, Kazuyuki 08004014 Cl. 257-202.
Nakanishi, Masatoshi: See--
Muraki, Kaoru; and Nakanishi, Masatoshi 08004548 Cl. 347-211.
Nakanishi, Takuya; and Liang, Zer, to Micron Technology, Inc. Data bus power-reduced semiconductor storage apparatus 08004909 Cl. 365-189.07.
Nakanishi, Yohei: See--
Hanaoka, Kazutaka; Nakanishi, Yohei; Inoue, Yuichi; and Shibasaki, Masakazu 08004640 Cl. 349-136.
Nakano, Daiju: See--
Katayama, Yasunao; and Nakano, Daiju 08005161 Cl. 375-274.
Nakano, Etsuhiro: See--
Nakamura, Takehiro; Hagiwara, Junichiro; Nakano, Etsuhiro; Ohno, Koji; Onoe, Seizo; Higashi, Akihiro; Tamura, Motoshi; Nakano, Masatomo; Kawakami, Hiroshi; and Morikawa, Hiroki 08005120 Cl. 370-509.
Nakano, Katsushi: See--
Kobayashi, Naoyuki; Tanimoto, Akikazu; Mizuno, Yasushi; Shiraishi, Kenichi; Nakano, Katsushi; and Owa, Soichi 08004653 Cl. 355-53.
Nakano, Kayo: See--
Sato, Akira; Nakano, Kayo; and Shirakawa, Yasuhiro 08003563 Cl. 502-305.
Nakano, Keishi: See--
Hashii, Naoya; Nakano, Keishi; Munezane, Tsuyoshi; Yoshimura, Atsushi; and Miyaki, Manabu 08002207 Cl. 239-596.
Nakano, Koji; Nakagami, Takashi; Kamitani, Hiroyuki; Hattori, Makoto; and Toyama, Koji, to Mitsubishi Heavy Industries, Ltd. Inverter system for vehicle-mounted air conditioner 08004221 Cl. 318-400.26.
Nakano, Masatomo: See--
Nakamura, Takehiro; Hagiwara, Junichiro; Nakano, Etsuhiro; Ohno, Koji; Onoe, Seizo; Higashi, Akihiro; Tamura, Motoshi; Nakano, Masatomo; Kawakami, Hiroshi; and Morikawa, Hiroki 08005120 Cl. 370-509.
Nakano, Yuzo: See--
Endo, Takao; Nakano, Yuzo; and Takeuchi, Hayato 08002482 Cl. 396-457.
Nakao, Mitsuhiro: See--
Fukuyoshi, Kenzo; Ishimatsu, Tadashi; Ogata, Keisuke; Nakao, Mitsuhiro; and Uchibori, Akiko 08004028 Cl. 257-294.
Nakashiba, Yasutaka; to Renesas Electronics Corporation Semiconductor device, method of manufacturing the same, and signal transmitting/receiving method using the semiconductor device 08004054 Cl. 257-421.
Nakashiba, Yasutaka; to Renesas Electronics Corporation Semiconductor device 08004062 Cl. 257-531.
Nakashima, Masataka; Hirai, Takeshi; and Nakamura, Norinaga, to Dai Nippon Printing Co., Ltd. Optical laminate 08003206 Cl. 428-337.
Nakashima, Satoshi; Usami, Yasushi; and Sasaki, Kazutaka, to Mitsubishi Chemical Corporation Nonaqueous electrolyte solution secondary battery separator having defined ratio of average pore diameter to maximum pore diameter and nonaqueous electrolyte solution secondary battery using the same 08003262 Cl. 429-251.
Nakashimo, Takao: See--
Imura, Takashi; and Nakashimo, Takao 08004257 Cl. 323-277.
Nakata, Katsuhiko: See--
Sato, Yoichi; Tosaka, Kenji; Hayashi, Mitsuo; Yasuo, Akihiro; Kimura, Hideki; Ueda, Kengo; Nakata, Katsuhiko; Iwakiri, Yoshihisa; Nori, Hitoshi; Haneda, Tomoaki; Tokumitsu, Mika; Shinjo, Naoki; Kuroda, Kouji; and Kusano, Yoshihiro 08004839 Cl. 361-696.
Nakata, Kohei: See--
Miyashita, Harumitsu; Nakata, Kohei; Ueda, Hiroshi; and Ogura, Youichi 08004945 Cl. 369-53.34.
Nakata, Yuichiro: See--
Otsuka, Shinichi; Nakata, Yuichiro; and Fujino, Junji 08003930 Cl. 250-214AL.
Nakatsuchi, Kazutaka: See--
Shigemori, Toshiaki; Fujita, Manabu; Nagase, Ayako; Matsui, Akira; and Nakatsuchi, Kazutaka 08002693 Cl. 600-101.
Nakatsuka, Hitoshi; to Au Optronics Corp. Liquid crystal display and gate modulation method thereof 08004485 Cl. 345-94.
Nakatsuru, Shuichi; Yoshikawa, Megumi; Hiroshima, Shinichi; Kishi, Yoshiro; Kuhara, Motoki; Nishida, Shiyo; and Shinohara, Midori, to Oncotherapy Science, Inc. Methods for damaging cells using effector functions of anti-EphA4 antibodies 08003098 Cl. 424-133.1.
Nakauchi, Akihiro: See--
Ouchi, Chidane; Nakauchi, Akihiro; and Kato, Seima 08004691 Cl. 356-521.
Nakayama, Kenichi; Yokoyama, Masaaki; and Ueda, Masato, to Sumitomo Chemical Company, Limited Organic light-light conversion device 08003976 Cl. 257-40.
Nakayama, Masaaki; Fusa, Shinobu; Kitao, Ichiro; and Maeda, Kenji, to Panasonic Corporation Image pickup apparatus, solid-state imaging device, and image generating method 08005320 Cl. 382-312.
Nakayama, Shigeki: See--
Murata, Hiroki; Nagae, Masahiro; Shimizu, Hajime; Nakayama, Shigeki; and Onishi, Tomomi 08001953 Cl. 123-568.21.
Nakayama, Toru; to Canon Kabushiki Kaisha Printing system and printing method using transfer of compressed image data and compression pattern from host to printing apparatus 08004705 Cl. 358-1.15.
Nakayama, Yoshio; Okino, Susumu; Ukai, Nobuyuki; Murakami, Moritoshi; and Honjo, Shintaro, to Mitsubishi Heavy Industries, Ltd. Hydrogen chloride supply system, air pollution control system, and hydrogen chloride supply control system 08003068 Cl. 423-210.
Nakazato, Kenichi: See--
Nishimura, Hisashi; and Nakazato, Kenichi 08004276 Cl. 324-207.25.
Nakazato, Kenichi; and Watanabe, Masayuki, to Japan Aviation Electronics Industry Limited RD converter and angle detecting apparatus 08004434 Cl. 341-115.
Nakazawa, Akira: See--
Hibbard, Christopher; Silverbrook, Kia; Nakazawa, Akira; Jackson, Garry Raymond; and Morgan, John Douglas Peter 08002384 Cl. 347-42.
Morgan, John Douglas Peter; Nakazawa, Akira; McAuliffe, Patrick John; and Silverbrook, Kia 08002381 Cl. 347-22.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 08002393 Cl. 347-84.
Silverbrook, Kia; Nakazawa, Akira; Hibbard, Christopher; Mackey, Paul Ian; Berry, Norman Micheal; and Jackson, Garry Raymond 08002394 Cl. 347-84.
Nakazawa, Akira; to Guala Technology Co., Ltd. Electric-field-sensitive element and display device using the same 08004737 Cl. 359-240.
Nakazawa, Yoshihiro; Sumada, Takashi; Nakajima, Hiroyuki; Takenaka, Masahiko; and Inui, Shujiro, to Honda Motor Co., Ltd. Side stand switch 08003903 Cl. 200-61.58R.
Nakazono, Takuya: See--
Kitada, Kazuo; Yura, Tomokazu; Nakazono, Takuya; and Koshio, Satoru 08002010 Cl. 156-511.
Nakhjiri, Madjid F.; and Wan, Changsheng, to FutureWei Technologies, Inc. Token-based dynamic key distribution method for roaming environments 08005224 Cl. 380-272.
Nalco Company: See--
Holland, Brian T. 08003707 Cl. 516-78.
Naljotov, Oleg; to Al Saint Riddling machine system 08002458 Cl. 366-217.
Nallaparaju, Suryanarayana Varma: See--
Vaidyanathan, Karthik; and Nallaparaju, Suryanarayana Varma 08005179 Cl. 375-368.
Nalley, James Elwood: See--
Buehler, Christopher D.; Nalley, James Elwood; Ward, Matthew L.; and Woodall, Bruce A. 08005456 Cl. 455-404.2.
Nam, Hyun-Hee; and Park, Jeong-Lyeol, to Crosstek Capital, LLC Photo mask and method for fabricating image sensor using the same 08003307 Cl. 430-317.
Nam, Jang-Jin; and Jeon, Yong-Weon, to Samsung Electronics Co., Ltd. Device for adjusting transmission signal level based on channel loading 08004486 Cl. 345-98.
Nam, Jeong-lim: See--
Koh, Cha-won; Cho, Han-ku; Nam, Jeong-lim; Yeo, Gi-sung; Park, Joon-soo; and Lee, Ji-young 08003543 Cl. 438-717.
Nam, Mun-Ho: See--
Son, Seung-Hyun; Jeon, Sang-Ho; Kim, Hyeon-Seok; Yun, Bok-Chun; Jeong, Sil-Keun; Hwang, Eui-Jeong; Kim, Jung-Min; Choi, Sung-Hyun; Nam, Mun-Ho; Kim, Hyun-Chul; Kim, Sung-Soo; Lee, Hye-Jung; Ahn, Sang-Hyuck; Cho, Sung-Hee; Kim, Gi-Young; Kim, Myoung-Sup; and Park, Hyoung-Bin 08004191 Cl. 313-583.
Nam, Sang-Woo; to Dongbu HiTek Co., Ltd. Single poly type EEPROM and method for manufacturing the EEPROM 08004034 Cl. 257-322.
Nam, Seung Hee: See--
Chang, Youn Gyoung; Nam, Seung Hee; Kim, Nam Kook; and Yoo, Soon Sung 08004098 Cl. 257-797.
Namco Machine & Gear Works Ltd.: See--
Vukovic, Bernard 08001687 Cl. 29-888.
Namkoong, Kak: See--
Rhee, Joo-won; Lee, Young-sun; Namkoong, Kak; and Park, Chin-sung 08003322 Cl. 435-6.
Namkung, Hyun Hee: See--
Jeon, Byeong Hwan; Park, Kyoung Soo; Kim, Bong Yong; Kwon, Young Jin; Yoon, Kang Bae; Shin, Kyong Hun; Namkung, Hyun Hee; Seo, Hyun Joo; and Lee, Cheon Seok 08003017 Cl. 252-511.
Nammatsu, Toshihiro; and Saito, Yasuaki, to Hitachi, Ltd Method for analyzing fault caused in virtualized environment, and management server 08006134 Cl. 714-26.
Nanba, Toyoaki: See--
Matsumoto, Yoshitaka; Nanba, Toyoaki; and Tsuji, Masaru 08002273 Cl. 271-209.
Nanda, Sanjiv: See--
Abraham, Santosh; Nandagopalan, Saishankar; Nanda, Sanjiv; and Sampath, Ashwin 08004992 Cl. 370-236.
Nandagopalan, Saishankar: See--
Abraham, Santosh; Nandagopalan, Saishankar; Nanda, Sanjiv; and Sampath, Ashwin 08004992 Cl. 370-236.
Nanjundaswamy, Kirakodu S.: See--
Bofinger, Todd E.; Bowden, William L.; Cintra, George; Nanjundaswamy, Kirakodu S.; Sirotina, Rimma A.; Totir, Dana Alexa; and Zhang, Fan 08003254 Cl. 429-224.
Nanke, Ralf: See--
Buchholtz, Gerhard; Fehre, Jens; Granz, Bernd; Hoheisel, Martin; Kruft, Werner; Lanski, Markus; Mahler, Matthias; Meinert, Christian; Mertelmeier, Thomas; Nanke, Ralf; and Rattner, Manfred 08002718 Cl. 601-4.
NanoBioMagnetics, Inc.: See--
Seeney, Charles E.; and Yuill, William A. 08001977 Cl. 128-899.
Nanya Technology Corp.: See--
Lo, Yi-Jen; Chiu, Yu-Shan; Su, Kuo-Hui; and Lin, Chiang-Hung 08003528 Cl. 438-656.
Nanya Technology Corporation: See--
Chen, Jung-Hua 08003457 Cl. 438-212.
Naoi, Kanae; Nakagawa, Katsuya; Otokawa, Hideyuki; and Umemoto, Azusa, to Sharp Kabushiki Kaisha Service providing apparatus 08005931 Cl. 709-222.
Naoi, Koichi: See--
Miya, Yukio; Naoi, Koichi; Tase, Fumio; and Tanokura, Yukio 08003225 Cl. 428-687.
Naota, Hiroaki: See--
Shiku, Hiroshi; Hiasa, Atsunori; Okumura, Satoshi; Naota, Hiroaki; and Miyahara, Yoshihiro 08003770 Cl. 536-23.1.
Napo Enterprises, LLC: See--
Curtis, Scott 08006199 Cl. 715-811.
Napolitano, David J.; DeBusschere, Brian Derek; McLaughlin, Glen W.; Mo, Larry Y. L.; Chou, Ching-Hua; Ji, Ting-Lan; and Steins, Robert W., to Zonaire Medical Systems, Inc. Continuous transmit focusing method and apparatus for ultrasound imaging system 08002705 Cl. 600-437.
Nar, Herbert: See--
Priepke, Henning; Dahmann, Georg; Gerlach, Kai; Nar, Herbert; Pfau, Roland; Schuler-Metz, Annette; and Wienen, Wolfgang 08003639 Cl. 514-217.01.
Narasimhan, Dave: See--
Thompson, Eric; Narasimhan, Dave; Moreland, Jeffrey C.; and Mohd. Ghazaly, Hafsah binti 08001809 Cl. 66-174.
Narasimhan, Rashmi: See--
Abdul, Anis M.; Mahajan, Ajay Kumar; Narasimhan, Rashmi; and Pietraniec, Nicholas A. 08006135 Cl. 714-27.
Narayan, Anand P: See--
Lamba, Gagandeep Singh; Guess, Tommy; McCloud, Michael; and Narayan, Anand P 08005128 Cl. 375-144.
Narayan, deceased, Opendra; and Liu, Zhenqian DNA vaccine compositions and methods of use 08003113 Cl. 424-208.1.
Narayanan, Ajit: See--
Chatterjee, Paresh; Narayanan, Ajit; Ranganathan, Loganathan; and Enoch, Sharon 08006061 Cl. 711-170.
Narayanan, Sankaran; Sekaran, Dhigha; Vermette, Charles A.; and Yan, Hao, to Microsoft Corporation Distributed routing of conferences using conference identifier 08005895 Cl. 709-204.
Narikawa, Tetsuro; to Casio Computer Co., Ltd. Light source unit and projector 08002413 Cl. 353-37.
Narimatsu, Masayasu: See--
Yamanaka, Takayuki; Narimatsu, Masayasu; Saikoh, Hideji; Saito, Junichi; and Kido, Eiichi 08005403 Cl. 399-228.
Narizuka, Satoru; Hagiwara, Yuji; Nagamori, Masashi; and Yamanaka, Kazuhiro, to Central Glass Company, Limited Fluorine-containing dicarboxylic acids and their novel polymer compounds 08003749 Cl. 528-173.
Narukawa, Yoshitaka: See--
Nakagawa, Noriaki; Yamaji, Hidenori; Narukawa, Yoshitaka; Koda, Michitomo; and Yoshimoto, Kazumi 08006276 Cl. 725-105.
Narumi, Satoshi: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto 08005406 Cl. 399-258.
Naruse, Kazushi: See--
Ichijo, Hisao; Adan, Alberto; Naruse, Kazushi; and Kagisawa, Atsushi 08004040 Cl. 257-341.
Nashiki, Tomotake; Sugawara, Hideo; Andou, Hidehiko; and Yoshitake, Hidetoshi, to Nitto Denko Corporation Transparent electrically-conductive film 08003200 Cl. 428-212.
Nasrullah, Jawad: See--
Burr, James B.; Bagchi, Archisman; and Nasrullah, Jawad 08003471 Cl. 438-300.
Nasukawa, Tetsuya; Roy, Shourya; Subramaniam, L. Venkata; and Takeuchi, Hironori, to International Business Machines Corporation Technique for searching for keywords determining event occurrence 08005829 Cl. 707-730.
National Chung Hsing University: See--
Huang, Chieh-Chen; Chang, Jui-Jen; Ho, Cheng-Yu; Chen, Wei-En; Lay, Jiunn-Jyi; Chou, Chia-Hung; and Han, Chang-Lung 08003344 Cl. 435-42.
National Institute for Materials Science: See--
Hirosaki, Naoto; Emoto, Hideyuki; and Ibukiyama, Masahiro 08003011 Cl. 252-301.4F.
National Institute of Advanced Industrial Science and Technology: See--
Asaka, Kinji; Mukai, Ken; and Hata, Kenji 08004146 Cl. 310-300.
Goto, Masataka; Fujihara, Hiromasa; and Okuno, Hiroshi 08005666 Cl. 704-207.
Yatsuo, Tsutomu; Harada, Shinsuke; Fukuda, Kenji; and Okamoto, Mitsuo 08003991 Cl. 257-77.
National Institute of Information and Communications Technology, Incorporated Administrative Agency: See--
Kawanishi, Tetsuya; and Izutsu, Masayuki 08005371 Cl. 398-188.
National Research Council of Canada: See--
Monchalin, Jean-Pierre; Blouin, Alain; and Campagne, Benjamin 08004689 Cl. 356-502.
National Semiconductor Corporation: See--
Bu, Jiankang; Jacobson, Lee James; and Labonte, Andre Paul 08004032 Cl. 257-315.
Buchanan, Benjamin Clyde; and Rosselot, David Richard 08004961 Cl. 370-216.
Hopper, Peter J. 08004303 Cl. 324-762.01.
Hopper, Peter J.; Johnson, Peter; Hwang, Kyuwoon; Mian, Michael; and Drury, Robert 08004061 Cl. 257-531.
Liu, Hsing-Chien Roy; and Chan, Wai Cheong 08004329 Cl. 327-161.
Manickam, Tulsi; Sallaway, Peter J.; Raghavan, Sreen A.; Phanse, Abhijit M.; and Wieser, James B. 08005135 Cl. 375-232.
National Sun Yat-Sen University: See--
Huang, Kwang-Yao; Lo, Chia-Yao; and Huang, Sheng-Lung 08001806 Cl. 65-384.
National Taipei University of Technology: See--
Chang, Wen-Chung 08001651 Cl. 15-319.
National Taiwan University: See--
Lin, Tsung-Hsien; and Chen, Yu-Yu 08004437 Cl. 341-143.
National University Corporation Nara Institute of Science and Technology: See--
Kamitakahara, Masanobu; Tanihara, Masao; Ohtsuki, Chikara; and Ogata, Shinichi 08003611 Cl. 514-17.2.
Nationz Technologies Inc.: See--
Yu, Yunbo; and Zhu, Shan 08002196 Cl. 235-492.
Natsubori, Shigeyasu: See--
Kambayashi, Toru; Kanai, Tatsunori; Saito, Takeshi; Yao, Hiroshi; Natsubori, Shigeyasu; Hori, Osamu; Kaneko, Toshimitsu; Morohoshi, Toshihiro; Harashima, Takahiro; Suzuki, Yoshinori; Oyanagi, Shigeru; and Aikawa, Takeshi 08006272 Cl. 725-70.
Natsume, Masahiko; to Sharp Kabushiki Kaisha Communication apparatus 08004707 Cl. 358-1.15.
Nauka, Krzysztof: See--
Sheng, Xia; Zhou, Zhang-Lin; Nauka, Krzysztof; and Yang, Chung Ching 08003980 Cl. 257-40.
Nautilus, Inc.: See--
Crawford, Douglas A.; Warner, Patrick A.; Golesh, Eric D.; Flick, Edward L.; and Wang, Lopin 08002680 Cl. 482-108.
Dibble, Ryan R.; Warner, Patrick A.; Golesh, Eric D.; and Christopher, Brent 08002677 Cl. 482-92.
Piaget, Gary; Christopher, Brent; Cook, Brian R.; Crawford, Douglas A.; Flick, Edward L.; Golesh, Eric D.; Monette, Ben; Potter, Randal; Singh, Todd; Rauwerdink, Matt; Warner, Patrick A.; and Smith, Bradley J. 08002674 Cl. 482-52.
Nawata, Yasuhiro: See--
Kobushi, Hiromu; Handa, Masayoshi; and Nawata, Yasuhiro 08003210 Cl. 428-402.
Nawaz, Mohsin: See--
Winkler, Bernhard; Nawaz, Mohsin; and Schoen, Florian 08004372 Cl. 333-186.
Nayebdadash, Ali; to Lear Fitness, Inc. Abdominal exercise device with plunger 08002683 Cl. 482-140.
Nayler, Oliver: See--
Bolli, Martin; Lehmann, David; Mathys, Boris; Mueller, Claus; Nayler, Oliver; Steiner, Beat; and Velker, Jörg 08003800 Cl. 548-131.
NBCUniversal Media LLC: See--
Fyvie, Thomas Joseph; Gascoyne, David Gilles; Peters, Andrea Jeannine; and Wisnudel, Marc Brian 08002851 Cl. 8-506.
nComputing Inc.: See--
Song, Young; Maier, Klaus A.; and Kipnis, Sergey 08005962 Cl. 709-227.
NCTEngineering GmbH: See--
May, Lutz 08004813 Cl. 361-143.
NDS Limited: See--
Mantin, Itsik; Sella, Yaron; and Waisbard, Erez 08005215 Cl. 380-46.
Neale, Adel Fay: See--
Casci, John Leonello; Holt, Elizabeth Margaret; and Neale, Adel Fay 08003566 Cl. 502-328.
Neale, Richard Scott: See--
Figueredo, Vincent Michael; Roman, Kendyl Allen; Raposo, Paul; Neale, Richard Scott; Hoomani, Cyrus J.; and Broadbent, Thomas Joseph 08004572 Cl. 348-211.8.
NEC Communication Systems, Ltd.: See--
Enomoto, Tadashi 08005005 Cl. 370-252.
NEC Corporation: See--
Amano, Mari; Tada, Munehiro; Furutake, Naoya; and Hayashi, Yoshihiro 08004087 Cl. 257-762.
Chono, Keiichi 08005317 Cl. 382-284.
Furukawa, Jun 08005211 Cl. 380-30.
Hirayama, Tomohisa 08004362 Cl. 330-277.
Hisamatsu, Hidenori 08005078 Cl. 370-360.
Honma, Hiromi 08004443 Cl. 341-155.
Ikenaga, Yoshifumi; and Nomura, Masahiro 08004348 Cl. 327-540.
Ikenaga, Yoshifumi; and Nomura, Masahiro 08004351 Cl. 327-544.
Kajitani, Hiroshi; Kimura, Hidekazu; Manako, Takashi; Yoshitake, Tsutomu; and Kubo, Yoshimi 08003266 Cl. 429-414.
Karino, Shuichi; and Jibiki, Masahiro 08004965 Cl. 370-220.
Kawaura, Hisao; and Sunamura, Hiroshi 08003969 Cl. 257-2.
Kondo, Seiji 08005047 Cl. 370-331.
Miyauchi, Nobuaki 08005464 Cl. 455-414.1.
Mori, Kentaro; Kikuchi, Katsumi; and Yamamichi, Shintaro 08004074 Cl. 257-686.
Nakaishi, Hiroshi; and Kubota, Tatsuya 08005361 Cl. 398-67.
Nose, Koichi; and Mizuno, Masayuki 08004268 Cl. 324-76.77.
Ootsuki, Michihito; Sukekawa, Masazumi; Iwasaki, Mitsutaka; and Tsukagoshi, Toshihiro 08004323 Cl. 327-156.
Shimizu, Takanori 08005122 Cl. 372-18.
Shimonishi, Hideyuki 08004985 Cl. 370-232.
Shimonishi, Hideyuki 08004989 Cl. 370-235.
Tsunemi, Yasuaki; and Yamamoto, Takehiro 08005830 Cl. 707-730.
Yamamichi, Shintaro; Kikuchi, Katsumi; Sakai, Jun; and Kouta, Hikaru 08004085 Cl. 257-758.
NEC Energy Devices, Ltd.: See--
Hirota, Yoshitomo 08003249 Cl. 429-186.
NEC Europe Ltd.: See--
Tartarelli, Sandra; Schlegel, Roman; Niccolini, Saverio; and Brunner, Marcus 08005074 Cl. 370-352.
NEC Laboratories America, Inc.: See--
Djordjevic, Ivan B.; Cvjetic, Milorad; Xu, Lei; and Wang, Ting 08006163 Cl. 714-758.
Ganai, Malay; and Gupta, Aarti 08005661 Cl. 703-22.
Sankaranarayanan, Sriram; Gupta, Aarti; Ivancic, Franjo; and Shlyakhter, Ilya 08006239 Cl. 717-154.
NEC LCD Technologies, Ltd: See--
Sakamoto, Michiaki; Kondo, Yuji; and Honbo, Nobuaki 08004490 Cl. 345-107.
Neeb, Daniel A.; and MontAlto, Thomas P. Apparatus for reducing the incidence of tampering with automatic fire sprinkler assemblies 08002046 Cl. 169-37.
Negele, Wolfgang; to Multivac Sepp Hagggenmüller GmbH & Co. KG Packaging machine having a lifting unit 08001749 Cl. 53-510.
Negishi, Takeshi; and Nagase, Toshiyuki, to Mitsubishi Materials Corporation Insulation substrate, power module substrate, manufacturing method thereof, and power module using the same 08001682 Cl. 29-840.
Negre, Jean-Eric: See--
De Kimpe, Thierry; Negre, Jean-Eric; and Czernichow, Jean 08002031 Cl. 166-250.01.
Nei, Kosei: See--
Suzawa, Hideomi; Sasagawa, Shinya; Shimomura, Akihisa; Momo, Junpei; Kurata, Motomu; Muraoka, Taiga; and Nei, Kosei 08003483 Cl. 438-406.
Neider, Bradley E: See--
Holtz, Alex; Buehnemann, David E; Fres, Gilberto; Hickenlooper, III, Harrison T; Hoeppner, Charles M; Morrow, Kevin K; Neider, Bradley E; Nordin, III, Loren J; Parker, Todd D; and Snyder, Robert J 08006184 Cl. 715-723.
Neilan, John: See--
Brady, Eamon; Vale, David; Kelly, Ronald; Neilan, John; Horan, Steven; Rabitte, Gerard; and McCaffrey, Gerry 08002790 Cl. 606-200.
Nekarda, Jan-Frederik: See--
Grohe, Andreas; Nekarda, Jan-Frederik; and Schultz-Wittmann, Oliver 08003530 Cl. 438-660.
Nektar Therapeutics: See--
Harris, J. Milton; and Kozlowski, Antoni 08003742 Cl. 526-260.
Nellcor Puritan Bennett LLC: See--
Greenwald, Scott D.; Devlin, Philip H.; and Sigl, Jeffrey C. 08005534 Cl. 600-544.
Wallace, Charles L.; Sanborn, Warren G.; Arnett, David; Butterbrodt, Jay; and Ferguson, Howard L. 08001967 Cl. 128-204.21.
Nelles, Gabriele: See--
Miteva, Tzenka; Nelles, Gabriele; and Yasuda, Akio 08003884 Cl. 136-263.
Nelms, II, Terry Lee: See--
Dennerline, David Allen; Nelms, II, Terry Lee; and Palmer, Jr., Bernard Paul 08006303 Cl. 726-23.
Nelson, Arthur Russell: See--
Donckers, II, J. Michael; Nelson, Arthur Russell; and Moon, Chester Darryl 08003208 Cl. 428-359.
Nelson, Brent W.: See--
Peterson, Bruce D.; and Nelson, Brent W. 08001914 Cl. 111-175.
Nelson, Donald; and Ikits, Milan, to Immersion Medical, Inc. Simulation of coupled objects 08005659 Cl. 703-11.
Nelson, Erik: See--
Keese, Roger; Munk, Trevor; Abbas, Raafat; Nelson, Erik; and Vidick, Benoit 08002049 Cl. 175-64.
Nelson, Frederick J: See--
O'Connor, Timothy J; and Nelson, Frederick J 08002956 Cl. 204-279.
Nelson, James S.; and Smahel, Judene, to Fairbault Foods, Inc. Hydration process for a refried bean product 08003154 Cl. 426-634.
Nelson, John C.: See--
Schultz, John C.; Sykora, Michael J.; Kristoffersen, Martin; Hagen, Kathy L.; Casner, Glenn E.; Albrecht, Bonnie W.; Brott, Robert L.; Brigham, Scott E.; and Nelson, John C. 08004622 Cl. 349-15.
Nelson, John E.: See--
Larson, Roger D.; Fergen, James E.; Nelson, John E.; Brace, Thomas J.; Kieffer, Michael J.; Yorkovich, John D.; Karel, Gerald L.; Marsolek, Gerald G.; Schwietz, Jr., Joseph E.; Grunes, Mitchell B.; McLeod, Kathleen M.; Willems, Richard M.; and Wurz, Ronald C. 08002182 Cl. 235-385.
Nelson, Lionel M.: See--
Boucher, Ryan P.; Paraschac, Joe; Doelling, Eric N.; Gillis, Edward M.; Cole, David H.; and Nelson, Lionel M. 08001971 Cl. 128-848.
Nelson, Mark E.; Dykman, Arkady Samuilovich; Zinenkov, Andrey Vladimirovich; Pinson, Victor Vladimirovich; and Grebenshchikov, Ilja Nikolayevich, to Sabic Innovative Plastics IP B.V. Method for producing phenol and acetone 08003827 Cl. 568-398.
Nelson, Matthew: See--
Boudewyns, Philllip R.; Nelson, Matthew; and Jessen, Jerry 08004507 Cl. 345-204.
Nelson, Michael Earl: See--
Jenkins, Cary Porter; Jenkins, Price Eugene; Flannery, II, Robert Randolph; and Nelson, Michael Earl 08005741 Cl. 705-36R.
Nelson, Robert A.; and Sobel, Robert M., to FONA Technologies, Inc. Method for making dried whey protein product 08003147 Cl. 426-471.
Nelson, Tim E.: See--
Wolfe, Don P.; Nottage, Douglas S.; Wagoner, Kevin J.; and Nelson, Tim E. 08005731 Cl. 705-35.
Nemtuda, David: See--
Hirtenstein, Edith; and Nemtuda, David 08005759 Cl. 705-306.
Neogi, Anindya: See--
Agarwal, Manoj K.; Gupta, Manish; Kar, Gautam; Kermani, Parviz; and Neogi, Anindya 08006230 Cl. 717-120.
Neology, Inc.: See--
Martinez de Velasco Cortina, Francisco; and Rietzler, Manfred 08004410 Cl. 340-572.4.
Neomics Co., Ltd.: See--
Kim, Sunghoon; and Choi, Jin Woo 08003780 Cl. 536-24.5.
Neotech Products, Inc.: See--
Goldstein, Mitchell; and Heyman, Arnold M. 08001966 Cl. 128-204.18.
Nepsund, Larry; Kuempel, Bradley; Engel, Donald P.; Boehrs, Bruce Allen; Anderson, Sheldon; Bucholtz, Richard L.; and Lundgren, Thomas John, to Donaldson Company, Inc. Air filter having fluted filter media 08002869 Cl. 55-481.
Neptune Wave Power, LLC: See--
Hench, Steven C. 08004104 Cl. 290-53.
Nereus Pharmaceuticals, Inc.: See--
Ling, Taotao; and Danishefsky, Samuel 08003802 Cl. 548-217.
Nesbitt, Pamela A.: See--
Kumhyr, David B.; and Nesbitt, Pamela A. 08006097 Cl. 713-183.
Ness, Everett Alan: See--
Turek, Caroline M.; McAneney Lannen, Gwynne Evelyn; Allen, C. Geoffrey; and Ness, Everett Alan 08002399 Cl. 347-99.
Ness Inventions, Inc.: See--
Ness, John T.; and Ness, Jeffrey A. 08002536 Cl. 425-217.
Ness, Jeffrey A.: See--
Ness, John T.; and Ness, Jeffrey A. 08002536 Cl. 425-217.
Ness, John T.; and Ness, Jeffrey A., to Ness Inventions, Inc. Concrete block machine having a controllable cutoff bar 08002536 Cl. 425-217.
Nestec S.A.: See--
Cahen, Antoine; Cahen, Philippe; and Boussemart, Christophe S. 08002146 Cl. 222-108.
Neta, Avraham: See--
Yodfat, Ofer; and Neta, Avraham 08002752 Cl. 604-198.
NetApp, Inc.: See--
Clayton-Luce, Timothy 08006059 Cl. 711-170.
Goodson, Garth Richard; Susarla, Sai; and Srinivasan, Kiran 08006079 Cl. 713-1.
Jernigan, IV, Richard P. 08005793 Cl. 707-639.
Neter, Witold; Hoenisch, Marek; Wegmann, Klaus; Schweininger, Stefan; and Wagner, Christian, to MHT Mold & Hotrunner Technology AG Neck block cooling 08002540 Cl. 425-552.
Network Protection Sciences, LLC: See--
Carlander, Carrie 08005913 Cl. 709-207.
Neubauer, Claus: See--
Chen, Terrence; Yuan, Chao; Sheikh, Abdul Saboor; and Neubauer, Claus 08005771 Cl. 706-12.
Neubrand, Frank; to Wilhelm Karmann GmbH Convertible top having over center backlight 08002326 Cl. 296-107.07.
Neufeld, Jeffrey M.: See--
Erbey, William C.; Bulman, Russell G.; Leist, Robert J.; Edgecomb, Mary K.; Vetal, Donald; Bonola, Armand; Hudson, Stephanie M.; Neufeld, Jeffrey M.; Toussaint-Blackman, Debra; Weaver, Rosemary; Blum, Sandy; and Bucspun, Federico 08005730 Cl. 705-34.
Neuman, Darren: See--
Zhong, Sheng; Neuman, Darren; and Schoner, Brian 08005312 Cl. 382-260.
Neuman, George A.: See--
Tonar, William L.; Cammenga, David J.; Anderson, John S.; Poll, David L.; Neuman, George A.; Stray, Joel A.; Busscher, Bradley L.; and Ypma, Kenton J. 08004741 Cl. 359-267.
Neumann, Felix: See--
Wirth, Georg; and Neumann, Felix 08001770 Cl. 60-286.
Neumann, Markus; to ST-Ericsson SA Synchronization scheme with adaptive reference frequency correction 08004322 Cl. 327-156.
Neumann, Stephen M.: See--
Pearson, Douglas H.; Neumann, Stephen M.; and Petranek, Diana C. 08002398 Cl. 347-86.
Neumann, Thomas; to Nortis, Inc. Method for creating perfusable microvessel systems 08003388 Cl. 435-395.
Neumetzler, Heiko; and Beetz, Martin, to ADC GmbH Protective plug for distribution frame devices in telecommunications and data technology 08005205 Cl. 379-412.
Neupert, Werner; Seon, Aurelia; Simoes-Nunes, Carlos; and Wehrli, Christof, to DSM IP Assets B.V. Aryl derivatives of curcumin, demethoxycurcumin, bisdemethoxycurcumin or curcuminisoxazolide and their use as animal feed additives 08003686 Cl. 514-449.
Neurim Pharmaceuticals (1991) Ltd.: See--
Peleg-Shulman, Tal; Laudon, Moshe; and Daily, Dorah 08003702 Cl. 514-646.
NeuroArm Surgical Ltd.: See--
Sutherland, Garnette Roy; Louw, Deon Francois; McBeth, Paul Bradley; Fielding, Tim; and Gregoris, Dennis John 08005571 Cl. 700-248.
Neurogen Corporation: See--
Bakthavatchalam, Rajagopal; Capitosti, Scott M.; Xu, Jianjun; Chenard, Bertrand L.; Ghosh, Manuka; and Blum, Charles A. 08003656 Cl. 514-263.3.
NeuStar, Inc.: See--
Rachitsky, Lenny; Drees, Tim; and Taylor, Douglas 08005890 Cl. 709-202.
Neuveut, Christine: See--
Langlade-Demoyen, Pierre; Garcia Pons, Fransisco; Adotevi, Olivier; Cardinaud, Sylvain; Neuveut, Christine; Kosmatopoulos, Kostas; Graff-Dubois, Stéphanie; and Menez-Jamet, Jeanne 08003773 Cl. 536-23.2.
Neves, Jose Luis Pontes Correla: See--
Berry, Christopher J.; Neves, Jose Luis Pontes Correla; Hwang, Charlie Chornglii; and Lewis, David Wade 08006213 Cl. 716-124.
Nevill-Manning, Craig; and Renaker, Pearl, to Google Inc. Method and apparatus for output of search results 08006197 Cl. 715-788.
Neville, Thomas B.; Nowakowski, John J.; Hannum, Mark C.; and Robertson, Thomas F., to Fives North American Combustion, Inc. Combustion method and apparatus 08002541 Cl. 431-174.
New, Richard M. H.: See--
De Souza, Jorge Campello; Chu, Frank R.; Han, Chunqi; Kulkarni, Anand Krishnamurthi; Molaro, Donald Joseph; New, Richard M. H.; and Sanvido, Marco 08006047 Cl. 711-156.
New York University: See--
Rosenberg, Martin Jay 08003598 Cl. 514-1.1.
Newbery, Miranda: See--
Silver, Joshua David; Robertson, Andrew; and Newbery, Miranda 08002403 Cl. 351-110.
Newfrey LLC: See--
Rosemann, Frank 08002509 Cl. 411-549.
Newman, David L. Intellectual property distribution system and method for distributing licenses 08005748 Cl. 705-37.
Newport Corporation: See--
Culpi, William; Bryant, William E.; and Rickman, John M. 08004527 Cl. 345-440.2.
Newport Media, Inc.: See--
Elsayed, Elsayed Ahmed; and Yousef, Nabil 08005173 Cl. 375-343.
Khalil, Ahmed; and Yousef, Nabil 08005990 Cl. 709-247.
Youssoufian, Edward; and Fahim, Amr 08005449 Cl. 455-226.2.
Newtec Services Group, Inc.: See--
Williams, Keith; and Maston, Michael Joseph 08001879 Cl. 86-54.
Newton, Mark W.: See--
Hoek, Steven G.; and Newton, Mark W. 08004425 Cl. 340-903.
Nexans: See--
Bremnes, Jarle Jansen 08005324 Cl. 385-12.
Neyens, Guido: See--
Knevels, Johan; Mingneau, Frank; and Neyens, Guido 08001856 Cl. 73-864.56.
Neyra, Percy E.: See--
Mayega, Valerian; Neyra, Percy E.; and Smith, Brett E. 08004248 Cl. 320-145.
Ng, Eng Jye: See--
Guo, Dianbo; Ng, Eng Jye; and Tan, Kien Beng 08004340 Cl. 327-333.
Ng, Jin-Aun; Yang, Wen-Chih; Chen, Chien-Liang; Fei, Chung-Hau; Chang, Maxi; Young, Bao-Ru; and Chuang, Harry, to Taiwan Semiconductor Manufacturing Company, Ltd. Method for making a semiconductor device having metal gate stacks 08003467 Cl. 438-285.
Ng, Krates: See--
Zuzga, Brian; Bley, John B.; Addleman, Mark Jacob; and Ng, Krates 08005943 Cl. 709-224.
Ng, Susanne San San: See--
Kan, Shyi Herng; Ying, Jackie Y.; Yu, Hanry; Schumacher, Karl; Ng, Susanne San San; and Sun, Wanxin 08003380 Cl. 435-297.1.
Ng, Wei Beng: See--
Ishida, Takehisa; and Ng, Wei Beng 08004167 Cl. 313-311.
Ng, Wing-Chak: See--
Fitts, Jr., James Russell; Hughes, Janis Wilson; Calhoun, Patricia Hwang; Ng, Wing-Chak; and Walton, Glynis Allicia 08003553 Cl. 442-394.
Ng, Yee S.; and Logel, Robert C., to Eastman Kodak Company Method and apparatus for printing using a tandem electrostatographic printer 08005415 Cl. 399-342.
Ngeno, Peter Kiprotich: See--
Colliver, Steven Peter; Ngeno, Peter Kiprotich; and Thiru, Ambalavanar 08003153 Cl. 426-597.
NGK Insulators, Ltd.: See--
Ito, Koichi; and Tokunaga, Takeshi 08003035 Cl. 264-267.
Iwata, Yuichi; Mitomi, Osamu; Kondo, Jungo; Aoki, Kenji; Yoshino, Takashi; and Hamajima, Akira 08002998 Cl. 216-24.
Ogura, Yutaka 08003191 Cl. 428-116.
Ngo, Vinh X.: See--
Old, David W.; and Ngo, Vinh X. 08003680 Cl. 514-381.
Ngola, Sarah M.: See--
Zhang, Jingwu; Sundararajan, Narayan; Ngola, Sarah M.; and Li, Handong 08003408 Cl. 436-525.
Nguy, Chanwa: See--
Lin, Pei-Ying; and Nguy, Chanwa 08002124 Cl. 211-70.6.
Nguyen, Beth: See--
Lake, Thomas; Snow, Alan D.; Castillo, Gerardo; Nguyen, Beth; Sanders, Virginia; Hu, Qubai; and Cam, Judy A. 08003612 Cl. 514-17.8.
Nguyen, Binh T.; and Paulsen, Craig A., to IGT Tournament game system and method using a tournament game card 08002630 Cl. 463-25.
Nguyen, Huy: See--
Lam, Lawrence; and Nguyen, Huy 08004829 Cl. 361-679.09.
Nguyen, Khiem K.: See--
Lewington, Richard; Grimbergen, Michael N.; Nguyen, Khiem K.; Bivens, Darin; Chandrachood, Madhavi R.; and Kumar, Ajay 08002946 Cl. 156-345.51.
Nguyen, Loc; Hammad, Ayman; and Gauthier, Patrick, to Visa U.S.A. Inc. Method and system for providing a distributed adaptive rules based dynamic pricing system 08005763 Cl. 705-400.
Nguyen, Qui Vi: See--
Pan, Feng; Wang, Yuxin; Huynh, Jonathan H.; Chang, Albert; Htoo, Khin; and Nguyen, Qui Vi 08004917 Cl. 365-211.
Nguyen, Son: See--
Maynard, Jeff; and Nguyen, Son 08004491 Cl. 345-156.
Nguyen, Thanh Quoc: See--
Connors, Michael Patrick; and Nguyen, Thanh Quoc 08005252 Cl. 381-381.
Nhamias, Alain: See--
Vergnault, Guy; Grenier, Pascal; Nhamias, Alain; Scherer, Dieter; Beck, Petra; and Cancade, Patricia 08003690 Cl. 514-462.
NHN Corporation: See--
Lee, Ram; Hong, Min-Hyung; and Chung, Hyun-Joo 08005837 Cl. 707-736.
Nhu, Hoang; to Broadcom Corporation Methods and systems for sample rate conversion 08005667 Cl. 704-211.
Ni, Jian: See--
Gentz, Reiner; Ebner, Reinhard; Yu, Guo-Liang; Ruben, Steven M.; Ni, Jian; and Feng, Ping 08003386 Cl. 435-361.
Ni, Quan: See--
Hatlestad, John D.; Ni, Quan; Stahmann, Jeffrey E.; Hartley, Jesse; Zhu, Qingsheng; Kenknight, Bruce H.; Daum, Douglas R.; and Lee, Kent 08002553 Cl. 434-262.
Niccolini, Saverio: See--
Tartarelli, Sandra; Schlegel, Roman; Niccolini, Saverio; and Brunner, Marcus 08005074 Cl. 370-352.
Nice SpA: See--
Marchetto, Oscar; Tomasella, Sergio; and Bortolan, Bruno 08004224 Cl. 318-466.
Nice Systems, Ltd.: See--
Wasserblat, Moshe; and Pereg, Oren 08005675 Cl. 704-252.
Nicely, Mark C.; and Bolich, Kathleen, to IGT Gaming device providing an award based on a count of outcomes which meets a condition 08002620 Cl. 463-16.
Nickerson, Michael L.: See--
Schmidt, Laura S.; Warren, Michelle; Toro, Jorge R.; Zbar, Berton; Nickerson, Michael L.; Linehan, W. Marston; and Turner, Maria L. 08003764 Cl. 530-387.9.
Nickolov, Peter A.: See--
Miloushev, Vladimir I.; and Nickolov, Peter A. 08005953 Cl. 709-225.
Nicolai, Rainer: See--
Popp, Hanns-Peter; Nicolai, Rainer; Rauleder, Hartwig; and Lang, Jürgen 08002954 Cl. 204-164.
Nicolaou, Kyriacos C.; Pratt, Benjamin; and Arseniyadis, Stellios, to Scripps Research Institute, The Chemical synthesis of a highly potent epothilone 08003801 Cl. 548-146.
Nicoli, Fabio: See--
Almirante, Nicoletta; Stefanini, Silvia; Storoni, Laura; Nicoli, Fabio; Padron, Julio Lazaro; and Biondi, Stefano 08003811 Cl. 549-464.
Nicoll, Monique: See--
Costa, Michael A.; Gendreau, Steven Brian; Dora, III, Emery G.; Nicoll, Monique; Urbani, Lenore; and Larson, Jeffrey S. 08003315 Cl. 435-6.
Nicox S.A.: See--
Almirante, Nicoletta; Stefanini, Silvia; Storoni, Laura; Nicoli, Fabio; Padron, Julio Lazaro; and Biondi, Stefano 08003811 Cl. 549-464.
Nidec Motor Corporation: See--
Peterson, Gregory A.; Stultz, Peter F.; Musser, Thomas; and Hilton, Daniel 08004135 Cl. 310-89.
Nidec Sankyo Corporation: See--
Furuya, Yukio; and Ootsuki, Noboru 08004779 Cl. 359-824.
Ohta, Keiji; Tatai, Toshio; and Oguchi, Shigeki 08002260 Cl. 271-9.01.
Nidek Co., Ltd.: See--
Inuzuka, Minoru; and Hirai, Takahiro 08002852 Cl. 8-507.
Nied, Stephan: See--
Buechner, Karl-Heinz; Nied, Stephan; Goethlich, Alexander; Klippel, Frank; and Schornick, Gunnar 08002119 Cl. 210-500.35.
Niedernostheide, Franz-Josef: See--
Mauder, Anton; Schulze, Hans-Joachim; Hille, Frank; Schulze, Holger; Pfaffenlehner, Manfred; Schaeffer, Carsten; and Niedernostheide, Franz-Josef 08003502 Cl. 438-514.
Niedzwiecki, Aleksandra: See--
Rath, Matthias W; Niedzwiecki, Aleksandra; and Roomi, Waheed M 08003110 Cl. 424-185.1.
Nielsen Company (US), LLC., The: See--
Ramaswamy, Arun 08006258 Cl. 725-9.
Nielsen, Karsten Agersted; Solvang, Mette; and Larsen, Peter Halvor, to Technical University of Denmark Method of producing metal to glass, metal to metal or metal to ceramic connections 08002166 Cl. 228-122.1.
Niemczyk, Steve; Dunn, Antoine; Elsner, Russell Mark; Malloy, Patrick J.; and Znamova, Dana, to OPNET Technologies, Inc Discovery of multiple-parent dependencies in network performance analysis 08005006 Cl. 370-252.
Nieminen, Mari K.: See--
Uskela, Sami; Rautianen, Aapo; Leppanen, Eva-Maria; Nieminen, Mari K.; and Tudose, Lucia 08002617 Cl. 463-1.
Nieters, James: See--
Griffith, Petra; Gossain, Vineet; Jones, Claude; Nieters, James; Barlok, Todd; Crampton, Matthew Catrow; and Malepati, Naga Viswanathan 08006200 Cl. 715-816.
Nieto-Roman, Francisco; Vors, Jean-Pierre; Villier, Alain; Lachaise, Helene; Mousques, Adeline; Hartmann, Benoit; Hutin, Pierre; Molina, Jose Lorenzo; and Muller, Benoit, to Bayer SAS Picolinic acid derivatives and their use as fungicides 08003799 Cl. 546-309.
Nifco Inc.: See--
Tomioka, Kazuyuki; and Tomiji, Katsuyasu 08001654 Cl. 16-64.
Nigmatulin, Tagir Robert: See--
Kellock, Iain Robertson; Bulgrin, Charles Alan; Nigmatulin, Tagir Robert; and Bruner, Ralph Chris 08002515 Cl. 415-1.
Nihei, Yasuhiro: See--
Omori, Atsufumi; Ishida, Masaaki; Nihei, Yasuhiro; and Ozasa, Dan 08005321 Cl. 382-318.
Nihei, Yasukazu; to Fujifilm Corporation Piezoelctric actuator, method of manufacturing same, and liquid ejection head 08004159 Cl. 310-346.
Niimura, Ryuta: See--
Emizu, Osamu; Yamaura, Hiroshi; Niimura, Ryuta; Fukuyoshi, Yasuhiro; and Kudo, Takao 08002656 Cl. 474-109.
Niitsu, Yoshiro; Yu, Lei; Liu, Jian; Zhao, Gang; Ma, Nianchun; and Van, Sang, to Nitto Denko Corporation Drug carriers 08003621 Cl. 514-44.
Nijboer, Jacob Gerrit: See--
Feddes, Bas; and Nijboer, Jacob Gerrit 08004947 Cl. 369-59.11.
Nike, Inc.: See--
Baudouin, Alexandre 08001704 Cl. 36-102.
Bordin, Mauro; Cavaliere, Sergio; Flintoff, Timm; and Tessaro, Matteo 08001642 Cl. 12-115.8.
Reichow, Alan W.; Citek, Karl; Erickson, Graham B.; and Yoo, Herb 08002408 Cl. 351-201.
Schindler, Eric S.; Mermet, Sebastien; Lindner, Troy C.; and Caine, Andrew 08001703 Cl. 36-29.
Waatti, Todd A.; and Brack, David T. 08005558 Cl. 700-98.
Nikitin, Andrey A.; Andreev, Alexander E.; and Scepanovic, Ranko, to LSI Corporation Method and system for outputting a sequence of commands and data described by a flowchart 08006209 Cl. 716-117.
Nikitin, Vladimir; and Zheng, Yi, to Hitachi Global Storage Technologies Netherlands B.V. Method for manufacturing a perpendicular magnetic write pole using an electrical lapping guide for tight write pole flare point control 08003304 Cl. 430-314.
Nikon Corporation: See--
Fujiwara, Makoto; and Katagishi, Yuuichi 08002483 Cl. 396-531.
Hirukawa, Shigeru 08004650 Cl. 355-53.
Kobayashi, Naoyuki; Tanimoto, Akikazu; Mizuno, Yasushi; Shiraishi, Kenichi; Nakano, Katsushi; and Owa, Soichi 08004653 Cl. 355-53.
Kusaka, Yosuke 08004593 Cl. 348-333.02.
Nagasaka, Hiroyuki 08004651 Cl. 355-53.
Nozaki, Hirotake 08004603 Cl. 348-376.
Nozaki, Hirotake; and Tanaka, Masahide 08005341 Cl. 386-224.
Phillips, Alton H. 08002420 Cl. 359-846.
Shigematsu, Koji 08004658 Cl. 355-71.
Nikon Vision Co., Ltd.: See--
Matsumoto, Miho; Miyakawa, Akiko; and Kurata, Toshihiko 08004778 Cl. 359-795.
Nimri, Alain: See--
Rodman, Jeffrey; Drell, David; Vander Kam, Rick A; Sexton, Martin G; Binford, Don; Nimri, Alain; Ratcliff, Jeff; Kilday, Carolyn; and Hess, Michael J. 08004556 Cl. 348-14.07.
Nimura, Taisuke; Sakai, Kiyotaka; Kofuji, Kenji; Shiomi, Yoshinobu; Toyoda, Hidetoshi; and Higashi, Yasuhiro, to Honda Motor Co., Ltd. Final gear transmission mechanism for a motorcycle, and motorcycle incorporating same 08002068 Cl. 180-226.
Ninham, Paul John; and Gamble, Lindsay Adjustable rowlock 08002598 Cl. 440-107.
Ninomiya, Tatsuya; and Tanaka, Kazuo, to Hitachi, Ltd. Storage system and data management method 08006036 Cl. 711-113.
Nintendo Co., Ltd.: See--
Nogami, Hisashi; Kobayashi, Ryuji; Komatsu, Kunihiro; and Kawai, Toshinori 08002636 Cl. 463-42.
Shimizu, Hideaki 08002633 Cl. 463-31.
Nintendo of America, Inc.: See--
Cheng, Henry 08005892 Cl. 709-203.
Nippon Chemical Industrial Co., Ltd: See--
Ohishi, Yoshihide 08003256 Cl. 429-231.6.
Nippon Mektron, Ltd.: See--
Akama, Fumio; Yoshimura, Ryoichi; Tanaka, Hideaki; Uchida, Hitoshi; and Okano, Koji 08004851 Cl. 361-760.
Nippon Mining & Metals Co., Ltd.: See--
Sekiguchi, Junnosuke; and Imori, Toru 08004082 Cl. 257-752.
Nippon Shokubai Co., Ltd.: See--
Noda, Nobuhisa 08003222 Cl. 428-480.
Nippon Steel Corporation: See--
Mizumura, Masaaki; Sato, Koichi; and Kuriyama, Yukihisa 08001819 Cl. 72-55.
Nippon Steel Materials Co., Ltd.: See--
Uno, Tomohiro; Kimura, Keiichi; and Yamada, Takashi 08004094 Cl. 257-784.
Nippon Telegraph and Telephone Corporation: See--
Kawashima, Munenari; Yamaguchi, Yo; Uehara, Kazuhiro; and Nishikawa, Kenjiro 08004363 Cl. 330-293.
Yonenaga, Kazushige; Yoneyama, Mikio; Tomizawa, Masahito; Hirano, Akira; Kuwahara, Shoichiro; Kataoka, Tomoyoshi; Sano, Akihide; and Funatsu, Gentaro 08005374 Cl. 398-208.
Nir-Buchbinder, Yarden; Pelleg, Dan; Raz-Pelleg, Orna; Ur, Shmuel; and Zlotnick, Aviad, to International Business Machines Corporation Software quality assessment based on semantic similarities 08006138 Cl. 714-38.1.
Nirogi, Ramakrishna; Kambhampati, Rama Sastri; Shinde, Anil Karbhari; Daulatabad, Anand Vijaykumar; Dwarampudi, Adi Reddy; Kandikere, Nagaraj Vishwottam; Vishwakarma, Santosh; and Jasti, Venkateswarlu, to Suven Life Sciences Limited Aminoalkoxy aryl sulfonamide compounds and their use as 5-HT6 ligands 08003670 Cl. 514-323.
Niroomand, Ardavan: See--
Sandhu, Gurtej S.; and Niroomand, Ardavan 08003310 Cl. 430-323.
Nishi, Takahiro: See--
Kondo, Satoshi; Nishi, Takahiro; Toma, Tadamasa; and Sugio, Toshiyasu 08003927 Cl. 250-208.1.
Nishi, Toshiro: See--
Toda, Mikio; Nishi, Toshiro; Oka, Nobuki; Tsutaya, Hiroyuki; Ara, Kuniaki; Ohira, Hiroaki; Kurome, Kazuya; and Yoshioka, Naoki 08004175 Cl. 313-503.
Nishida, Hideshi: See--
Kurata, Kazushi; Tanaka, Tetsuya; Higaki, Nobuo; Hayashi, Kunihiko; Kadota, Hiroshi; Kiyohara, Tokuzo; Kimura, Kozo; Nishida, Hideshi; Furukawa, Kazuya; Fujii, Shigeki; and Sugimura, Toshio 08006076 Cl. 712-228.
Nishida, Kazuya: See--
Okada, Akira; Imabayashi, Hirofumi; Yajima, Hideaki; Kanasaki, Katsumi; Miyazaki, Takehide; and Nishida, Kazuya 08004846 Cl. 361-721.
Nishida, Masaaki; Katou, Hiroshi; Kitou, Masashi; and Iizuka, Kohei, to Aisin AW Co., Ltd. Automatic transmission 08002663 Cl. 475-284.
Nishida, Shiyo: See--
Nakatsuru, Shuichi; Yoshikawa, Megumi; Hiroshima, Shinichi; Kishi, Yoshiro; Kuhara, Motoki; Nishida, Shiyo; and Shinohara, Midori 08003098 Cl. 424-133.1.
Nishihata, Hideki; Morimoto, Nobuyuki; Kusaba, Tatsumi; and Endo, Akihiko, to SUMCO Corporation Method for producing a bonded wafer 08003494 Cl. 438-459.
Nishijima, Takashi: See--
Saito, Yoji; and Nishijima, Takashi 08005514 Cl. 455-572.
Nishikawa, Hirofumi: See--
Isu, Yoshimi; Sekiguchi, Shunichi; Asai, Kohtaro; Nishikawa, Hirofumi; Kuroda, Shinichi; and Hasegawa, Yuri 08005143 Cl. 375-240.12.
Nishikawa, Kenjiro: See--
Kawashima, Munenari; Yamaguchi, Yo; Uehara, Kazuhiro; and Nishikawa, Kenjiro 08004363 Cl. 330-293.
Nishikawa, Masahiko; and Kanda, Takehiko, to Sanyo Electric Co., Ltd. Digital camera 08005342 Cl. 386-227.
Nishimura, Hidetoshi: See--
Ikegami, Tomoaki; Nishimura, Hidetoshi; and Nakanishi, Kazuyuki 08004014 Cl. 257-202.
Nishimura, Hisashi; and Nakazato, Kenichi, to Japan Aviation Electronics Industry Limited Reference signal generation circuit, angle converter, and angle detection apparatus 08004276 Cl. 324-207.25.
Nishimura, Kenichi: See--
Oki, Kazuo; Fukumoto, Yasuhisa; Akagi, Ryuichi; Nishimura, Kenichi; Kaneko, Taketo; Miura, Tamaki; Saito, Takamitsu; and Kawai, deceased, Mikio 08003015 Cl. 252-502.
Nishimura, Koichiro: See--
Yasukawa, Takakiyo; Watanabe, Koichi; and Nishimura, Koichiro 08004957 Cl. 369-116.
Nishimura, Koichiro; Kawashima, Toru; Harai, Mitsuru; and Toda, Tsuyoshi, to Hitachi Ltd. Optical disk apparatus and test writing method 08004941 Cl. 369-47.53.
Nishimura, Takayuki: See--
Hirose, Yuichi; Nishimura, Takayuki; Matsui, Hideaki; Yamagishi, Masaru; and Fukumoto, Takashi 08002261 Cl. 271-9.02.
Nishino, Satoshi; to Konica Minolta Medical & Graphic, Inc. Inkjet recording apparatus 08002387 Cl. 347-49.
Nishino, Satoshi; to Konica Minolta Medical & Graphic, Inc. Inkjet recording apparatus 08002388 Cl. 347-49.
Nishio, Masahiro; Tanzawa, Masaki; Hida, Masako; Shimizu, Takayuki; Kashiwabara, Keiichi; and Sakemi, Shuuji, to Toyota Jidosha Kabushiki Kaisha Butt welding system of steel plate and butt welding method of steel plate 08003914 Cl. 219-121.63.
Nishio, Yoshitaka; and Konno, Eiichi, to Fujitsu Limited Wiring path information creating method and wiring path information creating apparatus 08006219 Cl. 716-132.
Nishitani, Kazuhiro: See--
Munetsugu, Toshihiko; Nishitani, Kazuhiro; Kajimoto, Kazuo; Iwata, Yoshiaki; and Tanikawa, Kentaro 08005974 Cl. 709-231.
Nishitani, Mikihiko: See--
Tsujita, Takuji; Fukui, Yusuke; Terauchi, Masaharu; Nishitani, Mikihiko; Okafuji, Michiko; Ishino, Shinichiro; and Mizokami, Kaname 08004190 Cl. 313-582.
Nishiura, Hisao; Furuta, Shinji; Hasegawa, Makoto; and Watanabe, Takato, to Honda Motor Co., Ltd. Electric motorcycle 08002067 Cl. 180-220.
Nishiwaki, Kenjiro; and Furukawa, Toshio, to Brother Kogyo Kabushiki Kaisha Apparatus for forming multi-color image with control of unintended reverse-transfer of developer image onto photoconductor 08005387 Cl. 399-66.
Nishiyama, Taku; Yamamoto, Tetsuya; and Okumura, Naohisa, to Kabushiki Kaisha Toshiba Semiconductor memory device 08004071 Cl. 257-676.
Nishiyama, Toshihiko: See--
Kusuda, Shinya; Nishiyama, Toshihiko; Hashimura, Kazuya; Ueda, Junya; and Shibayama, Shiro 08003642 Cl. 514-235.5.
Nishizawa, Toru; Kaneko, Hiroaki; and Onodera, Hitoshi, to Nissan Motor Co., Ltd. Method for regenerating exhaust gas purifying filter apparatus 08001772 Cl. 60-295.
Nissan Motor Co., Ltd.: See--
Aotani, Koichiro 08003276 Cl. 429-493.
Nishizawa, Toru; Kaneko, Hiroaki; and Onodera, Hitoshi 08001772 Cl. 60-295.
Ono, Masashi 08005606 Cl. 701-110.
Tanishima, Kaori 08002059 Cl. 180-65.275.
Nissen IPAD, LLC: See--
Nissen, Mark D.; and Gayes, James M. 08001636 Cl. 5-644.
Nissen, Mark D.; and Gayes, James M., to Nissen IPAD, LLC Apparatus and method to position a patient for airway management and endotracheal intubation 08001636 Cl. 5-644.
Nissha Printing Co., Ltd.: See--
Watazu, Yuji; Okumura, Shuzo; Murata, Keishiro; Sakashita, Asako; and Okabe, Takahiro 08003900 Cl. 174-565.
Nisshinbo Industries, Inc.: See--
Kasahara, Masato; and Shibuya, Toshio 08004270 Cl. 324-96.
Nistler, Juergen; and Vester, Markus, to Siemens Aktiengesellschaft Arrangement for controlling individual antennas of an antenna arrangement 08004280 Cl. 324-309.
Nite Ize, Inc.: See--
Sorensen, Joseph 08001659 Cl. 24-130.
Nitschmann, Kai: See--
Goldberg, Roman; and Nitschmann, Kai 08001701 Cl. 34-82.
Nitta, Satyanarayana V.: See--
Bonilla, Griselda; Edelstein, Daniel C.; Nitta, Satyanarayana V.; Nogami, Takeshi; Ponoth, Shom; Rath, David L.; and Yang, Chih-Chao 08003520 Cl. 438-630.
Nittan Valve Co., Ltd.: See--
Kameda, Michihiro; and Aino, Hiroshi 08001938 Cl. 123-90.17.
Nitto Denko Corporation: See--
Kitada, Kazuo; Yura, Tomokazu; Nakazono, Takuya; and Koshio, Satoru 08002010 Cl. 156-511.
Nashiki, Tomotake; Sugawara, Hideo; Andou, Hidehiko; and Yoshitake, Hidetoshi 08003200 Cl. 428-212.
Niitsu, Yoshiro; Yu, Lei; Liu, Jian; Zhao, Gang; Ma, Nianchun; and Van, Sang 08003621 Cl. 514-44.
Shimizu, Yusuke 08005329 Cl. 385-39.
Sisk, David T.; Li, Sheng; and Mochizuki, Amane 08003229 Cl. 428-690.
Niu, Qingshan Jason; Mickols, William E.; and Zhang, Chunming, to Dow Global Technologies LLC Modified polyamide membrane 08002120 Cl. 210-500.38.
Niu, Xuxian: See--
Yao, Li; and Niu, Xuxian 08003024 Cl. 264-2.5.
Niwa, Akihiko: See--
Ishii, Hidekazu; Iida, Yuji; and Niwa, Akihiko 08004696 Cl. 358-1.1.
Nix, Kevin R.: See--
Coker, John L.; Malden, Matthew S.; and Nix, Kevin R. 08005814 Cl. 707-708.
Nix, Michael: See--
Riemen, Gudula; Lorbach, Elke; Helfrich, Juliana; Siebenkotten, Gregor; Mueller-Hartmann, Herbert; Rothmann-Cosic, Kirsten; Thiel, Corinna; Weigel, Meike; Wessendorf, Heike; Brosterhus, Helmut; and Nix, Michael 08003389 Cl. 435-461.
Nkrumah, Donald Joshua: See--
Moore, Stephen; Nkrumah, Donald Joshua; and Sherman, Esther Laura 08003318 Cl. 435-6.
Nobori, Kunio; to Panasonic Corporation Apparatus and method for image processing, image processing program and image processor 08005295 Cl. 382-162.
Nochta, Zoltan: See--
Bornhoevd, Christof; Avanes, Artin; Ziekow, Holger Robert; Nochta, Zoltan; Kubach, Uwe; Spiess, Patrik; Moreira Sa de Souza, Luciana; and Haller, Stephan 08005879 Cl. 707-899.
Noda, Akihiko; to Canon Kabushiki Kaisha Print schedule control equipment, print schedule control method, and program therefor 08004702 Cl. 358-1.15.
Noda, Kenichi: See--
Fujii, Hiroya; and Noda, Kenichi 08003350 Cl. 435-69.5.
Noda, Kouji: See--
Nagaya, Toshiatsu; Noda, Kouji; Ikeda, Masatoshi; Nakamura, Masaya; and Shibata, Daisuke 08004161 Cl. 310-358.
Noda, Nobuhisa; to Nippon Shokubai Co., Ltd. Resin composition for forming ultraviolet absorbing layer and laminate comprising ultraviolet absorbing layer 08003222 Cl. 428-480.
Nodera, Akio: See--
Hayata, Yusuke; and Nodera, Akio 08003735 Cl. 525-450.
Noe, David P.: See--
Ward, Kevin M.; and Noe, David P. 08002127 Cl. 211-105.3.
NOF Corporation: See--
Nakamoto, Ken-ichiro; Ohashi, Syunsuke; Yamamoto, Yuji; Sakanoue, Kenji; Itoh, Chika; and Yasukohchi, Tohru 08003117 Cl. 424-400.
Nogami, Hisashi; Kobayashi, Ryuji; Komatsu, Kunihiro; and Kawai, Toshinori, to Nintendo Co., Ltd. Storage medium storing game program, game apparatus, communication game system and game control method 08002636 Cl. 463-42.
Nogami, Satoru: See--
Baba, Shunji; Hashimoto, Shigeru; Sugimura, Yoshiyasu; and Nogami, Satoru 08002195 Cl. 235-492.
Nogami, Takeshi: See--
Bonilla, Griselda; Edelstein, Daniel C.; Nitta, Satyanarayana V.; Nogami, Takeshi; Ponoth, Shom; Rath, David L.; and Yang, Chih-Chao 08003520 Cl. 438-630.
Noguchi, Eri; and Marumoto, Yoshitomo, to Canon Kabushiki Kaisha Data processing apparatus, printing apparatus and method of creating mask pattern 08001720 Cl. 47-15.
Noguchi, Hirofumi: See--
Arimura, Ryoichi; Ashikaga, Nobuyuki; Menju, Takashi; Yukawa, Atsushi; Tsukui, Hiromi; Noguchi, Hirofumi; and Oono, Shinji 08002980 Cl. 210-192.
Noguchi, Tsutomu: See--
Sato, Noritaka; Noguchi, Tsutomu; and Mori, Hiroyuki 08003712 Cl. 523-124.
Noguchi, Yuusuke: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto 08005406 Cl. 399-258.
Noheji, Kiyotoshi: See--
Onaka, Miki; Noheji, Kiyotoshi; Fukushi, Togo; and Kondoh, Masanori 08004751 Cl. 359-334.
Nojaba, Michael; Thayamballi, Pradeep K.; Tung, James Tze-Hwa; and Turangan, Julius A., to Western Digital Technologies, Inc. Tester with virtual ground 08004782 Cl. 360-31.
Nojima, Hideo: See--
Hahm, Jung Yoon; Kuzgi, Eduard; Jeong, Jin Ha; and Nojima, Hideo 08001811 Cl. 68-13A.
NOK Corporation: See--
Hayashi, Takahiro; Hora, Makoto; and Miyajima, Keiichi 08003898 Cl. 174-385.
Yoshitsune, Syuji; Ito, Masaru; Muragishi, Hirotaka; and Koyama, Tomoyuki 08003030 Cl. 264-135.
Nokia Corporation: See--
Boldyrev, Sergey; Tyrkkö, Olli Teppo Kalevi; and Lappeteläinen, Antti Tuomas 08005654 Cl. 703-2.
Ermolov, Vladimir Alexsandrovich 08004018 Cl. 257-213.
Hojen-Sorensen, Pedro; and Pedersen, Morten With 08005156 Cl. 375-260.
Huang, Hui; Wang, Hao; and Zhao, Kai 08005093 Cl. 370-395.5.
Huomo, Heikki; Immonen, Olli; Lahteenmaki, Mia; and Ramo, Kimmo 08005426 Cl. 455-41.2.
Kemppinen, Pasi 08004574 Cl. 348-220.1.
Kiss, Krisztian; and Leppanen, Eva-Maria 08005073 Cl. 370-352.
Lainema, Jani 08005145 Cl. 375-240.16.
Salmenkaita, Matti; Gimenez, Jose; and Moreno, Pablo Tapia 08005046 Cl. 370-330.
Salokannel, Juha; Ruuska, Päivi M.; Reunamäki, Jukka; and Kasslin, Mika 08005465 Cl. 455-414.1.
Sébire, Benoist; Lintulampi, Raino; and Sébire, Guillaume 08005040 Cl. 370-329.
Tian, Jilei; Ahmaniemi, Teemu; Boda, Péter; and Vétek, Ákos 08005766 Cl. 706-11.
Uskela, Sami; Rautianen, Aapo; Leppanen, Eva-Maria; Nieminen, Mari K.; and Tudose, Lucia 08002617 Cl. 463-1.
Wigard, Jeroen; Ranta-aho, Karri; and Sebire, Benoist 08005499 Cl. 455-522.
Wirola, Lauri; and Kärkkäinen, Leo 08005249 Cl. 381-326.
Nokia Siemens Networks GmbH & Co. KG: See--
Drake, Eddie; Long, Xiping; and Vrudhula, Padmaja 08006259 Cl. 725-13.
Forck, Andreas; Haustein, Thomas; Jungnickel, Volker; von Helmolt, Clemens; and Zirwas, Wolfgang 08005045 Cl. 370-329.
Nokura, Yoshihiko: See--
Jachmann, Markus; Ikegami, Hiroshi; and Nokura, Yoshihiko 08003650 Cl. 514-252.05.
Nolan, Garry: See--
Krutzik, Peter O.; and Nolan, Garry 08003312 Cl. 435-4.
Noling, Calvin; and Scarpine, Daniel, to StormwateRx, LLC Passive stormwater management system 08002974 Cl. 210-116.
Nölscher, Christoph; Temmler, Dietmar; and Moll, Peter, to Qimonda AG Method for producing a structure on the surface of a substrate 08003538 Cl. 438-692.
Nolte, Andreas; Wahl, Hubert; and Becker, Klaus, to Carl Zeiss Microimaging GmbH Safety system for a laser radiation device 08004757 Cl. 359-368.
Nolting, Reinhard: See--
Elsaesser, Sven; Nolting, Reinhard; and Boensch, Matthias 08002573 Cl. 439-416.
Nomasaki, Daisuke: See--
Ozeki, Toshiaki; Oka, Koji; Nomasaki, Daisuke; Hidaka, Ikuo; and Makabe, Yoshikazu 08004446 Cl. 341-161.
Nomura, Masahiro: See--
Ikenaga, Yoshifumi; and Nomura, Masahiro 08004348 Cl. 327-540.
Ikenaga, Yoshifumi; and Nomura, Masahiro 08004351 Cl. 327-544.
Nomura, Masaya: See--
Hayashi, Chitoshi; Ishikuro, Tomoaki; Yamazaki, Taro; Wakisaka, Mitsuru; Sakai, Tatsunori; and Nomura, Masaya 08002017 Cl. 164-519.
Nomura, Masayoshi: See--
Ito, Yutaka; Nomura, Masayoshi; and Abe, Keiichiro 08004920 Cl. 365-222.
Nomura, Yujiro; Inoue, Nozomu; Koizumi, Ryuta; and Ikuma, Ken, to Seiko Epson Corporation Line head and an image forming apparatus using the line head 08004549 Cl. 347-234.
Nonaka, Takafumi; Kumagai, Takashi; Matsubara, Noriyuki; Ban, Kazuo; and Saito, Koichi, to Mitsubishi Electric Corporation Power circuit and illumination apparatus 08004204 Cl. 315-274.
Nonaka, Yusuke: See--
Ishii, Kenji; Nonaka, Yusuke; and Nagata, Koji 08006054 Cl. 711-162.
Nonomura, Yutaka: See--
Sugihara, Hisayoshi; Nonomura, Yutaka; Fujiyoshi, Motohiro; and Tsukada, Kouji 08001839 Cl. 73-493.
Nonoue, Hiroshi: See--
Kobayashi, Yasumi; Umemoto, Takashi; and Nonoue, Hiroshi 08004825 Cl. 361-523.
Noonan, Michael: See--
Reagan, Randy; Gniadek, Jeff; Parsons, Tom; and Noonan, Michael 08005335 Cl. 385-135.
Noordman, Oscar Franciscus Jozephus: See--
Joobeur, Adel; Noordman, Oscar Franciscus Jozephus; Van Der Veen, Paul; and Venkataraman, Arun Mahadevan 08004770 Cl. 359-631.
Nordin, III, Loren J: See--
Holtz, Alex; Buehnemann, David E; Fres, Gilberto; Hickenlooper, III, Harrison T; Hoeppner, Charles M; Morrow, Kevin K; Neider, Bradley E; Nordin, III, Loren J; Parker, Todd D; and Snyder, Robert J 08006184 Cl. 715-723.
Nordson Corporation: See--
Krumme, John F.; and Field, Leslie A. 08002753 Cl. 604-207.
Nordstrom, Paul G.: See--
Marshall, Brad E.; Scofield, Christopher L.; Pope, Elmore Eugene; and Nordstrom, Paul G. 08005823 Cl. 707-721.
Nore, Olivier: See--
Francois, Jean Marie; Parrou, Jean-Luc; Tourrasse, Olivier; and Nore, Olivier 08003114 Cl. 424-274.1.
Nori, Hitoshi: See--
Sato, Yoichi; Tosaka, Kenji; Hayashi, Mitsuo; Yasuo, Akihiro; Kimura, Hideki; Ueda, Kengo; Nakata, Katsuhiko; Iwakiri, Yoshihisa; Nori, Hitoshi; Haneda, Tomoaki; Tokumitsu, Mika; Shinjo, Naoki; Kuroda, Kouji; and Kusano, Yoshihiro 08004839 Cl. 361-696.
Norman, Andrew: See--
Khosla, Sunil; Norman, Andrew; and Van Schoonevelt, Hugo 08002913 Cl. 148-552.
Norman, Mark: See--
Lambert, Malcolm; Limmer, Andrew; Norman, Mark; and Mcloone, Michael 08002205 Cl. 239-533.2.
Norman, Mark A.: See--
Friauf, Cheryl M.; Kishi, Gregory T.; Norman, Mark A.; and Ostasiewski, Laura J. 08006049 Cl. 711-159.
Norman, Mark Allan: See--
Kishi, Gregory Tad; Norman, Mark Allan; Ostasiewski, Laura Jean; and Sansone, Christopher Michael 08006050 Cl. 711-159.
Norman, Robert; to Unity Semiconductor Corporation Programmable logic device structure using third dimensional memory 08004309 Cl. 326-40.
Norriss, Michael Geoffrey: See--
Demmer, Jeroen; Forster, Richard L.; Shenk, Michael Andrew; Norriss, Michael Geoffrey; Glenn, Matthew; Saulsbury, Keith Martin; and Hall, Claire 08003849 Cl. 800-278.
Nortel Networks Limited: See--
Beaudin, Steve; Jian, Chun-Yun; and Sychaleun, Somsack 08004371 Cl. 333-133.
Bragg, Nigel; Allan, David; Parry, Simon; Friskney, Robert; and Brueckheimer, Simon 08005081 Cl. 370-389.
Chiabaut, Jerome; Allan, David; and Bragg, Nigel 08005016 Cl. 370-254.
Steer, David G.; Dodd, Curt; and Jia, Ming 08005160 Cl. 375-267.
Thomas, Michael Flynn 08005029 Cl. 370-310.
Northrup, Jr., Robert Louis: See--
Barkdoll, Patrick J.; Valiulis, Thomas E.; and Northrup, Jr., Robert Louis 08002441 Cl. 362-287.
Northwestern Systems Corporation: See--
Lim, Lay-Swee; Su, Zhong-Xu; and Ma, Hei Shek 08002104 Cl. 198-406.
Nortis, Inc.: See--
Neumann, Thomas 08003388 Cl. 435-395.
Norwine, Jeffery A.: See--
Phillips, Gregory Joseph; Deporte, Rebecca; Norwine, Jeffery A.; and Joines, Penny B. 08005756 Cl. 705-41.
Nose, Koichi; and Mizuno, Masayuki, to NEC Corporation Signal measuring device 08004268 Cl. 324-76.77.
Noseworthy, Kenneth: See--
McDonald, Lee; Hajgato, Julius; and Noseworthy, Kenneth 08001964 Cl. 128-200.26.
Notheis, Ulrich: See--
Mägerlein, Wolfgang; Notheis, Ulrich; Friederich, Michael; Gerriets, Hans-Dieter; Grizinia, Heinrich; and Wagner, Paul 08003830 Cl. 568-853.
Nottage, Douglas S.: See--
Wolfe, Don P.; Nottage, Douglas S.; Wagoner, Kevin J.; and Nelson, Tim E. 08005731 Cl. 705-35.
Nouri, Ahmad; and Wisneski, David J., to International Business Machines Corporation Object oriented query path expression to relational outer join translator method, system, and article of manufacture, and computer program product 08005807 Cl. 707-705.
Nova, Richard C.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C. 08005552 Cl. 607-142.
Novak, Allison E.: See--
Hales, John H.; Novak, Allison E.; and Burleson, John D. 08002035 Cl. 166-297.
Novak, Anne J.: See--
Ansell, Stephen M.; and Novak, Anne J. 08003325 Cl. 435-6.
Novak, Julia E.: See--
Thompson, Penny; Blumberg, Hal; Chandrasekher, Yasmin A.; and Novak, Julia E. 08003104 Cl. 424-145.1.
Novak, Keith: See--
Coon, Thomas L.; Zdrojewski, Steve; and Novak, Keith 08002332 Cl. 296-187.02.
Novartis AG: See--
Artsyukhovich, Alex N.; and Rowe, T. Scott 08004764 Cl. 359-589.
Herold, Peter; Jelakovic, Stjepan; Mah, Robert; and Tschinke, Vincenzo 08003640 Cl. 514-230.5.
Kendig, Stephen; Honea, Dee Anna; and Golinski, James 08002608 Cl. 451-28.
Klimko, Peter G.; Collier, Jr., Robert J.; and Hellberg, Mark R. 08003635 Cl. 514-185.
Medina, Arturo Norberto; Scott, Robert; and Smith, Dawn Alison 08003710 Cl. 523-106.
Novatek Microelectronics Corp.: See--
Yang, Tzu-Cheng 08004320 Cl. 327-117.
Novatel Wireless, Inc.: See--
Pham, Cuong; Wu, John; and Soderberg, Ulf 08005217 Cl. 380-247.
Novellus Systems, Inc.: See--
Li, Ming; Van Schravendijk, Bart; Mountsier, Tom; Chi, Chiu; Ilcisin, Kevin; and Hsieh, Julian 08003549 Cl. 438-786.
Novo Nordisk A/S: See--
Bayer, deceased, Thomas; Sogaard, Birgitte; and Axelsen, Mads 08003605 Cl. 514-5.9.
Novoselov, Vladimir Ivanovich: See--
Fesenko, Evgeny Evgenyevich; Novoselov, Vladimir Ivanovich; Yanin, Vadim Alekseevich; Lipkin, Valery Mikhaylovich; and Shuvaeva, Tatyana Maratovna 08003345 Cl. 435-69.1.
NovoStent Corporation: See--
Hogendijk, Michael 08002725 Cl. 604-4.01.
Laroya, Gilbert S.; Martin, Gerald Ray; Betelia, Rainier; and Estrada, Edward A. 08002815 Cl. 623-1.12.
Nowak, Edward J.: See--
Anderson, Brent A.; and Nowak, Edward J. 08003463 Cl. 438-267.
Anderson, Brent A.; Nowak, Edward J.; and Rankin, Jed H. 08003516 Cl. 438-624.
Nowak, Glenn F: See--
Evans, Judy A.; Krause, Kenneth W.; and Nowak, Glenn F 08005572 Cl. 700-248.
Nowakowski, John J.: See--
Neville, Thomas B.; Nowakowski, John J.; Hannum, Mark C.; and Robertson, Thomas F. 08002541 Cl. 431-174.
Nowlin, William C.; Mohr, Paul W; Schena, Bruce M.; Larkin, David Q.; and Guthart, Gary, to Intuitive Surgical Operations, Inc. Software center and highly configurable robotic systems for surgery and other uses 08004229 Cl. 318-568.21.
Noyes, Ying Xie: See--
Hung, Szepo Robert; Noyes, Ying Xie; and Li, Hsiang-Tsun 08005297 Cl. 382-167.
Nozaki, Hirotake; to Nikon Corporation Camera with an interrupting unit, and camera with an inhibiting unit 08004603 Cl. 348-376.
Nozaki, Hirotake; and Tanaka, Masahide, to Nikon Corporation Image recording apparatus, dynamic image processing apparatus, dynamic image reproduction apparatus, dynamic image recording apparatus, information recording/reproduction apparatus and methods employed therein, recording medium with computer program stored therein 08005341 Cl. 386-224.
Nozaki, Takeaki; Kawamura, Masahisa; and Yasuda, Toshifumi, to Kanzaki Kokyukoki Mfg. Co., Ltd. Hydraulic drive working vehicle 08002073 Cl. 180-307.
NP IP Holdings LLC: See--
Kearns, Sr., Patrick Abbott 08002281 Cl. 273-292.
NSK Ltd.: See--
Kobayashi, Hideyuki; and Endo, Shuji 08005594 Cl. 701-42.
NSK-Warner K.K.: See--
Shirataki, Hirobumi; Ando, Tomoharu; and Okuma, Shinya 08002096 Cl. 192-45.
NTN Corporation: See--
Hirata, Masakazu; and Tsutsui, Hideyuki 08003203 Cl. 428-308.4.
Mikami, Hidenobu 08003582 Cl. 508-165.
Ohki, Chikara 08002907 Cl. 148-318.
Satoji, Fuminori; Nakajima, Ryouichi; Komori, Isao; Okamura, Kazuo; Okuma, Masafumi; and Mitani, Kenichi 08002471 Cl. 384-100.
Shibata, Kiyotake; Kiuchi, Masahiro; and Kuchiki, Yoshiaki 08002474 Cl. 384-544.
NTT DoCoMo, Inc.: See--
Gentry, Craig B.; Ramzan, Zulfikar Amin; and Bruhn, Bernhard 08006086 Cl. 713-158.
Ishii, Hiroyuki; Hayashi, Takahiro; Hanaki, Akihito; Kawamoto, Junichiro; Goto, Yoshikazu; and Furutani, Koji 08005037 Cl. 370-328.
Ishii, Hiroyuki; and Nakamura, Takehiro 08005440 Cl. 455-101.
Miki, Nobuhiko; Atarashi, Hiroyuki; Abeta, Sadayuki; and Sawahashi, Mamoru 08005063 Cl. 370-347.
Nakamura, Takehiro; Hagiwara, Junichiro; Nakano, Etsuhiro; Ohno, Koji; Onoe, Seizo; Higashi, Akihiro; Tamura, Motoshi; Nakano, Masatomo; Kawakami, Hiroshi; and Morikawa, Hiroki 08005120 Cl. 370-509.
Okawa, Koichi; Atarashi, Hiroyuki; Abeta, Sadayuki; and Sawahashi, Mamoru 08005110 Cl. 370-441.
Nuclear Research Center-Negev: See--
Gal, Gyora 08004405 Cl. 340-541.
Nucor Corporation: See--
Blejde, Walter N.; Mahapatra, Rama Ballav; Williams, James Geoffrey; Barbaro, Frank; Renwick, Philip John; Kaul, Harold Roland; Phillips, Andrew; Killmore, Christopher Ronald; and Strezov, Lazar 08002908 Cl. 148-320.
Craig, Jeff; Blankenship, Jeff; Mecham, Cory; and McNeil, Randall J. 08002472 Cl. 384-455.
Rees, Harold Bradley; Gruess, Ansgar; and Edwards, James D. 08002016 Cl. 164-480.
Nugmanov, Babur: See--
Houle, Gilles; Bakker, Ronny; Berkhuysen, Johan Willem Piere; Shridhar, Malayappan; Mason, James G.; Blinova, Katerina; and Nugmanov, Babur 08005273 Cl. 382-119.
Numamoto, Osamu: See--
Yoshida, Hiroshi; Aoki, Taro; Fujimoto, Katsuki; and Numamoto, Osamu 08005424 Cl. 455-40.
Numasawa, Yoichiro; and Watabe, Yoshimi, to Sanyo Electric Co., Ltd. Plasma treatment system and cleaning method of the same 08002947 Cl. 156-345.51.
Numata, Takafumi: See--
Cordonier, Christopher; Shichi, Tetsuya; Numata, Takafumi; Katsumata, Kenichi; Nakamura, Akimasa; Katsumata, Yasuhiro; Komine, Teruo; Amemiya, Kenichirou; Yamashita, Makoto; and Fujishima, Akira 08003219 Cl. 428-432.
Numer, Dominic Matthew: See--
Fisher, Mark Richard; Dishong, Ronald James; Numer, Dominic Matthew; and Briant, Robert Lewis 08001861 Cl. 74-89.36.
Nunez-Regueiro, Jose: See--
Krasnov, Alexey; Petrmichl, Rudolph Hugo; Wang, Jiangping; Murphy, Nestor P.; Frati, Maximo; and Nunez-Regueiro, Jose 08003167 Cl. 427-249.7.
Petrmichl, Rudolph Hugo; Remington, Jr., Michael P.; Nunez-Regueiro, Jose; Frati, Maxi; and Fisher, Greg 08003164 Cl. 427-165.
Nunoue, Shinya: See--
Nago, Hajime; Tachibana, Koichi; Zaima, Kotaro; Saito, Shinji; Nunoue, Shinya; and Oka, Toshiyuki 08004004 Cl. 257-98.
Nuriel, Ifat: See--
Spear, Gail Andrea; Factor, Michael E.; Matsoevich, Rivka Mayraz; Fienblit, Shachar; Rahav, Sheli; Bartfai, Robert Francis; Tzafir, Dalit; and Nuriel, Ifat 08005800 Cl. 707-678.
Nusbickel, Wendi L.: See--
Da Palma, William V.; Mandalia, Baiju D.; Moore, Victor S.; and Nusbickel, Wendi L. 08005934 Cl. 709-223.
Nute, Roger: See--
Fetouhi, Al; and Nute, Roger 08006256 Cl. 720-718.
NuVasive, Inc.: See--
Gharib, James; Farquhar, Allen; Kaula, Norbert F.; Blewett, deceased, Jeffrey J.; Finley, Eric; Elbanna, Jamil; and Martinelli, Scot 08005535 Cl. 600-546.
Nuvoton Technology Corp.: See--
Flachs, Victor; Tasher, Nir; Peled, Nimrod; Shamis, Leonid; and Mayer, Shani 08006004 Cl. 710-40.
NVIDIA Corporation: See--
Cabral, Brian; Migdal, Amy J.; Bastos, Rui M.; and Abdalla, Karim M. 08004523 Cl. 345-426.
Cheng, Tony Yuhsiang; Chong, Hon Fei; Dodge, Benjamin; Tsai, Howard; and Lin, Tsungyi 08006062 Cl. 711-170.
Cook, David R.; and Krivega, Mikhail V. 08004515 Cl. 345-419.
Herz, William S. 08004565 Cl. 348-169.
Kilgard, Mark J.; Everitt, Cass W.; Dodd, Christopher T.; and Glanville, Robert Steven 08006236 Cl. 717-136.
Rideout, Philip A.; Allen, Jason R.; Kiel, Jeffrey T.; and Dominé, Sébastien Julien 08006232 Cl. 717-124.
Sun, Mike 08006106 Cl. 713-300.
Toksvig, Michael J. M.; Cabral, Brian K.; Hutchins, Edward A.; King, Gary C.; and Donham, Christopher D. S. 08004522 Cl. 345-426.
Voorhies, Douglas A.; and Tzvetkov, Svetoslav D. 08004520 Cl. 345-422.
White, Jonathan B.; and Lightstone, Michael L. 08004613 Cl. 348-700.
Wilt, Nicholas Patrick 08005885 Cl. 708-551.
NVOQ Incorporated: See--
Marquette, Brian; Kramp, Chris; and Skret, Swavek 08001709 Cl. 37-355.
NXP B.V.: See--
Boezen, Henk; De Haas, Clemens; Bollen, Gerrit; and Weijland, Inesz 08004318 Cl. 327-108.
Dick, Burkhard 08004365 Cl. 330-295.
Evoy, David R.; Klapporth, Peter; and Pineda De Gyvez, Jose J. 08004922 Cl. 365-226.
NxStage Medical, Inc.: See--
Brugger, James M.; and McDowell, Christopher 08002727 Cl. 604-6.1.
NYCOMED GmbH: See--
Kautz, Ulrich 08003798 Cl. 546-285.
Nygaard, Larry R.: See--
Covey, Kevin K.; McGrath, Thomas J.; Sullivan, Joseph L.; Nygaard, Larry R.; and Nova, Richard C. 08005552 Cl. 607-142.
Nygaard, Michael G.: See--
Lee, Brett J.; McLean, Jacob A.; and Nygaard, Michael G. 08004694 Cl. 356-625.
Nypro Inc.: See--
Vangsness, Todd S.; Kane, Jeffrey F.; and Kimball, Ian 08002755 Cl. 604-248.
Nysaether, Jon: See--
Mathiassen, Stig; Mathiassen, Svein; and Nysaether, Jon 08005275 Cl. 382-124.