| US 7,580,924 B1 | ||
| Method and system for collection, analysis, and display of semiconductor manufacturing information | ||
| Christopher Lanseng Ling, Palo Alto, Calif. (US); Michael Leonard Simmons, Monte Sereno, Calif. (US); Noel John Manicle, Dublin (Ireland); and Andrew John Flynn, Kildare (Ireland) | ||
| Assigned to Xilinx, Inc., San Jose, Calif. (US) | ||
| Filed on Nov. 08, 2005, as Appl. No. 11/268,833. | ||
| Application 11/268833 is a continuation in part of application No. 11/192344, filed on Jul. 28, 2005. | ||
| Int. Cl. G06F 17/30 (2006.01) | ||
| U.S. Cl. 707—3 [707/104.1] | 18 Claims |
| 1. A method for processing semi-conductor manufacturing data comprising:
capturing files from a plurality of manufacturing data sites having semi-conductor manufacturing data;
the semi-conductor manufacturing data including test data;
the test data indicating electrical characteristics;
converting the files into a standard format for storage in a database;
building a query from a client device using a plurality of sets of selections, wherein when a first selection is made by the
client device in a first set of the sets of selections, a second set of the sets of selections is dynamically changed to only
display a displayed set of selections on the client device limited to selections associated with the first selection;
checking limits of the test data of the semi-conductor manufacturing data by accessing the database and comparing the test
data of the semi-conductor manufacturing data stored in the database with limits therefor;
a portion of the limits being user defined limits including a parameter limit associated with the electrical characteristics,
the parameter limit being for threshold voltage;
alerting the client device, when any stored semi-conductor manufacturing data exceeds one or more limit of the portion of
the limits; and
generating a report for the client device based on the built query and the converted files stored in the database.
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