| US 7,580,334 B2 | ||
| Optical storage medium inspection apparatus for determining whether an optical storage medium is good or defective | ||
| Shin-ichi Kadowaki, Sanda (Japan); Mamoru Shoji, Sakai (Japan); Atsushi Nakamura, Moriguchi (Japan); and Takashi Ishida, Yawata (Japan) | ||
| Assigned to Panasonic Corporation, Osaka (Japan) | ||
| Filed on Oct. 31, 2007, as Appl. No. 11/980,481. | ||
| Application 11/980481 is a division of application No. 10/509740, previously published as PCT/JP03/04209, filed on Apr. 02, 2003. | ||
| Claims priority of application No. P2002-100961 (JP), filed on Apr. 03, 2002; application No. P2002-152904 (JP), filed on May 27, 2002; and application No. P2002-217856 (JP), filed on Jul. 26, 2002. | ||
| Prior Publication US 2008/0130454 A1, Jun. 05, 2008 | ||
| Int. Cl. G11B 7/00 (2006.01) | ||
| U.S. Cl. 369—53.34 [369/59.19] | 1 Claim |
| 1. An optical storage medium inspection apparatus comprising:
an optical pickup head that emits a light beam to an optical storage medium, detects a light beam reflected from the optical
storage medium, and outputs a signal based on the detected light beam reflected from the optical storage medium;
a jitter measuring unit for measuring jitter in signals output from the optical pickup head; and
an evaluation unit for determining from the measured jitter if the optical storage medium is good or defective;
wherein the jitter measuring unit measures jitter from an optical storage medium to which digital information is recorded
as a train of marks or spaces of length kT based on a period T and an integer k of two or more, but does not measure jitter
in signals obtained from edges of marks or spaces of length 2T.
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