| US 7,579,823 B1 | ||
| Thin film sensor | ||
| Harold E. Ayliffe, Woodinville, Wash. (US) | ||
| Assigned to E. I. Spectra, LLC, Woodinville, Wash. (US) | ||
| Filed on Jun. 03, 2008, as Appl. No. 12/156,605. | ||
| Application 12/156605 is a continuation of application No. 11/452583, filed on Jun. 14, 2006, granted, now 7,417,418. | ||
| Claims priority of provisional application 60/690372, filed on Jun. 14, 2005. | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G01N 27/00 (2006.01) | ||
| U.S. Cl. 324—71.1 [435/287.1; 436/63; 422/73; 422/68.1; 422/82.01] | 11 Claims |
| 1. A method for analyzing particles suspended in a fluid, comprising the steps of:
adding a volume of particle-containing fluid to a one-time use disposable cartridge comprising a thin film sensor structured
to provide at least one fluid-flow channel formed between layers of said sensor, a portion of said at least one fluid-flow
channel having side walls comprising a through-the-thickness cut-out from a channel layer, said side walls being capped by
other layers to form a perimeter boundary around said portion though which fluid may be urged to flow past an electrode and
along a local length axis;
causing a pressure differential across said thin-film sensor effective to move said fluid through said sensor; and
analyzing particles flowing through said sensor by monitoring changes in electric impedance at said electrode as said particles
flow through one or more interrogation channels.
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