| US 7,578,209 B2 | ||
| Metal element inspection device and metal element inspection method | ||
| Hiroaki Kuroda, Mishima (Japan); and Eiichiro Muramatsu, Fuji (Japan) | ||
| Assigned to JATCO Ltd., (Japan) | ||
| Filed on Sep. 27, 2005, as Appl. No. 11/235,195. | ||
| Claims priority of application No. 2004-286953 (JP), filed on Sep. 30, 2004. | ||
| Prior Publication US 2006/0065065 A1, Mar. 30, 2006 | ||
| Int. Cl. G01M 19/00 (2006.01); G01B 5/00 (2006.01) | ||
| U.S. Cl. 73—865.8 [33/556] | 4 Claims |
| 1. A metal element inspection device comprising:
a conveying means for sequentially transporting a plurality of metal elements, wherein a flank side recessed part formed in
a metal element for a Continuously Variable Transmission belt is placed on a rail and travels along said rail; and
an inspection rod inserted in noncontact with an opposite side recessed part of said metal element in said conveying state;
and
said metal element inspection device inspects for the existence of foreign matter being present as a result of interference
by an uplifted portion of said metal element from said rail due to foreign matter lodged between the flank side recessed part
of said metal element and said inspection rod, or interference by foreign matter lodged between the opposite side recessed
part of said metal element and said inspection rod.
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