LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 18th DAY OF August, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

U-Haul International, Inc.: See--
Dilgard, David 07575438 Cl. 439-35.
U.S. Nanocorp, Inc.: See--
Lipka, Stephen M.; Miller, John R.; Xiao, Tongsan D.; and Dai, Jinxiang 07576971 Cl. 361-502.
Ubayashi, Shinsuke: See--
Matsui, Noriaki; Tsuruno, Kunio; Isemura, Keizo; Ubayashi, Shinsuke; and Sasaki, Ichiro 07576872 Cl. 358-1.1.
Ubidia, Fernando A.: See--
Hammonds, Marcus M.; Segiet, William W.; Ubidia, Fernando A.; and Stein, Aaron 07575185 Cl. 241-35.
UBS AG: See--
Bank, Marcel; and Loacker, Hansbeat 07577687 Cl. 707-203.
Meier, Guido; and Thaler, Michael 07577685 Cl. 707-104.1.
Rademacher, Robert; Adkisson, David; and Maloy, David 07577601 Cl. 705-36.
Ucciardello, Carmelo: See--
Conte, Antonino; Ucciardello, Carmelo; D'Alessandro, Carmine; Micciche, Mario; Matranga, Giovanni; and De Costantini, Diego 07576591 Cl. 327-536.
Uchida, Akikazu; Nakamura, Hiroshi; Tsuzuki, Kunihiro; Yokoyama, Shinichi; and Kobayashi, Yasunori, to Denso Corporation Electric air pump apparatus and evaporation fuel treatment system 07575410 Cl. 415-36.
Uchida, Akiyoshi: See--
Taguchi, Masakazu; Itakura, Akihiro; and Uchida, Akiyoshi 07576935 Cl. 360-46.
Uchida, Hidetoshi; Nagai, Yasunori; Watanabe, Takamichi; Kazama, Hitoshi; Yokoyama, Osamu; and Saito, Kazuya, to Sumitomo Light Metal Industries, Ltd. Aluminum alloy sheet for superplastic forming 07575811 Cl. 428-469.
Uchida, Naoki: See--
Sato, Noriko; Komatsu, Motohiro; Uchida, Naoki; Sugiyama, Takuo; and Mochizuki, Mitsuyuki 07575352 Cl. 362-514.
Uchida, Shintaro: See--
Takahashi, Hisayoshi; Sugiyama, Tetsu; and Uchida, Shintaro 07576511 Cl. 318-807.
Uchikawa, Satoko: See--
Ishimasa, Toru; and Uchikawa, Satoko 07576931 Cl. 359-822.
Uchikoshi, Akihiro: See--
Tamura, Motoshi; Miki, Mutsumaru; Okamoto, Akiko; Kusunose, Kenya; Uchikoshi, Akihiro; Igarashi, Daisuke; Yamagata, Katsuhiko; Sato, Takaaki; Hagiwara, Junichiro; Watanabe, Yasuyuki; Hamajima, Takuya; Hata, Masafumi; Ishikawa, Nobutaka; Yasuda, Yoshiyuki; Yunoki, Kazufumi; and Uchiyama, Nobuhide 07577435 Cl. 455-436.
Uchiyama, Junya: See--
Kotaka, Satoshi; and Uchiyama, Junya 07576881 Cl. 358-1.15.
Uchiyama, Nobuhide: See--
Tamura, Motoshi; Miki, Mutsumaru; Okamoto, Akiko; Kusunose, Kenya; Uchikoshi, Akihiro; Igarashi, Daisuke; Yamagata, Katsuhiko; Sato, Takaaki; Hagiwara, Junichiro; Watanabe, Yasuyuki; Hamajima, Takuya; Hata, Masafumi; Ishikawa, Nobutaka; Yasuda, Yoshiyuki; Yunoki, Kazufumi; and Uchiyama, Nobuhide 07577435 Cl. 455-436.
Uchiyama, Shoichi; to Seiko Epson Corporation Image display apparatus 07575327 Cl. 353-30.
Uchiyama, Tetsuo: See--
Endo, Morinobu; Uchiyama, Tetsuo; Yamaguchi, Akio; Yuoka, Teruaki; Aoyama, Hiroshi; Takeda, Kazutoshi; Maehara, Yoshifumi; Takenaka, Masato; Jujo, Koichiro; Suzuki, Shigeo; and Tokoro, Takeshi 07575800 Cl. 428-296.7.
Udagawa, Takashi: See--
Mitani, Kazuhiro; Udagawa, Takashi; and Kusunoki, Katsuki 07576365 Cl. 257-96.
UDT Sensors, Inc.: See--
Bui, Peter Steven; and Taneja, Narayan Dass 07576369 Cl. 257-127.
Udupa, Anand Hariraj; Sinha, Vikas Kumar; Agarwal, Nitin; Pentakota, Visvesvararaya A.; and Oswal, Sandeep, to Texas Instruments Incorporated Reducing the time to convert an analog input sample to a digital code in an analog to digital converter (ADC) 07576668 Cl. 341-122.
Ueda, Akifumi: See--
Momose, Hikaru; Ootake, Atsushi; Ueda, Akifumi; Fujiwara, Tadayuki; Takeshita, Masaru; Hayashi, Ryotaro; and Iwai, Takeshi 07575846 Cl. 430-270.1.
Ueda, Hiromi: See--
Kasai, Hiroyuki; Tsuboi, Toshinori; Ueda, Hiromi; Nomura, Takumi; Kobayashi, Hirokazu; Makino, Kunitetsu; and Endo, Hiroyuki 07577362 Cl. 398-70.
Ueda, Kazunori: See--
Onoue, Kenichi; Toyooka, Kuniaki; Nakamura, Shinichi; and Ueda, Kazunori D0598326 Cl. D12-91.
Ueda, Kazuo; to Alps Electric Co., Ltd. Recording unit 07576762 Cl. 347-223.
Ueda, Mitsunori: See--
Odake, Ryota; Ohsako, Junichi; Kawabe, Hideo; and Ueda, Mitsunori 07575175 Cl. 235-492.
Ueda, Naotsugu; Nozoe, Satoshi; and Shimomoto, Yasushi, to OMRON Corporation Flow rate measuring device 07574908 Cl. 73-202.
Ueda, Takaharu: See--
Kugiya, Takuo; Ueda, Takaharu; Okamoto, Ken-Ichi; and Matsuoka, Tatsuo 07575100 Cl. 187-305.
Ueda, Tetsuzo: See--
Hikita, Masahiro; Yanagihara, Manabu; Ueda, Tetsuzo; Uemoto, Yasuhiro; and Tanaka, Tsuyoshi 07576373 Cl. 257-192.
Ueda, Yoshihiro; to Kabushiki Kaisha Toshiba Semiconductor memory device and writing method thereof 07577041 Cl. 365-189.05.
Ueda, Yoshihisa: See--
Iwamori, Toshimichi; and Ueda, Yoshihisa 07577323 Cl. 385-14.
Uehira, Shigeki: See--
Yoshida, Aiko; Uehira, Shigeki; and Takeuchi, Hiroshi 07575696 Cl. 252-299.01.
Ueki, Shiki: See--
Nagasaki, Hideo; Nagase, Hisato; Aoshima, Toshihide; and Ueki, Shiki 07576036 Cl. 503-226.
Ueki, Yasuhiro; to Victor Company of Japan, Limited Information recording medium, and recording method and reproducing method thereof 07577081 Cl. 369-275.3.
Uemondo, Yosuke: See--
Yahata, Hiroshi; Hamasaka, Hiroshi; Miwa, Katsuhiko; Uemondo, Yosuke; and Maehashi, Takenori 07577340 Cl. 386-124.
Uemoto, Takumi: See--
Miyanishi, Shuichi; Tanaka, Shunji; and Uemoto, Takumi D0598330 Cl. D12-110.
Uemoto, Yasuhiro: See--
Hikita, Masahiro; Yanagihara, Manabu; Ueda, Tetsuzo; Uemoto, Yasuhiro; and Tanaka, Tsuyoshi 07576373 Cl. 257-192.
Uemura, Tetsuya; to Hitachi Global Storage Technologies Netherlands B.V. Data integrity inspection support method for disk devices, and data integrity inspection method for disk devices 07577897 Cl. 714-770.
Uemura, Toshiya; Sawazaki, Katsuhisa; Nakai, Masahito; and Ikemoto, Yuhei, to Toyoda Gosei Co., Ltd. Group III nitride compound semiconductor light emitting device 07576363 Cl. 257-94.
Uenda, Daisuke: See--
Terada, Yoshio; Fujii, Hirofumi; Namikawa, Makoto; Uenda, Daisuke; and Amano, Yasuhiro 07575812 Cl. 428-473.5.
Uenishi, Mari: See--
Tanaka, Hirohisa; Tan, Isao; Uenishi, Mari; and Taniguchi, Masashi 07576032 Cl. 502-340.
Ueno, Masaaki: See--
Sugishita, Masashi; and Ueno, Masaaki 07577493 Cl. 700-207.
Ueno, Tsuyoshi; to Ricoh Company, Ltd. Semiconductor integrated device and method of providing shield interconnection therein 07576382 Cl. 257-306.
Uesaka, Mitsuru: See--
Nose, Hiroyuki; Ishida, Daisuke; Kaneko, Namio; Sakae, Hisaharu; Uesaka, Mitsuru; Fukasawa, Atsushi; and Dobashi, Katsuhiro 07577236 Cl. 378-119.
Uesugi, Ryoji: See--
Akahane, Fujio; Takashima, Nagamitsu; Hakeda, Kazushige; Uesugi, Ryoji; and Koike, Yasunori 07575305 Cl. 347-68.
Uetani, Yasunori: See--
Yamada, Airi; Uetani, Yasunori; and Kamabuchi, Akira 07576223 Cl. 549-13.
Ueyanagi, Katsumichi: See--
Saito, Kazunori; Ashino, Kimihiro; and Ueyanagi, Katsumichi 07574919 Cl. 73-708.
Ukrainczyk, Ljerka: See--
Bellman, Robert A.; Ukrainczyk, Ljerka; Quintal, Jose M.; and Sachenik, Paul A. 07575798 Cl. 428-138.
Uliano, George Tubular radial pin tumbler lock 07574882 Cl. 70-491.
Ulibarri, Gerard: See--
Auvin, Serge; Chabrier de Lassauniere, Pierre-Etienne; Harnett, Jeremiah; Pons, Dominique; and Ulibarri, Gerard 07576241 Cl. 564-336.
Ullmann, Andreas: See--
Clemens, Wolfgang; Ficker, Jürgen; Knobloch, Alexander Friedrich; and Ullmann, Andreas 07576294 Cl. 200-512.
Ullrich, John W.: See--
Collini, Michael D.; Singhaus, Jr., Robert R.; Hu, Baihua; Jetter, James W.; Morris, Robert L.; Kaufman, David H.; Miller, Christopher P.; Ullrich, John W.; Unwalla, Rayomand J.; Wrobel, Jay E.; Quinet, Elaine; Nambi, Ponnal; Bernotas, Ronald C.; and Elloso, Merle 07576215 Cl. 546-156.
Ulmer, Kurt M.; and Tiessen, Terrance A., to Hewlett-Packard Development Company, L.P. Reflector with non-uniform metal oxide layer surface 07575810 Cl. 428-469.
UltraCell Corporation: See--
Brantley, Jennifer; Newell, Kenneth; Sopchak, David; Kaye, Ian W.; Thompson, Jesse; and Somogyvari, Arpad 07575611 Cl. 48-61.
Umansky, Samuil; and Melkonyan, Hovsep, to Genentech, Inc. Family of genes encoding apoptosis-related peptides, peptides encoded thereby and methods of use thereof 07576187 Cl. 530-387.9.
Umbehocker, Steve; and Unueco, Allen, to Symantec Operating Corporation Distributed storage management services 07577729 Cl. 709-223.
Umeda, Atsushi; Shiga, Tsutomu; and Ihata, Kouichi, to Denso Corporation Apparatus and method for determining patterns of damage being caused in rolling contact element 07577555 Cl. 703-2.
Umemura, Naoki: See--
Nakajima, Takeshi; Umemura, Naoki; Suzuki, Hisashi; Yamamoto, Seiji; and Oguri, Makoto 07575267 Cl. 296-97.9.
Umeno, Ken; to National Institute of Information and Communications Technology Transmitter apparatus, receiver apparatus, transmission method, reception method and program 07577182 Cl. 375-137.
Umezawa, Akira; to Kabushiki Kaisha Toshiba Non-volatile semiconductor memory device 07577032 Cl. 365-185.13.
Underbrink, Paul A.; and Gronemeyer, Steven A., to SiRF Technology, Inc. Method and system for data detection in a global positioning system satellite receiver 07577524 Cl. 701-213.
Unger, Michael A: See--
Franco, Juan P.; and Unger, Michael A 07575058 Cl. 166-334.4.
Unger, Peter D.: See--
Rohrbach, Ronald P.; Zulauf, Gary B.; Unger, Peter D.; and Bause, Daniel E. 07575688 Cl. 210-660.
Unhoch, Michael J.; to Arch Chemicals, Inc. Method of water treatment 07575673 Cl. 210-143.
Uniao Brasileira de Vidros s/a Industria e Comercio: See--
Brunelli, Vera Lúcia Dias D0598204 Cl. D5-59.
Union Carbide Chemicals & Plastics Technology Corporation: See--
Lysenko, Zenon; Maughon, Bob R.; Bicerano, Josef; Christenson, Christopher P.; Cummins, Clark H.; Dettlof, Marvin L.; and White, Jerry E. 07576227 Cl. 554-223.
Union Surgical, LLC: See--
Taras, John Stanley; and Steffen, Dennis L. 07575579 Cl. 606-96.
Unit Process Technologies, LLC: See--
Sansalone, John J. 07575393 Cl. 404-71.
United Microelectronics Corp.: See--
Chang, Jen-Chung; Hsu, Chia-Jung; Lu, Shey-Shi; Chen, Hsiao-Chin; and Lin, Tzu-Chao 07577418 Cl. 455-323.
Huang, Jui-Tsen 07576013 Cl. 438-761.
United Parcel Service of America, Inc.: See--
Rousseau, Curtis R.; Jaslow, Seth D.; and Lawson, deceased, Phil G. 07577598 Cl. 705-35.
United Software Associates, Inc.: See--
Bhat, Sandeep Ashok 07577989 Cl. 726-16.
United States Gypsum Company: See--
Rosso, Aaron Charles; Myers, Matthew Earle; Patel, Amar Arvind; Fong, Scott; Wascow, Joseph Z.; Williams, Daniel J.; and Retzke, Brian A. D0598477 Cl. D15-138.
United States of America as represented by the Administrator of the National Aeronautics and Space Administration, The: See--
Steele, Glen F.; and Salazar, George A. 07577482 Cl. 700-19.
United States of America as represented by the Department of Health and Human Services, The: See--
Greig, Nigel; Egan, Josephine; Doyle, Maire; Holloway, Harold; and Perry, Tracy Ann 07576050 Cl. 514-2.
United States of America as represented by the Department of Veterans Affairs, The: See--
Khuri, Shukri; Thatte, Hemant; and Birjinuik, Vladimir 07575856 Cl. 435-1.2.
United States of America as represented by the Secretary of the Air Force, The: See--
Gruneisen, Mark T.; Garvin, Matthew B.; Dymale, Raymond C.; and Rotge, James R. 07576308 Cl. 250-201.9.
Wenndt, Stanley J.; and Cupples, Edward J. 07577564 Cl. 704-203.
United States of America as represented by the Secretary of the Army, The: See--
Liu, Jony Jiang; and von der Lippe, Christian 07576837 Cl. 356-5.15.
Sonstroem, Jaime 07576791 Cl. 348-335.
United States of America as represented by the Secretary of the Department of Health and Human Services, The: See--
Martin, Roland; McFarland, Henry; Bielekova, Bibiana; and Waldmann, Thomas 07575742 Cl. 424-85.4.
United States of America as represented by the Secretary of the Navy, The: See--
Amidon, Charles Philip 07577405 Cl. 455-90.1.
Butts, James C.; Oliver, Stephen F.; Cox, Donald L.; and Abdow, David A. 07574971 Cl. 114-21.2.
Dinh, Son; Church, Keith; and Stevens, Ilya 07577169 Cl. 370-509.
Dockery, Luther Damian; and Margiotta, Peter 07574960 Cl. 102-202.8.
Doleski, Robert F.; Olson, Stanley J.; and Oliver, Stephen F. 07574922 Cl. 73-841.
Keller, Teddy M.; and Kolel-Veetil, Manoj 07576168 Cl. 528-25.
United States of America as represented by the United States National Aeronautics and Space Administration, The: See--
Whitaker, Sterling; Miles, Lowell; Gambles, Jody; and Maki, Gary K. 07576562 Cl. 326-40.
United Technologies Corporation: See--
Beals, James T.; Persky, Joshua; Shah, Dilip M.; Seetharaman, Venkat; Bose, Sudhangshu; Snyder, Jacob; Santeler, Keith; Verner, Carl; Murray, Stephen D.; Marcin, John; Gupta, Dinesh; Bales, Daniel A.; Paulonis, Daniel Francis; Cotnoir, Glenn; and Wiedemer, John 07575039 Cl. 164-369.
Funk, Stanley J.; and Chlus, Wieslaw A. 07575416 Cl. 416-193A.
Unity Opto Technology Co., Ltd.: See--
Chang, Wei 07576403 Cl. 257-434.
Universite Du Quebec A Chicoutimi: See--
Audet, Daniel; and Parent, Luc 07576534 Cl. 324-234.
Université Laval: See--
Di Paolo, Thérèse 07576073 Cl. 514-171.
University of Connecticut: See--
Wang, Lei 07576580 Cl. 327-161.
University of Connecticut, The: See--
King, Glenn F.; Mukherjee, Ashis K.; Wikel, Stephen K.; and McFarland, Brianna Sollod 07575758 Cl. 424-405.
University of Delhi: See--
Tyagi, Kumar Akhilesh; Arnab, Mukhopadyay; and Vij, Shubha 07576263 Cl. 800-289.
University of Georgia Research Foundation, Inc.: See--
Doyle, Michael P.; and Zhao, Tong 07575744 Cl. 424-93.4.
Hussey, Richard S.; and Huang, Guozhong 07576261 Cl. 800-279.
University of Massachusetts: See--
Sengupta, Sukalyan; Ergas, Sarina; Nüsslein, Klaus; and Sahu, Ashish 07575686 Cl. 210-617.
University of Rochester: See--
Diduck, Quentin; and Margala, Martin 07576353 Cl. 257-29.
University of Saskatchewan: See--
Buchanan, Fiona; Thue, Tracey D.; and Winkelman-Sim, Dianne 07575903 Cl. 435-91.2.
University of Southern California: See--
Khoshnevis, Behrokh 07574925 Cl. 73-861.52.
Zimmermann, Roger; Liu, Leslie S.; Seo, Beomjoo; and Cansizlar, Kemal Oral 07577110 Cl. 370-260.
University of Virginia Patent Foundation: See--
Rieger, Jayson M.; Linden, Joel M.; Macdonald, Timothy L.; Sullivan, Gail W.; Murphree, Lauren J.; Figler, Robert Alan; and Thompson, Robert Douglas 07576069 Cl. 514-46.
University of Waikato, The: See--
Carnegie, Dale Anthony; Cree, Michael John; and Dorrington, Adrian Andrew 07576839 Cl. 356-28.5.
University of Washington: See--
Xia, Younan; and Li, Dan 07575707 Cl. 264-465.
University of Washington, The: See--
Zhang, Jing 07575876 Cl. 435-7.1.
University of Western Australia, The: See--
Flematti, Gavin Ray; Ghisalberti, Emilio Luciano; Dixon, Kingsly Wayne; and Trengove, Robert Donald 07576213 Cl. 546-116.
University of Yamanashi: See--
Onishi, Hiroshi 07575554 Cl. 600-534.
Uno, Shiro; and Sato, Hitoshi, to Roland Corporation Hammer keyboard system and chassis 07576273 Cl. 84-236.
Unser, Steffen: See--
Struck, Oliver; Pingel-Keuth, Andreas; Przybyla, Christian; Fehrenbacher, Ulrich; Hirth, Thomas; and Unser, Steffen 07576162 Cl. 525-408.
Unsworth, Austin: See--
Baird, David; and Unsworth, Austin D0598212 Cl. D6-397.
Unueco, Allen: See--
Umbehocker, Steve; and Unueco, Allen 07577729 Cl. 709-223.
Unwalla, Rayomand J.: See--
Collini, Michael D.; Singhaus, Jr., Robert R.; Hu, Baihua; Jetter, James W.; Morris, Robert L.; Kaufman, David H.; Miller, Christopher P.; Ullrich, John W.; Unwalla, Rayomand J.; Wrobel, Jay E.; Quinet, Elaine; Nambi, Ponnal; Bernotas, Ronald C.; and Elloso, Merle 07576215 Cl. 546-156.
UOP LLC: See--
Jung, Philip O. 07575365 Cl. 366-348.
Kulprathipanja, Santi; Priegnitz, James W.; and Sohn, Stephen W. 07576248 Cl. 585-323.
Lomas, David A.; and Miller, Lawrence W. 07575725 Cl. 422-144.
Miller, Mark A.; and Lewis, Gregory J. 07575737 Cl. 423-713.
Nafis, Douglas A. 07575668 Cl. 208-57.
Sohn, Stephen W.; and Riley, Mark G. 07576247 Cl. 585-323.
VanWees, Mark 07575670 Cl. 208-212.
UOP PLLC: See--
Cartwright, Gordon T.; and Clark, Keith R. 07575624 Cl. 95-51.
Uoto, Kouichi: See--
Ohta, Toshiharu; Komoriya, Satoshi; Yoshino, Toshiharu; Uoto, Kouichi; Nakamoto, Yumi; Naito, Hiroyuki; Mochizuki, Akiyoshi; Nagata, Tsutomu; Kanno, Hideyuki; Haginoya, Noriyasu; Yoshikawa, Kenji; Nagamochi, Masatoshi; Kobayashi, Syozo; and Ono, Makoto 07576135 Cl. 514-673.
Uozumi, Gakuji: See--
Igarashi, Kazunori; Uozumi, Gakuji; Nayuki, Yasushi; and Nakayama, Ryoji 07575645 Cl. 148-312.
Upasani, Ravindra B.: See--
Kelly, Michael G.; Kincaid, John; Duncton, Matthew; Sahasrabudhe, Kiran; Janagani, Satyanarayana; Upasani, Ravindra B.; Wu, Guoxian; Fang, deceased, YunFeng; Wei, Zhi-Liang; and Kaub, Carl 07576099 Cl. 514-311.
Upgradedetect, Inc.: See--
Zomaya, Christ J.; and Berry, Michael R. 07577948 Cl. 717-168.
Ura, Munehiro: See--
Ishizuka, Seiji; Ura, Munehiro; Sugiyama, Tadashi; Nakajima, Kenji; Fujiwara, Kazuhiko; and Kawanishi, Naoyuki 07575773 Cl. 427-58.
Urabe, Akio: See--
Matsuda, Toru; Piersol, Kurt; Teramura, Shinsuke; Urabe, Akio; and Inagaki, Tatsuya 07577723 Cl. 709-220.
Urakami, Hitoshi: See--
Yamamoto, Masato; Mori, Yoichi; and Urakami, Hitoshi 07576467 Cl. 310-218.
Urata, Shigefumi; to Sharp Kabushiki Kaisha Song search system and song search method 07576278 Cl. 84-600.
Urayama, Fumio: See--
Sato, Hiroyuki; Saitou, Shinji; Saitou, Tadashi; Sasaki, Takahiro; Urayama, Fumio; Endo, Hiroshi; Yoshida, Tatsuya; Isono, Shinsuke; Mashiko, Kaoru; Abe, Takahiro; and Kubo, Kazuhiko 07577135 Cl. 370-386.
Urmanov, Aleksey M.: See--
Popescu, George; Gross, Kenny C.; and Urmanov, Aleksey M. 07574918 Cl. 73-660.
Urosu, Dan; to Symantec Corporation Trusted handler and data association 07577985 Cl. 726-2.
Uryu, Masaru: See--
Yamada, Shinichiro; Fujihira, Yuko; Mori, Hiroyuki; Noguchi, Tsutomu; Tokura, Kunihiko; and Uryu, Masaru 07576154 Cl. 524-413.
Usami, Hiroyuki: See--
Kikuchi, Tetsuro; Usami, Hiroyuki; Kato, Akira; and Oshima, Hisayoshi 07576512 Cl. 320-100.
USB AG. Stamford Branch: See--
Gould, Joel M.; and McGrath, Frank J. 05920836 Cl. 704-251.
USM Holding AG: See--
Scherrer, Kurt; and Schärer, Alexander 07574965 Cl. 108-147.19.
Usuda, Yoshihiro: See--
Kakehi, Masahiro; Usuda, Yoshihiro; Tabira, Yukiko; and Sugimoto, Shinichi 07575901 Cl. 435-87.
UTC Power Corporation: See--
Liu, Ke; and Rohrbach, Eric A. 07575610 Cl. 48-61.
Uvarov, Timofei; and Lee, Hyung-Guen, to Samsung Electronics Co., Ltd. Method and apparatus for processing image data of a color filter array 07577315 Cl. 382-300.
UX Ltd.: See--
Long, James 07577749 Cl. 709-230.
Uzrad-Nali, Oran; Plotz, Kevin G.; and Leichty, Phil L., to Brocade Communications Systems, Inc. Apparatus and method for performing cyclic redundancy check (CRC) on partial protocol data units (PDUS) 07577896 Cl. 714-758.