LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 12th DAY OF August, 2008
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
U.S. Encode Corporation: See--
Uang, Uei-Shan: See--
Chang, Kuen-Shan; and Uang, Uei-Shan
07411380 Cl. 323-314.
UChicago Argonne, LLC: See--
Dees, Dennis W.; and Ackerman, John P.
07410561 Cl. 205-43.
Jody, Bassam J.; and Daniels, Edward J.
07410110 Cl. 241-5.
Uchida, Hiroyuki: See--
Katoh, Takayuki; Miyashita, Atsushi; Yamazaki, Mitsuhiro; Uchida, Hiroyuki; Shimotono, Susumu; and Tadokoro, Mizuho
07412306 Cl. 700-299.
Uchida, Keisuke: See--
Kadota, Ichiro; Suzuki, Kazumi; Kosugi, Hideki; and Uchida, Keisuke
07412190 Cl. 399-254.
Uchida, Masafumi: See--
Yamazaki, Hiroshi; Shirose, Meizo; and Uchida, Masafumi
07410742 Cl. 430-123.5.
Uchida, Noriyuki: See--
Iida, Shiro; Uchida, Noriyuki; and Akutsu, Hidezoh
07411351 Cl. 313-634.
Iida, Shiro; Uchida, Noriyuki; and Yabuki, Tatsuhiro
07411350 Cl. 313-634.
Uchida, Seishiro; Takayanagi, Yoshihiro; and Ono, Makoto, to Daiichi Pharmaceutical Co., Ltd. Crystals of taxane derivative and process for their production
07410980 Cl. 514-338.
Uchiyama, Kenichi; Uematsu, Ikuo; Oomiya, Kayoko; Tono, Ichiro; Eto, Hideo; Kishimoto, Isao; Okada, Naotada; and Hirata, Masami, to Kabushiki Kaisha Toshiba Optical waveguide type iontophoresis sensor chip and method for packaging sensor chip
07410614 Cl. 422-82.11.
Uchiyama, Masaaki: See--
Wakabayashi, Hiroyuki; Shida, Toshio; Uchiyama, Masaaki; Hattori, Masato; Kato, Norishige; and Kawatsu, Kenji
07412201 Cl. 399-407.
Uchiyama, Takashi; Goto, Nobuhiro; and Yasuda, Shingo, to Konami Corporation Random number selector, and bingo game machine incorporating the same
07410169 Cl. 273-142R.
Udagawa, Masamichi: See--
Zimman, Christopher William; Hook, James William; Udagawa, Masamichi; and Lockwood, Craig
D0574850 Cl. D14-496.
Uddenberg, David T.; Slutz, Mark; and Varney, Brian J., to LSI Corporation Methods and structure for verifying domain functionality
07412631 Cl. 714-47.
Udrea, Florin; and Amaratunga, Gehan A. J., to Cambridge Semiconductor Limited Semiconductor device and method of forming a semiconductor device
07411272 Cl. 257-548.
Ueda, Hitoshi; to Olympus Corporation Image acquiring apparatus and image acquiring method
07411626 Cl. 348-364.
Ueda, Kazunori: See--
Fukui, Hirofumi; Katsuno, Kouji; and Ueda, Kazunori
D0574751 Cl. D12-91.
Ueda, Satoshi: See--
Tsuboi, Osamu; Ueda, Satoshi; Mizuno, Yoshihiro; Sawaki, Ippei; and Okuda, Hisao
07411714 Cl. 359-226.
Ueda, Takehiro; to NEC Electronics Corporation Semiconductor device
07411851 Cl. 365-225.7.
Ueda, Tetsuzo; and Tamai, Seiichiro, to Matsushita Electric Industrial Co., Ltd. Semiconductor photodetecting device and method of manufacturing the same
07411232 Cl. 257-291.
Ueda, Tomohiko: See--
Sakurai, Wataru; Katsura, Hiroshi; Kakii, Toshiaki; Sunaga, Kei; Ueda, Tomohiko; Hosoya, Toshifumi; Nishioka, Daizo; Ohtsuka, Kenichiro; and Masunaga, Yuko
07410303 Cl. 385-78.
Uegaki, Hiroko; Tabata, Norikazu; Masaki, Takai; Takahashi, Hiromitsu; Tanaka, Akihiko; and Hashimoto, Mitsuyo, to Toray Industries, Inc. Paste, display member, and process for production of display member
07411780 Cl. 361-525.
Uehara, Shin-ichi; and Takanashi, Nobuaki, to NEC Corporation Image display device and portable terminal device using the same
07411640 Cl. 349-95.
Uematsu, Ikuo: See--
Uchiyama, Kenichi; Uematsu, Ikuo; Oomiya, Kayoko; Tono, Ichiro; Eto, Hideo; Kishimoto, Isao; Okada, Naotada; and Hirata, Masami
07410614 Cl. 422-82.11.
Uemura, Tetsuya; to Hitachi Global Storage Technologies Netherlands B.V. Method for controlling disk drive using an address translation table
07412585 Cl. 711-207.
Ueno, Harumi; Tomono, Jun; Sagawa, Hiroaki; Sakai, Takeshi; and Kato, Ikunoshin, to Takara Bio. Inc. Sulfated fucogalactan digesting enzyme gene
07410786 Cl. 435-200.
Uenou, Yasuhiro; to IP Power Systems Corporation Power system for area containing a set of power consumers
07412304 Cl. 700-295.
Uenoyama, Shinya: See--
Ishida, Hiroya; Wakiya, Takeshi; and Uenoyama, Shinya
07410698 Cl. 428-403.
Ufert, Klaus-Dieter; to Infineon Technologies AG Method for fabricating a nonvolatile memory element and a nonvolatile memory element
07410868 Cl. 438-257.
Uffenheimer, Kenneth F.: See--
Goix, Philippe J.; Lingane, Paul J.; Phi-Wilson, Janette T.; and Uffenheimer, Kenneth F.
07410809 Cl. 436-518.
Uhlmann, Eugenie V; O'Farrell, Desmond J; Schofield, Kenneth; and Lynam, Niall R, to Donnelly Corporation Navigation system for a vehicle
07412328 Cl. 701-213.
Uhlmann, Frank; Nasmyth, Kim; Peters, Jan-Michael; Waizenegger, Irene; Buonomo, Sara; and Clyne, Rosemary, to Boehringer Ingelheim International GmbH Compounds modulating sister chromatid separation and method for identifying same
07410774 Cl. 435-23.
Uhm, Jae-Hoon: See--
Yun, Hyun-Ki; Lim, Byeong-Gyu; Kim, Myeong-Seog; Oh, Se-Saeng; and Uhm, Jae-Hoon
07411104 Cl. 585-525.
Uhm, Sae-Hoon: See--
Kwon, Gi-Chung; Lee, Sang-Won; Uhm, Sae-Hoon; Kim, Jae-Hyun; Hong, Bo-Han; and Lee, Yong-Kwan
07411148 Cl. 219-121.43.
Uhrich, Kathryn E.; Schmeltzer, Robert C.; and Anastasiou, Theodore James, to Rutgers, The State University of New Jersey Synthesis of polyanhydrides
07411031 Cl. 528-272.
Ukai, Kunihiro: See--
Wakita, Hidenobu; Taguchi, Kiyoshi; Fujihara, Seiji; and Ukai, Kunihiro
07410930 Cl. 502-300.
Ullman, Edwin F.: See--
Charter, Neil; Eglen, Richard M.; Singh, Rajendra; and Ullman, Edwin F.
07410755 Cl. 435-4.
Ulrich, Daniel J.: See--
Kramer, Kenneth L.; Dahneke, Marshall S.; Biondo, John P.; Wilcox, Reed N.; Schwanemann, David T.; Borgman, Douglas E.; Miller, John D.; Ulrich, David J.; and Ulrich, Daniel J.
07409735 Cl. 5-713.
Ulrich, David J.: See--
Kramer, Kenneth L.; Dahneke, Marshall S.; Biondo, John P.; Wilcox, Reed N.; Schwanemann, David T.; Borgman, Douglas E.; Miller, John D.; Ulrich, David J.; and Ulrich, Daniel J.
07409735 Cl. 5-713.
Ulrich, David John: See--
Boratav, Olus Naili; Burdette, Steven Roy; and Ulrich, David John
07409839 Cl. 65-199.
Ultima Labs, Inc.: See--
Flanagan, William D.
07411517 Cl. 340-854.4.
Ultracell Corporation: See--
Hall, Brian D.; Nguyen, Hiep T.; and Prescop, Theodore
D0574767 Cl. D13-101.
Ulysses Pharmaceutical Products, Inc.: See--
Chamberland, Suzanne; and Malouin, Francois
07410974 Cl. 514-266.2.
Umeda, Masaomi: See--
Murata, Toshiki; Sasaki, Sachiko; Yoshino, Takashi; Ikegami, Yuka; Masuda, Tsutomu; Shimada, Mitsuyuki; Shintani, Takuya; Shimazaki, Makoto; Lowinger, Timothy B.; Ziegelbauer, Karl B.; Fuchikami, Kinji; Umeda, Masaomi; Komura, Hiroshi; and Yoshida, Nagahiro
07410986 Cl. 514-352.
Umeda, Takaichiro; Kaga, Hikaru; Suzuki, Tsuyoshi; Shimizu, Seiji; Usui, Takamasa; and Shimizu, Yoichiro, to Brother Kogyo Kabushiki Kaisha Air bubble removal in an ink jet printer
07410248 Cl. 347-85.
Umeno, Ken; Shih, Shenghung; and Yamaguchi, Akihiro, to Japan Science and Technology Corporation Apparatus and method for filtering a spectrum spread communication
07411997 Cl. 375-150.
Umetsu, Kazushige; to Seiko Epson Corporation Method for manufacturing a crystal device
07411649 Cl. 349-187.
Underbrink, Paul A.; Tomlinson, Michael D.; and Clark, Ricke W., to Skyworks Solutions, Inc. Aligning a frame pulse of a high frequency timer using a low frequency timer
07412266 Cl. 455-574.
Underwood, Bradford J.; to Sports Imports, Inc. Composite locking upright
07410431 Cl. 473-492.
Unger, Peter D.: See--
Rohrbach, Ronald P.; Unger, Peter D.; Zulauf, Gary B.; Bause, Daniel E.; Johnson, Russ; and Rockwell, David R.
07410585 Cl. 210-633.
Unger, Reuven Z. M.; and Collins, Joshua E., to Sunpower, Inc. Dual mode compressor with automatic compression ratio adjustment for adapting to multiple operating conditions
07409833 Cl. 62-196.2.
Union Beach L.P.: See--
Tannenbaum, David H.; and Tannenbaum, Mary C.
07412325 Cl. 701-204.
United Microelectronics Corp.: See--
Hsuan, John; and Lee, Ellis
07412394 Cl. 705-1.
Ting, Shyh-Fann; Huang, Cheng-Tung; Hung, Wen-Han; Jeng, Li-Shian; and Cheng, Tzyy-Ming
07410875 Cl. 438-300.
United States of America as represented by the Administration of NASA, The: See--
United States of America as represented by the Administrator of the National Aeronautics and Space Administration, The: See--
Chuss, David T.; Wollack, Edward J.; Moseley, Samuel H.; and Novak, Giles A.
07412175 Cl. 398-204.
Fink, Patrick W.; Lin, Greg Y.; Chu, Andrew W.; Dobbins, Justin A.; Arndt, G. Dickey; and Ngo, Phong H.
07410485 Cl. 606-33.
Holland, Samuel D.; Delaune, Paul B.; and Turner, Kathryn M.
07411198 Cl. 250-370.01.
Polzin, Kurt A.; Korman, Valentin; Markusic, Thomas E.; and Stanojev, Boris Johann
07409875 Cl. 73-861.95.
United States of America as represented by the Department of Health and Human Services, Center for Disease Control and Prevention, The: See--
Tsang, Victor C. W.; Call, Jeffrey L.; Lee, Yeuk-mui; and Hancock, Kathy
07410771 Cl. 435-7.1.
United States of America as represented by the Department of Health and Human Services, The: See--
Schlom, Jeffrey; Panicali, Dennis L.; Gritz, Linda R.; and Mazzara, Gail P.
07410644 Cl. 424-232.1.
United States of America as represented by the Secretary of Army, The: See--
Beekman, Daniel W.
07409899 Cl. 89-1.11.
United States of America as represented by the Secretary of the Army, The: See--
Bloemer, Mark J.; Scalora, Michael; and Poliakov, Evgenl Y.
07412144 Cl. 385-129.
Chang, Richard K.; Pan, Yongle; and Hill, Steven Clyde
07410063 Cl. 209-44.2.
Hull, David M.; and Probst, Mark R.
07411401 Cl. 324-457.
Misra, Saswat; and Swami, Ananthram
07412020 Cl. 375-377.
Ruff, William C.; Stann, Barry L.; Shen, Paul H.; Redman, Brian C.; and Aliberti, Keith M.
07411662 Cl. 356-5.15.
United States of America as represented by the Secretary of the Navy: See--
Nechitailo, Nicholas V.; and Lewis, Keith B.
07409900 Cl. 89-8.
United States of America as represented by the Secretary of the Navy, The: See--
Gerhard, deceased, Erich M.
07411558 Cl. 343-709.
Unitel High Technology Corporation: See--
Univation Technologies, LLC: See--
Universal Avionics Systems Corp.: See--
Naimer, Ted; Hyatt, Sam; Brannen, Jim; and Lawrence, Tom
07412308 Cl. 701-7.
Universal Electronics, Inc.: See--
Gates, Stephen Brian
07412653 Cl. 715-716.
Universita′ Degli Studi “Roma Tre”: See--
Universitätsklinikum Freiburg: See--
Universite De Liege: See--
Reginster, Jean-Yves; Deberg, Michelle; Henrotin, Yves; and Christgau, Stephan
07410770 Cl. 435-7.1.
University of British Columbia, The: See--
Andersen, Raymond; Coleman, John; De Silva, Dilip; Kong, Fangming; Piers, Edward; Wallace, Debra; Roberge, Michel; and Allen, Theresa
07410951 Cl. 514-19.
University of Delaware: See--
Duncan, Melinda K.; Chen, Xiaoren; and Cain, William
07411049 Cl. 530-388.1.
University of Delhi Department of Biochemistry: See--
Chaudhary, Vijay Kumar; Gupta, Amita; Adhya, Sankar; and Pastan, Ira
07410801 Cl. 435-471.
University of Georgia Research Foundation, Inc.: See--
University of Iowa Research Foundation: See--
Davidson, Beverly L.; and Law, Lane K.
07410954 Cl. 514-44.
University of Kansas, The: See--
Burns, Mark R.; David, Sunil A.; and Jenkins, Scott A.
07411002 Cl. 514-601.
University of North Carolina at Chapel Hill, The: See--
Dykstra, Christine C.; Givens, Maurice Daniel; Stringfellow, David A.; Brock, Kenny; Boykin, David; Kumar, Arvid; Wilson, W. David; Tidwell, Richard R.; and Stephens, Chad F.
07410989 Cl. 514-394.
University of North Carolina at Charlotte: See--
Stroud, Charles Eugene; and Abramovici, Miron
07412343 Cl. 702-120.
University of North Carolinia at Chapel Hill: See--
Dykstra, Christine C.; Givens, Maurice Daniel; Stringfellow, David A.; Brock, Kenny; Boykin, David; Kumar, Arvid; Wilson, W. David; Tidwell, Richard R.; and Stephens, Chad F.
07410999 Cl. 514-461.
University of Pittsburgh - of the Commonwealth System of Higher Education, The: See--
Dowling, Patricia W.; and Youngner, Julius S.
07411058 Cl. 536-23.72.
University of Queensland, The: See--
Woodruff, Trent Martin; Taylor, Stephen Maxwell; and Fairlie, David
07410945 Cl. 514-9.
University of Rochester: See--
Tavli, Bulent; and Heinzelman, Wendi
07411919 Cl. 370-315.
University of Sheffield: See--
Foster, Simon; Mond, James; Clarke, Simon; McDowell, Philip; and Brummel, Kristy
07410647 Cl. 424-243.1.
University of Virginia Patent Foundation: See--
Macdonald, Timothy L.; and Dieckhaus, Christine M.
06538024 Cl. 514-478.
University of Western Sydney, The: See--
Fenton, Ronald Ralph; and Aldrich-Wright, Janice
07410960 Cl. 514-185.
Uno, Koji; to Shimano, Inc. Apparatus for providing electrical signals to bicycle components
07411307 Cl. 290-1R.
Unsicker, Samuel C.: See--
Roach, Alan; Kullgren, Peter; and Unsicker, Samuel C.
07410170 Cl. 273-146.
UOP LLC: See--
Bricker, Maureen L.; and Modica, Frank S.
07411102 Cl. 585-475.
Lapinski, Mark P.; Yuan, Leon; and Moser, Mark D.
07410565 Cl. 208-63.
Liu, Chunqing; and Wilson, Stephen T.
07410525 Cl. 95-45.
Wendelbo, Rune; Akporiaye, Duncan E.; Dahl, Ivar M.; Karlsson, Arne; Lewis, Gregory J.; Kempf, Richard S.; Patel, Amit J.; Anderson, Brent J.; Schumaker, Russell D.; and Greenlay, Nanette
07410804 Cl. 436-174.
Uppaluri, Renuka: See--
Battle, Vianney Pierre; Uppaluri, Renuka; and Warp, Richard
07412111 Cl. 382-284.
Upton, John Daniel; and Vega, Madeline, to International Business Machines Corporation Method to override daughterboard slots marked with power fault
07412629 Cl. 714-44.
Ur, Shmuel: See--
Biberstein, Marina; Bushinsky, Shay; Farchi, Eitan; and Ur, Shmuel
07412692 Cl. 717-124.
Urabe, Kiichiro: See--
Uratani, Ikuo; Urabe, Kiichiro; and Taninaka, Dai
07412573 Cl. 711-154.
Urai, Yoshihiro; Otabe, Makoto; and Kodaka, Kenji, to Honda Motor Co., Ltd. Travel safety system for vehicle
07412329 Cl. 701-301.
Uratani, Ikuo; Urabe, Kiichiro; and Taninaka, Dai, to Hitachi, Ltd. Storage device and device changeover control method for storage devices
07412573 Cl. 711-154.
Uro, Katsuji: See--
Mitsui, Takahiro; Fujiwara, Mikio; and Uro, Katsuji
07411622 Cl. 348-312.
User-Centric IP, L.P.: See--
Smith, Michael R.
07411493 Cl. 340-539.18.
USG Interiors, Inc.: See--
Ushiro, Teruyuki: See--
Yoshimura, Shinichi; and Ushiro, Teruyuki
07412076 Cl. 382-103.
Ushiyama, Toshihiro; Hirai, Toshimitsu; Mikoshiba, Toshiaki; Kiguchi, Hiroshi; and Hasei, Hironori, to Seiko Epson Corporation Method for fabricating thin film pattern, device and fabricating method therefor, method for fabricating liquid crystal display, liquid crystal display, method for fabricating active matrix substrate, electro-optical apparatus, and electrical apparatus
07410905 Cl. 438-701.
Usui, Takamasa: See--
Umeda, Takaichiro; Kaga, Hikaru; Suzuki, Tsuyoshi; Shimizu, Seiji; Usui, Takamasa; and Shimizu, Yoichiro
07410248 Cl. 347-85.
Usui, Tatehito; Fujii, Takashi; Yoshigai, Motohiko; and Kaji, Tetsunori, to Hitachi, Ltd. Film thickness measuring method of member to be processed using emission spectroscopy and processing method of the member using the measuring method
07411684 Cl. 356-503.
Utah, David Alan: See--
Woodfield, Andrew Philip; Ott, Eric Allen; Shamblen, Clifford Earl; Gigliotti, Michael Francis Xavier; Utah, David Alan; and Turner, Alan Glen
07410610 Cl. 419-34.
UTC Power Corporation: See--
Reiser, Carl A.; Saito, Kazuo; Cameron, James; and Resnick, Gennady
07410619 Cl. 422-105.
Reiser, Carl A.; Yang, Deliang; and Sawyer, Richard D.
07410712 Cl. 429-13.
Utsuno, Yukihiro: See--
Higashi, Masahiko; Nakamura, Manabu; Sera, Kentaro; Nansei, Hiroyuki; Utsuno, Yukihiro; Takagi, Hideo; and Kajita, Tatsuya
07410857 Cl. 438-216.
Uzuka, Tatsuya: See--
Sasaki, Nobuo; and Uzuka, Tatsuya
07410508 Cl. 29-25.01.