| US 7,577,536 B1 | ||
| Determination of ohmic losses in electrical devices | ||
| Calum Chisholm, Pasadena, Calif. (US); Dane Boysen, Pasadena, Calif. (US); Matt Hetterman, Altadena, Calif. (US); and Alex Papandrew, Pasadena, Calif. (US) | ||
| Assigned to Superprotonic, Inc., Pasadena, Calif. (US) | ||
| Filed on Jun. 08, 2007, as Appl. No. 11/760,555. | ||
| Int. Cl. G06F 19/00 (2006.01); G01R 19/00 (2006.01) | ||
| U.S. Cl. 702—65 [702/64] | 18 Claims |
| 1. A method for determining voltage loss in an electrical device, the method comprising:
obtaining an array A of voltage values corresponding to at least one current interrupt measurement at current In, wherein In corresponds to current values I1, I2, . . . , In, wherein subscript n is at least 3;
forming an array D of difference values using a difference of said array A over an elapsed time;
processing the difference values of the array D to obtain Vn, by a processing unit;
determining Vn for each In to form an array V of Vn; and
calculating a resistance, R, using the array V, thereby determining voltage loss in the electrical device.
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