| US 7,576,555 B2 | ||
| Current measuring apparatus, test apparatus, current measuring method and test method | ||
| Yoshihiro Hashimoto, Tokyo (Japan) | ||
| Assigned to Advantest Corporation, Tokyo (Japan) | ||
| Filed on Jul. 30, 2008, as Appl. No. 11/755,746. | ||
| Application 11/755746 is a continuation of application No. PCT/JP2006/303198, filed on Feb. 22, 2006. | ||
| Claims priority of application No. 2005-050071 (JP), filed on Feb. 25, 2005. | ||
| Prior Publication US 2009/0021239 A1, Jan. 22, 2009 | ||
| Int. Cl. G01R 31/26 (2006.01) | ||
| U.S. Cl. 324—765 | 17 Claims |
| 1. A current measuring apparatus that measures an electric current received by an electronic device from an input terminal,
the current measuring apparatus comprising:
a first voltage accumulator that accumulates a reference supply voltage that acts as a reference for a voltage being supplied
to the electronic device during measuring electric currents;
a first switch that connects a power supply to the first voltage accumulator to accumulate the reference supply voltage before
measuring electric currents and disconnects the power supply from the first voltage accumulator during measuring electric
currents;
a current supplying section that supplies an electric current based on the reference supply voltage accumulated in the first
voltage accumulator and a terminal voltage of the input terminal to the electronic device during measuring electric currents;
and
a first current measuring section that measures the supply current supplied to the electronic device.
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