| 1. A method, comprising:
simultaneously testing a first plurality of die on a substrate using a probe card having a plurality of probe elements, wherein
each and every one of the plurality of probe element is always to test a respective one of the first plurality of die on the
substrate; and
simultaneously testing a second plurality of die on the substrate after testing the first plurality of die, wherein each and
every one of the plurality of probe elements is always employed to test a respective one of the second plurality of die on
the substrate.
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