| US 7,571,363 B2 | ||
| Parametric measurement of high-speed I/O systems | ||
| Hugh S. Wallace, Fort Collins, Colo. (US); Adrian Wan-Chew Seet, New York, N.Y. (US); and Klaus-Dieter Hilliges, Shanghai (China) | ||
| Assigned to Agilent Technologies, Inc., Santa Clara, Calif. (US) | ||
| Filed on May 18, 2006, as Appl. No. 11/419,003. | ||
| Prior Publication US 2007/0268963 A1, Nov. 22, 2007 | ||
| Int. Cl. G01R 31/28 (2006.01) | ||
| U.S. Cl. 714—724 [714/25; 714/30; 714/56; 714/709; 714/712; 714/716; 714/738; 714/744; 327/141; 370/395.62; 375/221; 375/215; 375/213; 375/226; 375/229; 375/371; 375/376] | 42 Claims |
| 24. A test system for testing a device under test comprising an input/output (I/O) circuit, the test system comprising:
a phase tracking circuit comprising a phase comparator and a loop filter, the phase comparator operable to generate a phase
signal and to feed the phase signal to the loop filter; and
a processing circuit connected to receive from the phase comparator prior to the loop filter the phase signal generated by
the phase comparator, the processing circuit operable to determine parametric information pertaining to the I/O circuit from
the phase signal received from the phase comparator prior to the loop filter.
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