| US 7,571,068 B2 | ||
| Module, electronic device and evaluation tool | ||
| Thomas Franciscus Waayers, Eindhoven (Netherlands) | ||
| Assigned to NXP B.V., Eindhoven (Netherlands) | ||
| Appl. No. 10/524,458 PCT Filed Jul. 17, 2003, PCT No. PCT/IB03/03261 § 371(c)(1), (2), (4) Date Feb. 10, 2005, PCT Pub. No. WO2004/017083, PCT Pub. Date Feb. 26, 2004. |
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| Claims priority of application No. 02078366 (EP), filed on Aug. 14, 2002. | ||
| Prior Publication US 2005/0268193 A1, Dec. 01, 2005 | ||
| Int. Cl. G01R 27/28 (2006.01); G06F 3/00 (2006.01) | ||
| U.S. Cl. 702—120 [710/48] | 16 Claims |
| 1. A module comprising a functional block and a test controller for controlling the functional block in an evaluation mode
of the module, the test controller comprising:
a plurality of pins including an input pin and an output pin;
a first register coupled between the input pin and the output pin for receiving a bit pattern via the input pin and outputting
the bit pattern via the output pin; and
a second register coupled to the first register for capturing the bit pattern responsive to an update signal;
dedicated control circuitry for blocking the update signal responsive to the bit pattern;
a multiplexer; and
a no-update bypass register configured with the multiplexer in response to a no-update code, to maintain the bit pattern in
a stable state for the evaluation mode.
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